JP5726396B2 - 結像光学系 - Google Patents
結像光学系 Download PDFInfo
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- JP5726396B2 JP5726396B2 JP2008006616A JP2008006616A JP5726396B2 JP 5726396 B2 JP5726396 B2 JP 5726396B2 JP 2008006616 A JP2008006616 A JP 2008006616A JP 2008006616 A JP2008006616 A JP 2008006616A JP 5726396 B2 JP5726396 B2 JP 5726396B2
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- optical system
- mirror
- imaging optical
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Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/702—Reflective illumination, i.e. reflective optical elements other than folding mirrors, e.g. extreme ultraviolet [EUV] illumination systems
-
- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47J—KITCHEN EQUIPMENT; COFFEE MILLS; SPICE MILLS; APPARATUS FOR MAKING BEVERAGES
- A47J37/00—Baking; Roasting; Grilling; Frying
- A47J37/06—Roasters; Grills; Sandwich grills
- A47J37/067—Horizontally disposed broiling griddles
-
- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47J—KITCHEN EQUIPMENT; COFFEE MILLS; SPICE MILLS; APPARATUS FOR MAKING BEVERAGES
- A47J36/00—Parts, details or accessories of cooking-vessels
- A47J36/02—Selection of specific materials, e.g. heavy bottoms with copper inlay or with insulating inlay
- A47J36/025—Vessels with non-stick features, e.g. coatings
-
- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47J—KITCHEN EQUIPMENT; COFFEE MILLS; SPICE MILLS; APPARATUS FOR MAKING BEVERAGES
- A47J36/00—Parts, details or accessories of cooking-vessels
- A47J36/02—Selection of specific materials, e.g. heavy bottoms with copper inlay or with insulating inlay
- A47J36/04—Selection of specific materials, e.g. heavy bottoms with copper inlay or with insulating inlay the materials being non-metallic
-
- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47J—KITCHEN EQUIPMENT; COFFEE MILLS; SPICE MILLS; APPARATUS FOR MAKING BEVERAGES
- A47J37/00—Baking; Roasting; Grilling; Frying
- A47J37/06—Roasters; Grills; Sandwich grills
- A47J37/07—Roasting devices for outdoor use; Barbecues
- A47J37/0786—Accessories
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
- G02B17/0647—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using more than three curved mirrors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
- G02B17/0647—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using more than three curved mirrors
- G02B17/0663—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using more than three curved mirrors off-axis or unobscured systems in which not all of the mirrors share a common axis of rotational symmetry, e.g. at least one of the mirrors is warped, tilted or decentered with respect to the other elements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70191—Optical correction elements, filters or phase plates for controlling intensity, wavelength, polarisation, phase or the like
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70233—Optical aspects of catoptric systems, i.e. comprising only reflective elements, e.g. extreme ultraviolet [EUV] projection systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Food Science & Technology (AREA)
- Lenses (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Description
像平面は中心からのずれが最後から2番目の鏡の直径の1/5以下となるように、最後から2番目の鏡の背後に配列することができる。
結像光路内の最後からの2番目の鏡は、500mmを超える曲率半径を有するものとすることができる。
Claims (23)
- 像平面(8、57)内にある像視野(7)に、物体平面(4、58)内にある物体視野を結像させる、物体側から順に4つの鏡(59から62)又は6つの鏡(M1からM6)から構成され、前記鏡のうちの少なくとも1つは結像光(3)が通過するためのスルーホール(23)を備え、少なくとも1つの鏡(M1からM6、59から62)の反射面が、回転対称関数では記述できない自由曲面(27)であって、該自由曲面(27)に最も良く適合する回転対称面から最大で、少なくとも前記結像光(3)の波長の量に対応する値だけ異なる、自由曲面(27)の形態であることを特徴とする結像光学系(6、35、42、49、56、63、64、65、66)。
- 前記像平面(8、57)は、物体平面(4、58)に平行に配列されることを特徴とする請求項1に記載の結像光学系。
- 前記結像光(3)は、最大反射角24°で、鏡(M1からM6、59から62)により反射されることを特徴とする請求項1又は2のいずれかに記載の結像光学系。
- 前記結像光学系(6、35、42、49、56)内の前記結像光(3)の最大反射角(α)と前記像側の開口数の商は、34°であることを特徴とする請求項3に記載の結像光学系。
- 瞳平面(21)の領域内の前記結像光路内の最後の鏡(M6、62)の直前に配列されている鏡(M3、59)は、凸基本形状を有することを特徴とする請求項1から4のいずれか一項に記載の結像光学系。
- 複数の鏡のうちの少なくとも2つ(M1とM3、M1とM2、又はM2とM3)は前記主光線の負の角倍率を有することを特徴とする請求項1から5のいずれか一項に記載の結像光学系。
- 前記主光線の正の角倍率を有する鏡(M2)は、前記主光線の負の角倍率を有する2つの鏡(M1、M3)の間に配列されることを特徴とする請求項6に記載の結像光学系。
- 最後の鏡(M6、62)を通り、中心物体点の瞳の中心を通るように向けられた、中心結像光線は、前記像平面(8、57)に対して85°よりも大きい角度であることを特徴とする請求項1から7のいずれか一項に記載の結像光学系。
- 前記最後の鏡(M6、62)に向けられた前記結像光路は、前記鏡内の前記スルーホール(23)の領域内の中間像平面(22)内に中間像を有し、前記物体平面(4、58)と前記中間像平面(22)との間の光学系(M1からM4、59、60)の一部は少なくとも2.5×の縮小倍率レベルを有することを特徴とする請求項1から8のいずれか一項に記載の結像光学系。
- 結像光路内の最後から2番目の鏡となるように配列され、前記結像光を反射して前記最後の鏡(M6、62)に送る鏡(M5、61)は、結像光を通すためのスルーホール(24)を備え、前記像平面(7)は中心からのずれが前記最後から2番目の鏡(M5)の直径の1/5以下となるように、前記最後から2番目の鏡(M5)の背後に配列されることを特徴とする請求項1から9のいずれか一項に記載の結像光学系。
- 前記結像光路内の前記最後からの2番目の鏡(M5、61)は、500mmを超える曲率半径を有することを特徴とする請求項10に記載の結像光学系。
- 1mm 2 を超える像視野(7)を照らすことを特徴とする請求項1から11のいずれか一項に記載の結像光学系。
- 少なくとも0.4の像側の開口数を特徴とする請求項1から12のいずれか一項に記載の結像光学系。
- 像側でテレセントリックであることを特徴とする請求項1から13のいずれか一項に記載の結像光学系。
- 1mm未満の物体−像シフト(dois)を特徴とする請求項1から14のいずれか一項に記載の結像光学系。
- 前記物体視野と前記像視野との間の距離の40%を超える、前記物体平面(4、58)及び/又は前記像平面(8、57)に垂直な、互いから一定の距離にある隣接する鏡の少なくとも1つの対(M2とM3、M3とM4、M4とM5、M5とM6)を特徴とする請求項1から15のいずれか一項に記載の結像光学系。
- 少なくとも1つの鏡(M1からM4)は、使用される前記反射面から前記鏡に作用しない最も近い結像光路まで25mm未満の最小距離を有することを特徴とする請求項1から16のいずれか一項に記載の結像光学系。
- 前記結像光(3)を通過させる前記スルーホール(23)を備え、前記結像光路内の最後の鏡である、前記鏡(M6、62)により、前記結像光(3)が像視野(7)に反射されることを特徴とする請求項1から17のいずれか一項に記載の結像光学系。
- マイクロリソグラフィ用の投影露光装置であって、
請求項1から18のいずれか一項に記載の結像光学系(6、35、42、49)を備え、
前記照明光及び結像光(3)用の光源(2)を備え、
前記照明光(3)を前記結像光学系(6、35、42、49)の前記物体視野に当てるためのレンズ系(5)を備える投影露光装置。 - 10から30nmまでの範囲の波長を持つ前記照明光(3)を発生するための前記光源(2)が形成されることを特徴とする請求項19に記載の投影露光装置。
- 微細構造構成要素を生産するための方法であって、
レチクル(9)とウェハ(10)を用意するステップと、
請求項19又は20に記載の投影露光装置を使用することにより前記レチクル(9)上の構造を前記ウェハ(10)の感光層上に投影するステップと、
微細構造を前記ウェハ(10)上に形成するステップとを含む方法。 - 請求項1から18のいずれか一項に記載の結像光学系の物体平面と像平面を入れ換えた、顕微鏡レンズ(56)。
- 露光されている基板(10)を検査するための請求項22に記載の顕微鏡レンズ(56)。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102007003305.4 | 2007-01-17 | ||
DE102007003305 | 2007-01-17 |
Related Child Applications (1)
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JP2013202509A Division JP2014006553A (ja) | 2007-01-17 | 2013-09-27 | 結像光学系 |
Publications (2)
Publication Number | Publication Date |
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JP2008176326A JP2008176326A (ja) | 2008-07-31 |
JP5726396B2 true JP5726396B2 (ja) | 2015-06-03 |
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Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
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JP2008006616A Expired - Fee Related JP5726396B2 (ja) | 2007-01-17 | 2008-01-16 | 結像光学系 |
JP2013202509A Pending JP2014006553A (ja) | 2007-01-17 | 2013-09-27 | 結像光学系 |
JP2015195924A Pending JP2016006550A (ja) | 2007-01-17 | 2015-10-01 | 結像光学系 |
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JP2013202509A Pending JP2014006553A (ja) | 2007-01-17 | 2013-09-27 | 結像光学系 |
JP2015195924A Pending JP2016006550A (ja) | 2007-01-17 | 2015-10-01 | 結像光学系 |
Country Status (7)
Country | Link |
---|---|
US (5) | US8018650B2 (ja) |
EP (1) | EP1950594A1 (ja) |
JP (3) | JP5726396B2 (ja) |
KR (1) | KR101675158B1 (ja) |
CN (1) | CN101226272A (ja) |
SG (1) | SG144837A1 (ja) |
TW (2) | TWI576607B (ja) |
Families Citing this family (47)
Publication number | Priority date | Publication date | Assignee | Title |
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EP1950594A1 (de) | 2007-01-17 | 2008-07-30 | Carl Zeiss SMT AG | Abbildende Optik, Projektionsbelichtunsanlage für die Mikrolithographie mit einer derartigen abbildenden Optik, Verfahren zur Herstellung eines mikrostrukturierten Bauteils mit einer derartigen Projektionsbelichtungsanlage, durch das Herstellungsverfahren gefertigtes mikrostrukturiertes Bauelement sowie Verwendung einer derartigen abbildenden Optik |
WO2009052932A1 (en) * | 2007-10-26 | 2009-04-30 | Carl Zeiss Smt Ag | Imaging optical system and projection exposure installation for micro-lithography with an imaging optical system of this type |
DE102009000099A1 (de) * | 2009-01-09 | 2010-07-22 | Carl Zeiss Smt Ag | Mikrospiegelarray mit Doppelbiegebalken Anordnung und elektronischer Aktorik |
JP6112478B2 (ja) | 2008-03-20 | 2017-04-12 | カール・ツァイス・エスエムティー・ゲーエムベーハー | マイクロリソグラフィのための投影対物系 |
DE102008017645A1 (de) | 2008-04-04 | 2009-10-08 | Carl Zeiss Smt Ag | Vorrichtung zur mikrolithographischen Projektionsbelichtung sowie Vorrichtung zur Inspektion einer Oberfläche eines Substrats |
DE102008021341B4 (de) * | 2008-04-29 | 2015-05-07 | Carl Zeiss Ag | Anamorphotisches Abbildungsobjektiv |
DE102008033340B3 (de) * | 2008-07-16 | 2010-04-08 | Carl Zeiss Smt Ag | Abbildende Optik |
JP5489034B2 (ja) * | 2008-08-28 | 2014-05-14 | 国立大学法人東北大学 | 反射型投影光学装置 |
DE102008046699B4 (de) * | 2008-09-10 | 2014-03-13 | Carl Zeiss Smt Gmbh | Abbildende Optik |
JP5294804B2 (ja) * | 2008-10-31 | 2013-09-18 | 三菱電機株式会社 | 光学調整装置 |
US8248693B2 (en) * | 2008-11-04 | 2012-08-21 | Raytheon Company | Reflective triplet optical form with external rear aperture stop for cold shielding |
DE102009008644A1 (de) | 2009-02-12 | 2010-11-18 | Carl Zeiss Smt Ag | Abbildende Optik sowie Projektionsbelichtungsanlage für die Mikrolithografie mit einer derartigen abbildenden Optik |
CN102449526B (zh) * | 2009-03-30 | 2014-05-07 | 卡尔蔡司Smt有限责任公司 | 成像光学部件以及具有此类型的成像光学部件的用于微光刻的投射曝光设备 |
DE102009030501A1 (de) * | 2009-06-24 | 2011-01-05 | Carl Zeiss Smt Ag | Abbildende Optik zur Abbildung eines Objektfeldes in ein Bildfeld sowie Beleuchtungsoptik zur Ausleuchtung eines Objektfeldes |
WO2011073039A2 (en) | 2009-12-14 | 2011-06-23 | Carl Zeiss Smt Gmbh | Imaging optics |
DE102011005144A1 (de) * | 2010-03-17 | 2011-09-22 | Carl Zeiss Smt Gmbh | Reflektives optisches Element, Projektionssystem und Projektionsbelichtungsanlage |
DE102010029651A1 (de) | 2010-06-02 | 2011-12-08 | Carl Zeiss Smt Gmbh | Verfahren zum Betrieb einer Projektionsbelichtungsanlage für die Mikrolithographie mit Korrektur von durch rigorose Effekte der Maske induzierten Abbildungsfehlern |
JP5469778B2 (ja) * | 2010-04-22 | 2014-04-16 | カール・ツァイス・エスエムティー・ゲーエムベーハー | 結像光学系及びそのような結像光学系を有するマイクロリソグラフィのための投影露光装置 |
US8416407B2 (en) * | 2010-05-03 | 2013-04-09 | Raytheon Company | Optical spectrometer with wide field of view fore-optics |
DE102010029049B4 (de) | 2010-05-18 | 2014-03-13 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für ein Metrologiesystem für die Untersuchung eines Objekts mit EUV-Beleuchtungslicht sowie Metrologiesystem mit einer derartigen Beleuchtungsoptik |
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WO2011157643A1 (en) | 2010-06-15 | 2011-12-22 | Carl Zeiss Smt Gmbh | Mask for euv lithography, euv lithography system and method for optimising the imaging of a mask |
CN103038690B (zh) | 2010-07-30 | 2016-08-03 | 卡尔蔡司Smt有限责任公司 | 成像光学系统以及具有该类型成像光学系统的用于微光刻的投射曝光设备 |
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US8208200B2 (en) | 2012-06-26 |
TW201602632A (zh) | 2016-01-16 |
KR20080067968A (ko) | 2008-07-22 |
TWI576607B (zh) | 2017-04-01 |
US8967817B2 (en) | 2015-03-03 |
KR101675158B1 (ko) | 2016-11-22 |
US20080170310A1 (en) | 2008-07-17 |
US20110292367A1 (en) | 2011-12-01 |
US20140320838A1 (en) | 2014-10-30 |
SG144837A1 (en) | 2008-08-28 |
CN101226272A (zh) | 2008-07-23 |
US20120236282A1 (en) | 2012-09-20 |
JP2016006550A (ja) | 2016-01-14 |
US9298100B2 (en) | 2016-03-29 |
JP2014006553A (ja) | 2014-01-16 |
US8018650B2 (en) | 2011-09-13 |
JP2008176326A (ja) | 2008-07-31 |
TW200839286A (en) | 2008-10-01 |
US8810903B2 (en) | 2014-08-19 |
EP1950594A1 (de) | 2008-07-30 |
US20130342821A1 (en) | 2013-12-26 |
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