JPS5767815A - Measuring method for position of reflector using light - Google Patents

Measuring method for position of reflector using light

Info

Publication number
JPS5767815A
JPS5767815A JP14481580A JP14481580A JPS5767815A JP S5767815 A JPS5767815 A JP S5767815A JP 14481580 A JP14481580 A JP 14481580A JP 14481580 A JP14481580 A JP 14481580A JP S5767815 A JPS5767815 A JP S5767815A
Authority
JP
Japan
Prior art keywords
reflector
spot
light
image
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14481580A
Other languages
Japanese (ja)
Inventor
Mitsuhiro Ueda
Original Assignee
Mitsuhiro Ueda
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsuhiro Ueda filed Critical Mitsuhiro Ueda
Priority to JP14481580A priority Critical patent/JPS5767815A/en
Publication of JPS5767815A publication Critical patent/JPS5767815A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00Measuring distances in line of sight; Optical rangefinders
    • G01C3/02Details
    • G01C3/06Use of electric means to obtain final indication
    • G01C3/08Use of electric radiation detectors

Abstract

PURPOSE:To measure the position of a reflector by a simple and inexpensive device by irradiating the reflector with a light beam and forming an image of its spot on a linear photodetector under Scheinpflug condition. CONSTITUTION:A reflector 3 is irradiated with a light beam from a laser device 1, and an image of its spot 4 is formed on a linear array 6 of photoelectric elements through a lens 8, thereby finding the position of the spot 4 from the image-formation position 4'. When a plane 8 containing a lens 5 and that containing the linear photodetector 6 cross to each other at an optional point 7 on the optical path of the light beam 2 (i.e., under Scheinpflug condition), the image of the spot 4 is always in focus. Thus, the position of the spot 4 of the reflector 3 is measured by the simple, inexpensive device.
JP14481580A 1980-10-16 1980-10-16 Measuring method for position of reflector using light Pending JPS5767815A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14481580A JPS5767815A (en) 1980-10-16 1980-10-16 Measuring method for position of reflector using light

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14481580A JPS5767815A (en) 1980-10-16 1980-10-16 Measuring method for position of reflector using light

Publications (1)

Publication Number Publication Date
JPS5767815A true JPS5767815A (en) 1982-04-24

Family

ID=15371099

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14481580A Pending JPS5767815A (en) 1980-10-16 1980-10-16 Measuring method for position of reflector using light

Country Status (1)

Country Link
JP (1) JPS5767815A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59138916A (en) * 1983-01-28 1984-08-09 Matsushita Electric Works Ltd Range finder
JPS59228108A (en) * 1983-06-10 1984-12-21 Matsushita Electric Works Ltd Distance sensor
JPS62190410A (en) * 1986-02-18 1987-08-20 Toshiba Corp Measuring instrument for sample surface position
JPS6416906A (en) * 1987-07-10 1989-01-20 Iwatsu Electric Co Ltd Displacement gage utilizing laser light
JPH03183904A (en) * 1988-11-09 1991-08-09 Anstalt Gersan Detection of shape of object
EP0499778A2 (en) * 1991-02-18 1992-08-26 Ushio Co. Ltd Image processing apparatus

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59138916A (en) * 1983-01-28 1984-08-09 Matsushita Electric Works Ltd Range finder
JPS59228108A (en) * 1983-06-10 1984-12-21 Matsushita Electric Works Ltd Distance sensor
JPS62190410A (en) * 1986-02-18 1987-08-20 Toshiba Corp Measuring instrument for sample surface position
JPS6416906A (en) * 1987-07-10 1989-01-20 Iwatsu Electric Co Ltd Displacement gage utilizing laser light
JPH03183904A (en) * 1988-11-09 1991-08-09 Anstalt Gersan Detection of shape of object
EP0499778A2 (en) * 1991-02-18 1992-08-26 Ushio Co. Ltd Image processing apparatus
US5351316A (en) * 1991-02-18 1994-09-27 Ushio Co., Ltd. Image processing apparatus

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