JP5112020B2 - タイムトゥデジタルコンバータ - Google Patents

タイムトゥデジタルコンバータ Download PDF

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Publication number
JP5112020B2
JP5112020B2 JP2007303318A JP2007303318A JP5112020B2 JP 5112020 B2 JP5112020 B2 JP 5112020B2 JP 2007303318 A JP2007303318 A JP 2007303318A JP 2007303318 A JP2007303318 A JP 2007303318A JP 5112020 B2 JP5112020 B2 JP 5112020B2
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Japan
Prior art keywords
time
digital converter
resolution
signal
transmission line
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JP2007303318A
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English (en)
Japanese (ja)
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JP2008131659A5 (enExample
JP2008131659A (ja
Inventor
▲ヒョン▼ 哲 崔
晟 煥 趙
召 命 河
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Samsung Electronics Co Ltd
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Samsung Electronics Co Ltd
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Publication of JP2008131659A publication Critical patent/JP2008131659A/ja
Publication of JP2008131659A5 publication Critical patent/JP2008131659A5/ja
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/50—Analogue/digital converters with intermediate conversion to time interval
    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/005—Time-to-digital converters [TDC]

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
JP2007303318A 2006-11-24 2007-11-22 タイムトゥデジタルコンバータ Active JP5112020B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2006-0116644 2006-11-24
KR1020060116644A KR100852180B1 (ko) 2006-11-24 2006-11-24 타임투디지털컨버터

Publications (3)

Publication Number Publication Date
JP2008131659A JP2008131659A (ja) 2008-06-05
JP2008131659A5 JP2008131659A5 (enExample) 2010-12-16
JP5112020B2 true JP5112020B2 (ja) 2013-01-09

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JP2007303318A Active JP5112020B2 (ja) 2006-11-24 2007-11-22 タイムトゥデジタルコンバータ

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US (1) US7667633B2 (enExample)
JP (1) JP5112020B2 (enExample)
KR (1) KR100852180B1 (enExample)

Families Citing this family (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100845133B1 (ko) * 2006-11-15 2008-07-10 삼성전자주식회사 고해상도 타임투디지털컨버터
JP4443616B2 (ja) * 2008-03-07 2010-03-31 株式会社半導体理工学研究センター 時間デジタル変換回路
JP2010074201A (ja) * 2008-09-16 2010-04-02 Nec Electronics Corp 同期検出回路、これを用いたパルス幅変調回路、及び同期検出方法
KR100976625B1 (ko) * 2008-10-15 2010-08-18 한국전자통신연구원 타임투디지털컨버터를 이용한 위상 편이 복조기
KR101632657B1 (ko) * 2008-12-01 2016-06-23 삼성전자주식회사 타임투디지털 컨버터 및 디지털 위상 고정 루프
JP5590867B2 (ja) * 2008-12-01 2014-09-17 三星電子株式会社 タイム／デジタルコンバーター及びデジタル位相ロックループ
KR101292669B1 (ko) * 2008-12-02 2013-08-02 한국전자통신연구원 타임투디지털컨버터의 오차 보정 장치
US7999707B2 (en) * 2008-12-02 2011-08-16 Electronics And Telecommunications Research Institute Apparatus for compensating for error of time-to-digital converter
KR101056015B1 (ko) 2009-01-08 2011-08-10 한국과학기술원 높은 차수의 노이즈 쉐이핑이 가능한 시간-디지털 변환기 및 시간-디지털 변환 방법
JP5305935B2 (ja) * 2009-01-16 2013-10-02 ルネサスエレクトロニクス株式会社 デジタルフェーズロックドループ回路
US8098085B2 (en) * 2009-03-30 2012-01-17 Qualcomm Incorporated Time-to-digital converter (TDC) with improved resolution
US20100278198A1 (en) * 2009-04-30 2010-11-04 Nokia Corporation Method and apparatus for providing quantization of synchronization signals
US8736327B2 (en) 2009-06-24 2014-05-27 Fujitsu Limited Time-to-digital converter
JP5256535B2 (ja) * 2009-07-13 2013-08-07 ルネサスエレクトロニクス株式会社 位相同期ループ回路
TWI347085B (en) * 2009-10-09 2011-08-11 Ind Tech Res Inst Pipeline time-to-digital converter
US8355227B2 (en) * 2009-12-17 2013-01-15 Silicon Laboratories Inc. Electrostatic discharge circuitry with damping resistor
JP5632712B2 (ja) * 2010-11-05 2014-11-26 ルネサスエレクトロニクス株式会社 クロック発振回路及び半導体装置
JP5609585B2 (ja) * 2010-11-25 2014-10-22 ソニー株式会社 Ｐｌｌ回路、ｐｌｌ回路の誤差補償方法及び通信装置
US10045089B2 (en) * 2011-08-02 2018-08-07 Apple Inc. Selection of encoder and decoder for a video communications session
US8451159B1 (en) * 2011-11-14 2013-05-28 Texas Instruments Incorporated Pipelined ADC with a VCO-based stage
US8659360B2 (en) * 2011-12-28 2014-02-25 St-Ericsson Sa Charge-to-digital timer
US9379729B2 (en) 2011-12-28 2016-06-28 St-Ericsson Sa Resistive/residue charge-to-digital timer
US8618965B2 (en) 2011-12-28 2013-12-31 St-Ericsson Sa Calibration of a charge-to-digital timer
US8669794B2 (en) 2012-02-21 2014-03-11 Qualcomm Incorporated Circuit for detecting a voltage change using a time-to-digital converter
US8736338B2 (en) * 2012-04-11 2014-05-27 Freescale Semiconductor, Inc. High precision single edge capture and delay measurement circuit
US9098072B1 (en) 2012-09-05 2015-08-04 IQ-Analog Corporation Traveling pulse wave quantizer
CN103116163B (zh) * 2013-01-29 2015-02-04 东南大学 一种激光传感响应测距装置及控制方法
KR101278111B1 (ko) * 2013-04-12 2013-06-24 서울대학교산학협력단 타임 디지털 컨버터
JP6085523B2 (ja) * 2013-05-30 2017-02-22 ルネサスエレクトロニクス株式会社 半導体装置及び半導体装置の動作方法
US9594353B2 (en) * 2013-05-31 2017-03-14 Gyorgy Gabor Cserey Device and method for determining timing of a measured signal
JP5842017B2 (ja) * 2014-01-31 2016-01-13 アンリツ株式会社 信号解析装置および信号解析方法
US9606228B1 (en) 2014-02-20 2017-03-28 Banner Engineering Corporation High-precision digital time-of-flight measurement with coarse delay elements
US9223295B2 (en) 2014-04-18 2015-12-29 International Business Machines Corporation Time-to-digital converter
US9188961B1 (en) * 2015-02-18 2015-11-17 Micrel, Inc. Time-to-digital converter
US9323226B1 (en) 2015-04-08 2016-04-26 IQ-Analog Corporation Sub-ranging voltage-to-time-to-digital converter
EP3232278B1 (en) * 2016-04-11 2020-03-18 NXP USA, Inc. Calibration method and apparatus for high tdc resolution
EP3340468B1 (en) 2016-12-22 2023-12-06 NXP USA, Inc. Tdc, digital synthesizer, communication unit and method therefor
US9831888B1 (en) 2017-06-06 2017-11-28 IQ-Analog Corp. Sort-and delay time-to-digital converter
US10715754B2 (en) * 2018-01-23 2020-07-14 Stmicroelectronics (Research & Development) Limited Single reference clock time to digital converter
JP6659057B1 (ja) 2018-11-12 2020-03-04 Ｎｅｃプラットフォームズ株式会社 遅延時間検出回路、打刻情報生成装置および遅延時間検出方法
DE102019205731A1 (de) * 2019-04-18 2020-10-22 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Zeit-zu-Digital-Wandler-Anordnung
WO2021180927A1 (en) 2020-03-12 2021-09-16 Analog Devices International Unlimited Company Delay locked loops with calibration for external delay
US12316351B2 (en) * 2021-12-20 2025-05-27 Intel Corporation Self-organized encoder architectures including blind input swapping support

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5219957A (en) * 1975-08-08 1977-02-15 Japan Atom Energy Res Inst Time/digital conversion circuit
US4308524A (en) * 1979-06-05 1981-12-29 Harrison Systems, Inc. Fast high resolution predictive analog-to-digital converter with error correction
JPH0695148B2 (ja) * 1987-09-02 1994-11-24 株式会社日立製作所 時間差測定回路
US5345235A (en) 1993-04-12 1994-09-06 Motorola, Inc. Scaled reference analog-to-digital conversion circuitry and method of operation
US5796682A (en) * 1995-10-30 1998-08-18 Motorola, Inc. Method for measuring time and structure therefor
US5764175A (en) 1996-09-24 1998-06-09 Linear Technology Corporation Dual resolution circuitry for an analog-to-digital converter
US5836004A (en) * 1997-01-07 1998-11-10 Industrial Technology Research Institute Differential mode time to digital converter
JP3380206B2 (ja) * 1999-03-31 2003-02-24 沖電気工業株式会社 内部クロック発生回路
US6731667B1 (en) * 1999-11-18 2004-05-04 Anapass Inc. Zero-delay buffer circuit for a spread spectrum clock system and method therefor
US6754613B2 (en) * 2000-03-17 2004-06-22 Vector 12 Corporation High resolution time-to-digital converter
US6628276B1 (en) * 2000-03-24 2003-09-30 Stmicroelectronics, Inc. System for high precision signal phase difference measurement
KR100512935B1 (ko) * 2002-05-24 2005-09-07 삼성전자주식회사 내부 클럭신호 발생회로 및 방법
GB0306782D0 (en) * 2003-03-25 2003-04-30 Neutec Pharma Plc Treatment of infection due to clostridium difficile
US7148831B2 (en) * 2003-10-27 2006-12-12 Micron Technology, Inc. Variable quantization ADC for image sensors
JP4075777B2 (ja) * 2003-11-19 2008-04-16 沖電気工業株式会社 コンパレータ回路
US7205924B2 (en) * 2004-11-18 2007-04-17 Texas Instruments Incorporated Circuit for high-resolution phase detection in a digital RF processor
US20060132340A1 (en) 2004-12-22 2006-06-22 Lin Chun W Apparatus and method for time-to-digital conversion and jitter-measuring apparatus using the same
JP2007104475A (ja) * 2005-10-06 2007-04-19 Denso Corp Ａ／ｄ変換方法及び装置
US7332973B2 (en) * 2005-11-02 2008-02-19 Skyworks Solutions, Inc. Circuit and method for digital phase-frequency error detection
US7629915B2 (en) * 2006-05-26 2009-12-08 Realtek Semiconductor Corp. High resolution time-to-digital converter and method thereof
CA2562200A1 (en) * 2006-09-18 2008-03-18 Abdel-Fattah S. Yousif Time-to-digital converter
TWI328932B (en) * 2006-11-10 2010-08-11 Ind Tech Res Inst Cycle time to digital converter
US7564284B2 (en) * 2007-03-26 2009-07-21 Infineon Technologies Ag Time delay circuit and time to digital converter
US7639169B2 (en) * 2007-05-17 2009-12-29 Denso Corporation A/D converter circuit and A/D conversion method

Also Published As

Publication number Publication date
KR20080046937A (ko) 2008-05-28
US20080129574A1 (en) 2008-06-05
US7667633B2 (en) 2010-02-23
JP2008131659A (ja) 2008-06-05
KR100852180B1 (ko) 2008-08-13

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