JPS55142254A - Inspecting method for pattern of printed wiring board - Google Patents

Inspecting method for pattern of printed wiring board

Info

Publication number
JPS55142254A
JPS55142254A JP5030679A JP5030679A JPS55142254A JP S55142254 A JPS55142254 A JP S55142254A JP 5030679 A JP5030679 A JP 5030679A JP 5030679 A JP5030679 A JP 5030679A JP S55142254 A JPS55142254 A JP S55142254A
Authority
JP
Japan
Prior art keywords
light
reflected
ray
wiring board
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5030679A
Other languages
English (en)
Other versions
JPS6229737B2 (ja
Inventor
Koichi Tsukazaki
Yasuhiko Hara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP5030679A priority Critical patent/JPS55142254A/ja
Priority to US06/074,473 priority patent/US4277175A/en
Priority to GB7932215A priority patent/GB2047879B/en
Priority to DE19792937929 priority patent/DE2937929A1/de
Priority to FR7923447A priority patent/FR2455423A1/fr
Publication of JPS55142254A publication Critical patent/JPS55142254A/ja
Publication of JPS6229737B2 publication Critical patent/JPS6229737B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
JP5030679A 1979-04-25 1979-04-25 Inspecting method for pattern of printed wiring board Granted JPS55142254A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP5030679A JPS55142254A (en) 1979-04-25 1979-04-25 Inspecting method for pattern of printed wiring board
US06/074,473 US4277175A (en) 1979-04-25 1979-09-11 Method and apparatus for inspecting printed wiring boards
GB7932215A GB2047879B (en) 1979-04-25 1979-09-17 Photoelectric pcb inspection
DE19792937929 DE2937929A1 (de) 1979-04-25 1979-09-19 Verfahren und vorrichtung zum pruefen von leiterplatten fuer gedruckte schaltungen
FR7923447A FR2455423A1 (fr) 1979-04-25 1979-09-20 Appareil pour verifier les plaques de circuit imprime

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5030679A JPS55142254A (en) 1979-04-25 1979-04-25 Inspecting method for pattern of printed wiring board

Publications (2)

Publication Number Publication Date
JPS55142254A true JPS55142254A (en) 1980-11-06
JPS6229737B2 JPS6229737B2 (ja) 1987-06-27

Family

ID=12855204

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5030679A Granted JPS55142254A (en) 1979-04-25 1979-04-25 Inspecting method for pattern of printed wiring board

Country Status (5)

Country Link
US (1) US4277175A (ja)
JP (1) JPS55142254A (ja)
DE (1) DE2937929A1 (ja)
FR (1) FR2455423A1 (ja)
GB (1) GB2047879B (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5788796A (en) * 1980-11-21 1982-06-02 Hitachi Ltd Method of inspecting pattern of printed circuit board
US4405233A (en) * 1980-06-05 1983-09-20 Bell Telephone Laboratories, Incorporated Photo-electric apparatus for testing electrical connector contacts
JPS59150328A (ja) * 1983-01-28 1984-08-28 Fujitsu Ltd スル−ホ−ル検査装置
JP2016050869A (ja) * 2014-09-01 2016-04-11 大日本印刷株式会社 検査方法及び検査装置

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6017044B2 (ja) * 1979-07-23 1985-04-30 株式会社日立製作所 印刷配線板のパタ−ン検査装置
US4343553A (en) * 1979-09-03 1982-08-10 Hitachi, Ltd. Shape testing apparatus
EP0054596B1 (fr) * 1980-12-18 1985-05-29 International Business Machines Corporation Procédé d'inspection et de tri automatique d'objets présentant des configurations avec des tolérances dimensionnelles et des critères de rejet variables selon l'emplacement, équipement et circuits de mise en oeuvre
DE3274015D1 (en) * 1981-07-14 1986-12-04 Hitachi Ltd Pattern detection system
JPS5867093A (ja) * 1981-10-19 1983-04-21 株式会社東芝 印刷回路基板検査方法及びその装置
US4538909A (en) * 1983-05-24 1985-09-03 Automation Engineering, Inc. Circuit board inspection apparatus and method
DE3422395A1 (de) * 1983-06-16 1985-01-17 Hitachi, Ltd., Tokio/Tokyo Verfahren und vorrichtung zum ermitteln von verdrahtungsmustern
US4666303A (en) * 1983-07-11 1987-05-19 Diffracto Ltd. Electro-optical gap and flushness sensors
JPH0617777B2 (ja) * 1984-06-02 1994-03-09 大日本スクリーン製造株式会社 プリント配線板の撮像方法
DE3587582D1 (de) * 1985-03-14 1993-10-21 Beltronics Inc Gerät und Verfahren zum selbsttätigen Inspizieren von Objekten und zum Identifizieren oder Erkennen bekannter und unbekannter Teile davon, einschliesslich Fehler und dergleichen.
US4697142A (en) * 1985-04-01 1987-09-29 Ibm Corporation Printed circuit conductor test system
KR900007548B1 (ko) * 1985-10-04 1990-10-15 다이닛뽕스쿠링세이소오 가부시키가이샤 패턴 마스킹 방법 및 그 장치
US4949390A (en) * 1987-04-16 1990-08-14 Applied Vision Systems, Inc. Interconnect verification using serial neighborhood processors
DE4014149A1 (de) * 1990-05-02 1991-11-07 Grundig Emv Verfahren und vorrichtung zum pruefen von leiterplatten
JP2500961B2 (ja) * 1990-11-27 1996-05-29 大日本スクリーン製造株式会社 プリント基板の座残り検査方法
US6568073B1 (en) * 1991-11-29 2003-05-27 Hitachi Chemical Company, Ltd. Process for the fabrication of wiring board for electrical tests
US6133534A (en) * 1991-11-29 2000-10-17 Hitachi Chemical Company, Ltd. Wiring board for electrical tests with bumps having polymeric coating
JP2795044B2 (ja) * 1992-03-26 1998-09-10 住友電装株式会社 圧着端子画像処理検査における照明方法及び画像処理方法
JP2870379B2 (ja) * 1993-10-18 1999-03-17 住友電装株式会社 連結素子検査方法およびその装置
JP3350477B2 (ja) * 1999-04-02 2002-11-25 セイコーインスツルメンツ株式会社 ウエハ検査装置
AU2003267837A1 (en) * 2002-10-01 2004-04-23 Mirtec Co., Ltd. Vision inspection apparatus using a full reflection mirror
DE10337350B3 (de) * 2003-08-14 2005-11-24 Aleksej Limonow Verfahren und Einrichtung zur Entdeckung und Lokalisierung eines Defektes in einer logischen elektronischen Leiterplatte
USD967325S1 (en) * 2019-05-27 2022-10-18 Aimpoint Ab Backup sight
US11112351B2 (en) 2019-09-16 2021-09-07 International Business Machines Corporation Partial submersion testing for plating defects
US11162889B2 (en) 2019-09-16 2021-11-02 International Business Machines Corporation Non-destructive testing for plating defects

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5223365A (en) * 1975-08-13 1977-02-22 Cit Alcatel Method of and apparatus for automatically inspecting pattern of print circuit board
JPS5416668A (en) * 1977-07-08 1979-02-07 Hitachi Ltd Method of detecting excessivee or lackingg holes in print wire board

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5223365A (en) * 1975-08-13 1977-02-22 Cit Alcatel Method of and apparatus for automatically inspecting pattern of print circuit board
JPS5416668A (en) * 1977-07-08 1979-02-07 Hitachi Ltd Method of detecting excessivee or lackingg holes in print wire board

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4405233A (en) * 1980-06-05 1983-09-20 Bell Telephone Laboratories, Incorporated Photo-electric apparatus for testing electrical connector contacts
JPS5788796A (en) * 1980-11-21 1982-06-02 Hitachi Ltd Method of inspecting pattern of printed circuit board
JPS59150328A (ja) * 1983-01-28 1984-08-28 Fujitsu Ltd スル−ホ−ル検査装置
JPH0340333B2 (ja) * 1983-01-28 1991-06-18
JP2016050869A (ja) * 2014-09-01 2016-04-11 大日本印刷株式会社 検査方法及び検査装置

Also Published As

Publication number Publication date
DE2937929C2 (ja) 1987-03-12
FR2455423A1 (fr) 1980-11-21
US4277175A (en) 1981-07-07
DE2937929A1 (de) 1980-11-06
FR2455423B1 (ja) 1984-06-15
JPS6229737B2 (ja) 1987-06-27
GB2047879A (en) 1980-12-03
GB2047879B (en) 1983-08-03

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