JP4916763B2 - プローブ組立体 - Google Patents

プローブ組立体 Download PDF

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Publication number
JP4916763B2
JP4916763B2 JP2006129333A JP2006129333A JP4916763B2 JP 4916763 B2 JP4916763 B2 JP 4916763B2 JP 2006129333 A JP2006129333 A JP 2006129333A JP 2006129333 A JP2006129333 A JP 2006129333A JP 4916763 B2 JP4916763 B2 JP 4916763B2
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JP
Japan
Prior art keywords
probe
region
slit
support
bar
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2006129333A
Other languages
English (en)
Japanese (ja)
Other versions
JP2007303834A (ja
Inventor
智昭 久我
貴生 安田
晴匡 出羽
樹理 六戸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
Original Assignee
Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Priority to JP2006129333A priority Critical patent/JP4916763B2/ja
Priority to TW096112792A priority patent/TW200745567A/zh
Priority to KR1020070044361A priority patent/KR100863987B1/ko
Publication of JP2007303834A publication Critical patent/JP2007303834A/ja
Application granted granted Critical
Publication of JP4916763B2 publication Critical patent/JP4916763B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
JP2006129333A 2006-05-08 2006-05-08 プローブ組立体 Expired - Lifetime JP4916763B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2006129333A JP4916763B2 (ja) 2006-05-08 2006-05-08 プローブ組立体
TW096112792A TW200745567A (en) 2006-05-08 2007-04-12 Probe assembly
KR1020070044361A KR100863987B1 (ko) 2006-05-08 2007-05-08 프로브 조립체

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006129333A JP4916763B2 (ja) 2006-05-08 2006-05-08 プローブ組立体

Publications (2)

Publication Number Publication Date
JP2007303834A JP2007303834A (ja) 2007-11-22
JP4916763B2 true JP4916763B2 (ja) 2012-04-18

Family

ID=38837893

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006129333A Expired - Lifetime JP4916763B2 (ja) 2006-05-08 2006-05-08 プローブ組立体

Country Status (3)

Country Link
JP (1) JP4916763B2 (enExample)
KR (1) KR100863987B1 (enExample)
TW (1) TW200745567A (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5396104B2 (ja) * 2009-03-05 2014-01-22 株式会社日本マイクロニクス プローブ組立体
JP5690105B2 (ja) * 2009-11-26 2015-03-25 株式会社日本マイクロニクス プローブ装置
JP5588892B2 (ja) * 2010-12-03 2014-09-10 株式会社日本マイクロニクス プローブ組立体
US11821943B2 (en) * 2020-10-06 2023-11-21 Johnstech International Corporation Compliant ground block and testing system having compliant ground block
KR102265960B1 (ko) * 2020-12-29 2021-06-17 주식회사 프로이천 프로브 블록
KR102477553B1 (ko) * 2021-01-22 2022-12-15 주식회사 디앤에스시스템 디스플레이 패널 검사용 프로브 핀 블록
KR102294168B1 (ko) * 2021-06-18 2021-08-25 이시훈 블레이드형 프로브 블록
JP2023141024A (ja) 2022-03-23 2023-10-05 株式会社日本マイクロニクス プローブ、プローブ保持装置およびプローブの製造方法
CN116908500B (zh) * 2023-09-12 2023-12-01 上海泽丰半导体科技有限公司 一种通用测试平台探针塔的拆装方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3750831B2 (ja) * 1996-10-28 2006-03-01 株式会社日本マイクロニクス プローブ組立体
JP2000111574A (ja) * 1998-10-01 2000-04-21 Mitsubishi Electric Corp プローブカード
JP2004069485A (ja) * 2002-08-06 2004-03-04 Yamaha Corp プローブユニットおよびその製造方法、プローブカードおよびその製造方法
JP2006098278A (ja) * 2004-09-30 2006-04-13 Micronics Japan Co Ltd プローブ及びプローブ組立体
KR100615907B1 (ko) 2005-12-12 2006-08-28 (주)엠씨티코리아 평판표시패널 검사용 프로브 장치

Also Published As

Publication number Publication date
TWI325963B (enExample) 2010-06-11
TW200745567A (en) 2007-12-16
KR100863987B1 (ko) 2008-10-16
KR20070108824A (ko) 2007-11-13
JP2007303834A (ja) 2007-11-22

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