JPS649306A - Detector for light transmitting fine pattern - Google Patents
Detector for light transmitting fine patternInfo
- Publication number
- JPS649306A JPS649306A JP16229087A JP16229087A JPS649306A JP S649306 A JPS649306 A JP S649306A JP 16229087 A JP16229087 A JP 16229087A JP 16229087 A JP16229087 A JP 16229087A JP S649306 A JPS649306 A JP S649306A
- Authority
- JP
- Japan
- Prior art keywords
- detected
- image
- light transmitting
- filter
- polarization plane
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Abstract
PURPOSE:To detect 3-D shape in a short time, by a method wherein a polarization filter with a polarization plane thereof made rotatable is arranged and when the polarization plane is in a first direction, an image of an object to be detected is compared with that separately detected when it is in a second direction different therefrom. CONSTITUTION:A polarization filter 2 with the polarization plane made rotatable (up to 90 deg.) is arranged between a laser beam source 1 and a lighting objective lens 4. Then, an image I1 (Fig. b) of an object 9 to be detected as detected when the polarization plane of the filter 2 is in the direction as indicated by the Fig. (a) and an image I2 (Fig. d) of the object 9 being detected as detected when that of the filter 2 is in the direction as indicated by Fig. (c) are obtained separately. Then, the images I1 and I2 thus detected are compared and processed by a detection means 6 to obtain an image I3 (Fig. e). That is, a line light R2 reflected on the surface of a light transmitting pattern 92 of the object 9 is reflected on the bottom surface of the pattern 92 while being discriminated from a line light R1 refracted on the surface of the pattern 92 thereby detecting a fine light transmitting pattern.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16229087A JPS649306A (en) | 1987-07-01 | 1987-07-01 | Detector for light transmitting fine pattern |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16229087A JPS649306A (en) | 1987-07-01 | 1987-07-01 | Detector for light transmitting fine pattern |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS649306A true JPS649306A (en) | 1989-01-12 |
Family
ID=15751674
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16229087A Pending JPS649306A (en) | 1987-07-01 | 1987-07-01 | Detector for light transmitting fine pattern |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS649306A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006105951A (en) * | 2004-10-06 | 2006-04-20 | Nikon Corp | Defect inspection method |
JP2009168507A (en) * | 2008-01-11 | 2009-07-30 | Nsk Ltd | Method and apparatus for detecting edge position of transparent substrate |
WO2015014797A1 (en) * | 2013-08-02 | 2015-02-05 | Koninklijke Philips N.V. | Laser device with adjustable polarization |
JP2020173141A (en) * | 2019-04-09 | 2020-10-22 | 株式会社ミツトヨ | Surface shape measuring system and surface shape measuring method using surface shape measuring instrument |
-
1987
- 1987-07-01 JP JP16229087A patent/JPS649306A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006105951A (en) * | 2004-10-06 | 2006-04-20 | Nikon Corp | Defect inspection method |
JP2009168507A (en) * | 2008-01-11 | 2009-07-30 | Nsk Ltd | Method and apparatus for detecting edge position of transparent substrate |
WO2015014797A1 (en) * | 2013-08-02 | 2015-02-05 | Koninklijke Philips N.V. | Laser device with adjustable polarization |
US10135225B2 (en) | 2013-08-02 | 2018-11-20 | Koninklijke Philips N.V. | Laser device with adjustable polarization |
JP2020173141A (en) * | 2019-04-09 | 2020-10-22 | 株式会社ミツトヨ | Surface shape measuring system and surface shape measuring method using surface shape measuring instrument |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ES8500445A1 (en) | Optical detection of radial reflective defects | |
JPS55142254A (en) | Inspecting method for pattern of printed wiring board | |
DE3270640D1 (en) | Off-axis light beam defect detector | |
JPS54128682A (en) | Automatic detector for foreign matters | |
JPS649306A (en) | Detector for light transmitting fine pattern | |
JPS55149830A (en) | Inspection apparatus for appearance of spherical body | |
JPS55117946A (en) | Flaw detection method of hollow shaft inside surface | |
JPS61176839A (en) | Inspection of defect of transparent or semi-transparent plate-shaped body | |
JPS6439543A (en) | Defective inspection device | |
JPS5761905A (en) | Measuring device of surface coarseness | |
JPS5779454A (en) | Detection of pattern used for analysis based on amynological agglutination reaction | |
ES2014888A6 (en) | Apparatus and method for inspecting glass sheets. | |
JPS57168384A (en) | Detecting method for shape of object | |
JPS57118105A (en) | Detector | |
JPS57189046A (en) | Inspecting device for surface defect | |
JPS54133395A (en) | Detecting method and apparatus for carck on substrate | |
JPS5756704A (en) | Detector for surface flaw of bloom | |
JPS57135343A (en) | Surface defect inspecting device | |
JPS57166547A (en) | Apparatus for reflective spectrophotometry | |
JPS5728239A (en) | Inspection of defect on cylinder surface | |
JPH05188004A (en) | Foreign matter detecting device | |
JPS56126745A (en) | Automatic inspecting device for surface of plate material | |
JPS56125605A (en) | Method and apparatus for detection of shape of striplike body | |
JPS5595851A (en) | Surface defect test device | |
JPS6428512A (en) | Surface defect detecting device |