JP7287770B2 - 完全自己整合性ビアを形成するための選択的付着の方法 - Google Patents

完全自己整合性ビアを形成するための選択的付着の方法 Download PDF

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JP7287770B2
JP7287770B2 JP2018216745A JP2018216745A JP7287770B2 JP 7287770 B2 JP7287770 B2 JP 7287770B2 JP 2018216745 A JP2018216745 A JP 2018216745A JP 2018216745 A JP2018216745 A JP 2018216745A JP 7287770 B2 JP7287770 B2 JP 7287770B2
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substrate
metal
gas
layer
plasma
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エヌ.タピリー カンダバラ
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Tokyo Electron Ltd
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Families Citing this family (60)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9112003B2 (en) 2011-12-09 2015-08-18 Asm International N.V. Selective formation of metallic films on metallic surfaces
US9895715B2 (en) 2014-02-04 2018-02-20 Asm Ip Holding B.V. Selective deposition of metals, metal oxides, and dielectrics
US10047435B2 (en) 2014-04-16 2018-08-14 Asm Ip Holding B.V. Dual selective deposition
US9490145B2 (en) 2015-02-23 2016-11-08 Asm Ip Holding B.V. Removal of surface passivation
US10428421B2 (en) 2015-08-03 2019-10-01 Asm Ip Holding B.V. Selective deposition on metal or metallic surfaces relative to dielectric surfaces
US10814349B2 (en) 2015-10-09 2020-10-27 Asm Ip Holding B.V. Vapor phase deposition of organic films
US10695794B2 (en) 2015-10-09 2020-06-30 Asm Ip Holding B.V. Vapor phase deposition of organic films
US11081342B2 (en) 2016-05-05 2021-08-03 Asm Ip Holding B.V. Selective deposition using hydrophobic precursors
US10453701B2 (en) 2016-06-01 2019-10-22 Asm Ip Holding B.V. Deposition of organic films
US10373820B2 (en) 2016-06-01 2019-08-06 Asm Ip Holding B.V. Deposition of organic films
US11430656B2 (en) 2016-11-29 2022-08-30 Asm Ip Holding B.V. Deposition of oxide thin films
US11094535B2 (en) 2017-02-14 2021-08-17 Asm Ip Holding B.V. Selective passivation and selective deposition
US11501965B2 (en) * 2017-05-05 2022-11-15 Asm Ip Holding B.V. Plasma enhanced deposition processes for controlled formation of metal oxide thin films
JP7183187B2 (ja) 2017-05-16 2022-12-05 エーエスエム アイピー ホールディング ビー.ブイ. 誘電体上の酸化物の選択的peald
US10586734B2 (en) 2017-11-20 2020-03-10 Tokyo Electron Limited Method of selective film deposition for forming fully self-aligned vias
WO2019210234A1 (en) * 2018-04-27 2019-10-31 Tokyo Electron Limited Area selective deposition for cap layer formation in advanced contacts
JP2020056104A (ja) 2018-10-02 2020-04-09 エーエスエム アイピー ホールディング ビー.ブイ. 選択的パッシベーションおよび選択的堆積
US12482648B2 (en) 2018-10-02 2025-11-25 Asm Ip Holding B.V. Selective passivation and selective deposition
US11335596B2 (en) * 2018-10-30 2022-05-17 Taiwan Semiconductor Manufacturing Co., Ltd. Selective deposition for integrated circuit interconnect structures
KR102685504B1 (ko) * 2019-03-20 2024-07-17 가부시키가이샤 코쿠사이 엘렉트릭 반도체 장치의 제조 방법, 기판 처리 방법, 기판 처리 장치 및 프로그램
US11965238B2 (en) 2019-04-12 2024-04-23 Asm Ip Holding B.V. Selective deposition of metal oxides on metal surfaces
TWI845699B (zh) * 2019-06-12 2024-06-21 日商東京威力科創股份有限公司 半導體裝置的平坦化
JP7531981B2 (ja) * 2019-07-18 2024-08-13 東京エレクトロン株式会社 領域選択的堆積における横方向のフィルム成長を緩和するための方法
JP2021052069A (ja) * 2019-09-24 2021-04-01 東京エレクトロン株式会社 成膜方法
JP7262354B2 (ja) * 2019-09-24 2023-04-21 東京エレクトロン株式会社 成膜方法
JP2021057563A (ja) * 2019-09-24 2021-04-08 東京エレクトロン株式会社 成膜方法
US12525486B2 (en) * 2019-10-31 2026-01-13 Taiwan Semiconductor Manufacturing Co., Ltd. Isolation structure for metal interconnect
US11139163B2 (en) 2019-10-31 2021-10-05 Asm Ip Holding B.V. Selective deposition of SiOC thin films
JP7627432B2 (ja) * 2019-12-10 2025-02-06 東京エレクトロン株式会社 犠牲キャッピング層としての自己組織化単分子層
JP7365898B2 (ja) * 2019-12-27 2023-10-20 東京エレクトロン株式会社 成膜方法及び成膜装置
JP7227122B2 (ja) * 2019-12-27 2023-02-21 株式会社Kokusai Electric 基板処理方法、半導体装置の製造方法、基板処理装置、およびプログラム
JP7353200B2 (ja) * 2020-02-06 2023-09-29 東京エレクトロン株式会社 成膜方法
JP7072012B2 (ja) 2020-02-27 2022-05-19 株式会社Kokusai Electric 基板処理方法、半導体装置の製造方法、基板処理装置、及びプログラム
TW202140832A (zh) 2020-03-30 2021-11-01 荷蘭商Asm Ip私人控股有限公司 氧化矽在金屬表面上之選擇性沉積
TWI862807B (zh) 2020-03-30 2024-11-21 荷蘭商Asm Ip私人控股有限公司 相對於金屬表面在介電表面上之氧化矽的選擇性沉積
TWI865747B (zh) 2020-03-30 2024-12-11 荷蘭商Asm Ip私人控股有限公司 在兩不同表面上同時選擇性沉積兩不同材料
US11542597B2 (en) * 2020-04-08 2023-01-03 Applied Materials, Inc. Selective deposition of metal oxide by pulsed chemical vapor deposition
KR20230026385A (ko) * 2020-06-17 2023-02-24 도쿄엘렉트론가부시키가이샤 영역 선택적 증착에서 측방 막 형성을 감소시키는 방법
US20210398846A1 (en) * 2020-06-17 2021-12-23 Tokyo Electron Limited Method for area selective deposition using a surface cleaning process
JP2022050198A (ja) * 2020-09-17 2022-03-30 東京エレクトロン株式会社 成膜方法及び成膜装置
US20220136106A1 (en) * 2020-10-30 2022-05-05 The Board Of Trustees Of The Leland Stanford Junior University Advanced precursors for selective atomic layer deposition using self-assembled monolayers
US20220238323A1 (en) * 2021-01-28 2022-07-28 Tokyo Electron Limited Method for selective deposition of dielectric on dielectric
KR20230135603A (ko) * 2021-02-08 2023-09-25 도쿄엘렉트론가부시키가이샤 액상 컨포멀 실리콘 산화물 스핀-온 증착
JP2022159050A (ja) * 2021-03-31 2022-10-17 東京エレクトロン株式会社 膜形成方法及び基板処理装置
WO2022210351A1 (ja) * 2021-03-31 2022-10-06 東京エレクトロン株式会社 膜形成方法及び基板処理装置
JP2024523510A (ja) * 2021-07-06 2024-06-28 東京エレクトロン株式会社 自己組織化単分子層を使用する選択的な膜形成
WO2023096270A1 (ko) * 2021-11-26 2023-06-01 솔브레인 주식회사 고유전율 박막용 가리움제, 이를 이용한 선택영역증착 방법, 이로부터 제조된 반도체 기판 및 반도체 소자
JP7844154B2 (ja) * 2021-12-17 2026-04-13 株式会社Kokusai Electric 基板処理方法、基板処理装置、およびプログラム
US20230282514A1 (en) * 2022-03-04 2023-09-07 Taiwan Semiconductor Manufacturing Company, Ltd. Area selective deposition for zero via enclosure and extremely small metal line end space
JP2025513381A (ja) * 2022-04-21 2025-04-24 ジェレスト, インコーポレイテッド 混合酸化物誘電体膜の固有エリア選択性成膜
JP2023182324A (ja) * 2022-06-14 2023-12-26 東京エレクトロン株式会社 成膜方法及び成膜装置
JP2024019774A (ja) * 2022-08-01 2024-02-14 東京エレクトロン株式会社 成膜方法および成膜装置
CN115418629B (zh) * 2022-08-17 2024-01-12 杭州富芯半导体有限公司 薄膜沉积的方法
KR20240031533A (ko) 2022-08-31 2024-03-08 삼성전자주식회사 반도체 장치 제조 방법
JP2024049188A (ja) * 2022-09-28 2024-04-09 東京エレクトロン株式会社 膜形成方法及び基板処理装置
JP2024081396A (ja) * 2022-12-06 2024-06-18 東京エレクトロン株式会社 成膜方法及び成膜装置
JP2024165284A (ja) * 2023-05-17 2024-11-28 東京応化工業株式会社 表面処理膜の形成方法
JP2025005618A (ja) * 2023-06-28 2025-01-17 東京エレクトロン株式会社 成膜方法及び成膜装置
WO2025049165A1 (en) * 2023-08-29 2025-03-06 Entegris, Inc. Precursors for selective deposition of silicon-containing films
JP2025087989A (ja) * 2023-11-30 2025-06-11 東京エレクトロン株式会社 成膜方法及び成膜装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080032064A1 (en) 2006-07-10 2008-02-07 President And Fellows Of Harvard College Selective sealing of porous dielectric materials
JP2017195371A (ja) 2016-04-12 2017-10-26 東京エレクトロン株式会社 微細凹状フィーチャのSiO2充填及び触媒表面上への選択的SiO2堆積のための方法

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3469251B2 (ja) * 1990-02-14 2003-11-25 株式会社東芝 半導体装置の製造方法
JP4448356B2 (ja) 2004-03-26 2010-04-07 富士通株式会社 半導体装置およびその製造方法
EP1799401B1 (en) 2004-06-22 2014-03-12 Sunnen Products Company Servo stroking apparatus and system
US20060073276A1 (en) 2004-10-04 2006-04-06 Eric Antonissen Multi-zone atomic layer deposition apparatus and method
WO2008045953A2 (en) * 2006-10-10 2008-04-17 Celonova Biosciences, Inc. Compositions and devices comrising silicone and specific polyphosphazenes
US9245739B2 (en) * 2006-11-01 2016-01-26 Lam Research Corporation Low-K oxide deposition by hydrolysis and condensation
JP5310283B2 (ja) 2008-06-27 2013-10-09 東京エレクトロン株式会社 成膜方法、成膜装置、基板処理装置及び記憶媒体
JP2010041038A (ja) 2008-06-27 2010-02-18 Asm America Inc 重要な用途のための二酸化ケイ素の低温熱でのald
JP2010010686A (ja) 2008-06-27 2010-01-14 Asm America Inc 高成長率の二酸化ケイ素の堆積
US8907881B2 (en) * 2010-04-09 2014-12-09 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device and method for driving the same
US8758584B2 (en) * 2010-12-16 2014-06-24 Sensor Innovations, Inc. Electrochemical sensors
JP2016536452A (ja) 2013-10-15 2016-11-24 ビーコ・エーエルディー インコーポレイテッド 種前駆体を用いる高速原子層堆積プロセス
US9895715B2 (en) 2014-02-04 2018-02-20 Asm Ip Holding B.V. Selective deposition of metals, metal oxides, and dielectrics
JP6213278B2 (ja) 2014-02-07 2017-10-18 ウシオ電機株式会社 パターン形成体の製造方法
GB201415119D0 (en) * 2014-08-27 2014-10-08 Ibm Method for fabricating a semiconductor structure
US20160064275A1 (en) 2014-08-27 2016-03-03 Applied Materials, Inc. Selective Deposition With Alcohol Selective Reduction And Protection
US10062564B2 (en) 2014-12-15 2018-08-28 Tokyo Electron Limited Method of selective gas phase film deposition on a substrate by modifying the surface using hydrogen plasma
US9508545B2 (en) * 2015-02-09 2016-11-29 Applied Materials, Inc. Selectively lateral growth of silicon oxide thin film
WO2016138284A1 (en) * 2015-02-26 2016-09-01 Applied Materials, Inc. Methods for selective dielectric deposition using self-assembled monolayers
US20170029948A1 (en) 2015-07-28 2017-02-02 Asm Ip Holding B.V. Methods and apparatuses for temperature-indexed thin film deposition
US20170092533A1 (en) 2015-09-29 2017-03-30 Applied Materials, Inc. Selective silicon dioxide deposition using phosphonic acid self assembled monolayers as nucleation inhibitor
US10316406B2 (en) * 2015-10-21 2019-06-11 Ultratech, Inc. Methods of forming an ALD-inhibiting layer using a self-assembled monolayer
US9981286B2 (en) * 2016-03-08 2018-05-29 Asm Ip Holding B.V. Selective formation of metal silicides
US10068764B2 (en) 2016-09-13 2018-09-04 Tokyo Electron Limited Selective metal oxide deposition using a self-assembled monolayer surface pretreatment
US10453749B2 (en) 2017-02-14 2019-10-22 Tokyo Electron Limited Method of forming a self-aligned contact using selective SiO2 deposition
US10586734B2 (en) 2017-11-20 2020-03-10 Tokyo Electron Limited Method of selective film deposition for forming fully self-aligned vias
US10468585B1 (en) * 2018-05-31 2019-11-05 International Business Machines Corporation Dual function magnetic tunnel junction pillar encapsulation

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080032064A1 (en) 2006-07-10 2008-02-07 President And Fellows Of Harvard College Selective sealing of porous dielectric materials
JP2017195371A (ja) 2016-04-12 2017-10-26 東京エレクトロン株式会社 微細凹状フィーチャのSiO2充填及び触媒表面上への選択的SiO2堆積のための方法

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