JP6885612B2 - 抵抗測定装置及び抵抗測定方法 - Google Patents

抵抗測定装置及び抵抗測定方法 Download PDF

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Publication number
JP6885612B2
JP6885612B2 JP2018554146A JP2018554146A JP6885612B2 JP 6885612 B2 JP6885612 B2 JP 6885612B2 JP 2018554146 A JP2018554146 A JP 2018554146A JP 2018554146 A JP2018554146 A JP 2018554146A JP 6885612 B2 JP6885612 B2 JP 6885612B2
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supply
current
lead
conductive
voltage
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Japanese (ja)
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JPWO2018101233A1 (ja
Inventor
山下　宗寛
宗寛 山下
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Nidec Advance Technology Corp
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Nidec Read Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/08—Measuring resistance by measuring both voltage and current
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP2018554146A 2016-12-01 2017-11-28 抵抗測定装置及び抵抗測定方法 Active JP6885612B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2016233892 2016-12-01
JP2016233892 2016-12-01
PCT/JP2017/042509 WO2018101233A1 (ja) 2016-12-01 2017-11-28 抵抗測定装置及び抵抗測定方法

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JPWO2018101233A1 JPWO2018101233A1 (ja) 2019-10-24
JP6885612B2 true JP6885612B2 (ja) 2021-06-16

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JP2018554146A Active JP6885612B2 (ja) 2016-12-01 2017-11-28 抵抗測定装置及び抵抗測定方法

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JP (1) JP6885612B2 (zh)
KR (1) KR102416051B1 (zh)
CN (1) CN109997046B (zh)
TW (1) TWI761398B (zh)
WO (1) WO2018101233A1 (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111208353B (zh) * 2020-01-16 2022-03-25 精电(河源)显示技术有限公司 一种cog模组的ito+pin电阻的检测方法
CN117074785B (zh) * 2023-10-12 2023-12-22 福建省志骐电子科技有限公司 一种精度高的电阻阻值检测设备

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004101453A (ja) * 2002-09-12 2004-04-02 Ngk Spark Plug Co Ltd 特性測定方法及び装置
EP1607751A1 (en) * 2003-03-26 2005-12-21 JSR Corporation Connector for measurement of electric resistance, connector device for measurement of electric resistance and production process thereof, and measuring apparatus and measuring method of electric resistance for circuit board
JP2006047172A (ja) * 2004-08-06 2006-02-16 Nidec-Read Corp 基板検査装置、基板検査プログラム及び基板検査方法
JP2007178318A (ja) * 2005-12-28 2007-07-12 Nidec-Read Corp 基板検査装置及び方法
KR100958038B1 (ko) * 2009-09-10 2010-05-17 모니텍주식회사 용접 검사 장치
TW201142310A (en) * 2010-05-21 2011-12-01 Yageo Corp Method for measuring the resistance of a chip resistor having a low resistance
JP5507430B2 (ja) 2010-12-03 2014-05-28 日置電機株式会社 回路基板検査装置
JP2013051355A (ja) * 2011-08-31 2013-03-14 Fujikura Ltd 貫通配線の検査方法、貫通配線基板の製造方法
KR101882700B1 (ko) * 2012-07-18 2018-07-30 삼성디스플레이 주식회사 칩온글래스 기판 및 칩온글래스 기판에서의 접속 저항 측정 방법
KR102090578B1 (ko) * 2013-05-06 2020-03-19 삼성디스플레이 주식회사 전자 장치의 기판, 이를 포함하는 전자 장치 및 접속부의 저항 측정 방법
JP6311223B2 (ja) * 2013-06-07 2018-04-18 日本電産リード株式会社 検査装置、検査装置のキャリブレーション方法及び検査方法
TWI526132B (zh) * 2013-12-13 2016-03-11 Mpi Corp Correction film structure
JP6375661B2 (ja) * 2014-03-26 2018-08-22 日本電産リード株式会社 抵抗測定装置、基板検査装置、検査方法、及び検査用治具のメンテナンス方法
CN107076790B (zh) * 2014-10-29 2019-12-13 日本电产理德股份有限公司 基板检查装置及基板检查方法

Also Published As

Publication number Publication date
TWI761398B (zh) 2022-04-21
JPWO2018101233A1 (ja) 2019-10-24
CN109997046A (zh) 2019-07-09
KR102416051B1 (ko) 2022-07-04
KR20190086463A (ko) 2019-07-22
CN109997046B (zh) 2022-01-14
WO2018101233A1 (ja) 2018-06-07
TW201821812A (zh) 2018-06-16

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