JP5707343B2 - 自動分析システム - Google Patents

自動分析システム Download PDF

Info

Publication number
JP5707343B2
JP5707343B2 JP2011551928A JP2011551928A JP5707343B2 JP 5707343 B2 JP5707343 B2 JP 5707343B2 JP 2011551928 A JP2011551928 A JP 2011551928A JP 2011551928 A JP2011551928 A JP 2011551928A JP 5707343 B2 JP5707343 B2 JP 5707343B2
Authority
JP
Japan
Prior art keywords
rack
unit
sample
transport
buffer unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2011551928A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2011093442A1 (ja
Inventor
修 渡部
修 渡部
正志 圷
正志 圷
仁 時枝
仁 時枝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Priority to JP2011551928A priority Critical patent/JP5707343B2/ja
Publication of JPWO2011093442A1 publication Critical patent/JPWO2011093442A1/ja
Application granted granted Critical
Publication of JP5707343B2 publication Critical patent/JP5707343B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/026—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having blocks or racks of reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00178—Special arrangements of analysers
    • G01N2035/00326—Analysers with modular structure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0401—Sample carriers, cuvettes or reaction vessels
    • G01N2035/0412—Block or rack elements with a single row of samples
    • G01N2035/0415—Block or rack elements with a single row of samples moving in two dimensions in a horizontal plane
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/046—General conveyor features
    • G01N2035/0462—Buffers [FIFO] or stacks [LIFO] for holding carriers between operations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G01N35/0095—Scheduling introducing urgent samples with priority, e.g. Short Turn Around Time Samples [STATS]

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Warehouses Or Storage Devices (AREA)
JP2011551928A 2010-01-28 2011-01-28 自動分析システム Active JP5707343B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011551928A JP5707343B2 (ja) 2010-01-28 2011-01-28 自動分析システム

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2010016142 2010-01-28
JP2010016142 2010-01-28
JP2011551928A JP5707343B2 (ja) 2010-01-28 2011-01-28 自動分析システム
PCT/JP2011/051739 WO2011093442A1 (ja) 2010-01-28 2011-01-28 自動分析システム

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2014261038A Division JP2015057617A (ja) 2010-01-28 2014-12-24 自動分析システムおよび分析方法

Publications (2)

Publication Number Publication Date
JPWO2011093442A1 JPWO2011093442A1 (ja) 2013-06-06
JP5707343B2 true JP5707343B2 (ja) 2015-04-30

Family

ID=44319423

Family Applications (3)

Application Number Title Priority Date Filing Date
JP2011551928A Active JP5707343B2 (ja) 2010-01-28 2011-01-28 自動分析システム
JP2014261038A Pending JP2015057617A (ja) 2010-01-28 2014-12-24 自動分析システムおよび分析方法
JP2016083331A Pending JP2016130742A (ja) 2010-01-28 2016-04-19 自動分析装置および分析方法

Family Applications After (2)

Application Number Title Priority Date Filing Date
JP2014261038A Pending JP2015057617A (ja) 2010-01-28 2014-12-24 自動分析システムおよび分析方法
JP2016083331A Pending JP2016130742A (ja) 2010-01-28 2016-04-19 自動分析装置および分析方法

Country Status (6)

Country Link
US (1) US9031794B2 (enExample)
EP (1) EP2530472B1 (enExample)
JP (3) JP5707343B2 (enExample)
CN (1) CN102725641B (enExample)
IN (1) IN2012DN06632A (enExample)
WO (1) WO2011093442A1 (enExample)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3133890U (ja) * 2007-05-16 2007-07-26 株式会社日立ハイテクノロジーズ 検体処理システム
US10094844B2 (en) * 2011-09-05 2018-10-09 Hitachi High-Technologies Corporation Automatic analyzer
JP6082018B2 (ja) 2011-11-07 2017-02-15 ベックマン コールター， インコーポレイテッド サンプルを処理するためのシステムおよび方法
US9835637B2 (en) 2012-04-02 2017-12-05 Siemens Healthcare Diagnostics Inc. Virtual sample queues
JP6305733B2 (ja) * 2013-11-15 2018-04-04 株式会社日立ハイテクノロジーズ 自動分析装置
EP3171180B1 (en) * 2014-07-18 2023-09-27 Hitachi High-Tech Corporation Automatic analysis device
CN106489077B (zh) * 2014-07-31 2018-12-04 株式会社日立高新技术 自动分析装置
WO2016136390A1 (ja) * 2015-02-24 2016-09-01 株式会社 日立ハイテクノロジーズ 自動分析装置
JP6863677B2 (ja) * 2016-02-01 2021-04-21 株式会社日立ハイテク 自動分析装置
CN106841649B (zh) * 2016-12-19 2019-12-24 杭州美康盛德医学检验实验室有限公司 生化分析仪样品回收系统
CN107132369B (zh) * 2017-07-14 2018-08-14 安图实验仪器(郑州)有限公司 兼具急诊、复测功能的样本管理及检测系统
CN111279198B (zh) * 2017-12-15 2021-07-06 株式会社日立高新技术 自动分析装置
CN110231491B (zh) * 2018-03-06 2024-03-22 深圳迈瑞生物医疗电子股份有限公司 样本分析系统及其节能控制方法
CN110398602B (zh) * 2018-04-25 2024-12-20 深圳迈瑞生物医疗电子股份有限公司 一种样本分析系统和一种样本分析系统控制方法
CN110398603A (zh) * 2018-04-25 2019-11-01 深圳迈瑞生物医疗电子股份有限公司 一种样本分析系统和一种样本分析系统控制方法
CN110967499B (zh) * 2018-09-30 2024-07-16 深圳迈瑞生物医疗电子股份有限公司 样本分析仪及其样本回收方法
FR3089303B1 (fr) * 2018-11-30 2022-09-30 Erba Diagnostics Ltd Unité de transport d’échantillons pour automate de diagnostic
CN111624356A (zh) * 2019-02-27 2020-09-04 深圳迈瑞生物医疗电子股份有限公司 一种样本分析系统、样本调度方法及存储介质
JP7311996B2 (ja) 2019-03-27 2023-07-20 シスメックス株式会社 検体測定装置および検体測定方法
WO2021138916A1 (zh) * 2020-01-10 2021-07-15 深圳迈瑞生物医疗电子股份有限公司 一种样本分析系统及其样本调度方法
WO2021153028A1 (ja) * 2020-01-30 2021-08-05 株式会社日立ハイテク 自動分析システム
WO2023021832A1 (ja) * 2021-08-18 2023-02-23 ユニマテック株式会社 架橋性アクリルゴム組成物
CN114966071B (zh) * 2022-08-02 2023-05-09 长春东元生物技术有限公司 运送扫描结构、运送方法、样本分析仪及故障排查方法

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2994578B2 (ja) 1995-07-20 1999-12-27 株式会社エイアンドティー 検体搬送システム
JP3031237B2 (ja) * 1996-04-10 2000-04-10 株式会社日立製作所 検体ラックの搬送方法及び検体ラックを搬送する自動分析装置
JP4058081B2 (ja) * 1997-04-10 2008-03-05 株式会社日立製作所 自動分析装置、その支援システム、および、記憶媒体
JP3496447B2 (ja) * 1997-04-10 2004-02-09 株式会社日立製作所 検体ラックの搬送方法及び自動分析装置
EP0902290B1 (en) * 1997-09-11 2008-11-05 Hitachi, Ltd. Sample handling system for automatic analysers
JPH11304812A (ja) * 1998-04-20 1999-11-05 Hitachi Ltd 検体処理システム
JP2000046839A (ja) * 1998-07-28 2000-02-18 Hitachi Ltd 検体処理システム
DE69928644T2 (de) * 1999-05-14 2006-07-27 F. Hoffmann-La Roche Ag Automatisches Analysesystem
JP2001153875A (ja) * 1999-11-29 2001-06-08 Olympus Optical Co Ltd 自動分析装置
US6825041B2 (en) * 2001-03-16 2004-11-30 Beckman Coulter, Inc. Method and system for automated immunochemistry analysis
JP3760800B2 (ja) * 2001-06-01 2006-03-29 株式会社日立製作所 検体処理システム
US6571934B1 (en) * 2001-11-14 2003-06-03 Dade Behring Inc. Bi-directional magnetic sample rack conveying system
US20040014227A1 (en) * 2002-01-04 2004-01-22 Frederick Erik D. Apparatus, method and computer program product for automated high-throughput sampling and data acquisition
JP2003232798A (ja) * 2003-02-21 2003-08-22 Hitachi Eng Co Ltd 検体仕分け装置
JP3931150B2 (ja) 2003-03-19 2007-06-13 株式会社日立ハイテクノロジーズ 自動分析装置
JP2006038881A (ja) 2005-10-20 2006-02-09 Hitachi Ltd 生体サンプルの自動分析システム
JP2008281453A (ja) * 2007-05-11 2008-11-20 Hitachi High-Technologies Corp 自動分析システム
JP5049769B2 (ja) * 2007-12-25 2012-10-17 株式会社日立ハイテクノロジーズ 自動分析装置および検体処理システム
JP2009180607A (ja) * 2008-01-30 2009-08-13 Olympus Corp 自動分析装置
JP2009198405A (ja) * 2008-02-23 2009-09-03 Horiba Ltd 加熱型試料分析装置
JP3147908U (ja) * 2008-09-03 2009-01-29 株式会社日立ハイテクノロジーズ 検体保冷システム
JP5372678B2 (ja) * 2009-09-17 2013-12-18 シスメックス株式会社 検体処理装置

Also Published As

Publication number Publication date
WO2011093442A1 (ja) 2011-08-04
IN2012DN06632A (enExample) 2015-10-23
JPWO2011093442A1 (ja) 2013-06-06
JP2016130742A (ja) 2016-07-21
CN102725641A (zh) 2012-10-10
EP2530472A1 (en) 2012-12-05
EP2530472A4 (en) 2018-01-24
CN102725641B (zh) 2015-09-23
US20120294765A1 (en) 2012-11-22
EP2530472B1 (en) 2021-11-17
US9031794B2 (en) 2015-05-12
JP2015057617A (ja) 2015-03-26

Similar Documents

Publication Publication Date Title
JP5707343B2 (ja) 自動分析システム
CN104520718B (zh) 检体检查自动化系统以及检体的搬送方法
JP5771726B2 (ja) 自動分析装置
CN103748472B (zh) 自动分析装置
JP5142976B2 (ja) 自動分析装置
JP5417351B2 (ja) 検体搬送システムおよびその制御方法
JP5872287B2 (ja) 自動分析装置
JPWO2013099538A1 (ja) 検体移戴装置及びシステム
JP6710558B2 (ja) 検体搬送システムおよび検体検査システム
JPWO2014119378A1 (ja) 遠心分離システム、検体前処理システム、制御方法
JP3760800B2 (ja) 検体処理システム
JP6499872B2 (ja) 検体移載装置及び検体搬送システム
JP6426569B2 (ja) 検体検査システム
US20220018861A1 (en) Automatic analysis device
JP6259654B2 (ja) 分類収納装置、分類収納装置を備えた前処理システム
JPWO2020044790A1 (ja) 自動分析装置
JP2015096833A (ja) 自動分析装置
CN115707519A (zh) 实验室系统中的实验室装置的掩蔽和测试样品容器的按路线输送
JP2011027661A (ja) 自動分析装置、及び検体前処理システム，検体搬送システム
JP2002347933A (ja) 搬送管理システム、搬送管理方法および搬送管理プログラム
CN120826612A (zh) 检体处理装置以及检体处理方法
JP2014153079A (ja) 検体分析システム

Legal Events

Date Code Title Description
A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20140204

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20140407

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20141014

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20141224

A911 Transfer to examiner for re-examination before appeal (zenchi)

Free format text: JAPANESE INTERMEDIATE CODE: A911

Effective date: 20150108

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20150203

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20150302

R150 Certificate of patent or registration of utility model

Ref document number: 5707343

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

S533 Written request for registration of change of name

Free format text: JAPANESE INTERMEDIATE CODE: R313533

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350