KR100852180B1 - 타임투디지털컨버터 - Google Patents

타임투디지털컨버터 Download PDF

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Publication number
KR100852180B1
KR100852180B1 KR1020060116644A KR20060116644A KR100852180B1 KR 100852180 B1 KR100852180 B1 KR 100852180B1 KR 1020060116644 A KR1020060116644 A KR 1020060116644A KR 20060116644 A KR20060116644 A KR 20060116644A KR 100852180 B1 KR100852180 B1 KR 100852180B1
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South Korea
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time
transmission line
signal transmission
signal
digital
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Korean (ko)
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KR20080046937A (ko
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최형철
조성환
하소명
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삼성전자주식회사
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Priority to KR1020060116644A priority Critical patent/KR100852180B1/ko
Priority to JP2007303318A priority patent/JP5112020B2/ja
Priority to US11/986,592 priority patent/US7667633B2/en
Publication of KR20080046937A publication Critical patent/KR20080046937A/ko
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/50—Analogue/digital converters with intermediate conversion to time interval
    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/005—Time-to-digital converters [TDC]

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
KR1020060116644A 2006-11-24 2006-11-24 타임투디지털컨버터 Active KR100852180B1 (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1020060116644A KR100852180B1 (ko) 2006-11-24 2006-11-24 타임투디지털컨버터
JP2007303318A JP5112020B2 (ja) 2006-11-24 2007-11-22 タイムトゥデジタルコンバータ
US11/986,592 US7667633B2 (en) 2006-11-24 2007-11-23 Time-to-digital converter with high resolution and wide measurement range

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KR1020060116644A KR100852180B1 (ko) 2006-11-24 2006-11-24 타임투디지털컨버터

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KR100852180B1 true KR100852180B1 (ko) 2008-08-13

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US (1) US7667633B2 (enExample)
JP (1) JP5112020B2 (enExample)
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KR101056015B1 (ko) 2009-01-08 2011-08-10 한국과학기술원 높은 차수의 노이즈 쉐이핑이 가능한 시간-디지털 변환기 및 시간-디지털 변환 방법

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KR101632657B1 (ko) * 2008-12-01 2016-06-23 삼성전자주식회사 타임투디지털 컨버터 및 디지털 위상 고정 루프
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JP5632712B2 (ja) * 2010-11-05 2014-11-26 ルネサスエレクトロニクス株式会社 クロック発振回路及び半導体装置
JP5609585B2 (ja) * 2010-11-25 2014-10-22 ソニー株式会社 Ｐｌｌ回路、ｐｌｌ回路の誤差補償方法及び通信装置
US10045089B2 (en) * 2011-08-02 2018-08-07 Apple Inc. Selection of encoder and decoder for a video communications session
US8451159B1 (en) * 2011-11-14 2013-05-28 Texas Instruments Incorporated Pipelined ADC with a VCO-based stage
US8659360B2 (en) * 2011-12-28 2014-02-25 St-Ericsson Sa Charge-to-digital timer
US9379729B2 (en) 2011-12-28 2016-06-28 St-Ericsson Sa Resistive/residue charge-to-digital timer
US8618965B2 (en) 2011-12-28 2013-12-31 St-Ericsson Sa Calibration of a charge-to-digital timer
US8669794B2 (en) 2012-02-21 2014-03-11 Qualcomm Incorporated Circuit for detecting a voltage change using a time-to-digital converter
US8736338B2 (en) * 2012-04-11 2014-05-27 Freescale Semiconductor, Inc. High precision single edge capture and delay measurement circuit
US9098072B1 (en) 2012-09-05 2015-08-04 IQ-Analog Corporation Traveling pulse wave quantizer
CN103116163B (zh) * 2013-01-29 2015-02-04 东南大学 一种激光传感响应测距装置及控制方法
KR101278111B1 (ko) * 2013-04-12 2013-06-24 서울대학교산학협력단 타임 디지털 컨버터
JP6085523B2 (ja) * 2013-05-30 2017-02-22 ルネサスエレクトロニクス株式会社 半導体装置及び半導体装置の動作方法
US9594353B2 (en) * 2013-05-31 2017-03-14 Gyorgy Gabor Cserey Device and method for determining timing of a measured signal
JP5842017B2 (ja) * 2014-01-31 2016-01-13 アンリツ株式会社 信号解析装置および信号解析方法
US9606228B1 (en) 2014-02-20 2017-03-28 Banner Engineering Corporation High-precision digital time-of-flight measurement with coarse delay elements
US9223295B2 (en) 2014-04-18 2015-12-29 International Business Machines Corporation Time-to-digital converter
US9188961B1 (en) * 2015-02-18 2015-11-17 Micrel, Inc. Time-to-digital converter
US9323226B1 (en) 2015-04-08 2016-04-26 IQ-Analog Corporation Sub-ranging voltage-to-time-to-digital converter
EP3232278B1 (en) * 2016-04-11 2020-03-18 NXP USA, Inc. Calibration method and apparatus for high tdc resolution
EP3340468B1 (en) 2016-12-22 2023-12-06 NXP USA, Inc. Tdc, digital synthesizer, communication unit and method therefor
US9831888B1 (en) 2017-06-06 2017-11-28 IQ-Analog Corp. Sort-and delay time-to-digital converter
US10715754B2 (en) * 2018-01-23 2020-07-14 Stmicroelectronics (Research & Development) Limited Single reference clock time to digital converter
JP6659057B1 (ja) 2018-11-12 2020-03-04 Ｎｅｃプラットフォームズ株式会社 遅延時間検出回路、打刻情報生成装置および遅延時間検出方法
DE102019205731A1 (de) * 2019-04-18 2020-10-22 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Zeit-zu-Digital-Wandler-Anordnung
WO2021180927A1 (en) 2020-03-12 2021-09-16 Analog Devices International Unlimited Company Delay locked loops with calibration for external delay
US12316351B2 (en) * 2021-12-20 2025-05-27 Intel Corporation Self-organized encoder architectures including blind input swapping support

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US5764175A (en) 1996-09-24 1998-06-09 Linear Technology Corporation Dual resolution circuitry for an analog-to-digital converter
US20050088331A1 (en) * 2003-10-27 2005-04-28 Alexander Krymski Variable quantization ADC for image sensors

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US5764175A (en) 1996-09-24 1998-06-09 Linear Technology Corporation Dual resolution circuitry for an analog-to-digital converter
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Publication number Priority date Publication date Assignee Title
KR101056015B1 (ko) 2009-01-08 2011-08-10 한국과학기술원 높은 차수의 노이즈 쉐이핑이 가능한 시간-디지털 변환기 및 시간-디지털 변환 방법

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KR20080046937A (ko) 2008-05-28
US20080129574A1 (en) 2008-06-05
US7667633B2 (en) 2010-02-23
JP2008131659A (ja) 2008-06-05
JP5112020B2 (ja) 2013-01-09

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