JP5915178B2 - 結晶成長用熱分解窒化ホウ素製容器、およびそれを用いた半導体結晶の成長方法 - Google Patents
結晶成長用熱分解窒化ホウ素製容器、およびそれを用いた半導体結晶の成長方法 Download PDFInfo
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- JP5915178B2 JP5915178B2 JP2011552868A JP2011552868A JP5915178B2 JP 5915178 B2 JP5915178 B2 JP 5915178B2 JP 2011552868 A JP2011552868 A JP 2011552868A JP 2011552868 A JP2011552868 A JP 2011552868A JP 5915178 B2 JP5915178 B2 JP 5915178B2
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- boron nitride
- pyrolytic boron
- crystal growth
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- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 title claims description 81
- 239000013078 crystal Substances 0.000 title claims description 56
- 239000004065 semiconductor Substances 0.000 title claims description 25
- 238000002109 crystal growth method Methods 0.000 title claims description 3
- 238000000034 method Methods 0.000 claims description 12
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 7
- 229910052796 boron Inorganic materials 0.000 claims description 7
- 230000005484 gravity Effects 0.000 claims description 7
- 239000002994 raw material Substances 0.000 claims description 5
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 14
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 14
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 7
- 150000001875 compounds Chemical class 0.000 description 7
- 239000000463 material Substances 0.000 description 7
- 230000007547 defect Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 4
- 238000005336 cracking Methods 0.000 description 4
- 229910002804 graphite Inorganic materials 0.000 description 4
- 239000010439 graphite Substances 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 229910052582 BN Inorganic materials 0.000 description 3
- 229910005540 GaP Inorganic materials 0.000 description 3
- 229910000673 Indium arsenide Inorganic materials 0.000 description 3
- 239000005083 Zinc sulfide Substances 0.000 description 3
- 229910052799 carbon Inorganic materials 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- HZXMRANICFIONG-UHFFFAOYSA-N gallium phosphide Chemical compound [Ga]#P HZXMRANICFIONG-UHFFFAOYSA-N 0.000 description 3
- 229910052732 germanium Inorganic materials 0.000 description 3
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 229910052984 zinc sulfide Inorganic materials 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- 229910004613 CdTe Inorganic materials 0.000 description 2
- 239000000565 sealant Substances 0.000 description 2
- PFNQVRZLDWYSCW-UHFFFAOYSA-N (fluoren-9-ylideneamino) n-naphthalen-1-ylcarbamate Chemical compound C12=CC=CC=C2C2=CC=CC=C2C1=NOC(=O)NC1=CC=CC2=CC=CC=C12 PFNQVRZLDWYSCW-UHFFFAOYSA-N 0.000 description 1
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 description 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- 229910000712 Boron steel Inorganic materials 0.000 description 1
- -1 CdMnTe Inorganic materials 0.000 description 1
- 229910004611 CdZnTe Inorganic materials 0.000 description 1
- 229910005542 GaSb Inorganic materials 0.000 description 1
- 229910000661 Mercury cadmium telluride Inorganic materials 0.000 description 1
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 description 1
- 239000003708 ampul Substances 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- WPYVAWXEWQSOGY-UHFFFAOYSA-N indium antimonide Chemical compound [Sb]#[In] WPYVAWXEWQSOGY-UHFFFAOYSA-N 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
- DRDVZXDWVBGGMH-UHFFFAOYSA-N zinc;sulfide Chemical compound [S-2].[Zn+2] DRDVZXDWVBGGMH-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B11/00—Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
- C30B11/002—Crucibles or containers for supporting the melt
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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JP2010116944 | 2010-05-21 | ||
JP2010116944 | 2010-05-21 | ||
PCT/JP2011/061661 WO2011096597A1 (ja) | 2010-05-21 | 2011-05-20 | 結晶成長用熱分解窒化ホウ素製容器、およびそれを用いた半導体結晶の成長方法 |
Publications (2)
Publication Number | Publication Date |
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JPWO2011096597A1 JPWO2011096597A1 (ja) | 2013-06-13 |
JP5915178B2 true JP5915178B2 (ja) | 2016-05-11 |
Family
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Application Number | Title | Priority Date | Filing Date |
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JP2011552868A Active JP5915178B2 (ja) | 2010-05-21 | 2011-05-20 | 結晶成長用熱分解窒化ホウ素製容器、およびそれを用いた半導体結晶の成長方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP5915178B2 (zh) |
CN (1) | CN102906314B (zh) |
DE (1) | DE112011101731B4 (zh) |
WO (1) | WO2011096597A1 (zh) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6503642B2 (ja) * | 2014-06-09 | 2019-04-24 | 住友電気工業株式会社 | 結晶成長用坩堝 |
CN104562191B (zh) * | 2015-01-21 | 2017-06-06 | 中国工程物理研究院化工材料研究所 | 一种提纯固态半导体多晶材料的设备及方法 |
CN110016652B (zh) * | 2019-04-12 | 2020-04-24 | 山东国晶新材料有限公司 | 一种用于制作夹持杆的热解氮化硼板材的制备方法 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02188486A (ja) * | 1988-12-05 | 1990-07-24 | American Teleph & Telegr Co <Att> | 結晶の成長法 |
JPH06122504A (ja) * | 1992-07-02 | 1994-05-06 | Shin Etsu Chem Co Ltd | 熱分解窒化ほう素容器 |
JPH07206596A (ja) * | 1993-12-17 | 1995-08-08 | Gold Star Cable Co Ltd | ガリウムヒ素の単結晶成長用装置 |
JPH08268791A (ja) * | 1995-03-31 | 1996-10-15 | Hitachi Cable Ltd | 縦型結晶成長方法およびそれに使用される結晶成長容器 |
JPH09286700A (ja) * | 1995-03-16 | 1997-11-04 | Kobe Steel Ltd | 単結晶の製造方法および単結晶製造装置並びにそれに用いる原料収納容器 |
JP2000169277A (ja) * | 1998-12-03 | 2000-06-20 | Sumitomo Electric Ind Ltd | 結晶およびその製造方法ならびにその方法に用いられる結晶成長用るつぼ |
JP2010064936A (ja) * | 2008-09-12 | 2010-03-25 | Hitachi Cable Ltd | 半導体結晶の製造方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08333186A (ja) * | 1995-06-07 | 1996-12-17 | Hitachi Cable Ltd | 化合物半導体単結晶の製造方法及び製造装置 |
JP2868204B2 (ja) * | 1995-07-05 | 1999-03-10 | 株式会社秩父富士 | 四ほう酸リチウム単結晶の製造装置 |
JPH09110575A (ja) | 1995-10-19 | 1997-04-28 | Showa Denko Kk | 単結晶製造用ルツボ及び単結晶の製造方法 |
JPH11199362A (ja) | 1998-01-20 | 1999-07-27 | Kobe Steel Ltd | 化合物半導体単結晶の製造方法 |
JP3818311B1 (ja) * | 2005-03-23 | 2006-09-06 | 住友電気工業株式会社 | 結晶育成用坩堝 |
-
2011
- 2011-05-20 CN CN201180025287.8A patent/CN102906314B/zh active Active
- 2011-05-20 JP JP2011552868A patent/JP5915178B2/ja active Active
- 2011-05-20 WO PCT/JP2011/061661 patent/WO2011096597A1/ja active Application Filing
- 2011-05-20 DE DE112011101731.6T patent/DE112011101731B4/de active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02188486A (ja) * | 1988-12-05 | 1990-07-24 | American Teleph & Telegr Co <Att> | 結晶の成長法 |
JPH06122504A (ja) * | 1992-07-02 | 1994-05-06 | Shin Etsu Chem Co Ltd | 熱分解窒化ほう素容器 |
JPH07206596A (ja) * | 1993-12-17 | 1995-08-08 | Gold Star Cable Co Ltd | ガリウムヒ素の単結晶成長用装置 |
JPH09286700A (ja) * | 1995-03-16 | 1997-11-04 | Kobe Steel Ltd | 単結晶の製造方法および単結晶製造装置並びにそれに用いる原料収納容器 |
JPH08268791A (ja) * | 1995-03-31 | 1996-10-15 | Hitachi Cable Ltd | 縦型結晶成長方法およびそれに使用される結晶成長容器 |
JP2000169277A (ja) * | 1998-12-03 | 2000-06-20 | Sumitomo Electric Ind Ltd | 結晶およびその製造方法ならびにその方法に用いられる結晶成長用るつぼ |
JP2010064936A (ja) * | 2008-09-12 | 2010-03-25 | Hitachi Cable Ltd | 半導体結晶の製造方法 |
Also Published As
Publication number | Publication date |
---|---|
CN102906314B (zh) | 2015-09-30 |
DE112011101731T5 (de) | 2013-03-21 |
JPWO2011096597A1 (ja) | 2013-06-13 |
WO2011096597A1 (ja) | 2011-08-11 |
CN102906314A (zh) | 2013-01-30 |
DE112011101731B4 (de) | 2018-03-22 |
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