JPS57113342A - Eccentricity measurement - Google Patents

Eccentricity measurement

Info

Publication number
JPS57113342A
JPS57113342A JP18836180A JP18836180A JPS57113342A JP S57113342 A JPS57113342 A JP S57113342A JP 18836180 A JP18836180 A JP 18836180A JP 18836180 A JP18836180 A JP 18836180A JP S57113342 A JPS57113342 A JP S57113342A
Authority
JP
Japan
Prior art keywords
lenses
image pickup
pickup element
reflected
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18836180A
Other languages
Japanese (ja)
Inventor
Toshiyuki Iguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP18836180A priority Critical patent/JPS57113342A/en
Publication of JPS57113342A publication Critical patent/JPS57113342A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical means
    • G01B11/26Measuring arrangements characterised by the use of optical means for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27Measuring arrangements characterised by the use of optical means for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272Measuring arrangements characterised by the use of optical means for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means

Abstract

PURPOSE:To enable the inspection of the eccentricity level of lenses and the alignment accuracy of each lens surface in the lens array optical system by detecting the intensity distribution of a laser beam reflected from the surface thereof after projected thereon. CONSTITUTION:A laser beam from a laser oscillator 1 is focused with a condenser lens 2 and made a parallel flux with a beam diameter of the same size as the size of the surface of the lenses 7 with a beam expander 3. After changed in the direction with a plane mirror 4, the beam is irradiated on lenses 7 to be inspected on a base 6 through a half mirror 5. The flux reflected and condensed on the surface of the lenses 7 is reflected and enters an image pickup element 8 with a half mirror 5. Signals indicating the intensity corresponding to the quantity of beam which enters individual photoelement as picture elements composing the image pickup element 8 are outputted to determine the eccentricity of the lenses by computing the output in a signal processing circuit. The assembly of the lenses is moved according to an alignment pitch and the quantity of beam entering the image pickup element is integrated thereby measuring the alignment accuracy of the lens assembly.
JP18836180A 1980-12-29 1980-12-29 Eccentricity measurement Pending JPS57113342A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18836180A JPS57113342A (en) 1980-12-29 1980-12-29 Eccentricity measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18836180A JPS57113342A (en) 1980-12-29 1980-12-29 Eccentricity measurement

Publications (1)

Publication Number Publication Date
JPS57113342A true JPS57113342A (en) 1982-07-14

Family

ID=16222271

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18836180A Pending JPS57113342A (en) 1980-12-29 1980-12-29 Eccentricity measurement

Country Status (1)

Country Link
JP (1) JPS57113342A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5844670A (en) * 1995-07-28 1998-12-01 Ricoh Co., Ltd. Method of and systems for measuring eccentricity of an aspherical lens surface
WO2011129068A1 (en) * 2010-04-13 2011-10-20 コニカミノルタオプト株式会社 Eccentric amount measuring method
CN103278106A (en) * 2013-05-16 2013-09-04 中国科学院高能物理研究所 High-accuracy high-spatial resolution long range profile detection system

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5844670A (en) * 1995-07-28 1998-12-01 Ricoh Co., Ltd. Method of and systems for measuring eccentricity of an aspherical lens surface
WO2011129068A1 (en) * 2010-04-13 2011-10-20 コニカミノルタオプト株式会社 Eccentric amount measuring method
US8665425B2 (en) 2010-04-13 2014-03-04 Konica Minolta Advanced Layers, Inc. Eccentricity measuring method
JP5582188B2 (en) * 2010-04-13 2014-09-03 コニカミノルタ株式会社 Eccentricity measurement method
CN103278106A (en) * 2013-05-16 2013-09-04 中国科学院高能物理研究所 High-accuracy high-spatial resolution long range profile detection system

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