JP5696135B2 - ウエハーハンドリングシステムおよびその方法 - Google Patents
ウエハーハンドリングシステムおよびその方法 Download PDFInfo
- Publication number
- JP5696135B2 JP5696135B2 JP2012502404A JP2012502404A JP5696135B2 JP 5696135 B2 JP5696135 B2 JP 5696135B2 JP 2012502404 A JP2012502404 A JP 2012502404A JP 2012502404 A JP2012502404 A JP 2012502404A JP 5696135 B2 JP5696135 B2 JP 5696135B2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- station
- wafers
- slot
- carrier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims description 26
- 235000012431 wafers Nutrition 0.000 claims description 311
- 238000012545 processing Methods 0.000 claims description 28
- 238000012546 transfer Methods 0.000 claims description 20
- 230000005484 gravity Effects 0.000 claims description 19
- 241000405965 Scomberomorus brasiliensis Species 0.000 claims 1
- 239000012636 effector Substances 0.000 description 40
- 238000009792 diffusion process Methods 0.000 description 16
- 238000004519 manufacturing process Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 8
- 238000012423 maintenance Methods 0.000 description 7
- 239000000463 material Substances 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 230000032258 transport Effects 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000036316 preload Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000007723 transport mechanism Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
- H01L21/67781—Batch transfer of wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/6735—Closed carriers
- H01L21/67383—Closed carriers characterised by substrate supports
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67766—Mechanical parts of transfer devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68771—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by supporting more than one semiconductor substrate
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/137—Associated with semiconductor wafer handling including means for charging or discharging wafer cassette
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US16463909P | 2009-03-30 | 2009-03-30 | |
| US61/164,639 | 2009-03-30 | ||
| PCT/CA2010/000487 WO2010111781A1 (en) | 2009-03-30 | 2010-03-30 | Systems and methods for handling wafers |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012522385A JP2012522385A (ja) | 2012-09-20 |
| JP2012522385A5 JP2012522385A5 (enExample) | 2013-05-23 |
| JP5696135B2 true JP5696135B2 (ja) | 2015-04-08 |
Family
ID=42827441
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012502404A Expired - Fee Related JP5696135B2 (ja) | 2009-03-30 | 2010-03-30 | ウエハーハンドリングシステムおよびその方法 |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US9184079B2 (enExample) |
| EP (1) | EP2415074B1 (enExample) |
| JP (1) | JP5696135B2 (enExample) |
| KR (1) | KR101695434B1 (enExample) |
| CN (1) | CN102369595B (enExample) |
| CA (1) | CA2756831C (enExample) |
| MY (1) | MY161955A (enExample) |
| TW (1) | TW201044487A (enExample) |
| WO (1) | WO2010111781A1 (enExample) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8571396B2 (en) * | 2006-06-26 | 2013-10-29 | Tp Solar, Inc. | Rapid thermal firing IR conveyor furnace having high intensity heating section |
| US9301340B2 (en) | 2006-06-26 | 2016-03-29 | Tp Solar, Inc. | IR conveyor furnace having single belt with multiple independently controlled processing lanes |
| US8828776B2 (en) | 2009-04-16 | 2014-09-09 | Tp Solar, Inc. | Diffusion furnaces employing ultra low mass transport systems and methods of wafer rapid diffusion processing |
| WO2010121190A1 (en) * | 2009-04-16 | 2010-10-21 | Tp Solar, Inc. A Corporation Of Ca | Diffusion furnaces employing ultra low mass transport systems and methods of wafer rapid diffusion processing |
| US20120181265A1 (en) * | 2010-07-15 | 2012-07-19 | Despatch Industries Limited Partnership | Firing furnace configuration for thermal processing system |
| US8829396B2 (en) | 2010-11-30 | 2014-09-09 | Tp Solar, Inc. | Finger drives for IR wafer processing equipment conveyors and lateral differential temperature profile methods |
| CN103250230B (zh) | 2010-12-13 | 2016-08-31 | Tp太阳能公司 | 掺杂剂涂布系统以及涂布蒸气化掺杂化合物于光伏太阳能晶圆的方法 |
| US8816253B2 (en) | 2011-01-21 | 2014-08-26 | Tp Solar, Inc. | Dual independent transport systems for IR conveyor furnaces and methods of firing thin work pieces |
| BE1019301A5 (nl) * | 2011-08-31 | 2012-05-08 | Develop Mechanics Nv | Inrichting voor het hanteren van halfgeleiderwafers. |
| CN103187347B (zh) * | 2011-12-29 | 2016-10-05 | 中建材浚鑫科技股份有限公司 | 一种卸载电池硅片的方法 |
| US10755960B2 (en) * | 2014-11-04 | 2020-08-25 | Brooks Automation, Inc. | Wafer aligner |
| CN104409403A (zh) * | 2014-11-05 | 2015-03-11 | 江阴方艾机器人有限公司 | 光伏扩散工序中石英舟装载硅片工艺 |
| DE102014224588B4 (de) * | 2014-12-02 | 2019-08-01 | Heraeus Deutschland GmbH & Co. KG | Verfahren zum Herstellen eines plattenförmigen metallisierten Keramik-Substrats, Träger zum Herstellen des Substrats und Verwendung des Trägers |
| JP6688714B2 (ja) * | 2016-09-29 | 2020-04-28 | 株式会社Screenホールディングス | 基板配列装置および基板配列方法 |
| JP6811951B2 (ja) * | 2017-02-03 | 2021-01-13 | 株式会社ディスコ | 搬送機構 |
| US10510573B2 (en) * | 2017-11-14 | 2019-12-17 | Taiwan Semiconductor Manufacturing Co., Ltd. | Loading apparatus and operating method thereof |
| CN108382782B (zh) * | 2018-01-09 | 2021-02-12 | 惠科股份有限公司 | 一种基板的仓储方法和仓储系统 |
| TWI707753B (zh) * | 2020-05-07 | 2020-10-21 | 鈦昇科技股份有限公司 | 自動化手臂更換機構 |
| US20230012325A1 (en) * | 2021-07-09 | 2023-01-12 | Taiwan Semiconductor Manufacturing Company, Ltd. | Robot magazine and tray load and unload system |
Family Cites Families (39)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US4609103A (en) * | 1984-08-27 | 1986-09-02 | Texas Instruments Incorporated | Semiconductor slice cassette carrier |
| DE3681799D1 (de) * | 1985-01-22 | 1991-11-14 | Applied Materials Inc | Halbleiter-bearbeitungseinrichtung. |
| US4856957A (en) * | 1988-01-11 | 1989-08-15 | Mactronix, Inc. | Semiconductor wafer transfer apparatus with back-to-back positioning and separation |
| JPH0831510B2 (ja) * | 1988-03-09 | 1996-03-27 | 東京エレクトロン東北株式会社 | ウエハ移送方法 |
| US4840530A (en) * | 1988-05-23 | 1989-06-20 | Nguyen Loc H | Transfer apparatus for semiconductor wafers |
| FR2656599B1 (fr) * | 1989-12-29 | 1992-03-27 | Commissariat Energie Atomique | Dispositif de rangement d'objets plats dans une cassette avec rayonnages intermediaires. |
| US5154730A (en) * | 1991-05-17 | 1992-10-13 | Materials Research Corporation | Semiconductor wafer processing module having an inclined rotating wafer handling turret and a method of using the module |
| JPH05226458A (ja) * | 1992-02-13 | 1993-09-03 | Akuro Tec:Kk | シリコンウェハーの移し替え方法 |
| US5636960A (en) * | 1992-07-29 | 1997-06-10 | Tokyo Electron Limited | Apparatus for detecting and aligning a substrate |
| US5697748A (en) * | 1993-07-15 | 1997-12-16 | Applied Materials, Inc. | Wafer tray and ceramic blade for semiconductor processing apparatus |
| US6833035B1 (en) * | 1994-04-28 | 2004-12-21 | Semitool, Inc. | Semiconductor processing system with wafer container docking and loading station |
| TW319751B (enExample) * | 1995-05-18 | 1997-11-11 | Toshiba Co Ltd | |
| JPH09107013A (ja) * | 1995-10-09 | 1997-04-22 | Dainippon Screen Mfg Co Ltd | 基板受け渡し装置 |
| US5738574A (en) * | 1995-10-27 | 1998-04-14 | Applied Materials, Inc. | Continuous processing system for chemical mechanical polishing |
| US6286688B1 (en) * | 1996-04-03 | 2001-09-11 | Scp Global Technologies, Inc. | Compliant silicon wafer handling system |
| JP3223847B2 (ja) * | 1996-06-28 | 2001-10-29 | 住友金属工業株式会社 | シリコン単結晶ウェーハの熱処理方法と製造方法 |
| CH697146A5 (de) * | 1996-10-09 | 2008-05-15 | Tec Sem Ag | Greifvorrichtung zur Handhabung von Wafern. |
| JP3880131B2 (ja) * | 1997-05-07 | 2007-02-14 | 信越ポリマー株式会社 | 基板収納容器 |
| US5988971A (en) * | 1997-07-09 | 1999-11-23 | Ade Optical Systems Corporation | Wafer transfer robot |
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| JP3510463B2 (ja) * | 1997-11-10 | 2004-03-29 | 東京エレクトロン株式会社 | 基板の整列装置及び整列方法 |
| US6368040B1 (en) * | 1998-02-18 | 2002-04-09 | Tokyo Electron Limited | Apparatus for and method of transporting substrates to be processed |
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| JP2005510055A (ja) * | 2001-11-13 | 2005-04-14 | エフエスアイ インターナショナル インコーポレイテッド | マイクロエレクトロニクス基板の自動処理用の低減フットプリントツール |
| US7367773B2 (en) * | 2002-05-09 | 2008-05-06 | Maxtor Corporation | Apparatus for combining or separating disk pairs simultaneously |
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| JP2005123642A (ja) | 2004-12-06 | 2005-05-12 | Dainippon Screen Mfg Co Ltd | 搬送機構および搬送方法 |
| WO2006070630A1 (ja) * | 2004-12-28 | 2006-07-06 | Tokyo Electron Limited | 基板処理装置および基板搬送方法 |
| JP4688637B2 (ja) * | 2005-10-28 | 2011-05-25 | 東京エレクトロン株式会社 | 基板処理装置及びバッチ編成装置並びにバッチ編成方法及びバッチ編成プログラム |
| JP4999414B2 (ja) * | 2006-09-27 | 2012-08-15 | 信越ポリマー株式会社 | 基板の取り扱い装置及び基板の取り扱い方法 |
| JP2008124091A (ja) * | 2006-11-09 | 2008-05-29 | Fuji Electric Device Technology Co Ltd | 半導体装置の処理装置および処理方法 |
| EP1925577B1 (de) * | 2006-11-24 | 2009-07-08 | Jonas & Redmann Automationstechnik GmbH | Verfahren zum Bilden einer in einem Prozessboot zu positionierenden Back-to-Back Wafercharge und Handhabungssystem zum Bilden der Back-to-Back Wafercharge |
| JP4828503B2 (ja) * | 2007-10-16 | 2011-11-30 | 東京エレクトロン株式会社 | 基板処理装置、基板搬送方法、コンピュータプログラムおよび記憶媒体 |
-
2010
- 2010-03-30 MY MYPI2011004600A patent/MY161955A/en unknown
- 2010-03-30 US US12/750,095 patent/US9184079B2/en active Active
- 2010-03-30 TW TW099109588A patent/TW201044487A/zh unknown
- 2010-03-30 EP EP10757971.6A patent/EP2415074B1/en active Active
- 2010-03-30 CN CN201080014631.9A patent/CN102369595B/zh active Active
- 2010-03-30 KR KR1020117025756A patent/KR101695434B1/ko not_active Expired - Fee Related
- 2010-03-30 CA CA2756831A patent/CA2756831C/en active Active
- 2010-03-30 JP JP2012502404A patent/JP5696135B2/ja not_active Expired - Fee Related
- 2010-03-30 WO PCT/CA2010/000487 patent/WO2010111781A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| CA2756831A1 (en) | 2010-10-07 |
| EP2415074A4 (en) | 2012-02-22 |
| CN102369595A (zh) | 2012-03-07 |
| CN102369595B (zh) | 2016-03-23 |
| TW201044487A (en) | 2010-12-16 |
| EP2415074A1 (en) | 2012-02-08 |
| KR20120024568A (ko) | 2012-03-14 |
| MY161955A (en) | 2017-05-15 |
| KR101695434B1 (ko) | 2017-01-23 |
| CA2756831C (en) | 2017-12-05 |
| US9184079B2 (en) | 2015-11-10 |
| EP2415074B1 (en) | 2018-10-24 |
| JP2012522385A (ja) | 2012-09-20 |
| WO2010111781A1 (en) | 2010-10-07 |
| US20100272544A1 (en) | 2010-10-28 |
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