ES8402931A1 - Aparato para la inspeccion optica de objetos presentes en un campo de observacion. - Google Patents
Aparato para la inspeccion optica de objetos presentes en un campo de observacion.Info
- Publication number
- ES8402931A1 ES8402931A1 ES520558A ES520558A ES8402931A1 ES 8402931 A1 ES8402931 A1 ES 8402931A1 ES 520558 A ES520558 A ES 520558A ES 520558 A ES520558 A ES 520558A ES 8402931 A1 ES8402931 A1 ES 8402931A1
- Authority
- ES
- Spain
- Prior art keywords
- light
- light beam
- array
- inspection system
- inspected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21C—NUCLEAR REACTORS
- G21C17/00—Monitoring; Testing ; Maintaining
- G21C17/06—Devices or arrangements for monitoring or testing fuel or fuel elements outside the reactor core, e.g. for burn-up, for contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E30/00—Energy generation of nuclear origin
- Y02E30/30—Nuclear fission reactors
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- High Energy & Nuclear Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Plasma & Fusion (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
APARATO PARA LA INSPECCION OPTICA DE OBJETOS PRESENTES EN UN CAMPO DE OBSERVACION.EL APARATO INSPECCIONA LAS PROPIEDADES SUPERFICIALES DE CADA OBJETO (53) DETECTANDO LA LUZ REFLEJADA POR ESTE, A TRAVES DE UN SISTEMA DE LENTES QUE CONCENTRA LA LUZ REFLEJADA SOBRE UN CONJUNTO DE ELEMENTOS FOTOSENSIBLES. LAS SEÑALES DE SALIDA PROPORCIONADAS POR EL CONJUNTO PUEDEN UTILIZARSE PARA OBTENER UNA MEDICION INDICATIVA DE LA CONFORMIDAD DE LA SUPERFICIE INSPECCIONADA CON CRITERIOS PREDETERMINADOS. EL SISTEMA PUEDE DETERMINAR OTRAS PROPIEDADES DEL OBJETO, TALES COMO SUS DIMENSIONES, ILUMINANDOLECON UN SEGUNDO HAZ LUMINOSO DERIVADO DE UNA SEGUNDA SUPERFICIE LUMINOSA.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/361,992 US4532723A (en) | 1982-03-25 | 1982-03-25 | Optical inspection system |
Publications (2)
Publication Number | Publication Date |
---|---|
ES520558A0 ES520558A0 (es) | 1984-03-01 |
ES8402931A1 true ES8402931A1 (es) | 1984-03-01 |
Family
ID=23424254
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES520558A Expired ES8402931A1 (es) | 1982-03-25 | 1983-03-14 | Aparato para la inspeccion optica de objetos presentes en un campo de observacion. |
Country Status (7)
Country | Link |
---|---|
US (1) | US4532723A (es) |
JP (1) | JPS58169013A (es) |
CA (1) | CA1210472A (es) |
DE (1) | DE3309584A1 (es) |
ES (1) | ES8402931A1 (es) |
IT (1) | IT1160841B (es) |
SE (1) | SE462768B (es) |
Families Citing this family (62)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6049209A (ja) * | 1983-08-27 | 1985-03-18 | O Ii M Syst:Kk | 平ドリルの刃部径測定装置 |
DE3337251A1 (de) * | 1983-10-13 | 1985-04-25 | Gerd Dipl.-Phys. Dr. 8520 Erlangen Häusler | Optisches abtastverfahren zur dreidimensionalen vermessung von objekten |
JPS60165853U (ja) * | 1984-04-11 | 1985-11-02 | 日立電子エンジニアリング株式会社 | 円筒物体表面検査装置における搬送装置 |
US4723659A (en) * | 1985-06-28 | 1988-02-09 | Supernova Systems, Inc. | Apparatus for detecting impurities in translucent bodies |
US4730116A (en) * | 1985-08-06 | 1988-03-08 | Mitsubishi Denki Kabushiki Kaisha | Sheet thickness measuring apparatus by optical scanning |
JPS62255806A (ja) * | 1986-04-29 | 1987-11-07 | Mitsubishi Electric Corp | 膜厚測定方法及び装置 |
DE3641863A1 (de) * | 1986-12-08 | 1988-06-09 | Bosch Gmbh Robert | Oberflaechenpruefvorrichtung |
DE3641862A1 (de) * | 1986-12-08 | 1988-06-09 | Bosch Gmbh Robert | Vorrichtung zur pruefung rotationssymmetrischer werkstuecke |
FR2610407B1 (fr) * | 1987-01-30 | 1989-05-12 | Peugeot | Appareil pour le controle de pieces cylindriques |
AU606679B2 (en) * | 1987-03-09 | 1991-02-14 | Battelle Memorial Institute | Optical inspection system for cylindrical objects |
JPH07111328B2 (ja) * | 1987-12-07 | 1995-11-29 | 日本たばこ産業株式会社 | 円柱状検体の直径測定装置 |
DE3806109A1 (de) * | 1987-12-16 | 1989-07-06 | Klaus Prof Dr Ing Baukhage | Verfahren zur feststellung wenigstens der oberflaechenstruktur von bewegten sphaerischen partikeln |
DE3843300A1 (de) * | 1987-12-23 | 1989-07-13 | Karl Veit Holger Dr Ing | Messvorrichtung zur bestimmung der dicke von folien |
US5089384A (en) * | 1988-11-04 | 1992-02-18 | Amoco Corporation | Method and apparatus for selective cell destruction using amplified immunofluorescence |
US4930872A (en) * | 1988-12-06 | 1990-06-05 | Convery Joseph J | Imaging with combined alignment fixturing, illumination and imaging optics |
JPH034110A (ja) * | 1989-06-01 | 1991-01-10 | Mitsubishi Nuclear Fuel Co Ltd | 棒状体の真直度検査装置 |
DE3920669A1 (de) * | 1989-06-23 | 1991-01-10 | Sick Optik Elektronik Erwin | Optische abtastvorrichtung |
US5254853A (en) * | 1990-02-14 | 1993-10-19 | Stefan Reich | Optical sensing device |
US5043588A (en) * | 1990-06-18 | 1991-08-27 | Westinghouse Electric Corp. | Pellet diameter measurement apparatus and method detecting non-orthogonally to the common axis of the pellets |
US5186887A (en) * | 1990-10-02 | 1993-02-16 | Mitsubishi Nuclear Fuel Co. | Apparatus for inspecting peripheral surfaces of nuclear fuel pellets |
US5147047A (en) * | 1991-01-14 | 1992-09-15 | Westinghouse Electric Corp. | Pellet inspection system |
DE4124278A1 (de) * | 1991-07-23 | 1993-01-28 | Advanced Nuclear Fuels Gmbh | Verfahren und vorrichtung zur inspektion von tabletten |
DE59202930D1 (de) * | 1991-07-23 | 1995-08-24 | Advanced Nuclear Fuels Gmbh | Verfahren und Vorrichtung zur Inspektion von Tabletten. |
US5257325A (en) * | 1991-12-11 | 1993-10-26 | International Business Machines Corporation | Electronic parallel raster dual image registration device |
JPH0575656U (ja) * | 1992-03-17 | 1993-10-15 | 太陽誘電株式会社 | 電子部品の外観検査装置 |
GB9215832D0 (en) * | 1992-07-24 | 1992-09-09 | British Nuclear Fuels Plc | The inspection of cylindrical objects |
CA2102823A1 (en) * | 1992-11-20 | 1994-05-21 | James E. Devries | Method of monitoring and/or dispensing materials onto a substrate |
FR2700007B1 (fr) * | 1992-12-29 | 1995-03-10 | Fabrication Combustibles Ste Fra | Procédé et dispositif optiques de classification automatique de pastilles cylindriques de combustible nucléaire. |
JP3214942B2 (ja) * | 1993-02-25 | 2001-10-02 | 三菱原子燃料株式会社 | ペレット端面検査方法及び装置 |
GB9304966D0 (en) * | 1993-03-11 | 1993-04-28 | British Nucelar Fuels Plc | Optical measuring system |
US5383021A (en) * | 1993-04-19 | 1995-01-17 | Mectron Engineering Company | Optical part inspection system |
GB9309238D0 (en) * | 1993-05-05 | 1993-06-16 | British Nuclear Fuels Plc | Apparatus for detection of surface defects |
DK0644417T3 (da) * | 1993-09-16 | 2000-08-07 | Owens Brockway Glass Container | Inspektion af gennemskinnelige beholdere |
US5666325A (en) * | 1995-07-31 | 1997-09-09 | Nordson Corporation | Method and apparatus for monitoring and controlling the dispensing of materials onto a substrate |
US7006132B2 (en) * | 1998-02-25 | 2006-02-28 | California Institute Of Technology | Aperture coded camera for three dimensional imaging |
US7612870B2 (en) * | 1998-02-25 | 2009-11-03 | California Institute Of Technology | Single-lens aperture-coded camera for three dimensional imaging in small volumes |
US6610953B1 (en) | 1998-03-23 | 2003-08-26 | University Of Arkansas | Item defect detection apparatus and method |
US6271520B1 (en) | 1998-03-23 | 2001-08-07 | University Of Arkansas | Item defect detection apparatus and method |
US6252623B1 (en) | 1998-05-15 | 2001-06-26 | 3Dmetrics, Incorporated | Three dimensional imaging system |
US6285034B1 (en) | 1998-11-04 | 2001-09-04 | James L. Hanna | Inspection system for flanged bolts |
US6313948B1 (en) | 1999-08-02 | 2001-11-06 | James I. Hanna | Optical beam shaper |
US6252661B1 (en) | 1999-08-02 | 2001-06-26 | James L. Hanna | Optical sub-pixel parts inspection system |
US6603542B1 (en) | 2000-06-14 | 2003-08-05 | Qc Optics, Inc. | High sensitivity optical inspection system and method for detecting flaws on a diffractive surface |
US7046353B2 (en) * | 2001-12-04 | 2006-05-16 | Kabushiki Kaisha Topcon | Surface inspection system |
DE10160297B4 (de) * | 2001-12-07 | 2007-06-21 | Robert Bosch Gmbh | Vorrichtung zur Untersuchung der Oberfläche eines rotationssystemmetrischen Körpers |
US20050174567A1 (en) * | 2004-02-09 | 2005-08-11 | Mectron Engineering Company | Crack detection system |
US7593501B2 (en) * | 2005-01-06 | 2009-09-22 | Areva Np Inc. | Segment make-up system and method for manufacturing nuclear fuel rods |
US7154080B1 (en) | 2005-01-13 | 2006-12-26 | Dick Rauth | System and method for detecting the efficacy of machined parts |
US7684054B2 (en) * | 2006-08-25 | 2010-03-23 | Gii Acquisition, Llc | Profile inspection system for threaded and axial components |
BE1017422A3 (nl) * | 2006-12-08 | 2008-09-02 | Visys Nv | Werkwijze en inrichting voor het inspecteren en sorteren van een productstroom. |
US7777900B2 (en) * | 2007-10-23 | 2010-08-17 | Gii Acquisition, Llc | Method and system for optically inspecting parts |
US8237935B2 (en) * | 2007-10-23 | 2012-08-07 | Gii Acquisition, Llc | Method and system for automatically inspecting parts and for automatically generating calibration data for use in inspecting parts |
US7812970B2 (en) * | 2007-10-23 | 2010-10-12 | Gii Acquisition, Llc | Method and system for inspecting parts utilizing triangulation |
US8132802B2 (en) * | 2007-10-23 | 2012-03-13 | Gii Acquisition, Llc | Apparatus for quickly retaining and releasing parts to be optically measured |
US7738121B2 (en) * | 2007-10-23 | 2010-06-15 | Gii Acquisition, Llc | Method and inspection head apparatus for optically measuring geometric dimensions of a part |
US7920278B2 (en) * | 2007-10-23 | 2011-04-05 | Gii Acquisition, Llc | Non-contact method and system for inspecting parts |
US7738088B2 (en) * | 2007-10-23 | 2010-06-15 | Gii Acquisition, Llc | Optical method and system for generating calibration data for use in calibrating a part inspection system |
US7796278B2 (en) * | 2008-09-19 | 2010-09-14 | Gii Acquisition, Llc | Method for precisely measuring position of a part to be inspected at a part inspection station |
US8004694B2 (en) * | 2009-03-27 | 2011-08-23 | Gll Acquistion LLC | System for indirectly measuring a geometric dimension related to an opening in an apertured exterior surface of a part based on direct measurements of the part when fixtured at a measurement station |
US9395309B2 (en) * | 2014-10-15 | 2016-07-19 | Exnodes Inc. | Multiple angle computational wafer inspection |
CA3049647A1 (en) * | 2017-01-10 | 2018-07-19 | Sunspring America, Inc. | Optical method for identifying defects on tube surfaces |
TWM594685U (zh) * | 2019-08-22 | 2020-05-01 | 盛雄科技股份有限公司 | 多自由度球體物件檢測裝置(二) |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE378302B (es) * | 1972-07-03 | 1975-08-25 | Aga Ab | |
US3826576A (en) * | 1972-12-20 | 1974-07-30 | Goodyear Aerospace Corp | Laser measuring or monitoring system |
JPS49115569A (es) * | 1973-02-22 | 1974-11-05 | ||
SE376966B (es) * | 1973-10-12 | 1975-06-16 | Aga Ab | |
JPS524266A (en) * | 1975-06-27 | 1977-01-13 | Nippon Steel Corp | Unit to measure the bend of long-size object with circular section |
US4037103A (en) * | 1975-08-07 | 1977-07-19 | Exxon Research And Engineering Company | Diameter measuring system for cylindrical objects |
NL7602468A (nl) * | 1976-03-09 | 1977-09-13 | Skf Ind Trading & Dev | Inrichting voor het controleren van de fabricage- kwaliteit van voorwerpen. |
US4074938A (en) * | 1976-09-27 | 1978-02-21 | Systems Research Laboratories, Inc. | Optical dimension measuring device employing an elongated focused beam |
JPS6055762B2 (ja) * | 1977-04-08 | 1985-12-06 | 株式会社日立製作所 | 円筒物体外観検査装置 |
US4197888A (en) * | 1978-02-21 | 1980-04-15 | The Coe Manufacturing Company | Log centering apparatus and method using transmitted light and reference edge log scanner |
US4253768A (en) * | 1978-08-09 | 1981-03-03 | Westinghouse Electric Corp. | Processing system for detection and the classification of flaws on metallic surfaces |
JPS5537919A (en) * | 1978-09-11 | 1980-03-17 | Ngk Insulators Ltd | Automatic outer configuration measurement device |
FR2461944A1 (fr) * | 1979-07-20 | 1981-02-06 | Hitachi Ltd | Procede et appareil pour examiner l'aspect exterieur d'un objet cylindrique plein |
JPS56160645A (en) * | 1980-05-16 | 1981-12-10 | Hitachi Ltd | Detecting method for surface defect of body |
US4349112A (en) * | 1980-03-31 | 1982-09-14 | The United States Of America As Represented By The United States Department Of Energy | Pellet inspection apparatus |
-
1982
- 1982-03-25 US US06/361,992 patent/US4532723A/en not_active Expired - Lifetime
-
1983
- 1983-03-11 CA CA000423367A patent/CA1210472A/en not_active Expired
- 1983-03-14 ES ES520558A patent/ES8402931A1/es not_active Expired
- 1983-03-14 JP JP58040846A patent/JPS58169013A/ja active Granted
- 1983-03-17 DE DE19833309584 patent/DE3309584A1/de active Granted
- 1983-03-22 SE SE8301574A patent/SE462768B/sv not_active IP Right Cessation
- 1983-03-25 IT IT20297/83A patent/IT1160841B/it active
Also Published As
Publication number | Publication date |
---|---|
US4532723A (en) | 1985-08-06 |
SE462768B (sv) | 1990-08-27 |
DE3309584A1 (de) | 1983-10-06 |
ES520558A0 (es) | 1984-03-01 |
IT1160841B (it) | 1987-03-11 |
JPS58169013A (ja) | 1983-10-05 |
SE8301574D0 (sv) | 1983-03-22 |
IT8320297A0 (it) | 1983-03-25 |
DE3309584C2 (es) | 1988-11-10 |
CA1210472A (en) | 1986-08-26 |
SE8301574L (sv) | 1983-09-26 |
JPH038483B2 (es) | 1991-02-06 |
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