JP6110136B2 - ウエーハのレーザー加工方法およびレーザー加工装置 - Google Patents
ウエーハのレーザー加工方法およびレーザー加工装置 Download PDFInfo
- Publication number
- JP6110136B2 JP6110136B2 JP2012287691A JP2012287691A JP6110136B2 JP 6110136 B2 JP6110136 B2 JP 6110136B2 JP 2012287691 A JP2012287691 A JP 2012287691A JP 2012287691 A JP2012287691 A JP 2012287691A JP 6110136 B2 JP6110136 B2 JP 6110136B2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- adhesive film
- laser beam
- axis direction
- dividing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000003672 processing method Methods 0.000 title claims description 15
- 239000002313 adhesive film Substances 0.000 claims description 100
- 238000000034 method Methods 0.000 claims description 45
- 238000001514 detection method Methods 0.000 claims description 43
- 230000001678 irradiating effect Effects 0.000 claims description 25
- 238000003754 machining Methods 0.000 claims description 17
- 230000001681 protective effect Effects 0.000 claims description 17
- 238000003384 imaging method Methods 0.000 claims description 13
- 230000002950 deficient Effects 0.000 claims description 5
- 239000004065 semiconductor Substances 0.000 description 103
- 238000005520 cutting process Methods 0.000 description 33
- 230000007547 defect Effects 0.000 description 13
- 230000010355 oscillation Effects 0.000 description 9
- 230000002093 peripheral effect Effects 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 3
- 230000011218 segmentation Effects 0.000 description 3
- 238000003860 storage Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 229910009372 YVO4 Inorganic materials 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000007767 bonding agent Substances 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 229920000098 polyolefin Polymers 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Laser Beam Processing (AREA)
- Dicing (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012287691A JP6110136B2 (ja) | 2012-12-28 | 2012-12-28 | ウエーハのレーザー加工方法およびレーザー加工装置 |
TW102140689A TWI618192B (zh) | 2012-12-28 | 2013-11-08 | 晶圓之雷射加工方法及雷射加工裝置 |
KR1020130145881A KR102044044B1 (ko) | 2012-12-28 | 2013-11-28 | 웨이퍼의 레이저 가공 방법 및 레이저 가공 장치 |
CN201310729521.6A CN103909345B (zh) | 2012-12-28 | 2013-12-26 | 晶片的加工方法以及激光加工装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012287691A JP6110136B2 (ja) | 2012-12-28 | 2012-12-28 | ウエーハのレーザー加工方法およびレーザー加工装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2014130910A JP2014130910A (ja) | 2014-07-10 |
JP6110136B2 true JP6110136B2 (ja) | 2017-04-05 |
Family
ID=51035512
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012287691A Active JP6110136B2 (ja) | 2012-12-28 | 2012-12-28 | ウエーハのレーザー加工方法およびレーザー加工装置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6110136B2 (zh) |
KR (1) | KR102044044B1 (zh) |
CN (1) | CN103909345B (zh) |
TW (1) | TWI618192B (zh) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6491017B2 (ja) * | 2015-04-08 | 2019-03-27 | 株式会社ディスコ | 被加工物の搬送トレー |
JP6557081B2 (ja) * | 2015-07-13 | 2019-08-07 | 株式会社ディスコ | ウエーハの加工方法 |
JP2017041574A (ja) * | 2015-08-21 | 2017-02-23 | 株式会社ディスコ | ウエーハの加工方法 |
JP2017054843A (ja) * | 2015-09-07 | 2017-03-16 | 株式会社ディスコ | ウェーハの加工方法 |
JP6831246B2 (ja) * | 2017-01-11 | 2021-02-17 | 株式会社ディスコ | ウエーハの加工方法 |
US10593586B2 (en) * | 2017-03-17 | 2020-03-17 | Lam Research Corporation | Systems and methods for controlling substrate approach toward a target horizontal plane |
CN107275284B (zh) * | 2017-06-29 | 2019-11-12 | 华进半导体封装先导技术研发中心有限公司 | 一种daf芯片的制备方法 |
KR102550390B1 (ko) | 2017-09-12 | 2023-07-03 | 에베 그룹 에. 탈너 게엠베하 | 일시적으로 접합된 기판 스택을 분리하는 방법 및 장치 |
JP7214364B2 (ja) * | 2018-05-01 | 2023-01-30 | 株式会社ディスコ | ウエーハの加工方法 |
KR102174928B1 (ko) * | 2019-02-01 | 2020-11-05 | 레이저쎌 주식회사 | 멀티 빔 레이저 디본딩 장치 및 방법 |
JP7326053B2 (ja) | 2019-07-11 | 2023-08-15 | 株式会社ディスコ | 被加工物の加工方法 |
TW202138510A (zh) * | 2020-03-27 | 2021-10-16 | 日商琳得科股份有限公司 | 半導體裝置製造用片 |
JP2022017863A (ja) * | 2020-07-14 | 2022-01-26 | 株式会社東京精密 | レーザ加工装置、ウェーハ加工システム及びレーザ加工装置の制御方法 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000182995A (ja) | 1998-12-14 | 2000-06-30 | Mitsumi Electric Co Ltd | 半導体装置の製造方法 |
US6495406B1 (en) * | 2000-08-31 | 2002-12-17 | Micron Technology, Inc. | Method of forming lightly doped drain MOS transistor including forming spacers on gate electrode pattern before exposing gate insulator |
JP4109823B2 (ja) * | 2000-10-10 | 2008-07-02 | 株式会社東芝 | 半導体装置の製造方法 |
JP2005118808A (ja) * | 2003-10-15 | 2005-05-12 | Disco Abrasive Syst Ltd | レーザー加工装置 |
JP4018088B2 (ja) * | 2004-08-02 | 2007-12-05 | 松下電器産業株式会社 | 半導体ウェハの分割方法及び半導体素子の製造方法 |
JP2006332078A (ja) * | 2005-05-23 | 2006-12-07 | Matsushita Electric Ind Co Ltd | 半導体チップの製造方法 |
JP4830772B2 (ja) * | 2006-10-11 | 2011-12-07 | ヤマハ株式会社 | 半導体チップの検査方法 |
JP2009064905A (ja) * | 2007-09-05 | 2009-03-26 | Disco Abrasive Syst Ltd | 拡張方法および拡張装置 |
JP5011072B2 (ja) * | 2007-11-21 | 2012-08-29 | 株式会社ディスコ | レーザー加工装置 |
JP5444763B2 (ja) * | 2008-08-20 | 2014-03-19 | 日立化成株式会社 | 半導体装置の製造方法、それにより製造される半導体装置、及びダイシングテープ一体型接着シート |
JP5263051B2 (ja) * | 2009-07-21 | 2013-08-14 | Jfeスチール株式会社 | レーザ溶接機におけるレーザ照射点検出装置及びシーム位置検出装置 |
JP2012004353A (ja) * | 2010-06-17 | 2012-01-05 | Toshiba Corp | 剥離装置および剥離方法 |
JP5878292B2 (ja) * | 2010-12-24 | 2016-03-08 | 株式会社ディスコ | 光デバイスウエーハの加工方法 |
US8802545B2 (en) * | 2011-03-14 | 2014-08-12 | Plasma-Therm Llc | Method and apparatus for plasma dicing a semi-conductor wafer |
KR20120131096A (ko) * | 2011-05-24 | 2012-12-04 | 가부시기가이샤 디스코 | 레이저 가공 장치 |
JP5912293B2 (ja) * | 2011-05-24 | 2016-04-27 | 株式会社ディスコ | レーザー加工装置 |
-
2012
- 2012-12-28 JP JP2012287691A patent/JP6110136B2/ja active Active
-
2013
- 2013-11-08 TW TW102140689A patent/TWI618192B/zh active
- 2013-11-28 KR KR1020130145881A patent/KR102044044B1/ko active IP Right Grant
- 2013-12-26 CN CN201310729521.6A patent/CN103909345B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
TW201431005A (zh) | 2014-08-01 |
JP2014130910A (ja) | 2014-07-10 |
CN103909345B (zh) | 2017-04-05 |
KR20140086822A (ko) | 2014-07-08 |
KR102044044B1 (ko) | 2019-11-12 |
CN103909345A (zh) | 2014-07-09 |
TWI618192B (zh) | 2018-03-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6110136B2 (ja) | ウエーハのレーザー加工方法およびレーザー加工装置 | |
JP4630692B2 (ja) | レーザー加工方法 | |
KR101223203B1 (ko) | 레이저 가공방법 | |
JP5940906B2 (ja) | レーザー加工装置 | |
JP6034219B2 (ja) | ウエーハの加工方法 | |
JP2017152569A (ja) | ウエーハの加工方法 | |
JP2009272421A (ja) | デバイスの製造方法 | |
JP2009145292A (ja) | 被加工物のエッジ検出装置およびレーザー加工機 | |
JP2008108792A (ja) | ウエーハの加工方法 | |
JP5722071B2 (ja) | 半導体デバイスの製造方法およびレーザー加工装置 | |
JP5495869B2 (ja) | レーザー加工溝の確認方法 | |
TW201901770A (zh) | 雷射加工方法 | |
JP2010064125A (ja) | レーザー加工装置 | |
JP5331417B2 (ja) | レーザー加工装置 | |
JP6345928B2 (ja) | 検出装置 | |
JP2009146949A (ja) | ウエーハの分割方法 | |
KR101876578B1 (ko) | 사파이어 기판의 가공 방법 | |
JP2008264805A (ja) | レーザー加工装置およびウエーハの裏面に装着された接着フィルムのレーザー加工方法 | |
JP5940783B2 (ja) | 板状物の加工方法 | |
JP5839383B2 (ja) | ウエーハの加工方法 | |
JP6767849B2 (ja) | ウエーハ加工装置及びウエーハの加工方法 | |
JP6215558B2 (ja) | 加工装置 | |
JP2017050377A (ja) | ウエーハの加工方法 | |
JP2017050305A (ja) | ウエーハの加工方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20151020 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20161013 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20161025 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20161212 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20170214 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20170309 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 6110136 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |