JP4947817B2 - 発泡バルク金属ガラスで構成されている電気バンプを備える製品及びシステム - Google Patents
発泡バルク金属ガラスで構成されている電気バンプを備える製品及びシステム Download PDFInfo
- Publication number
- JP4947817B2 JP4947817B2 JP2009506819A JP2009506819A JP4947817B2 JP 4947817 B2 JP4947817 B2 JP 4947817B2 JP 2009506819 A JP2009506819 A JP 2009506819A JP 2009506819 A JP2009506819 A JP 2009506819A JP 4947817 B2 JP4947817 B2 JP 4947817B2
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- Japan
- Prior art keywords
- bmg
- foam
- foamed
- die
- electrical bump
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 239000005300 metallic glass Substances 0.000 title claims description 14
- 229910000679 solder Inorganic materials 0.000 claims description 79
- 239000000758 substrate Substances 0.000 claims description 71
- 239000006260 foam Substances 0.000 claims description 56
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- 229910052751 metal Inorganic materials 0.000 claims description 33
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- 239000006262 metallic foam Substances 0.000 claims description 12
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- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 10
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- 239000002243 precursor Substances 0.000 description 36
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- ZSJFLDUTBDIFLJ-UHFFFAOYSA-N nickel zirconium Chemical compound [Ni].[Zr] ZSJFLDUTBDIFLJ-UHFFFAOYSA-N 0.000 description 2
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Images
Classifications
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- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C45/00—Amorphous alloys
- C22C45/10—Amorphous alloys with molybdenum, tungsten, niobium, tantalum, titanium, or zirconium or Hf as the major constituent
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
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Description
Claims (26)
- セル状発泡体および網状発泡体から選択されるミクロ発泡構造を有するバルク金属ガラスで構成されているマクロ構造としての電気バンプを備える
製品。 - 前記バルク金属ガラスは、ジルコニウム合金で、ZrAlCuO、ZrAlNiCuO、ZrAlNiCuO、ZrTiAlNiCuO、ZrAlNiCu(Cr,Mo)、ZrAlNiCu(Ag,Pd,Au,Pt)、ZrAlNiCu(Nb,Ta,V)、ZrAlNi(Ag,Pd,Au,Pt)、ZrAlCuPd、ZrNi(Fe,Co)、ZrNi(Pd,Au,Pt)、ZrCuPd、ZrPd、ZrPt、またはそれらの組み合わせから選択される
請求項1に記載の製品。 - 前記バルク金属ガラスは、ハフニウム合金で、HfAlNiCu、HfAlNiCuPd、HfAlNiAg、HfCu(Pd,Pt)またはそれらの組み合わせから選択される
請求項1に記載の製品。 - 前記バルク金属ガラスは、チタン合金で、TiZrNi、TiZrNiCuまたはそれらの組み合わせから選択される
請求項1に記載の製品。 - 前記バルク金属ガラスは、鉄合金である
請求項1に記載の製品。 - 前記バルク金属ガラスは、ジルコニウム合金、ハフニウム合金、チタン合金、鉄合金またはそれらの組み合わせから選択される
請求項1に記載の製品。 - 前記電気バンプの直径が約1μmから約300μmの範囲内である
請求項1から6のいずれか一項に記載の製品。 - 前記電気バンプは
発泡ハンダコア第1材料と、
前記発泡ハンダコア第1材料がその上に配設されているハンダ基板第2材料と
を含む
請求項1から7のいずれか一項に記載の製品。 - 前記電気バンプは、
発泡ハンダコア第1材料と、
前記発泡ハンダコア第1材料を被覆するハンダシェル第2材料と
を含む
請求項1から7のいずれか一項に記載の製品。 - セル状発泡体および網状発泡体から選択されるミクロ発泡構造を有するバルク金属ガラスで構成されているマクロ構造としてのメタライゼーションインターコネクトをさらに備える
請求項1から9のいずれか一項に記載の製品。 - 前記電気バンプは、第1の電気バンプと、前記第1の電気バンプから離間されている第2の電気バンプとを含む
請求項1から10のいずれか一項に記載の製品。 - 前記電気バンプは、第1の電気バンプと、前記第1の電気バンプから離間されている第2の電気バンプとを含み、
前記第1の電気バンプおよび前記第2の電気バンプは、互いに隣接し、0.8ミリメートル以下のピッチで離間している
請求項1から10のいずれか一項に記載の製品。 - 前記電気バンプは実装基板のボード側に設けられている
請求項1から12のいずれか一項に記載の製品。 - 前記電気バンプは実装基板のダイ側に設けられている
請求項1から12のいずれか一項に記載の製品。 - 発泡金属ミクロ構造を有するボンディングパッドをさらに備える
請求項1から14のいずれか一項に記載の製品。 - 前記ボンディングパッドはバルク金属ガラスを含む
請求項15に記載の製品。 - 前記ボンディングパッドは、ジルコニウム合金、ハフニウム合金、チタン合金、鉄合金およびそれらの組み合わせから選択されるバルク金属ガラスを含む
請求項15に記載の製品。 - 前記発泡金属ミクロ構造はセル状発泡体および網状発泡体から選択される
請求項15に記載の製品。 - 前記ボンディングパッドは、実装基板のボード側に設けられている
請求項15から18のいずれか一項に記載の製品。 - 前記ボンディングパッドは、実装基板のダイ側に設けられている
請求項15から18のいずれか一項に記載の製品。 - ダイと、
前記ダイに配設されているボンディングパッドと、
前記ボンディングパッドに接合されている電気バンプと、
前記ボンディングパッド及び前記電気バンプを介して前記ダイに接合されているダイナミックランダムアクセスメモリと
を備え、
前記ボンディングパッドは発泡金属ミクロ構造を持ち、
前記電気バンプは、セル状発泡体および網状発泡体から選択されるミクロ発泡構造を有するバルク金属ガラスで構成されているマクロ構造を持つ
システム。 - 前記システムは、コンピュータ、ワイヤレス通信機、ハンドヘルドデバイス、自動車、機関車、飛行機、船舶または宇宙船のうちのいずれかに配設されている
請求項21に記載のシステム。 - 前記ダイは、データストレージデバイス、デジタル・シグナル・プロセッサ、マイクロコントローラ、特定用途向け集積回路またはマイクロプロセッサの中から選択される
請求項21に記載のシステム。 - ダイと、
前記ダイに接合されている電気バンプと、
前記ダイに接合されているダイナミックランダムアクセスメモリと
を備え、
前記電気バンプは、セル状発泡体および網状発泡体から選択されるミクロ発泡構造を有するバルク金属ガラスで構成されているマクロ構造を持つ
システム。 - 前記システムは、コンピュータ、ワイヤレス通信機、ハンドヘルドデバイス、自動車、機関車、飛行機、船舶または宇宙船のうちのいずれかに配設されている
請求項24に記載のシステム。 - 前記ダイは、データストレージデバイス、デジタル・シグナル・プロセッサ、マイクロコントローラ、特定用途向け集積回路またはマイクロプロセッサの中から選択される
請求項24に記載のシステム。
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US11/425,353 | 2006-06-20 | ||
US11/425,353 US7705458B2 (en) | 2006-06-20 | 2006-06-20 | Bulk metallic glass solders, foamed bulk metallic glass solders, foamed-solder bond pads in chip packages, methods of assembling same, and systems containing same |
PCT/US2007/071002 WO2007149737A2 (en) | 2006-06-20 | 2007-06-12 | Bulk metallic glass solders, foamed bulk metallic glass solders, foamed- solder bond pads in chip packages, methods of assembling same and systems containing same |
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JP2012047873A Division JP5182682B2 (ja) | 2006-06-20 | 2012-03-05 | 多孔質電気バンプの製造方法 |
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JP2012047873A Expired - Fee Related JP5182682B2 (ja) | 2006-06-20 | 2012-03-05 | 多孔質電気バンプの製造方法 |
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US (1) | US7705458B2 (ja) |
JP (2) | JP4947817B2 (ja) |
KR (1) | KR101205664B1 (ja) |
CN (2) | CN104681521A (ja) |
TW (1) | TWI351086B (ja) |
WO (1) | WO2007149737A2 (ja) |
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Publication number | Priority date | Publication date | Assignee | Title |
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US7628871B2 (en) * | 2005-08-12 | 2009-12-08 | Intel Corporation | Bulk metallic glass solder material |
US20090032970A1 (en) * | 2007-07-31 | 2009-02-05 | Park Chang-Min | Stacking of integrated circuits using glassy metal bonding |
DE102008017157B4 (de) | 2008-04-03 | 2022-10-06 | Vitesco Technologies GmbH | Kontaktelement und Leiterplattenordnung |
US7755200B2 (en) * | 2008-09-15 | 2010-07-13 | National Semiconductor Corporation | Methods and arrangements for forming solder joint connections |
JP5623022B2 (ja) * | 2009-03-25 | 2014-11-12 | 国立大学法人熊本大学 | 溶接方法の設計方法、溶接方法及び溶接接合体 |
US8895358B2 (en) * | 2009-09-11 | 2014-11-25 | Stats Chippac, Ltd. | Semiconductor device and method of forming cavity in PCB containing encapsulant or dummy die having CTE similar to CTE of large array WLCSP |
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JP2009533886A (ja) | 2009-09-17 |
US7705458B2 (en) | 2010-04-27 |
KR101205664B1 (ko) | 2012-11-27 |
JP5182682B2 (ja) | 2013-04-17 |
CN101473424A (zh) | 2009-07-01 |
TW200818431A (en) | 2008-04-16 |
CN104681521A (zh) | 2015-06-03 |
KR20090019852A (ko) | 2009-02-25 |
WO2007149737A2 (en) | 2007-12-27 |
JP2012164984A (ja) | 2012-08-30 |
US20070290339A1 (en) | 2007-12-20 |
WO2007149737A3 (en) | 2008-02-21 |
TWI351086B (en) | 2011-10-21 |
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