JPS53120234A - Semiconductor memory - Google Patents

Semiconductor memory

Info

Publication number
JPS53120234A
JPS53120234A JP3436777A JP3436777A JPS53120234A JP S53120234 A JPS53120234 A JP S53120234A JP 3436777 A JP3436777 A JP 3436777A JP 3436777 A JP3436777 A JP 3436777A JP S53120234 A JPS53120234 A JP S53120234A
Authority
JP
Japan
Prior art keywords
semiconductor memory
shorten
dividing
memory cell
increase
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3436777A
Other languages
Japanese (ja)
Inventor
Keikichi Tamaru
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP3436777A priority Critical patent/JPS53120234A/en
Publication of JPS53120234A publication Critical patent/JPS53120234A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To shorten the test time and thus to increase the test efficiency by dividing the memory cell array into some blocks under the division mode and then giving parallel operation to each block.
JP3436777A 1977-03-30 1977-03-30 Semiconductor memory Pending JPS53120234A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3436777A JPS53120234A (en) 1977-03-30 1977-03-30 Semiconductor memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3436777A JPS53120234A (en) 1977-03-30 1977-03-30 Semiconductor memory

Publications (1)

Publication Number Publication Date
JPS53120234A true JPS53120234A (en) 1978-10-20

Family

ID=12412189

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3436777A Pending JPS53120234A (en) 1977-03-30 1977-03-30 Semiconductor memory

Country Status (1)

Country Link
JP (1) JPS53120234A (en)

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57179997A (en) * 1981-04-25 1982-11-05 Toshiba Corp Semiconductor memory
JPS57186098U (en) * 1981-05-21 1982-11-26
JPS5853094A (en) * 1981-09-24 1983-03-29 Fujitsu Ltd Test method for storage device
JPS58128077A (en) * 1982-01-22 1983-07-30 Mitsubishi Electric Corp Memory device
EP0090002A1 (en) * 1981-09-28 1983-10-05 Motorola, Inc. Memory with permanent array division capability
JPS59119597A (en) * 1982-12-27 1984-07-10 Fujitsu Ltd Semiconductor storage device
JPS6015899A (en) * 1983-07-08 1985-01-26 Hitachi Micro Comput Eng Ltd Storage device
JPS6020399A (en) * 1983-07-15 1985-02-01 Nec Corp Testing method of semiconductor storage element
EP0143624A2 (en) * 1983-11-25 1985-06-05 Fujitsu Limited Dynamic semiconductor memory device having divided memory cell blocks
JPS60205897A (en) * 1984-03-30 1985-10-17 Toshiba Corp Semiconductor memory
JPS60253088A (en) * 1984-05-30 1985-12-13 Mitsubishi Electric Corp Semiconductor storage device
JPS61122998A (en) * 1984-08-31 1986-06-10 テキサス　インスツルメンツ　インコ−ポレイテツド Fast simultaneous testing method and apparatus using parallel writing into dynamic read/write memory array
JPS6410496A (en) * 1987-07-02 1989-01-13 Nec Corp Semiconductor storage device
US4868823A (en) * 1984-08-31 1989-09-19 Texas Instruments Incorporated High speed concurrent testing of dynamic read/write memory array
JPH02206100A (en) * 1989-02-03 1990-08-15 Hitachi Ltd Semiconductor memory
JP2008198297A (en) * 2007-02-14 2008-08-28 System Fabrication Technologies Inc Semiconductor storage device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51147924A (en) * 1975-06-13 1976-12-18 Fujitsu Ltd Memory unit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51147924A (en) * 1975-06-13 1976-12-18 Fujitsu Ltd Memory unit

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0215960B2 (en) * 1981-04-25 1990-04-13 Tokyo Shibaura Electric Co
JPS57179997A (en) * 1981-04-25 1982-11-05 Toshiba Corp Semiconductor memory
JPS57186098U (en) * 1981-05-21 1982-11-26
JPS5853094A (en) * 1981-09-24 1983-03-29 Fujitsu Ltd Test method for storage device
EP0090002A1 (en) * 1981-09-28 1983-10-05 Motorola, Inc. Memory with permanent array division capability
JPS58128077A (en) * 1982-01-22 1983-07-30 Mitsubishi Electric Corp Memory device
JPS59119597A (en) * 1982-12-27 1984-07-10 Fujitsu Ltd Semiconductor storage device
JPH047040B2 (en) * 1982-12-27 1992-02-07 Fujitsu Ltd
JPS6015899A (en) * 1983-07-08 1985-01-26 Hitachi Micro Comput Eng Ltd Storage device
JPS6020399A (en) * 1983-07-15 1985-02-01 Nec Corp Testing method of semiconductor storage element
EP0143624A2 (en) * 1983-11-25 1985-06-05 Fujitsu Limited Dynamic semiconductor memory device having divided memory cell blocks
JPS60205897A (en) * 1984-03-30 1985-10-17 Toshiba Corp Semiconductor memory
JPS60253088A (en) * 1984-05-30 1985-12-13 Mitsubishi Electric Corp Semiconductor storage device
JPH0440800B2 (en) * 1984-05-30 1992-07-06 Mitsubishi Electric Corp
JPS61122998A (en) * 1984-08-31 1986-06-10 テキサス　インスツルメンツ　インコ−ポレイテツド Fast simultaneous testing method and apparatus using parallel writing into dynamic read/write memory array
US4868823A (en) * 1984-08-31 1989-09-19 Texas Instruments Incorporated High speed concurrent testing of dynamic read/write memory array
JPS6410496A (en) * 1987-07-02 1989-01-13 Nec Corp Semiconductor storage device
JPH02206100A (en) * 1989-02-03 1990-08-15 Hitachi Ltd Semiconductor memory
JP2008198297A (en) * 2007-02-14 2008-08-28 System Fabrication Technologies Inc Semiconductor storage device

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