JP7287770B2 - 完全自己整合性ビアを形成するための選択的付着の方法 - Google Patents
完全自己整合性ビアを形成するための選択的付着の方法 Download PDFInfo
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- JP7287770B2 JP7287770B2 JP2018216745A JP2018216745A JP7287770B2 JP 7287770 B2 JP7287770 B2 JP 7287770B2 JP 2018216745 A JP2018216745 A JP 2018216745A JP 2018216745 A JP2018216745 A JP 2018216745A JP 7287770 B2 JP7287770 B2 JP 7287770B2
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- H10W20/01—Manufacture or treatment
- H10W20/071—Manufacture or treatment of dielectric parts thereof
- H10W20/074—Manufacture or treatment of dielectric parts thereof of dielectric parts comprising thin functional dielectric layers, e.g. dielectric etch-stop, barrier, capping or liner layers
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/071—Manufacture or treatment of dielectric parts thereof
- H10W20/081—Manufacture or treatment of dielectric parts thereof by forming openings in the dielectric parts
- H10W20/089—Manufacture or treatment of dielectric parts thereof by forming openings in the dielectric parts using processes for implementing desired shapes or dispositions of the openings, e.g. double patterning
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- H—ELECTRICITY
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- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/61—Formation of materials, e.g. in the shape of layers or pillars of insulating materials using masks
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- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
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- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
- H10P72/7618—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating carrousel
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- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
- H10P72/7621—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by supporting two or more semiconductor substrates
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Families Citing this family (60)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9112003B2 (en) | 2011-12-09 | 2015-08-18 | Asm International N.V. | Selective formation of metallic films on metallic surfaces |
| US9895715B2 (en) | 2014-02-04 | 2018-02-20 | Asm Ip Holding B.V. | Selective deposition of metals, metal oxides, and dielectrics |
| US10047435B2 (en) | 2014-04-16 | 2018-08-14 | Asm Ip Holding B.V. | Dual selective deposition |
| US9490145B2 (en) | 2015-02-23 | 2016-11-08 | Asm Ip Holding B.V. | Removal of surface passivation |
| US10428421B2 (en) | 2015-08-03 | 2019-10-01 | Asm Ip Holding B.V. | Selective deposition on metal or metallic surfaces relative to dielectric surfaces |
| US10814349B2 (en) | 2015-10-09 | 2020-10-27 | Asm Ip Holding B.V. | Vapor phase deposition of organic films |
| US10695794B2 (en) | 2015-10-09 | 2020-06-30 | Asm Ip Holding B.V. | Vapor phase deposition of organic films |
| US11081342B2 (en) | 2016-05-05 | 2021-08-03 | Asm Ip Holding B.V. | Selective deposition using hydrophobic precursors |
| US10453701B2 (en) | 2016-06-01 | 2019-10-22 | Asm Ip Holding B.V. | Deposition of organic films |
| US10373820B2 (en) | 2016-06-01 | 2019-08-06 | Asm Ip Holding B.V. | Deposition of organic films |
| US11430656B2 (en) | 2016-11-29 | 2022-08-30 | Asm Ip Holding B.V. | Deposition of oxide thin films |
| US11094535B2 (en) | 2017-02-14 | 2021-08-17 | Asm Ip Holding B.V. | Selective passivation and selective deposition |
| US11501965B2 (en) * | 2017-05-05 | 2022-11-15 | Asm Ip Holding B.V. | Plasma enhanced deposition processes for controlled formation of metal oxide thin films |
| JP7183187B2 (ja) | 2017-05-16 | 2022-12-05 | エーエスエム アイピー ホールディング ビー.ブイ. | 誘電体上の酸化物の選択的peald |
| US10586734B2 (en) | 2017-11-20 | 2020-03-10 | Tokyo Electron Limited | Method of selective film deposition for forming fully self-aligned vias |
| WO2019210234A1 (en) * | 2018-04-27 | 2019-10-31 | Tokyo Electron Limited | Area selective deposition for cap layer formation in advanced contacts |
| JP2020056104A (ja) | 2018-10-02 | 2020-04-09 | エーエスエム アイピー ホールディング ビー.ブイ. | 選択的パッシベーションおよび選択的堆積 |
| US12482648B2 (en) | 2018-10-02 | 2025-11-25 | Asm Ip Holding B.V. | Selective passivation and selective deposition |
| US11335596B2 (en) * | 2018-10-30 | 2022-05-17 | Taiwan Semiconductor Manufacturing Co., Ltd. | Selective deposition for integrated circuit interconnect structures |
| KR102685504B1 (ko) * | 2019-03-20 | 2024-07-17 | 가부시키가이샤 코쿠사이 엘렉트릭 | 반도체 장치의 제조 방법, 기판 처리 방법, 기판 처리 장치 및 프로그램 |
| US11965238B2 (en) | 2019-04-12 | 2024-04-23 | Asm Ip Holding B.V. | Selective deposition of metal oxides on metal surfaces |
| TWI845699B (zh) * | 2019-06-12 | 2024-06-21 | 日商東京威力科創股份有限公司 | 半導體裝置的平坦化 |
| JP7531981B2 (ja) * | 2019-07-18 | 2024-08-13 | 東京エレクトロン株式会社 | 領域選択的堆積における横方向のフィルム成長を緩和するための方法 |
| JP2021052069A (ja) * | 2019-09-24 | 2021-04-01 | 東京エレクトロン株式会社 | 成膜方法 |
| JP7262354B2 (ja) * | 2019-09-24 | 2023-04-21 | 東京エレクトロン株式会社 | 成膜方法 |
| JP2021057563A (ja) * | 2019-09-24 | 2021-04-08 | 東京エレクトロン株式会社 | 成膜方法 |
| US12525486B2 (en) * | 2019-10-31 | 2026-01-13 | Taiwan Semiconductor Manufacturing Co., Ltd. | Isolation structure for metal interconnect |
| US11139163B2 (en) | 2019-10-31 | 2021-10-05 | Asm Ip Holding B.V. | Selective deposition of SiOC thin films |
| JP7627432B2 (ja) * | 2019-12-10 | 2025-02-06 | 東京エレクトロン株式会社 | 犠牲キャッピング層としての自己組織化単分子層 |
| JP7365898B2 (ja) * | 2019-12-27 | 2023-10-20 | 東京エレクトロン株式会社 | 成膜方法及び成膜装置 |
| JP7227122B2 (ja) * | 2019-12-27 | 2023-02-21 | 株式会社Kokusai Electric | 基板処理方法、半導体装置の製造方法、基板処理装置、およびプログラム |
| JP7353200B2 (ja) * | 2020-02-06 | 2023-09-29 | 東京エレクトロン株式会社 | 成膜方法 |
| JP7072012B2 (ja) | 2020-02-27 | 2022-05-19 | 株式会社Kokusai Electric | 基板処理方法、半導体装置の製造方法、基板処理装置、及びプログラム |
| TW202140832A (zh) | 2020-03-30 | 2021-11-01 | 荷蘭商Asm Ip私人控股有限公司 | 氧化矽在金屬表面上之選擇性沉積 |
| TWI862807B (zh) | 2020-03-30 | 2024-11-21 | 荷蘭商Asm Ip私人控股有限公司 | 相對於金屬表面在介電表面上之氧化矽的選擇性沉積 |
| TWI865747B (zh) | 2020-03-30 | 2024-12-11 | 荷蘭商Asm Ip私人控股有限公司 | 在兩不同表面上同時選擇性沉積兩不同材料 |
| US11542597B2 (en) * | 2020-04-08 | 2023-01-03 | Applied Materials, Inc. | Selective deposition of metal oxide by pulsed chemical vapor deposition |
| KR20230026385A (ko) * | 2020-06-17 | 2023-02-24 | 도쿄엘렉트론가부시키가이샤 | 영역 선택적 증착에서 측방 막 형성을 감소시키는 방법 |
| US20210398846A1 (en) * | 2020-06-17 | 2021-12-23 | Tokyo Electron Limited | Method for area selective deposition using a surface cleaning process |
| JP2022050198A (ja) * | 2020-09-17 | 2022-03-30 | 東京エレクトロン株式会社 | 成膜方法及び成膜装置 |
| US20220136106A1 (en) * | 2020-10-30 | 2022-05-05 | The Board Of Trustees Of The Leland Stanford Junior University | Advanced precursors for selective atomic layer deposition using self-assembled monolayers |
| US20220238323A1 (en) * | 2021-01-28 | 2022-07-28 | Tokyo Electron Limited | Method for selective deposition of dielectric on dielectric |
| KR20230135603A (ko) * | 2021-02-08 | 2023-09-25 | 도쿄엘렉트론가부시키가이샤 | 액상 컨포멀 실리콘 산화물 스핀-온 증착 |
| JP2022159050A (ja) * | 2021-03-31 | 2022-10-17 | 東京エレクトロン株式会社 | 膜形成方法及び基板処理装置 |
| WO2022210351A1 (ja) * | 2021-03-31 | 2022-10-06 | 東京エレクトロン株式会社 | 膜形成方法及び基板処理装置 |
| JP2024523510A (ja) * | 2021-07-06 | 2024-06-28 | 東京エレクトロン株式会社 | 自己組織化単分子層を使用する選択的な膜形成 |
| WO2023096270A1 (ko) * | 2021-11-26 | 2023-06-01 | 솔브레인 주식회사 | 고유전율 박막용 가리움제, 이를 이용한 선택영역증착 방법, 이로부터 제조된 반도체 기판 및 반도체 소자 |
| JP7844154B2 (ja) * | 2021-12-17 | 2026-04-13 | 株式会社Kokusai Electric | 基板処理方法、基板処理装置、およびプログラム |
| US20230282514A1 (en) * | 2022-03-04 | 2023-09-07 | Taiwan Semiconductor Manufacturing Company, Ltd. | Area selective deposition for zero via enclosure and extremely small metal line end space |
| JP2025513381A (ja) * | 2022-04-21 | 2025-04-24 | ジェレスト, インコーポレイテッド | 混合酸化物誘電体膜の固有エリア選択性成膜 |
| JP2023182324A (ja) * | 2022-06-14 | 2023-12-26 | 東京エレクトロン株式会社 | 成膜方法及び成膜装置 |
| JP2024019774A (ja) * | 2022-08-01 | 2024-02-14 | 東京エレクトロン株式会社 | 成膜方法および成膜装置 |
| CN115418629B (zh) * | 2022-08-17 | 2024-01-12 | 杭州富芯半导体有限公司 | 薄膜沉积的方法 |
| KR20240031533A (ko) | 2022-08-31 | 2024-03-08 | 삼성전자주식회사 | 반도체 장치 제조 방법 |
| JP2024049188A (ja) * | 2022-09-28 | 2024-04-09 | 東京エレクトロン株式会社 | 膜形成方法及び基板処理装置 |
| JP2024081396A (ja) * | 2022-12-06 | 2024-06-18 | 東京エレクトロン株式会社 | 成膜方法及び成膜装置 |
| JP2024165284A (ja) * | 2023-05-17 | 2024-11-28 | 東京応化工業株式会社 | 表面処理膜の形成方法 |
| JP2025005618A (ja) * | 2023-06-28 | 2025-01-17 | 東京エレクトロン株式会社 | 成膜方法及び成膜装置 |
| WO2025049165A1 (en) * | 2023-08-29 | 2025-03-06 | Entegris, Inc. | Precursors for selective deposition of silicon-containing films |
| JP2025087989A (ja) * | 2023-11-30 | 2025-06-11 | 東京エレクトロン株式会社 | 成膜方法及び成膜装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080032064A1 (en) | 2006-07-10 | 2008-02-07 | President And Fellows Of Harvard College | Selective sealing of porous dielectric materials |
| JP2017195371A (ja) | 2016-04-12 | 2017-10-26 | 東京エレクトロン株式会社 | 微細凹状フィーチャのSiO2充填及び触媒表面上への選択的SiO2堆積のための方法 |
Family Cites Families (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3469251B2 (ja) * | 1990-02-14 | 2003-11-25 | 株式会社東芝 | 半導体装置の製造方法 |
| JP4448356B2 (ja) | 2004-03-26 | 2010-04-07 | 富士通株式会社 | 半導体装置およびその製造方法 |
| EP1799401B1 (en) | 2004-06-22 | 2014-03-12 | Sunnen Products Company | Servo stroking apparatus and system |
| US20060073276A1 (en) | 2004-10-04 | 2006-04-06 | Eric Antonissen | Multi-zone atomic layer deposition apparatus and method |
| WO2008045953A2 (en) * | 2006-10-10 | 2008-04-17 | Celonova Biosciences, Inc. | Compositions and devices comrising silicone and specific polyphosphazenes |
| US9245739B2 (en) * | 2006-11-01 | 2016-01-26 | Lam Research Corporation | Low-K oxide deposition by hydrolysis and condensation |
| JP5310283B2 (ja) | 2008-06-27 | 2013-10-09 | 東京エレクトロン株式会社 | 成膜方法、成膜装置、基板処理装置及び記憶媒体 |
| JP2010041038A (ja) | 2008-06-27 | 2010-02-18 | Asm America Inc | 重要な用途のための二酸化ケイ素の低温熱でのald |
| JP2010010686A (ja) | 2008-06-27 | 2010-01-14 | Asm America Inc | 高成長率の二酸化ケイ素の堆積 |
| US8907881B2 (en) * | 2010-04-09 | 2014-12-09 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device and method for driving the same |
| US8758584B2 (en) * | 2010-12-16 | 2014-06-24 | Sensor Innovations, Inc. | Electrochemical sensors |
| JP2016536452A (ja) | 2013-10-15 | 2016-11-24 | ビーコ・エーエルディー インコーポレイテッド | 種前駆体を用いる高速原子層堆積プロセス |
| US9895715B2 (en) | 2014-02-04 | 2018-02-20 | Asm Ip Holding B.V. | Selective deposition of metals, metal oxides, and dielectrics |
| JP6213278B2 (ja) | 2014-02-07 | 2017-10-18 | ウシオ電機株式会社 | パターン形成体の製造方法 |
| GB201415119D0 (en) * | 2014-08-27 | 2014-10-08 | Ibm | Method for fabricating a semiconductor structure |
| US20160064275A1 (en) | 2014-08-27 | 2016-03-03 | Applied Materials, Inc. | Selective Deposition With Alcohol Selective Reduction And Protection |
| US10062564B2 (en) | 2014-12-15 | 2018-08-28 | Tokyo Electron Limited | Method of selective gas phase film deposition on a substrate by modifying the surface using hydrogen plasma |
| US9508545B2 (en) * | 2015-02-09 | 2016-11-29 | Applied Materials, Inc. | Selectively lateral growth of silicon oxide thin film |
| WO2016138284A1 (en) * | 2015-02-26 | 2016-09-01 | Applied Materials, Inc. | Methods for selective dielectric deposition using self-assembled monolayers |
| US20170029948A1 (en) | 2015-07-28 | 2017-02-02 | Asm Ip Holding B.V. | Methods and apparatuses for temperature-indexed thin film deposition |
| US20170092533A1 (en) | 2015-09-29 | 2017-03-30 | Applied Materials, Inc. | Selective silicon dioxide deposition using phosphonic acid self assembled monolayers as nucleation inhibitor |
| US10316406B2 (en) * | 2015-10-21 | 2019-06-11 | Ultratech, Inc. | Methods of forming an ALD-inhibiting layer using a self-assembled monolayer |
| US9981286B2 (en) * | 2016-03-08 | 2018-05-29 | Asm Ip Holding B.V. | Selective formation of metal silicides |
| US10068764B2 (en) | 2016-09-13 | 2018-09-04 | Tokyo Electron Limited | Selective metal oxide deposition using a self-assembled monolayer surface pretreatment |
| US10453749B2 (en) | 2017-02-14 | 2019-10-22 | Tokyo Electron Limited | Method of forming a self-aligned contact using selective SiO2 deposition |
| US10586734B2 (en) | 2017-11-20 | 2020-03-10 | Tokyo Electron Limited | Method of selective film deposition for forming fully self-aligned vias |
| US10468585B1 (en) * | 2018-05-31 | 2019-11-05 | International Business Machines Corporation | Dual function magnetic tunnel junction pillar encapsulation |
-
2018
- 2018-11-16 US US16/193,849 patent/US10586734B2/en active Active
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-
2022
- 2022-09-16 KR KR1020220116934A patent/KR102549289B1/ko active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080032064A1 (en) | 2006-07-10 | 2008-02-07 | President And Fellows Of Harvard College | Selective sealing of porous dielectric materials |
| JP2017195371A (ja) | 2016-04-12 | 2017-10-26 | 東京エレクトロン株式会社 | 微細凹状フィーチャのSiO2充填及び触媒表面上への選択的SiO2堆積のための方法 |
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