JP5069232B2 - マイクロリソグラフィ投影露光装置の投影対物レンズ - Google Patents

マイクロリソグラフィ投影露光装置の投影対物レンズ Download PDF

Info

Publication number
JP5069232B2
JP5069232B2 JP2008523209A JP2008523209A JP5069232B2 JP 5069232 B2 JP5069232 B2 JP 5069232B2 JP 2008523209 A JP2008523209 A JP 2008523209A JP 2008523209 A JP2008523209 A JP 2008523209A JP 5069232 B2 JP5069232 B2 JP 5069232B2
Authority
JP
Japan
Prior art keywords
optical element
projection objective
manipulator
actuators
projection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2008523209A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009503826A (ja
JP2009503826A5 (enExample
Inventor
コンラディ,オラルフ
ビットナー,ボリス
ブライジイステル,サシャ
ハウフ,マルクス
フメル,ヴォルフガング
カツィ,アリフ
トロスバッハ,ベアベル
ウェーバー,ヨッヘン
ホルデーラー,フーベルト
タエバチ,パヤン
Original Assignee
カール・ツァイス・エスエムティー・ゲーエムベーハー
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by カール・ツァイス・エスエムティー・ゲーエムベーハー filed Critical カール・ツァイス・エスエムティー・ゲーエムベーハー
Publication of JP2009503826A publication Critical patent/JP2009503826A/ja
Publication of JP2009503826A5 publication Critical patent/JP2009503826A5/ja
Application granted granted Critical
Publication of JP5069232B2 publication Critical patent/JP5069232B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0025Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
    • G02B27/0068Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration having means for controlling the degree of correction, e.g. using phase modulators, movable elements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00Simple or compound lenses
    • G02B3/12Fluid-filled or evacuated lenses
    • G02B3/14Fluid-filled or evacuated lenses of variable focal length
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70258Projection system adjustments, e.g. adjustments during exposure or alignment during assembly of projection system
    • G03F7/70266Adaptive optics, e.g. deformable optical elements for wavefront control, e.g. for aberration adjustment or correction
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70808Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
    • G03F7/70825Mounting of individual elements, e.g. mounts, holders or supports

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)
JP2008523209A 2005-07-25 2006-07-24 マイクロリソグラフィ投影露光装置の投影対物レンズ Expired - Fee Related JP5069232B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US70213705P 2005-07-25 2005-07-25
US60/702,137 2005-07-25
PCT/EP2006/007273 WO2007017089A1 (en) 2005-07-25 2006-07-24 Projection objective of a microlithographic projection exposure apparatus

Publications (3)

Publication Number Publication Date
JP2009503826A JP2009503826A (ja) 2009-01-29
JP2009503826A5 JP2009503826A5 (enExample) 2009-07-02
JP5069232B2 true JP5069232B2 (ja) 2012-11-07

Family

ID=37309529

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008523209A Expired - Fee Related JP5069232B2 (ja) 2005-07-25 2006-07-24 マイクロリソグラフィ投影露光装置の投影対物レンズ

Country Status (3)

Country Link
US (2) US7830611B2 (enExample)
JP (1) JP5069232B2 (enExample)
WO (1) WO2007017089A1 (enExample)

Families Citing this family (89)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7646544B2 (en) * 2005-05-14 2010-01-12 Batchko Robert G Fluidic optical devices
KR101762083B1 (ko) 2005-05-12 2017-07-26 가부시키가이샤 니콘 투영 광학계, 노광 장치 및 노광 방법
US7948683B2 (en) * 2006-05-14 2011-05-24 Holochip Corporation Fluidic lens with manually-adjustable focus
US8064142B2 (en) 2005-05-14 2011-11-22 Holochip Corporation Fluidic lens with reduced optical aberration
US7697214B2 (en) 2005-05-14 2010-04-13 Holochip Corporation Fluidic lens with manually-adjustable focus
WO2007017089A1 (en) * 2005-07-25 2007-02-15 Carl Zeiss Smt Ag Projection objective of a microlithographic projection exposure apparatus
US7715107B2 (en) * 2006-04-25 2010-05-11 Asml Netherlands B.V. Optical element for correction of aberration, and a lithographic apparatus comprising same
NO326372B1 (no) 2006-09-21 2008-11-17 Polight As Polymerlinse
JP5244806B2 (ja) 2006-10-11 2013-07-24 ポライト エイエス 小型調整可能レンズの設計
JP5255565B2 (ja) 2006-10-11 2013-08-07 ポライト エイエス 調整可能なレンズの製造方法
JP5193227B2 (ja) 2007-01-22 2013-05-08 カール・ツァイス・エスエムティー・ゲーエムベーハー 半導体リソグラフィシステム及びその使用方法
WO2008100154A1 (en) 2007-02-12 2008-08-21 Polight As Flexible lens assembly with variable focal length
US7602562B2 (en) * 2007-05-21 2009-10-13 Electro Scientific Industries, Inc. Fluid counterbalance for a laser lens used to scribe an electronic component substrate
FR2919073B1 (fr) 2007-07-19 2010-10-15 Commissariat Energie Atomique Dispositif optique a moyens d'actionnement d'une membrane deformable compacts
JP5224218B2 (ja) * 2007-07-23 2013-07-03 カール・ツァイス・エスエムティー・ゲーエムベーハー マイクロリソグラフィ投影露光装置の光学システム
EP2188673A1 (en) * 2007-08-03 2010-05-26 Carl Zeiss SMT AG Projection objective for microlithography, projection exposure apparatus, projection exposure method and optical correction plate
EP2048540A1 (en) 2007-10-09 2009-04-15 Carl Zeiss SMT AG Microlithographic projection exposure apparatus
JP5006762B2 (ja) * 2007-11-05 2012-08-22 キヤノン株式会社 露光装置及びデバイス製造方法
PL2313798T3 (pl) 2008-07-11 2018-08-31 Polight As Sposób i układ do redukcji efektów cieplnych w regulowanych soczewkach małych rozmiarów
DE102008032853A1 (de) * 2008-07-14 2010-01-21 Carl Zeiss Smt Ag Optische Einrichtung mit einem deformierbaren optischen Element
JPWO2010024106A1 (ja) * 2008-08-28 2012-01-26 株式会社ニコン 照明光学系、露光装置、およびデバイス製造方法
DE102008042356A1 (de) * 2008-09-25 2010-04-08 Carl Zeiss Smt Ag Projektionsbelichtungsanlage mit optimierter Justagemöglichkeit
DE102008049616B4 (de) * 2008-09-30 2012-03-29 Carl Zeiss Smt Gmbh Projektionsbelichtungsanlage für die Mikrolithographie zur Herstellung von Halbleiterbauelementen
US8659835B2 (en) * 2009-03-13 2014-02-25 Optotune Ag Lens systems and method
US8699141B2 (en) 2009-03-13 2014-04-15 Knowles Electronics, Llc Lens assembly apparatus and method
US9164202B2 (en) 2010-02-16 2015-10-20 Holochip Corporation Adaptive optical devices with controllable focal power and aspheric shape
KR101680300B1 (ko) 2009-08-31 2016-11-28 삼성전자주식회사 액체 렌즈 및 그 제조방법
KR101675130B1 (ko) 2009-09-03 2016-11-10 삼성전자주식회사 액체 렌즈
FR2950154B1 (fr) 2009-09-15 2011-12-23 Commissariat Energie Atomique Dispositif optique a membrane deformable a actionnement piezoelectrique en forme de couronne continue
FR2950153B1 (fr) 2009-09-15 2011-12-23 Commissariat Energie Atomique Dispositif optique a membrane deformable a actionnement piezoelectrique
DE102009045163B4 (de) 2009-09-30 2017-04-06 Carl Zeiss Smt Gmbh Optische Anordnung in einer mikrolithographischen Projektionsbelichtungsanlage
NL2005701A (en) 2009-12-22 2011-06-23 Asml Netherlands Bv Active mount, lithographic apparatus comprising such active mount and method for tuning such active mount.
DE102010001551A1 (de) * 2010-02-03 2011-08-04 TRUMPF Laser- und Systemtechnik GmbH, 71254 Adaptive Linse
WO2011116792A1 (en) 2010-03-26 2011-09-29 Carl Zeiss Smt Gmbh Optical system, exposure apparatus, and waverfront correction method
US8947796B2 (en) * 2010-05-07 2015-02-03 Hewlett-Packard Development Company, L.P. Telecentric optical assembly
US9036264B2 (en) * 2010-08-12 2015-05-19 Adlens Beacon, Inc. Fluid-filled lenses and their ophthalmic applications
KR101912092B1 (ko) 2010-10-05 2018-10-26 삼성전자 주식회사 액체 렌즈
KR101912093B1 (ko) 2010-10-29 2018-10-26 삼성전자 주식회사 광학 장치
KR101529807B1 (ko) 2011-01-20 2015-06-17 칼 짜이스 에스엠티 게엠베하 투영 노광 도구를 조작하는 방법
WO2012123000A1 (en) 2011-03-15 2012-09-20 Carl Zeiss Smt Gmbh Method of operating a microlithographic projection exposure apparatus
DE102011075316A1 (de) * 2011-05-05 2012-11-08 Carl Zeiss Smt Gmbh Optisches Modul mit einer Messeinrichtung
DE102011076435B4 (de) * 2011-05-25 2013-09-19 Carl Zeiss Smt Gmbh Verfahren sowie Vorrichtung zur Einstellung einer Beleuchtungsoptik
KR101693950B1 (ko) 2011-09-29 2017-01-06 칼 짜이스 에스엠테 게엠베하 마이크로리소그래피 투영 노광 장치의 투영 대물 렌즈
KR101679136B1 (ko) * 2012-02-04 2016-11-23 칼 짜이스 에스엠티 게엠베하 마이크로리소그래픽 투영 노광 장치의 동작 방법 및 이러한 장치의 투영 오브젝티브
GB201205394D0 (en) * 2012-03-27 2012-05-09 Adlens Ltd Improvements in or relating to deformable non-round membrane assemblies
IN2014DN08706A (enExample) * 2012-03-27 2015-05-22 Adlens Ltd
WO2013156041A1 (en) 2012-04-18 2013-10-24 Carl Zeiss Smt Gmbh A microlithographic apparatus and a method of changing an optical wavefront in an objective of such an apparatus
WO2013174646A1 (en) * 2012-05-24 2013-11-28 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
WO2014117791A1 (en) 2013-02-01 2014-08-07 Carl Zeiss Smt Gmbh Microlithographic projection exposure apparatus and method of operating same
US9651872B2 (en) 2013-03-13 2017-05-16 Carl Zeiss Smt Gmbh Projection lens with wavefront manipulator
WO2014139543A1 (en) 2013-03-13 2014-09-18 Carl Zeiss Smt Gmbh Microlithographic apparatus
US9298102B2 (en) 2013-03-13 2016-03-29 Carl Zeiss Smt Gmbh Projection lens with wavefront manipulator
DE102013204391B3 (de) * 2013-03-13 2014-05-28 Carl Zeiss Smt Gmbh Projektionsobjektiv mit Wellenfrontmanipulator
DE102013204572A1 (de) * 2013-03-15 2014-09-18 Carl Zeiss Smt Gmbh Projektionsbelichtungsanlage mit hochflexiblem Manipulator
KR101668984B1 (ko) 2013-09-14 2016-10-24 칼 짜이스 에스엠티 게엠베하 마이크로리소그래피 투영 장치의 동작 방법
JP6168957B2 (ja) * 2013-09-30 2017-07-26 キヤノン株式会社 光学装置、投影光学系、露光装置および物品の製造方法
DE102014209160A1 (de) * 2014-05-14 2015-11-19 Carl Zeiss Smt Gmbh Optisches Modul
DE102014209150A1 (de) * 2014-05-14 2015-07-02 Carl Zeiss Smt Gmbh Optisches Modul
DE102014209147A1 (de) * 2014-05-14 2015-11-19 Carl Zeiss Smt Gmbh Optisches Modul
DE102014209151A1 (de) * 2014-05-14 2015-07-02 Carl Zeiss Smt Gmbh Optisches Modul
WO2015173362A1 (de) 2014-05-14 2015-11-19 Carl Zeiss Smt Gmbh Optimale anordnung von aktuier- und sensorpunkten auf einem optischen element
DE102014209149A1 (de) * 2014-05-14 2015-10-08 Carl Zeiss Smt Gmbh Optisches Modul
DE102014212710A1 (de) * 2014-07-01 2016-01-07 Carl Zeiss Smt Gmbh Optischer Manipulator, Projektionsobjektiv und Projektionsbelichtungsanlage
DE102014212711A1 (de) 2014-07-01 2016-01-07 Carl Zeiss Smt Gmbh Plattenförmiges optisches Element, optischer Manipulator, Projektionsobjektiv und Projektionsbelichtungsanlage
DE102014218474A1 (de) 2014-09-15 2016-03-17 Carl Zeiss Smt Gmbh Projektionsobjektiv, Projektionsbelichtungsanlage und Projektionsbelichtungsverfahren für die EUV-Mikrolithographie
JP6629318B2 (ja) * 2014-11-24 2020-01-15 エーエスエムエル ネザーランズ ビー.ブイ. 放射ビーム装置
NL2016065A (en) * 2015-02-24 2016-09-30 Asml Netherlands Bv A lithographic apparatus, a manipulator systemand a method of controlling curvature of a focal plane.
DE102015209051B4 (de) 2015-05-18 2018-08-30 Carl Zeiss Smt Gmbh Projektionsobjektiv mit Wellenfrontmanipulator sowie Projektionsbelichtungsverfahren und Projektionsbelichtungsanlage
CN108700828B (zh) * 2016-02-25 2020-09-15 Asml荷兰有限公司 致动器系统和光刻设备
DE102017203304A1 (de) * 2016-03-17 2017-09-21 Sony Corporation Linsenstack auf waferebene, optisches system, elektronische einrichtung und verfahren
DE102016218744A1 (de) 2016-09-28 2018-03-29 Carl Zeiss Smt Gmbh Projektionsbelichtungsanlage mit Flüssigkeitsschicht zur Wellenfrontkorrektur
DE102016221878A1 (de) 2016-11-08 2017-11-09 Carl Zeiss Smt Gmbh Projektionsbelichtungsanlage für die Halbleiterlithographie und deren Komponenten sowie Herstellungsverfahren derartiger Komponenten
GB201800930D0 (en) 2018-01-19 2018-03-07 Adlens Ltd Improvements in or relating to variable focusing power optical devices
DE102018202687A1 (de) 2018-02-22 2018-05-03 Carl Zeiss Smt Gmbh Herstellungsverfahren für Komponenten einer Projektionsbelichtungsanlage für die Halbleiterlithographie und Projektionsbelichtungsanlage
US11378806B1 (en) * 2018-12-07 2022-07-05 Facebook Technologies, Llc Multi-element electromechanical actuation mechanism for asymmetric optical applications
DE102019201509A1 (de) * 2019-02-06 2020-08-06 Carl Zeiss Smt Gmbh Abstützung eines optischen Elements
US11561415B1 (en) 2019-05-16 2023-01-24 Meta Platforms Technologies, Llc Moving guide actuation of fluid lenses
US11867927B1 (en) 2019-05-16 2024-01-09 Meta Platforms Technologies, Llc Modified membranes for fluid lenses
US11333803B2 (en) 2019-05-16 2022-05-17 Facebook Technologies, Llc Fluid lens with low energy membrane adjustment
US11635637B1 (en) 2019-05-16 2023-04-25 Meta Platforms Technologies, Llc Fluid lens with low energy membrane adjustment
US11719960B1 (en) 2019-05-16 2023-08-08 Meta Platforms Technologies, Llc Gravity sag compensation in fluid-filled lenses
WO2021018499A1 (en) * 2019-07-29 2021-02-04 Asml Netherlands B.V. Thermo-mechanical actuator
CN112526707A (zh) * 2019-09-18 2021-03-19 华为技术有限公司 镜头模组及电子设备
US11506825B1 (en) 2019-10-24 2022-11-22 Meta Platforms, Inc. Elastomer based flexures for fluid lenses
US11703616B2 (en) 2019-11-05 2023-07-18 Meta Platforms Technologies, Llc Fluid lens with low gas content fluid
US11740391B1 (en) 2020-12-31 2023-08-29 Meta Platforms Technologies, Llc Fluid lens operational feedback using sensor signal
DE102021205368A1 (de) * 2021-05-27 2022-12-01 Carl Zeiss Smt Gmbh Komponente für eine Projektionsbelichtungsanlage für die Halbleiterlithografie und Verfahren zur Auslegung der Komponente
DE102023130957A1 (de) * 2023-11-08 2025-05-08 Carl Zeiss Smt Gmbh Verfahren zum Bestimmen wenigstens eines Manipulatorfreiheitsgrads, Verfahren zum Definieren wenigstens eines virtuellen Manipulators, Verfahren zum Betrieb einer Projektionsbelichtungsanlage sowie Projektionsbelichtungsanlage
WO2025191794A1 (ja) * 2024-03-14 2025-09-18 株式会社ニコン 光学部材変形装置、収差補正装置、及び光学装置

Family Cites Families (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4289379A (en) * 1977-04-27 1981-09-15 Quantel S.A. Optical system having a variable focal length
GB2183059B (en) * 1985-11-05 1989-09-27 Michel Treisman Suspension system for a flexible optical membrane
US4825247A (en) * 1987-02-16 1989-04-25 Canon Kabushiki Kaisha Projection exposure apparatus
IL83179A0 (en) * 1987-07-14 1987-12-31 Daniel Barnea Variable lens
US5523193A (en) * 1988-05-31 1996-06-04 Texas Instruments Incorporated Method and apparatus for patterning and imaging member
JP2679195B2 (ja) * 1988-12-21 1997-11-19 株式会社ニコン 投影露光装置
WO1991017483A1 (de) * 1990-05-02 1991-11-14 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Belichtungsvorrichtung
JP3021142B2 (ja) * 1990-11-28 2000-03-15 キヤノン株式会社 光学素子、映像安定化装置及び光学装置
US5229872A (en) * 1992-01-21 1993-07-20 Hughes Aircraft Company Exposure device including an electrically aligned electronic mask for micropatterning
JP3368091B2 (ja) 1994-04-22 2003-01-20 キヤノン株式会社 投影露光装置及びデバイスの製造方法
JPH085942A (ja) 1994-06-16 1996-01-12 Canon Inc 可変頂角プリズム装置
JP3480071B2 (ja) 1994-10-13 2003-12-15 株式会社デンソー 可変焦点レンズ
US5774274A (en) * 1995-05-12 1998-06-30 Schachar; Ronald A. Variable focus lens by small changes of the equatorial lens diameter
US5684637A (en) * 1995-07-19 1997-11-04 Floyd; Johnnie E. Fluid filled and pressurized lens with flexible optical boundary having variable focal length
JP3526042B2 (ja) 1995-08-09 2004-05-10 株式会社ニコン 投影露光装置
EP0851304B1 (en) * 1996-12-28 2004-03-17 Canon Kabushiki Kaisha Projection exposure apparatus and device manufacturing method
SE511727C2 (sv) 1998-02-17 1999-11-15 Haakan Bonds Anordning innefattande en optisk kropp
DE19827603A1 (de) * 1998-06-20 1999-12-23 Zeiss Carl Fa Optisches System, insbesondere Projektions-Belichtungsanlage der Mikrolithographie
US6437925B1 (en) * 1998-06-30 2002-08-20 Olympus Optical Co., Ltd. Optical apparatus
JP2000058436A (ja) 1998-08-11 2000-02-25 Nikon Corp 投影露光装置及び露光方法
DE19859634A1 (de) * 1998-12-23 2000-06-29 Zeiss Carl Fa Optisches System, insbesondere Projektionsbelichtungsanlage der Mikrolithographie
JP2001013306A (ja) 1999-06-28 2001-01-19 Canon Inc 可変焦点レンズ装置
DE10000193B4 (de) 2000-01-05 2007-05-03 Carl Zeiss Smt Ag Optisches System
TW550377B (en) * 2000-02-23 2003-09-01 Zeiss Stiftung Apparatus for wave-front detection
JP4532647B2 (ja) 2000-02-23 2010-08-25 キヤノン株式会社 露光装置
DE10119861A1 (de) * 2000-05-04 2001-11-08 Zeiss Carl Projektionsobjektiv, insbesondere für die Mikrolithographie
JP2002131513A (ja) 2000-10-27 2002-05-09 Fuji Photo Film Co Ltd 焦点距離可変レンズ
EP1231515B1 (en) 2001-02-08 2008-11-05 ASML Netherlands B.V. Lithographic apparatus and device manufacturing method
US6666559B2 (en) * 2001-04-17 2003-12-23 Olympus Optical Co., Ltd. Variable-profile optical device including variable-profile mirror and optical element including variable-profile optical element
JP2003029150A (ja) * 2001-07-13 2003-01-29 Olympus Optical Co Ltd 光学特性可変光学素子を含む光学系及び光学装置
DE10140608A1 (de) * 2001-08-18 2003-03-06 Zeiss Carl Vorrichtung zur Justage eines optischen Elements
JP3687585B2 (ja) * 2001-10-05 2005-08-24 オムロン株式会社 焦点可変レンズ装置
DE10225266A1 (de) * 2001-12-19 2003-07-03 Zeiss Carl Smt Ag Abbildungseinrichtung in einer Projektionsbelichtungsanlage
JP2003257052A (ja) * 2002-02-28 2003-09-12 Sony Corp 露光装置、露光方法、記録および/または再生装置ならびに記録および/または再生方法
AU2002346911A1 (en) * 2002-10-15 2004-05-04 Carl Zeiss Smt Ag Optical arrangement and method of specifying and performing a deformation of an optical surface of an optical element being part of the optical arrangement
WO2005022614A1 (ja) * 2003-08-28 2005-03-10 Nikon Corporation 露光方法及び装置、並びにデバイス製造方法
DE102004051838A1 (de) * 2003-10-23 2005-05-25 Carl Zeiss Smt Ag Spiegelanordnung, Verfahren zum Herstellen einer solchen, optisches System und lithographisches Verfahren zur Herstellung eines miniaturisierten Bauelements
US7385764B2 (en) * 2003-12-15 2008-06-10 Carl Zeiss Smt Ag Objectives as a microlithography projection objective with at least one liquid lens
EP1697798A2 (en) 2003-12-15 2006-09-06 Carl Zeiss SMT AG Projection objective having a high aperture and a planar end surface
US7466489B2 (en) * 2003-12-15 2008-12-16 Susanne Beder Projection objective having a high aperture and a planar end surface
EP1706793B1 (en) 2004-01-20 2010-03-03 Carl Zeiss SMT AG Exposure apparatus and measuring device for a projection lens
JP2007520893A (ja) * 2004-02-03 2007-07-26 ロチェスター インスティテュート オブ テクノロジー 流体を使用したフォトリソグラフィ法及びそのシステム
CN101727021A (zh) * 2004-02-13 2010-06-09 卡尔蔡司Smt股份公司 微平版印刷投影曝光装置的投影物镜
WO2006053751A2 (de) 2004-11-18 2006-05-26 Carl Zeiss Smt Ag Projektionsobjektiv einer mikrolithographischen projektionsbelichtungsanlage
TWI454731B (zh) 2005-05-27 2014-10-01 Zeiss Carl Smt Gmbh 用於改進投影物鏡的成像性質之方法以及該投影物鏡
WO2007017089A1 (en) * 2005-07-25 2007-02-15 Carl Zeiss Smt Ag Projection objective of a microlithographic projection exposure apparatus

Also Published As

Publication number Publication date
US7990622B2 (en) 2011-08-02
US7830611B2 (en) 2010-11-09
JP2009503826A (ja) 2009-01-29
US20080239503A1 (en) 2008-10-02
WO2007017089A1 (en) 2007-02-15
US20110019169A1 (en) 2011-01-27

Similar Documents

Publication Publication Date Title
JP5069232B2 (ja) マイクロリソグラフィ投影露光装置の投影対物レンズ
CN101821678B (zh) 微光刻投射曝光设备
KR101367074B1 (ko) 동공 미러를 갖는 반사굴절식 투영 대물렌즈, 투영 노광 장치 및 방법
JP5684412B2 (ja) 瞳ミラーを有する反射屈折投影対物器械、投影露光装置及び方法
JP4639357B2 (ja) 収差補正光学エレメントおよびこれを備えたリソグラフィ装置
JP5224218B2 (ja) マイクロリソグラフィ投影露光装置の光学システム
US20080212183A1 (en) Lithographic apparatus, aberration correction device and device manufacturing method
JP5861973B2 (ja) マイクロリソグラフィ投影露光装置を作動させる方法及びそのような装置の投影対物系
JP6147924B2 (ja) マイクロリソグラフィ投影装置を作動させる方法
KR20240165451A (ko) 구동 디바이스, 광학 시스템 및 리소그래피 장치
KR20080047993A (ko) 리소그래피 장치, 디바이스 제조 방법, 및 컴퓨터 프로그램제품
US12353137B2 (en) Field facet system and lithography apparatus
US20160054662A1 (en) Projection exposure apparatus with a highly flexible manipulator
US20090231568A1 (en) Method of measuring wavefront error, method of correcting wavefront error, and method of fabricating semiconductor device
US20250110327A1 (en) Method for operating a control device, control device, optical system and lithography apparatus
TWI397781B (zh) Optical system, exposure apparatus and apparatus manufacturing method
WO2014117791A1 (en) Microlithographic projection exposure apparatus and method of operating same
JP4469820B2 (ja) 照明ビーム測定
US20110134403A1 (en) Microlithographic projection exposure apparatus
EP1906253A1 (en) Projection objective of a microlithographic projection exposure apparatus

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090514

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20090514

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20110909

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20110920

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20111220

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20111228

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120214

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20120717

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20120816

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20150824

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Ref document number: 5069232

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees