JP4637475B2 - 取外し可能なサセプタを用いた半導体基板搬送システム、及び半導体基板の搬送方法 - Google Patents
取外し可能なサセプタを用いた半導体基板搬送システム、及び半導体基板の搬送方法 Download PDFInfo
- Publication number
- JP4637475B2 JP4637475B2 JP2003406235A JP2003406235A JP4637475B2 JP 4637475 B2 JP4637475 B2 JP 4637475B2 JP 2003406235 A JP2003406235 A JP 2003406235A JP 2003406235 A JP2003406235 A JP 2003406235A JP 4637475 B2 JP4637475 B2 JP 4637475B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- susceptor
- semiconductor substrate
- removable
- self
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
- H10P72/7611—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge profile or support profile
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0434—Apparatus for thermal treatment mainly by convection
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
- H10P72/12—Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements
- H10P72/127—Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements characterised by the substrate support
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
- H10P72/18—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] characterised by being specially adapted for supporting a single substrate or by comprising a stack of such individual supports
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/137—Associated with semiconductor wafer handling including means for charging or discharging wafer cassette
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/310,141 US6799940B2 (en) | 2002-12-05 | 2002-12-05 | Removable semiconductor wafer susceptor |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2004200678A JP2004200678A (ja) | 2004-07-15 |
| JP2004200678A5 JP2004200678A5 (enExample) | 2006-12-07 |
| JP4637475B2 true JP4637475B2 (ja) | 2011-02-23 |
Family
ID=32467973
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003406235A Expired - Fee Related JP4637475B2 (ja) | 2002-12-05 | 2003-12-04 | 取外し可能なサセプタを用いた半導体基板搬送システム、及び半導体基板の搬送方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US6799940B2 (enExample) |
| JP (1) | JP4637475B2 (enExample) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6761085B1 (en) * | 2002-02-06 | 2004-07-13 | Novellus Systems Incorporated | Method and apparatus for damping vibrations in a semiconductor wafer handling arm |
| EP1431825A1 (en) * | 2002-12-20 | 2004-06-23 | ASML Netherlands B.V. | Lithographic apparatus, device manufacturing method, and substrate holder |
| KR100549273B1 (ko) * | 2004-01-15 | 2006-02-03 | 주식회사 테라세미콘 | 반도체 제조장치의 기판홀더 |
| KR100875464B1 (ko) * | 2004-09-30 | 2008-12-22 | 가부시키가이샤 히다치 고쿠사이 덴키 | 열처리 장치 및 기판의 제조방법 |
| TW201115675A (en) * | 2005-04-25 | 2011-05-01 | Terasemicon Co Ltd | Manufacturing method for the holder of the batch type boat |
| US7748542B2 (en) * | 2005-08-31 | 2010-07-06 | Applied Materials, Inc. | Batch deposition tool and compressed boat |
| JP4813313B2 (ja) * | 2006-09-29 | 2011-11-09 | Sumco Techxiv株式会社 | シリコン単結晶引上げ装置及び該装置に使用される黒鉛部材並びに黒鉛部材の劣化防止方法 |
| JP5205738B2 (ja) * | 2006-10-16 | 2013-06-05 | 株式会社Sumco | シリコンウェーハの支持方法、熱処理治具および熱処理ウェーハ |
| US8099190B2 (en) * | 2007-06-22 | 2012-01-17 | Asm International N.V. | Apparatus and method for transferring two or more wafers whereby the positions of the wafers can be measured |
| US20090004405A1 (en) * | 2007-06-29 | 2009-01-01 | Applied Materials, Inc. | Thermal Batch Reactor with Removable Susceptors |
| JP5071217B2 (ja) * | 2008-04-17 | 2012-11-14 | 信越半導体株式会社 | 縦型熱処理用ボートおよびそれを用いたシリコンウエーハの熱処理方法 |
| JP2010157536A (ja) * | 2008-12-26 | 2010-07-15 | Nuflare Technology Inc | サセプタの製造方法 |
| KR101855217B1 (ko) * | 2010-12-30 | 2018-05-08 | 비코 인스트루먼츠 인코포레이티드 | 캐리어 연장부를 이용한 웨이퍼 처리 |
| DE102016111236A1 (de) * | 2016-06-20 | 2017-12-21 | Heraeus Noblelight Gmbh | Substrat-Trägerelement für eine Trägerhorde, sowie Trägerhorde und Vorrichtung mit dem Substrat-Trägerelement |
| EP3422396B1 (de) | 2017-06-28 | 2021-08-04 | Meyer Burger (Germany) GmbH | Vorrichtung zum transport eines substrats, behandlungsvorrichtung mit einer an einen substratträger einer solchen vorrichtung angepassten aufnahmeplatte und verfahren zum prozessieren eines substrates unter nutzung einer solchen vorrichtung zum transport eines substrats sowie behandlungsanlage |
| US11521876B2 (en) * | 2018-03-07 | 2022-12-06 | Tokyo Electron Limited | Horizontal substrate boat |
| EP3626865A1 (en) | 2018-09-20 | 2020-03-25 | Heraeus GMSI LLC | Susceptor and method for manufacturing the same |
| US12046495B2 (en) | 2020-06-26 | 2024-07-23 | Globalwafers Co., Ltd. | Wafer boats for supporting semiconductor wafers in a furnace |
Family Cites Families (65)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5475985A (en) | 1977-11-29 | 1979-06-18 | Matsushita Electric Ind Co Ltd | Heat treatment method of semiconductor substrate and its unit |
| KR890008922A (ko) | 1987-11-21 | 1989-07-13 | 후세 노보루 | 열처리 장치 |
| JPH01100446U (enExample) * | 1987-12-23 | 1989-07-05 | ||
| US5162047A (en) * | 1989-08-28 | 1992-11-10 | Tokyo Electron Sagami Limited | Vertical heat treatment apparatus having wafer transfer mechanism and method for transferring wafers |
| US5310339A (en) | 1990-09-26 | 1994-05-10 | Tokyo Electron Limited | Heat treatment apparatus having a wafer boat |
| JP3058901B2 (ja) | 1990-09-26 | 2000-07-04 | 東京エレクトロン株式会社 | 熱処理装置 |
| JP3204699B2 (ja) | 1990-11-30 | 2001-09-04 | 株式会社東芝 | 熱処理装置 |
| JP3100252B2 (ja) * | 1992-05-26 | 2000-10-16 | 東京エレクトロン株式会社 | 被処理体用ボート及びそれを用いた被処理体の移し換え方法ならびに熱処理装置 |
| JPH0661328A (ja) * | 1992-08-06 | 1994-03-04 | Nec Yamaguchi Ltd | 半導体ウェハー搬送装置 |
| JPH06151347A (ja) | 1992-11-02 | 1994-05-31 | Mitsubishi Materials Corp | 縦型熱処理炉用ボート |
| JPH06151550A (ja) * | 1992-11-05 | 1994-05-31 | Toshiba Corp | ウェハーフォーク |
| JPH06163440A (ja) | 1992-11-16 | 1994-06-10 | Shin Etsu Chem Co Ltd | 半導体縦型拡散炉用治具 |
| US5492229A (en) | 1992-11-27 | 1996-02-20 | Toshiba Ceramics Co., Ltd. | Vertical boat and a method for making the same |
| JP3280438B2 (ja) | 1992-11-30 | 2002-05-13 | 東芝セラミックス株式会社 | 縦型ボート |
| JP3250628B2 (ja) | 1992-12-17 | 2002-01-28 | 東芝セラミックス株式会社 | 縦型半導体熱処理用治具 |
| JP3245246B2 (ja) | 1993-01-27 | 2002-01-07 | 東京エレクトロン株式会社 | 熱処理装置 |
| JP3333577B2 (ja) | 1993-03-09 | 2002-10-15 | 東京エレクトロン株式会社 | 熱処理用ボート及び縦型熱処理装置 |
| US5458688A (en) | 1993-03-09 | 1995-10-17 | Tokyo Electron Kabushiki Kaisha | Heat treatment boat |
| JP2913439B2 (ja) | 1993-03-18 | 1999-06-28 | 東京エレクトロン株式会社 | 移載装置及び移載方法 |
| JPH06275701A (ja) * | 1993-03-19 | 1994-09-30 | Kokusai Electric Co Ltd | 基板搬送装置 |
| JPH0774234A (ja) * | 1993-06-28 | 1995-03-17 | Tokyo Electron Ltd | 静電チャックの電極構造、この組み立て方法、この組み立て治具及び処理装置 |
| JPH0745691A (ja) | 1993-07-29 | 1995-02-14 | Kokusai Electric Co Ltd | ウェーハホルダ |
| US5562387A (en) | 1993-10-04 | 1996-10-08 | Tokyo Electron Limited | Device for transferring plate-like objects |
| JP3453834B2 (ja) * | 1994-02-25 | 2003-10-06 | 三菱電機株式会社 | ウエハチャック装置および半導体製造装置 |
| JPH07263370A (ja) | 1994-03-17 | 1995-10-13 | Tokyo Electron Ltd | 熱処理装置 |
| JP3239977B2 (ja) | 1994-05-12 | 2001-12-17 | 株式会社日立国際電気 | 半導体製造装置 |
| US5775889A (en) | 1994-05-17 | 1998-07-07 | Tokyo Electron Limited | Heat treatment process for preventing slips in semiconductor wafers |
| JPH07326656A (ja) * | 1994-05-31 | 1995-12-12 | Fujitsu Ltd | 基板カセット |
| US5618351A (en) | 1995-03-03 | 1997-04-08 | Silicon Valley Group, Inc. | Thermal processing apparatus and process |
| JPH08264521A (ja) | 1995-03-20 | 1996-10-11 | Kokusai Electric Co Ltd | 半導体製造用反応炉 |
| JPH08277297A (ja) | 1995-04-06 | 1996-10-22 | Fujirebio Inc | 免疫原及び該免疫原を用いた免疫方法 |
| WO1996035228A1 (en) | 1995-05-05 | 1996-11-07 | Saint-Gobain Industrial Ceramics, Inc. | Slip free vertical rack design |
| US5534074A (en) | 1995-05-17 | 1996-07-09 | Heraeus Amersil, Inc. | Vertical boat for holding semiconductor wafers |
| JPH0950967A (ja) | 1995-05-26 | 1997-02-18 | Tokyo Electron Ltd | 被処理体の支持ボート |
| JP3218164B2 (ja) | 1995-05-31 | 2001-10-15 | 東京エレクトロン株式会社 | 被処理体の支持ボート、熱処理装置及び熱処理方法 |
| JP3504784B2 (ja) | 1995-09-07 | 2004-03-08 | 東京エレクトロン株式会社 | 熱処理方法 |
| JPH0992625A (ja) | 1995-09-20 | 1997-04-04 | Tokyo Electron Ltd | 熱処理用ボ−ト |
| JPH09139352A (ja) | 1995-11-15 | 1997-05-27 | Nec Corp | 縦型炉用ウェーハボート |
| JPH09199438A (ja) | 1996-01-12 | 1997-07-31 | Tokyo Electron Ltd | 熱処理用治具 |
| JP2927231B2 (ja) | 1996-01-12 | 1999-07-28 | 日本電気株式会社 | 半導体集積回路の不良解析方法及び装置 |
| JPH09199437A (ja) | 1996-01-12 | 1997-07-31 | Sumitomo Sitix Corp | 半導体ウェーハ支持装置 |
| US5820366A (en) | 1996-07-10 | 1998-10-13 | Eaton Corporation | Dual vertical thermal processing furnace |
| JP3469000B2 (ja) | 1996-08-02 | 2003-11-25 | 三井造船株式会社 | 縦型ウエハ支持装置 |
| EP0843338A1 (en) | 1996-11-15 | 1998-05-20 | Upsys | An improved boat for supporting semiconductor wafers |
| US6156121A (en) | 1996-12-19 | 2000-12-05 | Tokyo Electron Limited | Wafer boat and film formation method |
| JP3157738B2 (ja) | 1997-02-27 | 2001-04-16 | 山形日本電気株式会社 | ウエハ移載装置および移載方法 |
| JPH10270390A (ja) * | 1997-03-24 | 1998-10-09 | Nec Kyushu Ltd | 研磨装置のウェハ保持機構 |
| JPH10284429A (ja) | 1997-03-31 | 1998-10-23 | Sumitomo Sitix Corp | ウェーハ支持装置 |
| US6190113B1 (en) * | 1997-04-30 | 2001-02-20 | Applied Materials, Inc. | Quartz pin lift for single wafer chemical vapor deposition/etch process chamber |
| JP3494554B2 (ja) | 1997-06-26 | 2004-02-09 | 東芝セラミックス株式会社 | 半導体用治具およびその製造方法 |
| JPH1126561A (ja) | 1997-06-30 | 1999-01-29 | Toshiba Corp | 半導体製造装置 |
| JPH1129392A (ja) * | 1997-07-07 | 1999-02-02 | Hitachi Cable Ltd | 気層エピタキシャル成長方法及び装置 |
| JPH1140659A (ja) | 1997-07-15 | 1999-02-12 | Toshiba Ceramics Co Ltd | 半導体ウエハの熱処理用縦型ボート |
| JPH1154447A (ja) | 1997-08-06 | 1999-02-26 | Hitachi Ltd | ウェハ支持治具およびそれを用いた熱処理装置 |
| US6293749B1 (en) * | 1997-11-21 | 2001-09-25 | Asm America, Inc. | Substrate transfer system for semiconductor processing equipment |
| JPH11243064A (ja) | 1998-02-25 | 1999-09-07 | Sumitomo Metal Ind Ltd | ウェーハ支持板 |
| JPH11265852A (ja) * | 1998-03-17 | 1999-09-28 | Shin Etsu Handotai Co Ltd | 薄膜製造装置 |
| KR100424428B1 (ko) | 1998-09-28 | 2004-03-24 | 가부시키가이샤 히타치세이사쿠쇼 | 종형로 및 종형로용 웨이퍼보트 |
| JP2000232151A (ja) | 1999-02-10 | 2000-08-22 | Hitachi Ltd | 縦型炉用ウェハボート |
| JP3357311B2 (ja) * | 1999-02-12 | 2002-12-16 | アプライド マテリアルズ インコーポレイテッド | 半導体製造装置におけるウェハ支持装置 |
| US6099645A (en) | 1999-07-09 | 2000-08-08 | Union Oil Company Of California | Vertical semiconductor wafer carrier with slats |
| JP2001313329A (ja) * | 2000-04-28 | 2001-11-09 | Applied Materials Inc | 半導体製造装置におけるウェハ支持装置 |
| JP3584864B2 (ja) * | 2000-08-25 | 2004-11-04 | 三菱住友シリコン株式会社 | ウェーハ用サセプタ及びこれを備えたウェーハ熱処理装置 |
| JP2002151412A (ja) * | 2000-10-30 | 2002-05-24 | Applied Materials Inc | 半導体製造装置 |
| JP2002329777A (ja) * | 2001-05-07 | 2002-11-15 | Tokyo Electron Ltd | プラズマ処理方法及び基板保持装置 |
-
2002
- 2002-12-05 US US10/310,141 patent/US6799940B2/en not_active Expired - Fee Related
-
2003
- 2003-12-04 JP JP2003406235A patent/JP4637475B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US6799940B2 (en) | 2004-10-05 |
| US20040109748A1 (en) | 2004-06-10 |
| JP2004200678A (ja) | 2004-07-15 |
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