JPS57189046A - Inspecting device for surface defect - Google Patents
Inspecting device for surface defectInfo
- Publication number
- JPS57189046A JPS57189046A JP7330281A JP7330281A JPS57189046A JP S57189046 A JPS57189046 A JP S57189046A JP 7330281 A JP7330281 A JP 7330281A JP 7330281 A JP7330281 A JP 7330281A JP S57189046 A JPS57189046 A JP S57189046A
- Authority
- JP
- Japan
- Prior art keywords
- patterns
- light
- reflected
- photodetector
- inspected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:To detect the reflected light from the entire circumference of the surface of a material to be inspected only with one unit of photodetector by synchronizing the scanning of the light of divided irradiation systems respectively. CONSTITUTION:Two light scanning patterns are generated by synchronized laser beams 2a, 2b, and the two light scanning patterns are synthesized by using a reflecting mirror 11A and a half mirror 11B. This synthesized pattern is stopped-down onto the surface of a material 3 to be inspected, by which the inspecting region is divided like incident light irradiation patterns 4a, 4b. The reflected rays from the patterns 4a, 4b form reflected light projection patterns 5a, 5b on a photodetector 6, by which the superposed parts of the reflected rays are produced on the detection surface. There are binary-coded by the slice level setting circuit of a signal processing circuit 15.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7330281A JPS57189046A (en) | 1981-05-15 | 1981-05-15 | Inspecting device for surface defect |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7330281A JPS57189046A (en) | 1981-05-15 | 1981-05-15 | Inspecting device for surface defect |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57189046A true JPS57189046A (en) | 1982-11-20 |
JPS6367849B2 JPS6367849B2 (en) | 1988-12-27 |
Family
ID=13514224
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7330281A Granted JPS57189046A (en) | 1981-05-15 | 1981-05-15 | Inspecting device for surface defect |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57189046A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59155540U (en) * | 1983-04-05 | 1984-10-18 | 三菱電機株式会社 | Defect inspection equipment |
JPS59155541U (en) * | 1983-04-05 | 1984-10-18 | 三菱電機株式会社 | Defect inspection equipment |
JP2008506939A (en) * | 2004-07-16 | 2008-03-06 | ファルドー・ジャン−フランソワ | Surface analysis of elongated objects |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5327087A (en) * | 1976-08-26 | 1978-03-13 | Toshiba Corp | Flaw detector |
JPS559170A (en) * | 1978-07-07 | 1980-01-23 | Fujikura Ltd | Surface flaw detector |
-
1981
- 1981-05-15 JP JP7330281A patent/JPS57189046A/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5327087A (en) * | 1976-08-26 | 1978-03-13 | Toshiba Corp | Flaw detector |
JPS559170A (en) * | 1978-07-07 | 1980-01-23 | Fujikura Ltd | Surface flaw detector |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59155540U (en) * | 1983-04-05 | 1984-10-18 | 三菱電機株式会社 | Defect inspection equipment |
JPS59155541U (en) * | 1983-04-05 | 1984-10-18 | 三菱電機株式会社 | Defect inspection equipment |
JP2008506939A (en) * | 2004-07-16 | 2008-03-06 | ファルドー・ジャン−フランソワ | Surface analysis of elongated objects |
Also Published As
Publication number | Publication date |
---|---|
JPS6367849B2 (en) | 1988-12-27 |
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