JP5481724B2 - 半導体素子内蔵基板 - Google Patents
半導体素子内蔵基板 Download PDFInfo
- Publication number
- JP5481724B2 JP5481724B2 JP2009291632A JP2009291632A JP5481724B2 JP 5481724 B2 JP5481724 B2 JP 5481724B2 JP 2009291632 A JP2009291632 A JP 2009291632A JP 2009291632 A JP2009291632 A JP 2009291632A JP 5481724 B2 JP5481724 B2 JP 5481724B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- dam
- semiconductor element
- pad
- solder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/01—Manufacture or treatment
- H10W70/05—Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/65—Shapes or dispositions of interconnections
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/67—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
- H10W70/68—Shapes or dispositions thereof
- H10W70/685—Shapes or dispositions thereof comprising multiple insulating layers
- H10W70/687—Shapes or dispositions thereof comprising multiple insulating layers characterized by the outer layers being for protection, e.g. solder masks, or for protection against chemical or mechanical damage
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/401—Package configurations characterised by multiple insulating or insulated package substrates, interposers or RDLs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/63—Vias, e.g. via plugs
- H10W70/635—Through-vias
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/381—Auxiliary members
- H10W72/387—Flow barriers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
- H10W74/012—Manufacture or treatment of encapsulations on active surfaces of flip-chip devices, e.g. forming underfills
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/15—Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/722—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Non-Metallic Protective Coatings For Printed Circuits (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009291632A JP5481724B2 (ja) | 2009-12-24 | 2009-12-24 | 半導体素子内蔵基板 |
| US12/971,596 US8330277B2 (en) | 2009-12-24 | 2010-12-17 | Semiconductor element built-in device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009291632A JP5481724B2 (ja) | 2009-12-24 | 2009-12-24 | 半導体素子内蔵基板 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011134818A JP2011134818A (ja) | 2011-07-07 |
| JP2011134818A5 JP2011134818A5 (https=) | 2012-11-08 |
| JP5481724B2 true JP5481724B2 (ja) | 2014-04-23 |
Family
ID=44186466
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009291632A Active JP5481724B2 (ja) | 2009-12-24 | 2009-12-24 | 半導体素子内蔵基板 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US8330277B2 (https=) |
| JP (1) | JP5481724B2 (https=) |
Families Citing this family (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012114173A (ja) * | 2010-11-23 | 2012-06-14 | Shinko Electric Ind Co Ltd | 半導体装置の製造方法及び半導体装置 |
| KR101811301B1 (ko) * | 2011-05-24 | 2017-12-26 | 삼성전자주식회사 | 반도체 패키지 |
| US8806420B2 (en) | 2011-09-13 | 2014-08-12 | Alcatel Lucent | In-grid on-device decoupling for BGA |
| JP5893387B2 (ja) * | 2011-12-22 | 2016-03-23 | 新光電気工業株式会社 | 電子装置及びその製造方法 |
| JP6051577B2 (ja) * | 2012-04-20 | 2016-12-27 | セイコーエプソン株式会社 | 電子デバイスおよび電子機器 |
| KR20140019173A (ko) * | 2012-08-06 | 2014-02-14 | 삼성전기주식회사 | 솔더 코팅볼을 이용한 패키징 방법 및 이에 따라 제조된 패키지 |
| KR102694901B1 (ko) * | 2012-11-20 | 2024-08-16 | 앰코 테크놀로지 싱가포르 홀딩 피티이. 엘티디. | 반도체 패키지 및 그 제조 방법 |
| US9799592B2 (en) | 2013-11-19 | 2017-10-24 | Amkor Technology, Inc. | Semicondutor device with through-silicon via-less deep wells |
| US9497861B2 (en) * | 2012-12-06 | 2016-11-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Methods and apparatus for package with interposers |
| KR20140082444A (ko) * | 2012-12-24 | 2014-07-02 | 삼성전기주식회사 | 인쇄회로기판 및 인쇄회로기판 제조 방법 |
| US8928134B2 (en) * | 2012-12-28 | 2015-01-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package on package bonding structure and method for forming the same |
| US9313881B2 (en) * | 2013-01-11 | 2016-04-12 | Qualcomm Incorporated | Through mold via relief gutter on molded laser package (MLP) packages |
| JP6230794B2 (ja) * | 2013-01-31 | 2017-11-15 | 新光電気工業株式会社 | 電子部品内蔵基板及びその製造方法 |
| TWI533421B (zh) | 2013-06-14 | 2016-05-11 | 日月光半導體製造股份有限公司 | 半導體封裝結構及半導體製程 |
| JP6415111B2 (ja) * | 2013-06-20 | 2018-10-31 | キヤノン株式会社 | プリント回路板、半導体装置の接合構造及びプリント回路板の製造方法 |
| US9659891B2 (en) * | 2013-09-09 | 2017-05-23 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor device having a boundary structure, a package on package structure, and a method of making |
| US9299650B1 (en) * | 2013-09-25 | 2016-03-29 | Stats Chippac Ltd. | Integrated circuit packaging system with single metal layer interposer and method of manufacture thereof |
| US9698079B2 (en) * | 2014-01-03 | 2017-07-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | Barrier structures between external electrical connectors |
| US9362161B2 (en) | 2014-03-20 | 2016-06-07 | Stats Chippac, Ltd. | Semiconductor device and method of forming 3D dual side die embedded build-up semiconductor package |
| JP6152816B2 (ja) * | 2014-03-26 | 2017-06-28 | ソニー株式会社 | 半導体デバイス、表示パネル、表示装置、電子装置、および、半導体デバイスの製造方法 |
| US9373585B2 (en) | 2014-09-17 | 2016-06-21 | Invensas Corporation | Polymer member based interconnect |
| US10032652B2 (en) * | 2014-12-05 | 2018-07-24 | Advanced Semiconductor Engineering, Inc. | Semiconductor package having improved package-on-package interconnection |
| US9972557B2 (en) * | 2014-12-11 | 2018-05-15 | Stmicroelectronics Pte Ltd | Integrated circuit (IC) package with a solder receiving area and associated methods |
| JP2016115884A (ja) * | 2014-12-17 | 2016-06-23 | 凸版印刷株式会社 | 半導体装置及びその製造方法 |
| US9597752B2 (en) | 2015-03-13 | 2017-03-21 | Mediatek Inc. | Composite solder ball, semiconductor package using the same, semiconductor device using the same and manufacturing method thereof |
| US9666514B2 (en) | 2015-04-14 | 2017-05-30 | Invensas Corporation | High performance compliant substrate |
| EP4362378A3 (en) | 2015-08-13 | 2024-07-03 | Huawei Technologies Co., Ltd. | Uplink reference signal transmission method, user terminal, and base station |
| US10790426B2 (en) * | 2016-04-01 | 2020-09-29 | Nichia Corporation | Method of manufacturing light emitting element mounting base member, method of manufacturing light emitting device using the light emitting element mounting base member, light emitting element mounting base member, and light emitting device using the light emitting element mounting base member |
| DE102016107792B4 (de) * | 2016-04-27 | 2022-01-27 | Infineon Technologies Ag | Packung und halbfertiges Produkt mit vertikaler Verbindung zwischen Träger und Klammer sowie Verfahren zum Herstellen einer Packung und einer Charge von Packungen |
| US10204889B2 (en) | 2016-11-28 | 2019-02-12 | Taiwan Semiconductor Manufacturing Co., Ltd. | Package structure and method of forming thereof |
| US11201066B2 (en) * | 2017-01-31 | 2021-12-14 | Skyworks Solutions, Inc. | Control of under-fill using a dam on a packaging substrate for a dual-sided ball grid array package |
| US10515936B1 (en) * | 2018-06-25 | 2019-12-24 | Powertech Technology Inc. | Package structure and manufacturing method thereof |
| WO2020024115A1 (zh) * | 2018-07-31 | 2020-02-06 | 华为技术有限公司 | 一种芯片组合件及终端设备 |
| JP7163162B2 (ja) * | 2018-12-10 | 2022-10-31 | 新光電気工業株式会社 | 半導体パッケージ |
| KR20230063230A (ko) * | 2021-11-01 | 2023-05-09 | 삼성전자주식회사 | 반도체 패키지 |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5239373A (en) * | 1975-09-25 | 1977-03-26 | Hitachi Ltd | Dam for prevention of flowing of solder material |
| JPS6379677U (https=) * | 1986-11-12 | 1988-05-26 | ||
| JPH0750759B2 (ja) * | 1988-07-01 | 1995-05-31 | シャープ株式会社 | 半導体装置 |
| JPH04196332A (ja) * | 1990-11-28 | 1992-07-16 | Hitachi Ltd | 電子回路装置 |
| JPH07212018A (ja) * | 1994-01-18 | 1995-08-11 | Matsushita Electric Ind Co Ltd | 基 板 |
| JPH10163599A (ja) * | 1996-12-03 | 1998-06-19 | Nec Corp | プリント配線板 |
| JP2001135907A (ja) * | 1999-11-10 | 2001-05-18 | Oki Electric Ind Co Ltd | Icパッケージ取り付け構造 |
| JP2001320168A (ja) * | 2000-03-02 | 2001-11-16 | Murata Mfg Co Ltd | 配線基板およびその製造方法、ならびにそれを用いた電子装置 |
| JP2004079872A (ja) | 2002-08-21 | 2004-03-11 | Alps Electric Co Ltd | 電子回路ユニットの半田付け構造 |
| JP4094982B2 (ja) | 2003-04-15 | 2008-06-04 | ハリマ化成株式会社 | はんだ析出方法およびはんだバンプ形成方法 |
| EP2290682A3 (en) * | 2005-12-14 | 2011-10-05 | Shinko Electric Industries Co., Ltd. | Package with a chip embedded between two substrates and method of manufacturing the same |
| JP4182144B2 (ja) * | 2005-12-14 | 2008-11-19 | 新光電気工業株式会社 | チップ内蔵基板の製造方法 |
| US8133762B2 (en) * | 2009-03-17 | 2012-03-13 | Stats Chippac, Ltd. | Semiconductor device and method of providing z-interconnect conductive pillars with inner polymer core |
| JP2008147458A (ja) * | 2006-12-11 | 2008-06-26 | Nec Electronics Corp | プリント配線板およびその製造方法 |
| JP5068990B2 (ja) * | 2006-12-26 | 2012-11-07 | 新光電気工業株式会社 | 電子部品内蔵基板 |
| SG149710A1 (en) * | 2007-07-12 | 2009-02-27 | Micron Technology Inc | Interconnects for packaged semiconductor devices and methods for manufacturing such devices |
-
2009
- 2009-12-24 JP JP2009291632A patent/JP5481724B2/ja active Active
-
2010
- 2010-12-17 US US12/971,596 patent/US8330277B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2011134818A (ja) | 2011-07-07 |
| US8330277B2 (en) | 2012-12-11 |
| US20110156264A1 (en) | 2011-06-30 |
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