CN102725641B - 自动分析系统 - Google Patents

自动分析系统 Download PDF

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Publication number
CN102725641B
CN102725641B CN201180007235.8A CN201180007235A CN102725641B CN 102725641 B CN102725641 B CN 102725641B CN 201180007235 A CN201180007235 A CN 201180007235A CN 102725641 B CN102725641 B CN 102725641B
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China
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mentioned
rack
unit
sample
detection bodies
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CN201180007235.8A
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English (en)
Chinese (zh)
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CN102725641A (zh
Inventor
渡部修
圷正志
时枝仁
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/026—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having blocks or racks of reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00178—Special arrangements of analysers
    • G01N2035/00326—Analysers with modular structure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0401—Sample carriers, cuvettes or reaction vessels
    • G01N2035/0412—Block or rack elements with a single row of samples
    • G01N2035/0415—Block or rack elements with a single row of samples moving in two dimensions in a horizontal plane
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/046—General conveyor features
    • G01N2035/0462—Buffers [FIFO] or stacks [LIFO] for holding carriers between operations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G01N35/0095—Scheduling introducing urgent samples with priority, e.g. Short Turn Around Time Samples [STATS]

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Warehouses Or Storage Devices (AREA)
CN201180007235.8A 2010-01-28 2011-01-28 自动分析系统 Active CN102725641B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010016142 2010-01-28
JP2010-016142 2010-01-28
PCT/JP2011/051739 WO2011093442A1 (ja) 2010-01-28 2011-01-28 自動分析システム

Publications (2)

Publication Number Publication Date
CN102725641A CN102725641A (zh) 2012-10-10
CN102725641B true CN102725641B (zh) 2015-09-23

Family

ID=44319423

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201180007235.8A Active CN102725641B (zh) 2010-01-28 2011-01-28 自动分析系统

Country Status (6)

Country Link
US (1) US9031794B2 (enExample)
EP (1) EP2530472B1 (enExample)
JP (3) JP5707343B2 (enExample)
CN (1) CN102725641B (enExample)
IN (1) IN2012DN06632A (enExample)
WO (1) WO2011093442A1 (enExample)

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JP3133890U (ja) * 2007-05-16 2007-07-26 株式会社日立ハイテクノロジーズ 検体処理システム
US10094844B2 (en) * 2011-09-05 2018-10-09 Hitachi High-Technologies Corporation Automatic analyzer
JP6082018B2 (ja) 2011-11-07 2017-02-15 ベックマン コールター， インコーポレイテッド サンプルを処理するためのシステムおよび方法
US9835637B2 (en) 2012-04-02 2017-12-05 Siemens Healthcare Diagnostics Inc. Virtual sample queues
JP6305733B2 (ja) * 2013-11-15 2018-04-04 株式会社日立ハイテクノロジーズ 自動分析装置
EP3171180B1 (en) * 2014-07-18 2023-09-27 Hitachi High-Tech Corporation Automatic analysis device
CN106489077B (zh) * 2014-07-31 2018-12-04 株式会社日立高新技术 自动分析装置
WO2016136390A1 (ja) * 2015-02-24 2016-09-01 株式会社 日立ハイテクノロジーズ 自動分析装置
JP6863677B2 (ja) * 2016-02-01 2021-04-21 株式会社日立ハイテク 自動分析装置
CN106841649B (zh) * 2016-12-19 2019-12-24 杭州美康盛德医学检验实验室有限公司 生化分析仪样品回收系统
CN107132369B (zh) * 2017-07-14 2018-08-14 安图实验仪器(郑州)有限公司 兼具急诊、复测功能的样本管理及检测系统
CN111279198B (zh) * 2017-12-15 2021-07-06 株式会社日立高新技术 自动分析装置
CN110231491B (zh) * 2018-03-06 2024-03-22 深圳迈瑞生物医疗电子股份有限公司 样本分析系统及其节能控制方法
CN110398602B (zh) * 2018-04-25 2024-12-20 深圳迈瑞生物医疗电子股份有限公司 一种样本分析系统和一种样本分析系统控制方法
CN110398603A (zh) * 2018-04-25 2019-11-01 深圳迈瑞生物医疗电子股份有限公司 一种样本分析系统和一种样本分析系统控制方法
CN110967499B (zh) * 2018-09-30 2024-07-16 深圳迈瑞生物医疗电子股份有限公司 样本分析仪及其样本回收方法
FR3089303B1 (fr) * 2018-11-30 2022-09-30 Erba Diagnostics Ltd Unité de transport d’échantillons pour automate de diagnostic
CN111624356A (zh) * 2019-02-27 2020-09-04 深圳迈瑞生物医疗电子股份有限公司 一种样本分析系统、样本调度方法及存储介质
JP7311996B2 (ja) 2019-03-27 2023-07-20 シスメックス株式会社 検体測定装置および検体測定方法
WO2021138916A1 (zh) * 2020-01-10 2021-07-15 深圳迈瑞生物医疗电子股份有限公司 一种样本分析系统及其样本调度方法
WO2021153028A1 (ja) * 2020-01-30 2021-08-05 株式会社日立ハイテク 自動分析システム
WO2023021832A1 (ja) * 2021-08-18 2023-02-23 ユニマテック株式会社 架橋性アクリルゴム組成物
CN114966071B (zh) * 2022-08-02 2023-05-09 长春东元生物技术有限公司 运送扫描结构、运送方法、样本分析仪及故障排查方法

Citations (6)

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Publication number Priority date Publication date Assignee Title
JP2001153875A (ja) * 1999-11-29 2001-06-08 Olympus Optical Co Ltd 自動分析装置
US6290907B1 (en) * 1997-09-11 2001-09-18 Hitachi, Ltd. Sample handling system
EP1460431A2 (en) * 2003-03-19 2004-09-22 Hitachi High-Technologies Corporation Automatic analyzer
JP2006343351A (ja) * 1997-04-10 2006-12-21 Hitachi Ltd 自動分析装置およびその支援システム
JP2008281453A (ja) * 2007-05-11 2008-11-20 Hitachi High-Technologies Corp 自動分析システム
JP2009150859A (ja) * 2007-12-25 2009-07-09 Hitachi High-Technologies Corp 自動分析装置および検体処理システム

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JP3031237B2 (ja) * 1996-04-10 2000-04-10 株式会社日立製作所 検体ラックの搬送方法及び検体ラックを搬送する自動分析装置
JP3496447B2 (ja) * 1997-04-10 2004-02-09 株式会社日立製作所 検体ラックの搬送方法及び自動分析装置
JPH11304812A (ja) * 1998-04-20 1999-11-05 Hitachi Ltd 検体処理システム
JP2000046839A (ja) * 1998-07-28 2000-02-18 Hitachi Ltd 検体処理システム
DE69928644T2 (de) * 1999-05-14 2006-07-27 F. Hoffmann-La Roche Ag Automatisches Analysesystem
US6825041B2 (en) * 2001-03-16 2004-11-30 Beckman Coulter, Inc. Method and system for automated immunochemistry analysis
JP3760800B2 (ja) * 2001-06-01 2006-03-29 株式会社日立製作所 検体処理システム
US6571934B1 (en) * 2001-11-14 2003-06-03 Dade Behring Inc. Bi-directional magnetic sample rack conveying system
US20040014227A1 (en) * 2002-01-04 2004-01-22 Frederick Erik D. Apparatus, method and computer program product for automated high-throughput sampling and data acquisition
JP2003232798A (ja) * 2003-02-21 2003-08-22 Hitachi Eng Co Ltd 検体仕分け装置
JP2006038881A (ja) 2005-10-20 2006-02-09 Hitachi Ltd 生体サンプルの自動分析システム
JP2009180607A (ja) * 2008-01-30 2009-08-13 Olympus Corp 自動分析装置
JP2009198405A (ja) * 2008-02-23 2009-09-03 Horiba Ltd 加熱型試料分析装置
JP3147908U (ja) * 2008-09-03 2009-01-29 株式会社日立ハイテクノロジーズ 検体保冷システム
JP5372678B2 (ja) * 2009-09-17 2013-12-18 シスメックス株式会社 検体処理装置

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Publication number Priority date Publication date Assignee Title
JP2006343351A (ja) * 1997-04-10 2006-12-21 Hitachi Ltd 自動分析装置およびその支援システム
US6290907B1 (en) * 1997-09-11 2001-09-18 Hitachi, Ltd. Sample handling system
JP2001153875A (ja) * 1999-11-29 2001-06-08 Olympus Optical Co Ltd 自動分析装置
EP1460431A2 (en) * 2003-03-19 2004-09-22 Hitachi High-Technologies Corporation Automatic analyzer
JP2008281453A (ja) * 2007-05-11 2008-11-20 Hitachi High-Technologies Corp 自動分析システム
JP2009150859A (ja) * 2007-12-25 2009-07-09 Hitachi High-Technologies Corp 自動分析装置および検体処理システム

Also Published As

Publication number Publication date
JP5707343B2 (ja) 2015-04-30
WO2011093442A1 (ja) 2011-08-04
IN2012DN06632A (enExample) 2015-10-23
JPWO2011093442A1 (ja) 2013-06-06
JP2016130742A (ja) 2016-07-21
CN102725641A (zh) 2012-10-10
EP2530472A1 (en) 2012-12-05
EP2530472A4 (en) 2018-01-24
US20120294765A1 (en) 2012-11-22
EP2530472B1 (en) 2021-11-17
US9031794B2 (en) 2015-05-12
JP2015057617A (ja) 2015-03-26

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