JP5850873B2 - 感活性光線性又は感放射線性樹脂組成物、それを用いたレジスト膜、パターン形成方法、及び電子デバイスの製造方法 - Google Patents
感活性光線性又は感放射線性樹脂組成物、それを用いたレジスト膜、パターン形成方法、及び電子デバイスの製造方法 Download PDFInfo
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- BJIPTTLGYTXQBB-UHFFFAOYSA-N C=Sc1ccccc1 Chemical compound C=Sc1ccccc1 BJIPTTLGYTXQBB-UHFFFAOYSA-N 0.000 description 1
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- OWMVSZAMULFTJU-UHFFFAOYSA-N OCCN(CCO)C(CO)(CO)CO Chemical compound OCCN(CCO)C(CO)(CO)CO OWMVSZAMULFTJU-UHFFFAOYSA-N 0.000 description 1
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| JP2013054400A JP5850873B2 (ja) | 2012-07-27 | 2013-03-15 | 感活性光線性又は感放射線性樹脂組成物、それを用いたレジスト膜、パターン形成方法、及び電子デバイスの製造方法 |
| PCT/JP2013/070833 WO2014017667A1 (en) | 2012-07-27 | 2013-07-25 | Actinic ray-sensitive or radiation-sensitive resin composition, resist film, using the same, pattern forming method, manufacturing method of electronic device, and electronic device |
| KR1020157002291A KR101776048B1 (ko) | 2012-07-27 | 2013-07-25 | 감활성광선성 또는 감방사선성 수지 조성물, 그것을 사용한 레지스트 막, 패턴형성방법, 전자 디바이스의 제조방법, 및 전자 디바이스 |
| TW102126777A TWI587086B (zh) | 2012-07-27 | 2013-07-26 | 感光化射線性或感放射線性樹脂組成物、使用其的抗蝕劑膜、圖案形成方法、電子元件的製造方法及電子元件 |
| US14/605,631 US9551933B2 (en) | 2012-07-27 | 2015-01-26 | Actinic ray-sensitive or radiation-sensitive resin composition, resist film, using the same, pattern forming method, manufacturing method of electronic device, and electronic device |
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| JP2013054400A JP5850873B2 (ja) | 2012-07-27 | 2013-03-15 | 感活性光線性又は感放射線性樹脂組成物、それを用いたレジスト膜、パターン形成方法、及び電子デバイスの製造方法 |
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| JP (1) | JP5850873B2 (OSRAM) |
| KR (1) | KR101776048B1 (OSRAM) |
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| WO (1) | WO2014017667A1 (OSRAM) |
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| JP4554665B2 (ja) * | 2006-12-25 | 2010-09-29 | 富士フイルム株式会社 | パターン形成方法、該パターン形成方法に用いられる多重現像用ポジ型レジスト組成物、該パターン形成方法に用いられるネガ現像用現像液及び該パターン形成方法に用いられるネガ現像用リンス液 |
| JP5830493B2 (ja) * | 2012-06-27 | 2015-12-09 | 富士フイルム株式会社 | 感活性光線性又は感放射線性樹脂組成物、それを用いた感活性光線性又は感放射線性膜、パターン形成方法及び半導体デバイスの製造方法 |
| JP5873826B2 (ja) * | 2012-07-27 | 2016-03-01 | 富士フイルム株式会社 | パターン形成方法、及び電子デバイスの製造方法 |
| JP5850873B2 (ja) * | 2012-07-27 | 2016-02-03 | 富士フイルム株式会社 | 感活性光線性又は感放射線性樹脂組成物、それを用いたレジスト膜、パターン形成方法、及び電子デバイスの製造方法 |
| KR101869312B1 (ko) | 2014-07-31 | 2018-06-20 | 후지필름 가부시키가이샤 | 패턴 형성 방법, 레지스트 패턴, 전자 디바이스의 제조 방법, 및 전자 디바이스 |
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| US9815930B2 (en) * | 2015-08-07 | 2017-11-14 | Rohm And Haas Electronic Materials Llc | Block copolymer and associated photoresist composition and method of forming an electronic device |
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| US6090526A (en) * | 1996-09-13 | 2000-07-18 | Shipley Company, L.L.C. | Polymers and photoresist compositions |
| TWI289238B (en) * | 2000-01-13 | 2007-11-01 | Fujifilm Corp | Negative resist compositions using for electronic irradiation |
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| JP5292377B2 (ja) * | 2010-10-05 | 2013-09-18 | 富士フイルム株式会社 | 感活性光線性又は感放射線性樹脂組成物、並びに、それを用いた感活性光線性又は感放射線性膜及びパターン形成方法 |
| JP5445430B2 (ja) * | 2010-11-15 | 2014-03-19 | 信越化学工業株式会社 | パターン形成方法 |
| JP5856991B2 (ja) * | 2012-05-21 | 2016-02-10 | 富士フイルム株式会社 | 化学増幅型レジスト組成物、ネガ型化学増幅型レジスト組成物、それを用いたレジスト膜、レジスト塗布マスクブランクス、フォトマスクの製造方法及びパターン形成方法、並びに、電子デバイスの製造方法 |
| JP5965855B2 (ja) * | 2012-07-27 | 2016-08-10 | 富士フイルム株式会社 | 感活性光線性又は感放射線性樹脂組成物、それを用いたレジスト膜、パターン形成方法、及び電子デバイスの製造方法、並びに樹脂 |
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| JP5894953B2 (ja) * | 2012-07-27 | 2016-03-30 | 富士フイルム株式会社 | 感活性光線性又は感放射線性樹脂組成物、それを用いたレジスト膜、パターン形成方法、及び電子デバイスの製造方法 |
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| KR101776048B1 (ko) | 2017-09-07 |
| TWI587086B (zh) | 2017-06-11 |
| US9551933B2 (en) | 2017-01-24 |
| WO2014017667A1 (en) | 2014-01-30 |
| TW201413375A (zh) | 2014-04-01 |
| KR20150028328A (ko) | 2015-03-13 |
| JP2014041327A (ja) | 2014-03-06 |
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