JPS5683076A - High tension mos field-effect transistor - Google Patents

High tension mos field-effect transistor

Info

Publication number
JPS5683076A
JPS5683076A JP16069279A JP16069279A JPS5683076A JP S5683076 A JPS5683076 A JP S5683076A JP 16069279 A JP16069279 A JP 16069279A JP 16069279 A JP16069279 A JP 16069279A JP S5683076 A JPS5683076 A JP S5683076A
Authority
JP
Japan
Prior art keywords
region
insulating film
high resistance
resistance layer
effect transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16069279A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6350871B2 (enrdf_load_stackoverflow
Inventor
Kiyotoshi Nakagawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP16069279A priority Critical patent/JPS5683076A/ja
Priority to DE3046749A priority patent/DE3046749C2/de
Publication of JPS5683076A publication Critical patent/JPS5683076A/ja
Priority to US06/655,638 priority patent/US4614959A/en
Publication of JPS6350871B2 publication Critical patent/JPS6350871B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/111Field plates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/601Insulated-gate field-effect transistors [IGFET] having lightly-doped drain or source extensions, e.g. LDD IGFETs or DDD IGFETs 
    • H10D30/603Insulated-gate field-effect transistors [IGFET] having lightly-doped drain or source extensions, e.g. LDD IGFETs or DDD IGFETs  having asymmetry in the channel direction, e.g. lateral high-voltage MISFETs having drain offset region or extended drain IGFETs [EDMOS]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/111Field plates
    • H10D64/112Field plates comprising multiple field plate segments
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/20Electrodes characterised by their shapes, relative sizes or dispositions 
    • H10D64/23Electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. sources, drains, anodes or cathodes
    • H10D64/251Source or drain electrodes for field-effect devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/20Electrodes characterised by their shapes, relative sizes or dispositions 
    • H10D64/23Electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. sources, drains, anodes or cathodes
    • H10D64/251Source or drain electrodes for field-effect devices
    • H10D64/258Source or drain electrodes for field-effect devices characterised by the relative positions of the source or drain electrodes with respect to the gate electrode

Landscapes

  • Electrodes Of Semiconductors (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP16069279A 1979-12-10 1979-12-10 High tension mos field-effect transistor Granted JPS5683076A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP16069279A JPS5683076A (en) 1979-12-10 1979-12-10 High tension mos field-effect transistor
DE3046749A DE3046749C2 (de) 1979-12-10 1980-12-10 MOS-Transistor für hohe Betriebsspannungen
US06/655,638 US4614959A (en) 1979-12-10 1984-09-28 Improved high voltage MOS transistor with field plate layers for preventing reverse field plate effect

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16069279A JPS5683076A (en) 1979-12-10 1979-12-10 High tension mos field-effect transistor

Publications (2)

Publication Number Publication Date
JPS5683076A true JPS5683076A (en) 1981-07-07
JPS6350871B2 JPS6350871B2 (enrdf_load_stackoverflow) 1988-10-12

Family

ID=15720396

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16069279A Granted JPS5683076A (en) 1979-12-10 1979-12-10 High tension mos field-effect transistor

Country Status (1)

Country Link
JP (1) JPS5683076A (enrdf_load_stackoverflow)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04107875A (ja) * 1990-08-27 1992-04-09 Matsushita Electron Corp 半導体装置とそれを用いたハイサイドスイッチング装置
JPH0645530A (ja) * 1984-01-23 1994-02-18 Internatl Rectifier Corp 双方向導通絶縁ゲート電界効果トランジスタ
US6172400B1 (en) * 1998-04-27 2001-01-09 Spectrian Corporation MOS transistor with shield coplanar with gate electrode
US6989566B2 (en) 2001-06-04 2006-01-24 Matsushita Electric Industrial Co., Ltd. High-voltage semiconductor device including a floating block
JP2010157760A (ja) * 2010-03-01 2010-07-15 Mitsubishi Electric Corp 半導体装置
JP2010157582A (ja) * 2008-12-26 2010-07-15 Rohm Co Ltd 半導体装置
JP2011040773A (ja) * 2010-10-04 2011-02-24 Mitsubishi Electric Corp 半導体装置
JP2013093482A (ja) * 2011-10-27 2013-05-16 Renesas Electronics Corp 半導体装置および半導体装置の製造方法
US10199483B2 (en) 2016-05-26 2019-02-05 Shindengen Electric Manufacturing Co., Ltd. Semiconductor device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53980A (en) * 1977-07-13 1978-01-07 Hitachi Ltd Field-effect transistor of high dielectric strength

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53980A (en) * 1977-07-13 1978-01-07 Hitachi Ltd Field-effect transistor of high dielectric strength

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0645530A (ja) * 1984-01-23 1994-02-18 Internatl Rectifier Corp 双方向導通絶縁ゲート電界効果トランジスタ
JPH04107875A (ja) * 1990-08-27 1992-04-09 Matsushita Electron Corp 半導体装置とそれを用いたハイサイドスイッチング装置
US6172400B1 (en) * 1998-04-27 2001-01-09 Spectrian Corporation MOS transistor with shield coplanar with gate electrode
US6989566B2 (en) 2001-06-04 2006-01-24 Matsushita Electric Industrial Co., Ltd. High-voltage semiconductor device including a floating block
JP2010157582A (ja) * 2008-12-26 2010-07-15 Rohm Co Ltd 半導体装置
JP2010157760A (ja) * 2010-03-01 2010-07-15 Mitsubishi Electric Corp 半導体装置
JP2011040773A (ja) * 2010-10-04 2011-02-24 Mitsubishi Electric Corp 半導体装置
JP2013093482A (ja) * 2011-10-27 2013-05-16 Renesas Electronics Corp 半導体装置および半導体装置の製造方法
US10199483B2 (en) 2016-05-26 2019-02-05 Shindengen Electric Manufacturing Co., Ltd. Semiconductor device

Also Published As

Publication number Publication date
JPS6350871B2 (enrdf_load_stackoverflow) 1988-10-12

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