JPS57143858A - Semiconductor integrated circuit - Google Patents
Semiconductor integrated circuitInfo
- Publication number
- JPS57143858A JPS57143858A JP3020781A JP3020781A JPS57143858A JP S57143858 A JPS57143858 A JP S57143858A JP 3020781 A JP3020781 A JP 3020781A JP 3020781 A JP3020781 A JP 3020781A JP S57143858 A JPS57143858 A JP S57143858A
- Authority
- JP
- Japan
- Prior art keywords
- single crystal
- fuse
- layer
- integrated circuit
- semiconductor integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/525—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body with adaptable interconnections
- H01L23/5256—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body with adaptable interconnections comprising fuses, i.e. connections having their state changed from conductive to non-conductive
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B20/00—Read-only memory [ROM] devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Bipolar Transistors (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
- Read Only Memory (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56030207A JPS5846174B2 (ja) | 1981-03-03 | 1981-03-03 | 半導体集積回路 |
US06/657,478 US4517583A (en) | 1981-03-03 | 1984-10-04 | Semiconductor integrated circuit including a fuse element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56030207A JPS5846174B2 (ja) | 1981-03-03 | 1981-03-03 | 半導体集積回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57143858A true JPS57143858A (en) | 1982-09-06 |
JPS5846174B2 JPS5846174B2 (ja) | 1983-10-14 |
Family
ID=12297282
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56030207A Expired JPS5846174B2 (ja) | 1981-03-03 | 1981-03-03 | 半導体集積回路 |
Country Status (2)
Country | Link |
---|---|
US (1) | US4517583A (ja) |
JP (1) | JPS5846174B2 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01160033A (ja) * | 1987-12-17 | 1989-06-22 | Toshiba Corp | 半導体メモリー装置 |
JP2007134373A (ja) * | 2005-11-08 | 2007-05-31 | Nec Electronics Corp | 半導体装置、半導体装置のヒューズ処理方法 |
JP2007521644A (ja) * | 2003-04-29 | 2007-08-02 | フリースケール セミコンダクター インコーポレイテッド | フューズ及びその形成方法 |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5155058A (en) * | 1986-11-07 | 1992-10-13 | Canon Kabushiki Kaisha | Method of making semiconductor memory device |
US4872140A (en) * | 1987-05-19 | 1989-10-03 | Gazelle Microcircuits, Inc. | Laser programmable memory array |
GB2206730A (en) * | 1987-05-19 | 1989-01-11 | Gazelle Microcircuits Inc | Semiconductor circuit device parameter optimization |
EP0510667B1 (en) * | 1991-04-26 | 1996-09-11 | Canon Kabushiki Kaisha | Semiconductor device having an improved insulated gate transistor |
EP0563852A1 (en) * | 1992-04-02 | 1993-10-06 | Siemens Aktiengesellschaft | Zag fuse for reduced blow-current applications |
JP3587537B2 (ja) * | 1992-12-09 | 2004-11-10 | 株式会社半導体エネルギー研究所 | 半導体装置 |
US5389814A (en) * | 1993-02-26 | 1995-02-14 | International Business Machines Corporation | Electrically blowable fuse structure for organic insulators |
KR0157345B1 (ko) * | 1995-06-30 | 1998-12-01 | 김광호 | 반도체 메모리 소자의 전기 휴즈셀 |
US5976917A (en) | 1998-01-29 | 1999-11-02 | Micron Technology, Inc. | Integrated circuitry fuse forming methods, integrated circuitry programming methods, and related integrated circuitry |
TW462123B (en) * | 1998-03-10 | 2001-11-01 | United Microelectronics Corp | Layout design of electrostatic discharge protection device |
WO2001073845A1 (en) * | 2000-03-28 | 2001-10-04 | Koninklijke Philips Electronics N.V. | Integrated circuit with programmable memory element |
US6323535B1 (en) * | 2000-06-16 | 2001-11-27 | Infineon Technologies North America Corp. | Electrical fuses employing reverse biasing to enhance programming |
EP1340262A2 (en) * | 2000-11-27 | 2003-09-03 | Koninklijke Philips Electronics N.V. | Poly fuse rom with mos device based cell structure and the method for read and write therefore |
US6960978B2 (en) * | 2003-07-16 | 2005-11-01 | Hewlett-Packard Development Company, L.P. | Fuse structure |
US7242239B2 (en) * | 2005-06-07 | 2007-07-10 | International Business Machines Corporation | Programming and determining state of electrical fuse using field effect transistor having multiple conduction states |
US7382036B2 (en) * | 2005-07-29 | 2008-06-03 | International Business Machines Corporation | Doped single crystal silicon silicided eFuse |
US7645645B2 (en) * | 2006-03-09 | 2010-01-12 | International Business Machines Corporation | Electrically programmable fuse structures with terminal portions residing at different heights, and methods of fabrication thereof |
US7417300B2 (en) * | 2006-03-09 | 2008-08-26 | International Business Machines Corporation | Electrically programmable fuse structures with narrowed width regions configured to enhance current crowding and methods of fabrication thereof |
US7460003B2 (en) * | 2006-03-09 | 2008-12-02 | International Business Machines Corporation | Electronic fuse with conformal fuse element formed over a freestanding dielectric spacer |
US7784009B2 (en) * | 2006-03-09 | 2010-08-24 | International Business Machines Corporation | Electrically programmable π-shaped fuse structures and design process therefore |
US7288804B2 (en) * | 2006-03-09 | 2007-10-30 | International Business Machines Corporation | Electrically programmable π-shaped fuse structures and methods of fabrication thereof |
JP2009021282A (ja) * | 2007-07-10 | 2009-01-29 | Elpida Memory Inc | 半導体装置 |
JP5149576B2 (ja) * | 2007-09-21 | 2013-02-20 | パナソニック株式会社 | 半導体装置 |
US9331211B2 (en) * | 2009-08-28 | 2016-05-03 | X-Fab Semiconductor Foundries Ag | PN junctions and methods |
GB0915501D0 (en) * | 2009-09-04 | 2009-10-07 | Univ Warwick | Organic photosensitive optoelectronic devices |
TWI494934B (zh) | 2013-10-25 | 2015-08-01 | Nuvoton Technology Corp | 熔絲電路 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA902796A (en) * | 1972-06-13 | J. Boleky Edward | Fabrication of semiconductor devices | |
US3533088A (en) * | 1967-10-31 | 1970-10-06 | Rca Corp | Control circuit for memory |
US3584183A (en) * | 1968-10-03 | 1971-06-08 | North American Rockwell | Laser encoding of diode arrays |
US3699395A (en) * | 1970-01-02 | 1972-10-17 | Rca Corp | Semiconductor devices including fusible elements |
BE794202A (fr) * | 1972-01-19 | 1973-05-16 | Intel Corp | Liaison fusible pour circuit integre sur substrat semi-conducteur pour memoires |
BE795556A (fr) * | 1972-02-17 | 1973-06-18 | Siemens Ag | Circuit integre comportant des couches de semiconducteur disposees sur un substrat isolant |
US4045310A (en) * | 1976-05-03 | 1977-08-30 | Teletype Corporation | Starting product for the production of a read-only memory and a method of producing it and the read-only memory |
CA1135854A (en) * | 1977-09-30 | 1982-11-16 | Michel Moussie | Programmable read only memory cell |
JPS54105988A (en) * | 1978-02-07 | 1979-08-20 | Seiko Epson Corp | Semiconductor memory device |
-
1981
- 1981-03-03 JP JP56030207A patent/JPS5846174B2/ja not_active Expired
-
1984
- 1984-10-04 US US06/657,478 patent/US4517583A/en not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01160033A (ja) * | 1987-12-17 | 1989-06-22 | Toshiba Corp | 半導体メモリー装置 |
JP2007521644A (ja) * | 2003-04-29 | 2007-08-02 | フリースケール セミコンダクター インコーポレイテッド | フューズ及びその形成方法 |
JP2007134373A (ja) * | 2005-11-08 | 2007-05-31 | Nec Electronics Corp | 半導体装置、半導体装置のヒューズ処理方法 |
Also Published As
Publication number | Publication date |
---|---|
US4517583A (en) | 1985-05-14 |
JPS5846174B2 (ja) | 1983-10-14 |
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