JPS5767815A - Measuring method for position of reflector using light - Google Patents
Measuring method for position of reflector using lightInfo
- Publication number
- JPS5767815A JPS5767815A JP14481580A JP14481580A JPS5767815A JP S5767815 A JPS5767815 A JP S5767815A JP 14481580 A JP14481580 A JP 14481580A JP 14481580 A JP14481580 A JP 14481580A JP S5767815 A JPS5767815 A JP S5767815A
- Authority
- JP
- Japan
- Prior art keywords
- reflector
- spot
- image
- light beam
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C3/00—Measuring distances in line of sight; Optical rangefinders
- G01C3/02—Details
- G01C3/06—Use of electric means to obtain final indication
- G01C3/08—Use of electric radiation detectors
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
Abstract
PURPOSE:To measure the position of a reflector by a simple and inexpensive device by irradiating the reflector with a light beam and forming an image of its spot on a linear photodetector under Scheinpflug condition. CONSTITUTION:A reflector 3 is irradiated with a light beam from a laser device 1, and an image of its spot 4 is formed on a linear array 6 of photoelectric elements through a lens 8, thereby finding the position of the spot 4 from the image-formation position 4'. When a plane 8 containing a lens 5 and that containing the linear photodetector 6 cross to each other at an optional point 7 on the optical path of the light beam 2 (i.e., under Scheinpflug condition), the image of the spot 4 is always in focus. Thus, the position of the spot 4 of the reflector 3 is measured by the simple, inexpensive device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14481580A JPS5767815A (en) | 1980-10-16 | 1980-10-16 | Measuring method for position of reflector using light |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14481580A JPS5767815A (en) | 1980-10-16 | 1980-10-16 | Measuring method for position of reflector using light |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5767815A true JPS5767815A (en) | 1982-04-24 |
Family
ID=15371099
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14481580A Pending JPS5767815A (en) | 1980-10-16 | 1980-10-16 | Measuring method for position of reflector using light |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5767815A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59138916A (en) * | 1983-01-28 | 1984-08-09 | Matsushita Electric Works Ltd | Range finder |
JPS59228108A (en) * | 1983-06-10 | 1984-12-21 | Matsushita Electric Works Ltd | Distance sensor |
JPS62190410A (en) * | 1986-02-18 | 1987-08-20 | Toshiba Corp | Measuring instrument for sample surface position |
JPS6416906A (en) * | 1987-07-10 | 1989-01-20 | Iwatsu Electric Co Ltd | Displacement gage utilizing laser light |
JPH03183904A (en) * | 1988-11-09 | 1991-08-09 | Anstalt Gersan | Detection of shape of object |
EP0499778A2 (en) * | 1991-02-18 | 1992-08-26 | Ushio Co. Ltd | Image processing apparatus |
-
1980
- 1980-10-16 JP JP14481580A patent/JPS5767815A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59138916A (en) * | 1983-01-28 | 1984-08-09 | Matsushita Electric Works Ltd | Range finder |
JPS59228108A (en) * | 1983-06-10 | 1984-12-21 | Matsushita Electric Works Ltd | Distance sensor |
JPS62190410A (en) * | 1986-02-18 | 1987-08-20 | Toshiba Corp | Measuring instrument for sample surface position |
JPS6416906A (en) * | 1987-07-10 | 1989-01-20 | Iwatsu Electric Co Ltd | Displacement gage utilizing laser light |
JPH03183904A (en) * | 1988-11-09 | 1991-08-09 | Anstalt Gersan | Detection of shape of object |
EP0499778A2 (en) * | 1991-02-18 | 1992-08-26 | Ushio Co. Ltd | Image processing apparatus |
US5351316A (en) * | 1991-02-18 | 1994-09-27 | Ushio Co., Ltd. | Image processing apparatus |
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