JPS5327087A - Flaw detector - Google Patents

Flaw detector

Info

Publication number
JPS5327087A
JPS5327087A JP10108476A JP10108476A JPS5327087A JP S5327087 A JPS5327087 A JP S5327087A JP 10108476 A JP10108476 A JP 10108476A JP 10108476 A JP10108476 A JP 10108476A JP S5327087 A JPS5327087 A JP S5327087A
Authority
JP
Japan
Prior art keywords
flaw detector
photoelectric conversion
circular arc
conversion element
arc surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10108476A
Other languages
Japanese (ja)
Inventor
Masayoshi Shimada
Yoshihisa Morioka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP10108476A priority Critical patent/JPS5327087A/en
Publication of JPS5327087A publication Critical patent/JPS5327087A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To make small necessary number of photoelectric conversion element, and to make possible detection for flaw existing on circular arc surface, by employing light source, light scanning mechanism, and horn type conical reflector.
JP10108476A 1976-08-26 1976-08-26 Flaw detector Pending JPS5327087A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10108476A JPS5327087A (en) 1976-08-26 1976-08-26 Flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10108476A JPS5327087A (en) 1976-08-26 1976-08-26 Flaw detector

Publications (1)

Publication Number Publication Date
JPS5327087A true JPS5327087A (en) 1978-03-13

Family

ID=14291221

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10108476A Pending JPS5327087A (en) 1976-08-26 1976-08-26 Flaw detector

Country Status (1)

Country Link
JP (1) JPS5327087A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57189046A (en) * 1981-05-15 1982-11-20 Mitsubishi Electric Corp Inspecting device for surface defect
JPS5834346A (en) * 1981-08-26 1983-02-28 Mitsubishi Electric Corp Inspecting device for surface fault

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57189046A (en) * 1981-05-15 1982-11-20 Mitsubishi Electric Corp Inspecting device for surface defect
JPS6367849B2 (en) * 1981-05-15 1988-12-27 Mitsubishi Electric Corp
JPS5834346A (en) * 1981-08-26 1983-02-28 Mitsubishi Electric Corp Inspecting device for surface fault

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