JPS56118647A - Flaw inspecting apparatus - Google Patents
Flaw inspecting apparatusInfo
- Publication number
- JPS56118647A JPS56118647A JP2155480A JP2155480A JPS56118647A JP S56118647 A JPS56118647 A JP S56118647A JP 2155480 A JP2155480 A JP 2155480A JP 2155480 A JP2155480 A JP 2155480A JP S56118647 A JPS56118647 A JP S56118647A
- Authority
- JP
- Japan
- Prior art keywords
- flaw
- small frame
- existence
- inspected
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Closed-Circuit Television Systems (AREA)
Abstract
PURPOSE:To make it possible to automatically discriminate the existence of a flaw and its kind by a method wherein the two-dimensional pattern corresponding to the surface being inspected captured by a photoelectric tube is successively cut out by a small frame, and the continuity and size of the flaw pattern in the small frame is inspected in real time. CONSTITUTION:The laser beam oscillated from a laser tube 1 is affected by a rotary reflecting mirror 2 and a lens 3 so as to converge on the surface of a sample 4 continuously moving in the direction of X, in order to scan the whole surface of the sample 4. The light reflected from the smooth surface of the sample 4 is conversely made incident on the lens 3. When there is a flaw, the reflection of the laser beam becomes a scattered light, exciting the current of a photoelectric tube 7. The binary-coded two-dimensional pattern corresponding to the surface being inspected, captured by the photoelectic tube 7, is successively cut out by a small frame of proper size, and by measuring the distribution of 1 in the small frame, the existence of a flaw as wel as whether it is linear or lone are decided. Thereby, it is possible to automatically discriminate the existence of a flaw and its kind.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2155480A JPS56118647A (en) | 1980-02-25 | 1980-02-25 | Flaw inspecting apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2155480A JPS56118647A (en) | 1980-02-25 | 1980-02-25 | Flaw inspecting apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56118647A true JPS56118647A (en) | 1981-09-17 |
JPS6256974B2 JPS6256974B2 (en) | 1987-11-28 |
Family
ID=12058216
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2155480A Granted JPS56118647A (en) | 1980-02-25 | 1980-02-25 | Flaw inspecting apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56118647A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59196446A (en) * | 1983-04-22 | 1984-11-07 | Toshiba Corp | Defect recognizing device |
EP0611608A1 (en) * | 1993-02-16 | 1994-08-24 | SYSTEM KURANDT GmbH | Method and device for scanning and checking of tracks applied to a substrate |
CN104406517A (en) * | 2014-11-12 | 2015-03-11 | 昆山万像光电有限公司 | Multi-station laser scanning measuring method for flatness |
CN110763690A (en) * | 2019-11-14 | 2020-02-07 | 上海精测半导体技术有限公司 | Surface detection device and method |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54133022A (en) * | 1978-04-07 | 1979-10-16 | Hitachi Ltd | Comparison and inspection system for two dimensional picture |
JPS5594147A (en) * | 1979-01-12 | 1980-07-17 | Kobe Steel Ltd | Method of discriminating surface flaw of high temperature material to be detected |
-
1980
- 1980-02-25 JP JP2155480A patent/JPS56118647A/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54133022A (en) * | 1978-04-07 | 1979-10-16 | Hitachi Ltd | Comparison and inspection system for two dimensional picture |
JPS5594147A (en) * | 1979-01-12 | 1980-07-17 | Kobe Steel Ltd | Method of discriminating surface flaw of high temperature material to be detected |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59196446A (en) * | 1983-04-22 | 1984-11-07 | Toshiba Corp | Defect recognizing device |
EP0611608A1 (en) * | 1993-02-16 | 1994-08-24 | SYSTEM KURANDT GmbH | Method and device for scanning and checking of tracks applied to a substrate |
CN104406517A (en) * | 2014-11-12 | 2015-03-11 | 昆山万像光电有限公司 | Multi-station laser scanning measuring method for flatness |
CN110763690A (en) * | 2019-11-14 | 2020-02-07 | 上海精测半导体技术有限公司 | Surface detection device and method |
Also Published As
Publication number | Publication date |
---|---|
JPS6256974B2 (en) | 1987-11-28 |
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