JP6525530B2 - 撮像装置 - Google Patents
撮像装置 Download PDFInfo
- Publication number
- JP6525530B2 JP6525530B2 JP2014174928A JP2014174928A JP6525530B2 JP 6525530 B2 JP6525530 B2 JP 6525530B2 JP 2014174928 A JP2014174928 A JP 2014174928A JP 2014174928 A JP2014174928 A JP 2014174928A JP 6525530 B2 JP6525530 B2 JP 6525530B2
- Authority
- JP
- Japan
- Prior art keywords
- transistor
- wiring
- circuit
- light
- potential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20184—Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20188—Auxiliary details, e.g. casings or cooling
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
- H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
- H10F39/1898—Indirect radiation image sensors, e.g. using luminescent members
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
- A61B6/4208—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Measurement Of Radiation (AREA)
- Light Receiving Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Thin Film Transistor (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014174928A JP6525530B2 (ja) | 2013-08-30 | 2014-08-29 | 撮像装置 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013179560 | 2013-08-30 | ||
| JP2013179560 | 2013-08-30 | ||
| JP2014174928A JP6525530B2 (ja) | 2013-08-30 | 2014-08-29 | 撮像装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015065433A JP2015065433A (ja) | 2015-04-09 |
| JP2015065433A5 JP2015065433A5 (enExample) | 2017-09-07 |
| JP6525530B2 true JP6525530B2 (ja) | 2019-06-05 |
Family
ID=52581806
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014174928A Expired - Fee Related JP6525530B2 (ja) | 2013-08-30 | 2014-08-29 | 撮像装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US9360564B2 (enExample) |
| JP (1) | JP6525530B2 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9674470B2 (en) | 2014-04-11 | 2017-06-06 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, method for driving semiconductor device, and method for driving electronic device |
| WO2015189732A1 (ja) | 2014-06-09 | 2015-12-17 | 株式会社半導体エネルギー研究所 | 撮像装置 |
| TWI757788B (zh) | 2014-06-27 | 2022-03-11 | 日商半導體能源研究所股份有限公司 | 攝像裝置及電子裝置 |
| US9729809B2 (en) | 2014-07-11 | 2017-08-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and driving method of semiconductor device or electronic device |
| US9685476B2 (en) * | 2015-04-03 | 2017-06-20 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device and electronic device |
| US10163948B2 (en) * | 2015-07-23 | 2018-12-25 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device and electronic device |
| US10242617B2 (en) * | 2016-06-03 | 2019-03-26 | Semiconductor Energy Laboratory Co., Ltd. | Display device, display module, electronic device, and driving method |
| US11367739B2 (en) | 2017-06-27 | 2022-06-21 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and electronic component |
| JP2019220684A (ja) * | 2018-06-19 | 2019-12-26 | シャープ株式会社 | 放射線検出器 |
| CN109216391B (zh) * | 2018-09-11 | 2021-02-19 | 京东方科技集团股份有限公司 | 一种探测面板、其制作方法及检测装置 |
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| US9360564B2 (en) | 2016-06-07 |
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