JP5401000B2 - アモルファス粒子集合体 - Google Patents
アモルファス粒子集合体 Download PDFInfo
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- JP5401000B2 JP5401000B2 JP2003521408A JP2003521408A JP5401000B2 JP 5401000 B2 JP5401000 B2 JP 5401000B2 JP 2003521408 A JP2003521408 A JP 2003521408A JP 2003521408 A JP2003521408 A JP 2003521408A JP 5401000 B2 JP5401000 B2 JP 5401000B2
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- CKLHRQNQYIJFFX-UHFFFAOYSA-K ytterbium(III) chloride Chemical compound [Cl-].[Cl-].[Cl-].[Yb+3] CKLHRQNQYIJFFX-UHFFFAOYSA-K 0.000 description 1
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Images
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- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
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- Powder Metallurgy (AREA)
Description
本願は、同時係属で共通の譲受人に譲渡され、出典を明記することによりその開示内容を本願明細書の一部とするホーンらの米国仮特許出願第60/313,588号「ドープガラス材料」に基づく優先権を主張する。
本発明は、特に望ましい光学特性を伴う、粒子及び緻密化組成物に関する。更に詳しくは、一実施形態において、本発明は、希少金属酸化物と、材料の特性を修正するためにドープした、アモルファス粒子、結晶粒子、及びガラス等の粒子及び緻密化材料、特に希土類ドープガラスとに関する。更に、本発明は、流動する反応物(flowing reactant)との反応と、これに続く、ガラス、多結晶材料、結晶材料、又はその組み合わせ等の固化光学材料への固化とを使用した粉末の形成を含む、ドープ組成物を形成する方法に関する。
インターネットに基づくシステムを含む通信及び情報技術の爆発的発展は、光通信ネットワークを実施し、光通信により可能となる大きな帯域幅を利用するための世界的な試みの原動力となっている。光ファイバ技術の容量は、高密度波長分割多重技術の実施により、更に拡大することができる。
一態様において、本発明は、以下の一つ以上を含む粒子の集合体に関する:非希土類金属及び/又は半金属ホスト組成及び希土類金属ドーパント及び/又は添加物を含むアモルファス粒子と、B2O3及びTeO2で構成されるグループから選択された半金属酸化物を含む粒子と、GeO2及び金属及び/又は半金属ドーパント及び/又は添加物を含むアモルファス粒子と、LiNbO3及びLiTaO3で構成されるグループから選択された金属及び/又は半金属を含む粒子と、金属及び/又は半金属ヒ化物、金属及び/又は半金属カルシネート(か焼物、calcinate)、金属及び/又は半金属テルル化物、金属及び/又は半金属リン化物、及び金属及び/又は半金属セレン化物で構成されるグループから選択された金属及び/又は半金属組成物を含む粒子と、第一の金属及び/又は半金属、第一の金属及び/又は半金属とは異なる遷移金属、及びそのフッ素ドーパント及び/又は添加物を含む粒子と、ガラス形成ホスト組成物、電磁スペクトルの第一の波長における吸収及び第一の波長より大きな第二の波長における放出を導入する第一のドーパント及び/又は添加物、及び電磁放射の第三の波長への露出の結果として粒子の屈折率における永続的変化を形成する第二のドーパント及び/又は添加物を含む粒子と、ガラス形成ホスト組成物、電磁スペクトルの第一の波長における吸収及び第一の波長より大きな第二の波長における放出を導入する第一のドーパント及び/又は添加物を含む粒子と、及び/又は、酸化組成物、シリコンを含む酸化組成物、アルカリ金属又はアルカリ土類金属、及び第三の金属及び/又は半金属元素を含む粒子と。この粒子の集合体は、通常、約500nm以下、及び/又は、代替又は追加として、約250nm以下の平均直径を有する。
粉末、固化層、及び中間緻密化材料は、選択可能な広範な組成物、特に、希土類元素などの望ましい光学材料により製造することができる。こうした材料を製造するアプローチは、均一性の高い粒子及びコーティングの生産を提供し、同時に高い生産速度で動作する。特に、改良された特性を伴う様々な光学材料を生産できる。一実施形態に関して、アモルファス粉末及びガラスは、酸化物ホスト内の希土類ドーパント及び/又は添加物により形成可能であり、特に、アモルファス半金属酸化物材料は、一実施形態において、希土類金属ドーパント及び/又は添加物などの金属ドーパント及び/又は添加物により形成できる。アモルファス粉末は、一般に、サブミクロン又はナノメートルの平均直径を有する。望ましい材料の滑らかな薄層は、選択した組成物により形成可能であり、これは、一実施形態において、一つ以上の様々なドーパント及び/又は添加物を含む。適切なドーパント及び/又は添加物は、例えば、希土類金属を含み、これは屈折率及び選択的光吸収といった特性の望ましい修正を与えることができる。更に、粉末及び固化層は、ホスト材料内の一つ又は複数の選択されたドーパント及び/又は添加物を含む複合組成物によって形成可能であり、これは周期表の全元素から選択した三種、四種、又はそれ以上の元素を含む単純な又は複合的な材料にすることができる。適切な実施形態において、粉末は、追加的処理により、或いは追加的処理なしで、光学材料などとして有用となる可能性がある。固化層、例えばガラス層は、反応性堆積処理を使用して粒子コーティングを直接堆積させ、その後、粉末を均一な緻密化層へと固化させることで形成できる。この均一なガラス層は、平面状の光学デバイスへと形成することが可能であり、これを平面上で集積し、集積した平面構造を形成してもよい。
レーザ熱分解は、単独で、或いは追加的処理を含め、広範な粒子組成物及び構造を伴うサブミクロン及びナノスケールの粒子の製造にとって有用であることが実証されている。対象となる一部の組成物については、下で更に説明する。光反応蒸着を使用することで、粒子は、コーティングとして、基板上に堆積させることができる。下で詳細に説明する反応物輸送アプローチは、流動する反応物のシステムにおいて、光源等の放射の有無に関係なく、ドープアモルファス粒子及び/又は結晶粒子を製造するために適合させることが可能である。一実施形態において、下で説明するように、流動する反応物のストリームを使用するその他の化学反応合成方法は、望ましい粒子及び/又はコーティングを製造するために適合させることが可能である。レーザ熱分解は、一部の用途において、ドープ粒子及び/又は複合粒子組成物を製造するのに特に適したアプローチであり、これは、レーザ熱分解により、高い生産及び/又は体積速度で、極めて均一な生成物粒子を製造することができるためである。
様々な粒子をレーザ熱分解によって製造することが可能である。光反応蒸着の実行に関するレーザ熱分解の適合化は、レーザ熱分解によって製造可能な選択された組成を伴う粒子と同等のコーティングを製造するために利用できる。具体的には、ホスト材料は、結晶又はアモルファス材料を形成する組成の中に、一つ以上の金属及び/又は半金属元素を含むことができる。加えて、粒子は、この粒子の光学、化学、及び/又は物理的特性を変化させるためにドープすることが可能である。一般に、粉末は、サブミクロン又はナノメートルの範囲の粒子サイズを伴う微細又は超微細粒子を含む。こうした粒子は、粉末アレイを形成する際には、堆積中に部分的に融合又は焼結してもよいし、しなくてもよい。均一層を形成するために、粉末アレイは、固化及び/又は緻密化させることが可能である。形成中又は形成後に、粉末アレイにドーパント及び/又は添加物を組み込むことにより、緻密化材料を通じたドーパント及び/又は添加物の分布が生じる。
AaBbCcDdEeFfGgHhIiJjKkLlMmNnOo
を有するものとして特徴付けることが可能であり、ここで、A、B、C、D、E、F、G、H、I、J、K、L、M、N、及びOは個別に存在又は欠如し、A、B、C、D、E、F、G、H、I、J、K、L、M、N、及びOの少なくとも一つが存在しており、これは、1A族元素と、2A族元素と、3B族元素(ランタニド群の元素及びアクチニド群の元素を含む)と、4B族元素と、5B族元素と、6B族元素と、7B族元素と、8B族元素と、1B族元素と、2B族元素と、3A族元素と、4A族元素と、5A族元素と、6A族元素と、7A族元素と、を含む元素の周期表の元素で構成されるグループから個別に選択され、a、b、c、d、e、f、g、h、i、j、k、l、m、n、及びoのそれぞれは、約1乃至約1,000,000の(複数の)範囲内の値から個別に選択され、数としては1、10、100、1000、10000、100000、1000000、及びこれらの適切な合計が考えられる。言い換えれば、これらの元素は、希ガス以外で、周期表からの任意の元素にすることができる。
適切なレーザ熱分解装置は、一般に、周囲の環境から分離された反応チャンバを備える。反応物輸送装置に接続された反応物入口は、反応チャンバを通る流動として、反応物ストリームを生成する。光ビーム経路等の放射ビーム経路は、反応区域で反応物ストリームと交差する。反応物及び/又は生成物ストリームは、反応区域後も出口へと続き、ここで反応物及び/又は生成物ストリームは反応チャンバを退出し、収集装置に達する。光反応蒸着に関して、コーティングは、下で更に説明するように、反応チャンバ内、或いは反応チャンバに接続された別個のコーティングチャンバ内で実行することができる。一般に、レーザ等の放射源は、反応チャンバの外部に位置しており、光ビームは適切な窓を通じて反応チャンバに入る。
光反応蒸着は、反応物ストリームからの望ましい組成物の合成を引き起こすために光源等の高強度放射源を使用するコーティングアプローチである。高強度放射源が反応を引き起こす点において、これは、レーザ熱分解との類似性を有する。しかしながら、光反応蒸着において、結果として生じる組成物は、基板表面へ向けられ、ここでコーティングが形成される。非常に均一な粒子の製造につながるレーザ熱分解の特徴に対応して、結果的に均一性の高いコーティングの製造が可能となる。
レーザ熱分解及び/又は光反応蒸着は、非常に均一な粒子、特にナノスケール粒子の形成に、特に適している。こうした粒子は、更なる処理のために収集することが可能であり、或いは、こうした粒子は、基板に直接的に堆積させ、粒子コーティングを形成することができる。小さな粒子サイズ、球形の形態、及び粒子の均一性は、全体として、例えば、組成と、表面及び材料間の界面の平滑性とに関して、結果として生じるコーティングの均一性を導くことができる。特に、平均を大きく上回る粒子の欠如は、より均一なコーティングにつながる。
材料は、粒子製造のための反応物ストリームにドーパント及び/又は添加物配意を適切に導入することで、堆積中にドープすることができるが、代替又は追加として、粉末アレイの形成に続いて、粉末アレイをドープすることも可能である。粉末アレイに組み込まれる一次粒子のナノスケールにより、粉末アレイは、その後の固化中のホスト材料へのドーパント及び/又は添加物の組み込みを促進する大きな表面積を有する。ドーパント及び/又は添加物は、反応チャンバ内で、或いは、反応及び/又はコーティングチャンバからの取り外した後で、粉末アレイに加えることが可能である。コーティング基板を反応チャンバから取り外した後で、ドーパント及び/又は添加物を加える場合、ドーパント及び/又は添加物は、直接的に、或いは電気移動堆積を使用して、粉末アレイに加えることができる。こうしたドーピングアプローチにおいて、粉末アレイは、ドープ処理を開始する前に部分的に固化させ、通常はアレイのナノ構造の全ての特徴を除去することなく、アレイを安定させることができる。
熱処理は、粒子を焼結させ、光学材料等の望ましい材料を形成するための粉末の圧縮、つまり緻密化につながる。こうした粒子の焼結は、一般に、固化と呼ばれる。緻密化した材料は、一般に、均一な材料であり、つまり、一般には多孔性ネットワークではないが、但し、材料の均一性にはランダムな不完全部が存在する場合がある。光学材料を固化、つまり緻密化させるためには、結晶材料の融点又はアモルファス材料の流動温度を超える温度、例えば、ガラス遷移温度を超える温度、及び、場合によっては、下回ることでガラスが自己支持性となる軟化点を超える温度まで、材料を加熱し、コーティングを固化させて緻密化材料にすることができる。固化は、層内でアモルファス、結晶、又は多結晶の相を形成するのに使用することができる。一般に、固化は、層のパターン形成前又は形成後に実行することができる。リアクタの火炎により予備熱処理を加え、固化処理中のドーパント及び/又は添加物の移動を低減すること、及び材料を部分的に緻密化させることができる。本明細書で説明する手法を使用して、ドープガラスから、平面状の光学デバイスを作成することができる。
粉末アレイの堆積に続いて、前駆体は、粒子のないガス及び/又は蒸気生成物を形成する反応を行う燃料及び酸素源のみを反応物ストリームが含むように、遮断することができる。燃料及び酸素源の反応によって生じる火炎は、基板に何らかの付加的な材料を堆積させることなく、コーティング基板を加熱するのに使用することができる。こうした加熱ステップでは、ドープシリカガラスの完全な固化時にドーパント及び/又は添加物の移動を低減することが観察される。火炎加熱ステップは、いくつかの層のコーティングステップの間に、或いは、いくつかの層の堆積後に実行可能であり、これにおいて、各コーティング層は他の層と同じ組成を有しても、有していなくてもよい。一般には、望ましい数の層又は望ましい量の材料を堆積させた後、最終的な固化熱処理が実行され、材料を完全に固化させる。均一な組成を伴うコーティングの形成においては、同じ組成を伴う粒子の一つ以上の層を堆積させることができる。全ての層は、例えば火炎による、何らかの固化又は部分的固化の前に堆積させることが可能であり、或いは、完全又は部分的固化は、同じ組成を有する粒子により各層又は層のサブセットが形成された後で実行することができる。最終的な固化後、均一な組成の粒子により形成された層は、固化処理中のドーパント及び/又は添加物の移動により、材料の厚さを通じて、ドーパント及び/又は添加物濃度における何らかの変動を有する場合がある。
上記のように、粒子及び固化材料は、例えば、光学用途を含め、様々な用途を有する。特に、固化後に形成される均一材料は、ファイバ予備形成物及び平面状の光学構造等、光学デバイスの形成に使用することができる。本明細書で説明する改良された材料は、光学的な集積構造及び電気光学的な構造に組み込むことが可能な、様々な望ましい光学デバイスに、有利な形で組み込むことができる。特に、一部のドーパント及び/又は添加物は、望ましい機能特性を導入し、他のドーパント及び/又は添加物は、複数の層などの特徴を伴う構造を形成する処理を改善する。上記のアプローチは、構造の選択された部分内に局部化する、選択された組成及び/又はドーパント及び/又は添加物を伴う構造の堆積を導くために使用することができる。
下地被覆材の層890は、基板892上に位置している。コア層894は、光学経路に沿った導波路898、900の間に、増幅器材料896を含む。ポンプ導波路902は、増幅器材料896と随意的に接続される。ポンプ導波路902は、同じ層の被覆材904に囲まれ、ポンプ光源と接続する。外側被覆材906は、ポンプ導波路902の上に配置することができる。
この例では、光反応蒸着及び固化を使用した、アルミナ及び酸化ナトリウムガラス形成物と、エルビウムドーパントとを含むシリカガラスによる、シリコン基板のコーティングについて説明する。
slm=一分間当たりの標準リットル
コーティング動作の完了後、ウェーハは、ウェーハ表面全体にコーティングを有する。コーティングの化学組成は、顕微鏡検査に使用された日立S−3000H走査電子顕微鏡に取り付けたエネルギ分散型X線分析装置(EDXA、Oxford Instruments Model 7021)を使用して測定した。EDXA走査は、20kVの加速電圧と、約85mAの電流で動作するWフィラメントとを使用して、倍率500倍で取得した。相互作用量は、約2ミクロンの直径を有するように推定した。EXDA走査は、コーティング表面上で取り出した。粉末アレイは、EDXAによる測定では、以下の組成を有した:O−49.1重量パーセント(wt%)、Si−31.7wt%、Na−9.9wt%、Al−5.1wt%、Er−2.4wt%、及び不純物(C、H、Nなど)合計2.2wt%。
sccm=1分間当たりの標準立方センチ
炉から取り出した後、ウェーハは、その表面に透明なガラスを有した。固化したガラスは、約4ミクロン乃至約6ミクロンの厚さを有した。固化したガラスは、EDXA分析により、以下の組成を有することが分かった:O−50.2wt%、Si−34.1wt%、Na−10.5wt%、Al−3.7wt%、Er−1.5wt%、及び不純物合計0.1wt%。
この例では、光反応蒸着、酸素及び塩素の混合物における熱処理、及び固化を使用した、アルミナ及び酸化ナトリウムガラス形成物と、エルビウムドーパントとを含むシリカガラスによる、シリコン基板のコーティングについて説明する。
slm=一分間当たりの標準リットル
コーティング動作の完了後、ウェーハは、ウェーハ表面全体にコーティングを有する。コーティングの化学組成は、顕微鏡検査に使用された日立S−3000H走査電子顕微鏡に取り付けたエネルギ分散型X線分析装置(EDXA、Oxford Instruments Model 7021)を使用して測定した。EDXA走査は、20kVの加速電圧と、約85mAの電流で動作するWフィラメントとを使用して、倍率500倍で取得した。相互作用量は、約2ミクロンの直径を有するように推定した。EXDA走査は、コーティング表面上で取り出した。粉末アレイは、EDXAによる測定では、以下の組成を有した:O−51.6wt%、Si−35.4wt%、Na−4.2wt%、Al−5.8wt%、Er−1.9wt%、及び不純物(C、H、Nなど)合計1.0wt%。
sccm=1分間当たりの標準立方センチ
炉から取り出した後、ウェーハは、その表面に透明なガラスを有した。固化したガラスは、約4ミクロン乃至約6ミクロンの厚さを有した。固化したガラスは、EDXA分析により、以下の組成を有することが分かった:O−52.8wt%、Si−35.6wt%、Na−3.7wt%、Al−6.2wt%、Er−1.7wt%、及び不純物合計0.0wt%。
この例では、光反応蒸着、酸素雰囲気における熱処理、及び不活性雰囲気における固化を使用した、アルミナ及び酸化ナトリウムガラス形成物と、エルビウムドーパントとを含むシリカガラスによる、シリコン基板のコーティングについて説明する。この例において使用される前駆体は、塩化物イオンを含む。八種類の反応条件について説明する。
コーティング動作の完了後、ウェーハは、ウェーハ表面全体にコーティングを有する。コーティングの化学組成は、顕微鏡検査に使用された日立S−3000H走査電子顕微鏡に取り付けたエネルギ分散型X線分析装置(EDXA、Oxford Instruments Model 7021)を使用して測定した。EDXA走査は、20kVの加速電圧と、約85mAの電流で動作するWフィラメントとを使用して、倍率500倍で取得した。相互作用量は、約2ミクロンの直径を有するように推定した。EXDA走査は、コーティング表面上で取り出した。EDXAにより測定した表5及び6の八種類の実施形態の粉末アレイは、表7に表示している。
コーティングウェーハは、マッフル炉(Neytech、Model Centurion Qex)において加熱した。ウェーハは、最初に酸素雰囲気において450℃で加熱して炭素汚染物を除去し、次に、ヘリウム雰囲気においてTmaxで加熱し、ガラスの固化を完了させた。Tmaxは、試料1、3、5、及び7に関して1100℃であり、試料2、4、6、及び8に関して1200℃とした。表8では、加熱及び冷却条件と共に、熱処理についてまとめている。
炉から取り出した後、ウェーハは、その表面に透明なガラスを有した。固化したガラスは、約4ミクロン乃至約6ミクロンの厚さを有した。固化したガラスは、EDXA分析により、表9に示すような組成を有することが分かった。
この例では、光反応蒸着及び固化を使用した、アルミナ及び酸化ナトリウムガラス形成物と、エルビウムドーパントとを含むシリカガラスによる、シリコン基板のコーティングについて説明する。この例では、反応物ストリームには、エチレンを含めなかった。
コーティング動作の完了後、ウェーハは、ウェーハ表面全体にコーティングを有する。コーティングの化学組成は、顕微鏡検査に使用された日立S−3000H走査電子顕微鏡に取り付けたエネルギ分散型X線分析装置(EDXA、Oxford Instruments Model 7021)を使用して測定した。EDXA走査は、20kVの加速電圧と、約85mAの電流で動作するWフィラメントとを使用して、倍率500倍で取得した。相互作用量は、約2ミクロンの直径を有するように推定した。EXDA走査は、コーティング表面上で取り出した。粉末アレイは、EDXAによる測定では、以下の組成を有した:O−51.3重量パーセント(wt%)、Si−36.0wt%、Na−3.1wt%、Al−3.0wt%、Er−2.0wt%、及び炭素−1.6wt%。
sccm=1分間当たりの標準立方センチ
炉から取り出した後、ウェーハは、その表面に透明なガラスを有した。固化したガラスは、約4ミクロン乃至約6ミクロンの厚さを有した。固化したガラスは、EDXA分析により、以下の組成を有することが分かった:O−51.5wt%、Si−34.9wt%、Na−3.5wt%、Al−6.1wt%、Er−1.8wt%、及び炭素−2.2wt%。
この例では、光反応蒸着及び固化を使用した、アルミナ及びランタン添加物と、エルビウムドーパントとを含むシリカガラスによる、シリコン基板のコーティングについて説明する。この例では、反応物ストリームには、エチレンを含めなかった。
コーティング動作の完了後、ウェーハは、ウェーハ表面全体にコーティングを有する。コーティングの化学組成は、使用して測定した。粉末アレイは、ICPによる測定では、以下の組成を有した:O−40.9重量パーセント(wt%)、Si−25.7wt%、La−21.8wt%、Al−9.2wt%、Er−2.3wt%、及び炭素−0.2wt%。この特定の組成は、固化が困難だった。
この例では、低い火炎温度での、光反応蒸着及び固化を使用した、アルミナ及び酸化ナトリウムガラス形成物と、エルビウムドーパントとを含むシリカガラスによる、シリコン基板のコーティングについて説明する。
コーティング動作の完了後、ウェーハは、ウェーハ表面全体にコーティングを有する。コーティングの化学組成は、使用して測定した。粉末アレイは、ICPによる測定では、以下の組成を有した:O−51.4重量パーセント(wt%)、Si−34.0wt%、Na−4.8wt%、Al−6.6wt%、Er−3.1wt%、及び不純物0.0wt%。
炉から取り出した後、ウェーハは、その表面に透明なガラスを有した。固化したガラスは、約4ミクロン乃至約6ミクロンの厚さを有した。固化したガラスは、EDXA分析により、以下の組成を有することが分かった:O−50.0wt%、Si−34.4wt%、Na−5.6wt%、Al−6.8wt%、Er−2.3wt%、及び不純物合計0.0wt%。
Claims (4)
- (i)TiO2、SiO2、GeO2、Al2O3、P2O3、B2O3、TeO2 からなる群から選択される1以上の組成物と、(ii)Ho、Eu、Ce、Tb、Dy、Er、Yb、Nd、La、Y、Pr、Tmからなる群から選択される1以上の希土類金属のドーパント又は添加物と、からなるアモルファス粒子集合体であって、
当該アモルファス粒子集合体は500nm未満の平均一次粒子直径を有する一次粒子の緩く固められた塊体であり、前記一次粒子は所定の粒子直径の分布を含み、当該分布において、95%の一次粒子が、該一次粒子の平均粒径の45%より大きく、200%より小さいことを特徴とするアモルファス粒子集合体。 - (i)GeO2と、(ii)シリコン、ホウ素、ヒ素、アンチモン、テルリウム及びリンからなる群から選択された元素を含むドーパント又は添加物と、からなるアモルファス粒子集合体であって、
当該アモルファス粒子集合体は500nm未満の平均直径を有する一次粒子の緩く固められた塊体であり、
前記一次粒子は所定の粒子直径の分布を含み、当該分布において、95%の一次粒子が、該一次粒子の平均粒径の45%より大きく、200%より小さいことを特徴とするアモルファス粒子集合体。 - 一次粒子は100nmより小さい平均直径を有していることを特徴とする請求項1又は2に記載のアモルファス粒子集合体。
- 一次粒子の平均直径の5倍を超える直径を有する一次粒子を含んでいないことを特徴とする請求項1から3のいずれか一項に記載のアモルファス粒子集合体。
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US10/099,597 US6849334B2 (en) | 2001-08-17 | 2002-03-15 | Optical materials and optical devices |
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JP2005500242A (ja) | 2005-01-06 |
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CN1571726A (zh) | 2005-01-26 |
US7306845B2 (en) | 2007-12-11 |
EP1425162A4 (en) | 2010-07-21 |
CN1982242B (zh) | 2010-09-08 |
WO2003016961A2 (en) | 2003-02-27 |
US7776406B2 (en) | 2010-08-17 |
WO2003016961A3 (en) | 2003-10-30 |
US20080069945A1 (en) | 2008-03-20 |
EP1425162A2 (en) | 2004-06-09 |
TWI318693B (en) | 2009-12-21 |
CN1289286C (zh) | 2006-12-13 |
KR20040027896A (ko) | 2004-04-01 |
KR100930557B1 (ko) | 2009-12-09 |
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