JPS57179997A - Semiconductor memory - Google Patents

Semiconductor memory

Info

Publication number
JPS57179997A
JPS57179997A JP56063004A JP6300481A JPS57179997A JP S57179997 A JPS57179997 A JP S57179997A JP 56063004 A JP56063004 A JP 56063004A JP 6300481 A JP6300481 A JP 6300481A JP S57179997 A JPS57179997 A JP S57179997A
Authority
JP
Japan
Prior art keywords
output
circuit
block
output terminal
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56063004A
Other languages
English (en)
Other versions
JPH0215960B2 (ja
Inventor
Mitsuaki Ishikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP56063004A priority Critical patent/JPS57179997A/ja
Publication of JPS57179997A publication Critical patent/JPS57179997A/ja
Publication of JPH0215960B2 publication Critical patent/JPH0215960B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP56063004A 1981-04-25 1981-04-25 Semiconductor memory Granted JPS57179997A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56063004A JPS57179997A (en) 1981-04-25 1981-04-25 Semiconductor memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56063004A JPS57179997A (en) 1981-04-25 1981-04-25 Semiconductor memory

Publications (2)

Publication Number Publication Date
JPS57179997A true JPS57179997A (en) 1982-11-05
JPH0215960B2 JPH0215960B2 (ja) 1990-04-13

Family

ID=13216735

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56063004A Granted JPS57179997A (en) 1981-04-25 1981-04-25 Semiconductor memory

Country Status (1)

Country Link
JP (1) JPS57179997A (ja)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6159698A (ja) * 1984-08-30 1986-03-27 Mitsubishi Electric Corp 半導体記憶装置
JPS6159700A (ja) * 1984-08-30 1986-03-27 Mitsubishi Electric Corp 半導体記憶装置
JPS61158100A (ja) * 1984-12-28 1986-07-17 シーメンス、アクチエンゲゼルシヤフト 集積半導体メモリ
JPS61158099A (ja) * 1984-12-28 1986-07-17 シーメンス、アクチエンゲゼルシヤフト 集積半導体メモリ
JPS61292299A (ja) * 1985-06-18 1986-12-23 Toshiba Corp オンチツプメモリテスト容易化回路
JPS621200A (ja) * 1985-02-28 1987-01-07 Nec Corp 半導体メモリ
DE3639169A1 (de) * 1986-01-21 1987-07-23 Mitsubishi Electric Corp Halbleiterspeichervorrichtung
JPS6446300A (en) * 1987-08-17 1989-02-20 Nippon Telegraph & Telephone Semiconductor memory
JPH04233045A (ja) * 1990-06-20 1992-08-21 American Teleph & Telegr Co <Att> データ圧縮方法及び装置
JP2000048599A (ja) * 1998-07-24 2000-02-18 Mitsubishi Electric Corp 同期型半導体記憶装置
JP2001266600A (ja) * 2000-03-17 2001-09-28 Oki Electric Ind Co Ltd 組み込み型メモリ試験回路
JP2002304899A (ja) * 2001-04-06 2002-10-18 Fujitsu Ltd 半導体記憶装置及び半導体記憶装置のワード線多重選択試験方法
KR100542470B1 (ko) * 1997-09-29 2006-04-06 지멘스 악티엔게젤샤프트 멀티뱅크메모리소자를위한뱅크인터로크설계와관련테스트모드수행을위한장치및방법

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51147924A (en) * 1975-06-13 1976-12-18 Fujitsu Ltd Memory unit
JPS53120234A (en) * 1977-03-30 1978-10-20 Toshiba Corp Semiconductor memory

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51147924A (en) * 1975-06-13 1976-12-18 Fujitsu Ltd Memory unit
JPS53120234A (en) * 1977-03-30 1978-10-20 Toshiba Corp Semiconductor memory

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0411959B2 (ja) * 1984-08-30 1992-03-03 Mitsubishi Electric Corp
JPS6159700A (ja) * 1984-08-30 1986-03-27 Mitsubishi Electric Corp 半導体記憶装置
JPS6159698A (ja) * 1984-08-30 1986-03-27 Mitsubishi Electric Corp 半導体記憶装置
JPS61158100A (ja) * 1984-12-28 1986-07-17 シーメンス、アクチエンゲゼルシヤフト 集積半導体メモリ
JPS61158099A (ja) * 1984-12-28 1986-07-17 シーメンス、アクチエンゲゼルシヤフト 集積半導体メモリ
JPS621200A (ja) * 1985-02-28 1987-01-07 Nec Corp 半導体メモリ
JPS61292299A (ja) * 1985-06-18 1986-12-23 Toshiba Corp オンチツプメモリテスト容易化回路
DE3639169A1 (de) * 1986-01-21 1987-07-23 Mitsubishi Electric Corp Halbleiterspeichervorrichtung
JPS6446300A (en) * 1987-08-17 1989-02-20 Nippon Telegraph & Telephone Semiconductor memory
JPH04233045A (ja) * 1990-06-20 1992-08-21 American Teleph & Telegr Co <Att> データ圧縮方法及び装置
KR100542470B1 (ko) * 1997-09-29 2006-04-06 지멘스 악티엔게젤샤프트 멀티뱅크메모리소자를위한뱅크인터로크설계와관련테스트모드수행을위한장치및방법
JP2000048599A (ja) * 1998-07-24 2000-02-18 Mitsubishi Electric Corp 同期型半導体記憶装置
JP2001266600A (ja) * 2000-03-17 2001-09-28 Oki Electric Ind Co Ltd 組み込み型メモリ試験回路
JP4521922B2 (ja) * 2000-03-17 2010-08-11 Ｏｋｉセミコンダクタ株式会社 組み込み型メモリ試験回路
JP2002304899A (ja) * 2001-04-06 2002-10-18 Fujitsu Ltd 半導体記憶装置及び半導体記憶装置のワード線多重選択試験方法

Also Published As

Publication number Publication date
JPH0215960B2 (ja) 1990-04-13

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