JPS56104461A - Semiconductor memory device - Google Patents
Semiconductor memory deviceInfo
- Publication number
- JPS56104461A JPS56104461A JP733380A JP733380A JPS56104461A JP S56104461 A JPS56104461 A JP S56104461A JP 733380 A JP733380 A JP 733380A JP 733380 A JP733380 A JP 733380A JP S56104461 A JPS56104461 A JP S56104461A
- Authority
- JP
- Japan
- Prior art keywords
- capacitor
- type
- electrode
- region
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
Landscapes
- Semiconductor Memories (AREA)
- Element Separation (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE:To enable the integration of the semiconductor memory device by using a part of field shielding layer formed on a cell isolating region as one electrode of a capacitor and forming the device by a self-alignment system. CONSTITUTION:A polycrystalline silicon layer is formed on a P type semiconductor substrate 10 as a shielding layer 11 and a capacitor electrode 13. A bit line 16 for connecting an N<+> type drain region 15 is formed in parallel with a P<+> type cell isolating region 12 in the semiconductor substrate 10, and a word line 17 is connected to a gate electrode 18 perpendicularly to the bit line 16. An N-channel MOSFET is formed of the gate electrode 18, the source region 14 and the drain region 15, and a capacitor is formed of the capacitor electrode 13, the source region 14 and the oxide film interposed therebetween. A P<-> type layer 19 operates to suppress the expansion of the depletion layer so as to increase the junction capacitor. The integration of the device can be increased by forming the structure of a self-alignment system.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55007333A JPS6023504B2 (en) | 1980-01-24 | 1980-01-24 | semiconductor memory device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55007333A JPS6023504B2 (en) | 1980-01-24 | 1980-01-24 | semiconductor memory device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56104461A true JPS56104461A (en) | 1981-08-20 |
JPS6023504B2 JPS6023504B2 (en) | 1985-06-07 |
Family
ID=11663020
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55007333A Expired JPS6023504B2 (en) | 1980-01-24 | 1980-01-24 | semiconductor memory device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6023504B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6248041A (en) * | 1985-08-28 | 1987-03-02 | Nec Corp | Semiconductor integrated circuit device |
JPH03203352A (en) * | 1989-12-29 | 1991-09-05 | Nec Corp | Semiconductor device |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5359384A (en) * | 1976-09-13 | 1978-05-29 | Texas Instruments Inc | Nnchannel mos silicon gate ram cell |
-
1980
- 1980-01-24 JP JP55007333A patent/JPS6023504B2/en not_active Expired
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5359384A (en) * | 1976-09-13 | 1978-05-29 | Texas Instruments Inc | Nnchannel mos silicon gate ram cell |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6248041A (en) * | 1985-08-28 | 1987-03-02 | Nec Corp | Semiconductor integrated circuit device |
JPH03203352A (en) * | 1989-12-29 | 1991-09-05 | Nec Corp | Semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
JPS6023504B2 (en) | 1985-06-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5279679A (en) | Semiconductor memory device | |
JPS55156358A (en) | Semiconductor memory device | |
JPS5718356A (en) | Semiconductor memory storage | |
JPS55151363A (en) | Mos semiconductor device and fabricating method of the same | |
JPS56162860A (en) | Semiconductor device | |
JPS56107571A (en) | Semiconductor memory storage device | |
GB1519995A (en) | Semiconductor devices | |
JPS56104461A (en) | Semiconductor memory device | |
JPS5521102A (en) | Semiconductor memory cell | |
JPS53112687A (en) | Semiconductor device | |
JPS5448179A (en) | Mis-type semiconductor integrated circuit device | |
JPS57118664A (en) | Semiconductor device | |
JPS57192070A (en) | Semiconductor memory unit | |
JPS57121271A (en) | Field effect transistor | |
JPS56158471A (en) | Manufacture of semiconductor storage device | |
JPS57210667A (en) | Semiconductor memory device | |
JPS5660052A (en) | Semiconductor memory device | |
JPS57162371A (en) | Mos semiconductor memory device | |
JPS5754375A (en) | Mis semiconductor memeory device | |
JPS6428950A (en) | Semiconductor storage device and manufacture thereof | |
JPS54138381A (en) | Semiconductor memory device | |
JPS5779660A (en) | Semiconductor memory device | |
JPS57164574A (en) | Semiconductor memory device | |
JPS57195386A (en) | Dynamic type semiconductor storage device | |
JPS5346287A (en) | Production of semiconductor integrated circuit |