JPS649306A - Detector for light transmitting fine pattern - Google Patents

Detector for light transmitting fine pattern

Info

Publication number
JPS649306A
JPS649306A JP16229087A JP16229087A JPS649306A JP S649306 A JPS649306 A JP S649306A JP 16229087 A JP16229087 A JP 16229087A JP 16229087 A JP16229087 A JP 16229087A JP S649306 A JPS649306 A JP S649306A
Authority
JP
Japan
Prior art keywords
detected
image
light transmitting
filter
polarization plane
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16229087A
Other languages
Japanese (ja)
Inventor
Satoshi Iwata
Moritoshi Ando
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP16229087A priority Critical patent/JPS649306A/en
Publication of JPS649306A publication Critical patent/JPS649306A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To detect 3-D shape in a short time, by a method wherein a polarization filter with a polarization plane thereof made rotatable is arranged and when the polarization plane is in a first direction, an image of an object to be detected is compared with that separately detected when it is in a second direction different therefrom. CONSTITUTION:A polarization filter 2 with the polarization plane made rotatable (up to 90 deg.) is arranged between a laser beam source 1 and a lighting objective lens 4. Then, an image I1 (Fig. b) of an object 9 to be detected as detected when the polarization plane of the filter 2 is in the direction as indicated by the Fig. (a) and an image I2 (Fig. d) of the object 9 being detected as detected when that of the filter 2 is in the direction as indicated by Fig. (c) are obtained separately. Then, the images I1 and I2 thus detected are compared and processed by a detection means 6 to obtain an image I3 (Fig. e). That is, a line light R2 reflected on the surface of a light transmitting pattern 92 of the object 9 is reflected on the bottom surface of the pattern 92 while being discriminated from a line light R1 refracted on the surface of the pattern 92 thereby detecting a fine light transmitting pattern.
JP16229087A 1987-07-01 1987-07-01 Detector for light transmitting fine pattern Pending JPS649306A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16229087A JPS649306A (en) 1987-07-01 1987-07-01 Detector for light transmitting fine pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16229087A JPS649306A (en) 1987-07-01 1987-07-01 Detector for light transmitting fine pattern

Publications (1)

Publication Number Publication Date
JPS649306A true JPS649306A (en) 1989-01-12

Family

ID=15751674

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16229087A Pending JPS649306A (en) 1987-07-01 1987-07-01 Detector for light transmitting fine pattern

Country Status (1)

Country Link
JP (1) JPS649306A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006105951A (en) * 2004-10-06 2006-04-20 Nikon Corp Defect inspection method
JP2009168507A (en) * 2008-01-11 2009-07-30 Nsk Ltd Method and apparatus for detecting edge position of transparent substrate
WO2015014797A1 (en) * 2013-08-02 2015-02-05 Koninklijke Philips N.V. Laser device with adjustable polarization
JP2020173141A (en) * 2019-04-09 2020-10-22 株式会社ミツトヨ Surface shape measuring system and surface shape measuring method using surface shape measuring instrument

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006105951A (en) * 2004-10-06 2006-04-20 Nikon Corp Defect inspection method
JP2009168507A (en) * 2008-01-11 2009-07-30 Nsk Ltd Method and apparatus for detecting edge position of transparent substrate
WO2015014797A1 (en) * 2013-08-02 2015-02-05 Koninklijke Philips N.V. Laser device with adjustable polarization
US10135225B2 (en) 2013-08-02 2018-11-20 Koninklijke Philips N.V. Laser device with adjustable polarization
JP2020173141A (en) * 2019-04-09 2020-10-22 株式会社ミツトヨ Surface shape measuring system and surface shape measuring method using surface shape measuring instrument

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