JP4570868B2 - 半導体装置 - Google Patents
半導体装置 Download PDFInfo
- Publication number
- JP4570868B2 JP4570868B2 JP2003433851A JP2003433851A JP4570868B2 JP 4570868 B2 JP4570868 B2 JP 4570868B2 JP 2003433851 A JP2003433851 A JP 2003433851A JP 2003433851 A JP2003433851 A JP 2003433851A JP 4570868 B2 JP4570868 B2 JP 4570868B2
- Authority
- JP
- Japan
- Prior art keywords
- bonding
- electrodes
- power supply
- semiconductor device
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/90—Masterslice integrated circuits
- H10D84/998—Input and output buffer/driver structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
- H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
- H10D84/0165—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices
- H10D84/0186—Manufacturing their interconnections or electrodes, e.g. source or drain electrodes
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W44/00—Electrical arrangements for controlling or matching impedance
- H10W44/20—Electrical arrangements for controlling or matching impedance at high-frequency [HF] or radio frequency [RF]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/65—Shapes or dispositions of interconnections
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W44/00—Electrical arrangements for controlling or matching impedance
- H10W44/20—Electrical arrangements for controlling or matching impedance at high-frequency [HF] or radio frequency [RF]
- H10W44/203—Electrical connections
- H10W44/206—Wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07541—Controlling the environment, e.g. atmosphere composition or temperature
- H10W72/07552—Controlling the environment, e.g. atmosphere composition or temperature changes in structures or sizes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07541—Controlling the environment, e.g. atmosphere composition or temperature
- H10W72/07553—Controlling the environment, e.g. atmosphere composition or temperature changes in shapes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07541—Controlling the environment, e.g. atmosphere composition or temperature
- H10W72/07554—Controlling the environment, e.g. atmosphere composition or temperature changes in dispositions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/521—Structures or relative sizes of bond wires
- H10W72/527—Multiple bond wires having different sizes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/536—Shapes of wire connectors the connected ends being ball-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5366—Shapes of wire connectors the bond wires having kinks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/537—Multiple bond wires having different shapes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/5449—Dispositions of bond wires not being orthogonal to a side surface of the chip, e.g. fan-out arrangements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/547—Dispositions of multiple bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5522—Materials of bond wires comprising metals or metalloids, e.g. silver comprising gold [Au]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/59—Bond pads specially adapted therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/931—Shapes of bond pads
- H10W72/932—Plan-view shape, i.e. in top view
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/931—Shapes of bond pads
- H10W72/934—Cross-sectional shape, i.e. in side view
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/944—Dispositions of multiple bond pads
- H10W72/9445—Top-view layouts, e.g. mirror arrays
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/951—Materials of bond pads
- H10W72/952—Materials of bond pads comprising metals or metalloids, e.g. PbSn, Ag or Cu
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Wire Bonding (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003433851A JP4570868B2 (ja) | 2003-12-26 | 2003-12-26 | 半導体装置 |
| US11/005,217 US7211903B2 (en) | 2003-12-26 | 2004-12-07 | Semiconductor device and manufacturing method of them |
| TW93138020A TWI364803B (en) | 2003-12-26 | 2004-12-08 | Semiconductor device |
| US11/730,088 US7323788B2 (en) | 2003-12-26 | 2007-03-29 | Semiconductor device and manufacturing method of them |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003433851A JP4570868B2 (ja) | 2003-12-26 | 2003-12-26 | 半導体装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005191447A JP2005191447A (ja) | 2005-07-14 |
| JP2005191447A5 JP2005191447A5 (https=) | 2007-02-15 |
| JP4570868B2 true JP4570868B2 (ja) | 2010-10-27 |
Family
ID=34791113
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003433851A Expired - Fee Related JP4570868B2 (ja) | 2003-12-26 | 2003-12-26 | 半導体装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (2) | US7211903B2 (https=) |
| JP (1) | JP4570868B2 (https=) |
| TW (1) | TWI364803B (https=) |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4570868B2 (ja) * | 2003-12-26 | 2010-10-27 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| JP2007103423A (ja) * | 2005-09-30 | 2007-04-19 | Renesas Technology Corp | 半導体装置及びその製造方法 |
| JP4993929B2 (ja) * | 2006-03-23 | 2012-08-08 | ルネサスエレクトロニクス株式会社 | 半導体集積回路装置 |
| US7394164B2 (en) * | 2006-07-28 | 2008-07-01 | Ultra Chip, Inc. | Semiconductor device having bumps in a same row for staggered probing |
| US7501709B1 (en) * | 2006-08-25 | 2009-03-10 | Altera Corporation | BGA package with wiring schemes having reduced current loop paths to improve cross talk control and characteristic impedance |
| US8922028B2 (en) * | 2007-02-13 | 2014-12-30 | Advanced Semiconductor Engineering, Inc. | Semiconductor package |
| JP2010010492A (ja) | 2008-06-27 | 2010-01-14 | Sony Corp | 半導体装置および半導体集積回路 |
| JP5395407B2 (ja) * | 2008-11-12 | 2014-01-22 | ルネサスエレクトロニクス株式会社 | 表示装置駆動用半導体集積回路装置および表示装置駆動用半導体集積回路装置の製造方法 |
| KR100935854B1 (ko) | 2009-09-22 | 2010-01-08 | 테세라 리써치 엘엘씨 | 와이어 본딩 및 기준 와이어 본딩에 의해 제어되는 임피던스를 가진 마이크로전자 어셈블리 |
| KR100950511B1 (ko) * | 2009-09-22 | 2010-03-30 | 테세라 리써치 엘엘씨 | 와이어 본딩 및 도전성 기준 소자에 의해 제어되는 임피던스를 포함하는 마이크로전자 어셈블리 |
| JP5448727B2 (ja) * | 2009-11-05 | 2014-03-19 | ルネサスエレクトロニクス株式会社 | 半導体装置及びその製造方法 |
| JP5252027B2 (ja) * | 2010-06-11 | 2013-07-31 | カシオ計算機株式会社 | 半導体装置の製造方法 |
| US8531013B2 (en) | 2010-06-11 | 2013-09-10 | Casio Computer Co., Ltd. | Semiconductor device equipped with bonding wires and manufacturing method of semiconductor device equipped with bonding wires |
| JP5467959B2 (ja) | 2010-07-21 | 2014-04-09 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| US9136197B2 (en) | 2010-09-16 | 2015-09-15 | Tessera, Inc. | Impedence controlled packages with metal sheet or 2-layer RDL |
| US8853708B2 (en) | 2010-09-16 | 2014-10-07 | Tessera, Inc. | Stacked multi-die packages with impedance control |
| US8581377B2 (en) | 2010-09-16 | 2013-11-12 | Tessera, Inc. | TSOP with impedance control |
| US8786083B2 (en) | 2010-09-16 | 2014-07-22 | Tessera, Inc. | Impedance controlled packages with metal sheet or 2-layer RDL |
| US8222725B2 (en) | 2010-09-16 | 2012-07-17 | Tessera, Inc. | Metal can impedance control structure |
| US9166594B2 (en) | 2012-05-28 | 2015-10-20 | Baysand Inc. | Flexible, space-efficient I/O circuitry for integrated circuits |
| US20160307873A1 (en) * | 2015-04-16 | 2016-10-20 | Mediatek Inc. | Bonding pad arrangment design for semiconductor package |
| WO2017183352A1 (ja) | 2016-04-22 | 2017-10-26 | 株式会社ソシオネクスト | 半導体チップおよびこれを備えた半導体装置 |
| JP2018107296A (ja) * | 2016-12-27 | 2018-07-05 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
| JP7273654B2 (ja) * | 2019-08-09 | 2023-05-15 | ルネサスエレクトロニクス株式会社 | 半導体装置、その製造方法および電子装置 |
| US20210287965A1 (en) * | 2020-03-13 | 2021-09-16 | Samsung Electronics Co., Ltd. | Semiconductor device |
| US11688686B2 (en) | 2020-07-14 | 2023-06-27 | Samsung Electronics Co., Ltd. | Semiconductor device including an input/output circuit |
| CN114220825B (zh) * | 2022-02-22 | 2022-08-23 | 上海天马微电子有限公司 | 发光驱动基板、发光面板及显示装置 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2745628B2 (ja) * | 1989-01-25 | 1998-04-28 | 日本電気株式会社 | 樹脂封止型半導体装置 |
| JP2758322B2 (ja) * | 1992-09-30 | 1998-05-28 | 京セラ株式会社 | 電子部品搭載用回路基板 |
| JP3278093B2 (ja) * | 1994-08-31 | 2002-04-30 | 沖電気工業株式会社 | 半導体デバイス |
| FR2764115B1 (fr) * | 1997-06-02 | 2001-06-08 | Sgs Thomson Microelectronics | Dispositif semiconducteur et procede de connexion des fils internes de masse d'un tel dispositif |
| JP3472455B2 (ja) * | 1997-09-12 | 2003-12-02 | 沖電気工業株式会社 | 半導体集積回路装置及びそのパッケージ構造 |
| JPH11284006A (ja) * | 1998-03-31 | 1999-10-15 | Fujitsu Ltd | 半導体装置 |
| JP3375560B2 (ja) * | 1999-02-15 | 2003-02-10 | 松下電器産業株式会社 | 半導体装置 |
| JP4071914B2 (ja) | 2000-02-25 | 2008-04-02 | 沖電気工業株式会社 | 半導体素子及びこれを用いた半導体装置 |
| US6476506B1 (en) * | 2001-09-28 | 2002-11-05 | Motorola, Inc. | Packaged semiconductor with multiple rows of bond pads and method therefor |
| TW536765B (en) * | 2001-10-19 | 2003-06-11 | Acer Labs Inc | Chip package structure for array type bounding pad |
| TW511193B (en) * | 2001-12-13 | 2002-11-21 | Acer Labs Inc | Inner circuit structure of array type bonding pad chip and its manufacturing method |
| TWM244576U (en) * | 2003-07-16 | 2004-09-21 | Via Tech Inc | Chip package structure |
| US6956286B2 (en) * | 2003-08-05 | 2005-10-18 | International Business Machines Corporation | Integrated circuit package with overlapping bond fingers |
| JP2005136302A (ja) * | 2003-10-31 | 2005-05-26 | Renesas Technology Corp | 半導体集積回路装置の製造方法 |
| JP4570868B2 (ja) * | 2003-12-26 | 2010-10-27 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| JP4533173B2 (ja) * | 2004-02-24 | 2010-09-01 | キヤノン株式会社 | 半導体集積回路装置 |
| JP4438579B2 (ja) * | 2004-09-14 | 2010-03-24 | 株式会社デンソー | センサ装置 |
| US7675168B2 (en) * | 2005-02-25 | 2010-03-09 | Agere Systems Inc. | Integrated circuit with staggered differential wire bond pairs |
| DE102005009163B4 (de) * | 2005-02-25 | 2013-08-14 | Infineon Technologies Ag | Halbleiterbauteil mit einem Halbleiterchip, der Signalkontaktflächen und Versorgungskontaktflächen aufweist, sowie Verfahren zur Herstellung des Halbleiterbauteils |
-
2003
- 2003-12-26 JP JP2003433851A patent/JP4570868B2/ja not_active Expired - Fee Related
-
2004
- 2004-12-07 US US11/005,217 patent/US7211903B2/en not_active Expired - Lifetime
- 2004-12-08 TW TW93138020A patent/TWI364803B/zh not_active IP Right Cessation
-
2007
- 2007-03-29 US US11/730,088 patent/US7323788B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US7211903B2 (en) | 2007-05-01 |
| JP2005191447A (ja) | 2005-07-14 |
| TWI364803B (en) | 2012-05-21 |
| US20070170601A1 (en) | 2007-07-26 |
| US20050162880A1 (en) | 2005-07-28 |
| TW200531194A (en) | 2005-09-16 |
| US7323788B2 (en) | 2008-01-29 |
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