JP3956049B2 - タングステン膜の形成方法 - Google Patents
タングステン膜の形成方法 Download PDFInfo
- Publication number
- JP3956049B2 JP3956049B2 JP2003062443A JP2003062443A JP3956049B2 JP 3956049 B2 JP3956049 B2 JP 3956049B2 JP 2003062443 A JP2003062443 A JP 2003062443A JP 2003062443 A JP2003062443 A JP 2003062443A JP 3956049 B2 JP3956049 B2 JP 3956049B2
- Authority
- JP
- Japan
- Prior art keywords
- tungsten film
- gas
- tungsten
- film forming
- passivation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/34—Nitrides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04D—NON-POSITIVE-DISPLACEMENT PUMPS
- F04D17/00—Radial-flow pumps, e.g. centrifugal pumps; Helico-centrifugal pumps
- F04D17/08—Centrifugal pumps
- F04D17/16—Centrifugal pumps for displacing without appreciable compression
- F04D17/168—Pumps specially adapted to produce a vacuum
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Organic Chemistry (AREA)
- Metallurgy (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Engineering & Computer Science (AREA)
- Inorganic Chemistry (AREA)
- Electrodes Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003062443A JP3956049B2 (ja) | 2003-03-07 | 2003-03-07 | タングステン膜の形成方法 |
| KR1020040015267A KR100785534B1 (ko) | 2003-03-07 | 2004-03-06 | 텅스텐막의 형성 방법 |
| TW093106061A TW200421465A (en) | 2003-03-07 | 2004-03-08 | Method of forming tungsten film |
| KR1020070059454A KR100783845B1 (ko) | 2003-03-07 | 2007-06-18 | 텅스텐막의 형성 방법 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003062443A JP3956049B2 (ja) | 2003-03-07 | 2003-03-07 | タングステン膜の形成方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2004273764A JP2004273764A (ja) | 2004-09-30 |
| JP3956049B2 true JP3956049B2 (ja) | 2007-08-08 |
Family
ID=33124364
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003062443A Expired - Lifetime JP3956049B2 (ja) | 2003-03-07 | 2003-03-07 | タングステン膜の形成方法 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP3956049B2 (enExample) |
| KR (2) | KR100785534B1 (enExample) |
| TW (1) | TW200421465A (enExample) |
Families Citing this family (69)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9076843B2 (en) | 2001-05-22 | 2015-07-07 | Novellus Systems, Inc. | Method for producing ultra-thin tungsten layers with improved step coverage |
| JP4945937B2 (ja) * | 2005-07-01 | 2012-06-06 | 東京エレクトロン株式会社 | タングステン膜の形成方法、成膜装置及び記憶媒体 |
| JP2007046134A (ja) * | 2005-08-11 | 2007-02-22 | Tokyo Electron Ltd | 金属系膜形成方法及びプログラムを記録した記録媒体 |
| US8268078B2 (en) * | 2006-03-16 | 2012-09-18 | Tokyo Electron Limited | Method and apparatus for reducing particle contamination in a deposition system |
| CN101365822A (zh) | 2006-07-31 | 2009-02-11 | 东京毅力科创株式会社 | 基板处理装置、程序、存储介质和决定是否需要调节的方法 |
| JP2008244298A (ja) * | 2007-03-28 | 2008-10-09 | Tokyo Electron Ltd | 金属膜の成膜方法、多層配線構造の形成方法、半導体装置の製造方法、成膜装置 |
| JP5547380B2 (ja) * | 2008-04-30 | 2014-07-09 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
| US8623733B2 (en) | 2009-04-16 | 2014-01-07 | Novellus Systems, Inc. | Methods for depositing ultra thin low resistivity tungsten film for small critical dimension contacts and interconnects |
| US9159571B2 (en) | 2009-04-16 | 2015-10-13 | Lam Research Corporation | Tungsten deposition process using germanium-containing reducing agent |
| US12444651B2 (en) | 2009-08-04 | 2025-10-14 | Novellus Systems, Inc. | Tungsten feature fill with nucleation inhibition |
| US10256142B2 (en) | 2009-08-04 | 2019-04-09 | Novellus Systems, Inc. | Tungsten feature fill with nucleation inhibition |
| US9653353B2 (en) | 2009-08-04 | 2017-05-16 | Novellus Systems, Inc. | Tungsten feature fill |
| KR20110075915A (ko) * | 2009-12-29 | 2011-07-06 | 주식회사 아토 | 박막 증착방법 |
| JP5959991B2 (ja) | 2011-11-25 | 2016-08-02 | 東京エレクトロン株式会社 | タングステン膜の成膜方法 |
| US9153486B2 (en) | 2013-04-12 | 2015-10-06 | Lam Research Corporation | CVD based metal/semiconductor OHMIC contact for high volume manufacturing applications |
| JP6336866B2 (ja) * | 2013-10-23 | 2018-06-06 | 株式会社日立国際電気 | 半導体デバイスの製造方法、基板処理装置およびプログラム |
| JP6554418B2 (ja) | 2013-11-27 | 2019-07-31 | 東京エレクトロン株式会社 | タングステン膜の成膜方法および成膜装置 |
| JP5950892B2 (ja) | 2013-11-29 | 2016-07-13 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法及びプログラム |
| US9589808B2 (en) | 2013-12-19 | 2017-03-07 | Lam Research Corporation | Method for depositing extremely low resistivity tungsten |
| TWI672737B (zh) * | 2013-12-27 | 2019-09-21 | 美商蘭姆研究公司 | 允許低電阻率鎢特徵物填充之鎢成核程序 |
| JP6437324B2 (ja) | 2014-03-25 | 2018-12-12 | 東京エレクトロン株式会社 | タングステン膜の成膜方法および半導体装置の製造方法 |
| JP6147913B2 (ja) * | 2014-03-28 | 2017-06-14 | 株式会社日立国際電気 | 半導体デバイスの製造方法、基板処理装置およびプログラム |
| JP6391355B2 (ja) | 2014-08-11 | 2018-09-19 | 東京エレクトロン株式会社 | タングステン膜の成膜方法 |
| JP6706903B2 (ja) | 2015-01-30 | 2020-06-10 | 東京エレクトロン株式会社 | タングステン膜の成膜方法 |
| CN105839068B (zh) | 2015-01-30 | 2018-09-21 | 东京毅力科创株式会社 | 钨膜的成膜方法 |
| US9953984B2 (en) | 2015-02-11 | 2018-04-24 | Lam Research Corporation | Tungsten for wordline applications |
| JP6416679B2 (ja) | 2015-03-27 | 2018-10-31 | 東京エレクトロン株式会社 | タングステン膜の成膜方法 |
| US9978605B2 (en) | 2015-05-27 | 2018-05-22 | Lam Research Corporation | Method of forming low resistivity fluorine free tungsten film without nucleation |
| US9613818B2 (en) | 2015-05-27 | 2017-04-04 | Lam Research Corporation | Deposition of low fluorine tungsten by sequential CVD process |
| US9754824B2 (en) | 2015-05-27 | 2017-09-05 | Lam Research Corporation | Tungsten films having low fluorine content |
| JP6478813B2 (ja) | 2015-05-28 | 2019-03-06 | 東京エレクトロン株式会社 | 金属膜の成膜方法 |
| JP6541438B2 (ja) | 2015-05-28 | 2019-07-10 | 東京エレクトロン株式会社 | 金属膜のストレス低減方法および金属膜の成膜方法 |
| CN107924829B (zh) * | 2015-09-30 | 2021-07-23 | 株式会社国际电气 | 半导体器件的制造方法、衬底处理装置及记录介质 |
| TWI720106B (zh) * | 2016-01-16 | 2021-03-01 | 美商應用材料股份有限公司 | Pecvd含鎢硬遮罩膜及製造方法 |
| JP6710089B2 (ja) | 2016-04-04 | 2020-06-17 | 東京エレクトロン株式会社 | タングステン膜の成膜方法 |
| CN109563619A (zh) | 2016-07-26 | 2019-04-02 | 东京毅力科创株式会社 | 钨膜的成膜方法 |
| JP6865602B2 (ja) * | 2017-02-22 | 2021-04-28 | 東京エレクトロン株式会社 | 成膜方法 |
| US10224224B2 (en) | 2017-03-10 | 2019-03-05 | Micromaterials, LLC | High pressure wafer processing systems and related methods |
| US10622214B2 (en) * | 2017-05-25 | 2020-04-14 | Applied Materials, Inc. | Tungsten defluorination by high pressure treatment |
| KR102574914B1 (ko) | 2017-06-02 | 2023-09-04 | 어플라이드 머티어리얼스, 인코포레이티드 | 보론 카바이드 하드마스크의 건식 스트리핑 |
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| US10276411B2 (en) | 2017-08-18 | 2019-04-30 | Applied Materials, Inc. | High pressure and high temperature anneal chamber |
| KR102405723B1 (ko) | 2017-08-18 | 2022-06-07 | 어플라이드 머티어리얼스, 인코포레이티드 | 고압 및 고온 어닐링 챔버 |
| CN111095524B (zh) | 2017-09-12 | 2023-10-03 | 应用材料公司 | 用于使用保护阻挡物层制造半导体结构的设备和方法 |
| US10643867B2 (en) | 2017-11-03 | 2020-05-05 | Applied Materials, Inc. | Annealing system and method |
| CN111357090B (zh) | 2017-11-11 | 2024-01-05 | 微材料有限责任公司 | 用于高压处理腔室的气体输送系统 |
| KR102622303B1 (ko) | 2017-11-16 | 2024-01-05 | 어플라이드 머티어리얼스, 인코포레이티드 | 고압 스팀 어닐링 프로세싱 장치 |
| KR20200075892A (ko) | 2017-11-17 | 2020-06-26 | 어플라이드 머티어리얼스, 인코포레이티드 | 고압 처리 시스템을 위한 컨덴서 시스템 |
| CN111699549B (zh) | 2018-01-24 | 2025-03-28 | 应用材料公司 | 使用高压退火的接缝弥合 |
| KR102702244B1 (ko) | 2018-03-09 | 2024-09-03 | 어플라이드 머티어리얼스, 인코포레이티드 | 금속 함유 재료들을 위한 고압 어닐링 프로세스 |
| US10714331B2 (en) | 2018-04-04 | 2020-07-14 | Applied Materials, Inc. | Method to fabricate thermally stable low K-FinFET spacer |
| US11549175B2 (en) | 2018-05-03 | 2023-01-10 | Lam Research Corporation | Method of depositing tungsten and other metals in 3D NAND structures |
| US10950429B2 (en) | 2018-05-08 | 2021-03-16 | Applied Materials, Inc. | Methods of forming amorphous carbon hard mask layers and hard mask layers formed therefrom |
| US10566188B2 (en) | 2018-05-17 | 2020-02-18 | Applied Materials, Inc. | Method to improve film stability |
| US10704141B2 (en) | 2018-06-01 | 2020-07-07 | Applied Materials, Inc. | In-situ CVD and ALD coating of chamber to control metal contamination |
| US10748783B2 (en) | 2018-07-25 | 2020-08-18 | Applied Materials, Inc. | Gas delivery module |
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| WO2020092002A1 (en) | 2018-10-30 | 2020-05-07 | Applied Materials, Inc. | Methods for etching a structure for semiconductor applications |
| CN112996950B (zh) | 2018-11-16 | 2024-04-05 | 应用材料公司 | 使用增强扩散工艺的膜沉积 |
| WO2020117462A1 (en) | 2018-12-07 | 2020-06-11 | Applied Materials, Inc. | Semiconductor processing system |
| WO2020123987A1 (en) | 2018-12-14 | 2020-06-18 | Lam Research Corporation | Atomic layer deposition on 3d nand structures |
| KR20210141762A (ko) | 2019-04-11 | 2021-11-23 | 램 리써치 코포레이션 | 고 단차 커버리지 (step coverage) 텅스텐 증착 |
| US12237221B2 (en) | 2019-05-22 | 2025-02-25 | Lam Research Corporation | Nucleation-free tungsten deposition |
| KR20220047333A (ko) | 2019-08-12 | 2022-04-15 | 램 리써치 코포레이션 | 텅스텐 증착 |
| US11901222B2 (en) | 2020-02-17 | 2024-02-13 | Applied Materials, Inc. | Multi-step process for flowable gap-fill film |
| TW202206634A (zh) * | 2020-06-30 | 2022-02-16 | 美商應用材料股份有限公司 | 在低溫下的選擇性鎢沉積 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5342652A (en) * | 1992-06-15 | 1994-08-30 | Materials Research Corporation | Method of nucleating tungsten on titanium nitride by CVD without silane |
| JP3415207B2 (ja) * | 1992-07-24 | 2003-06-09 | 東京エレクトロン株式会社 | 化学気相成長による金属薄膜形成方法 |
| JPH06275624A (ja) * | 1993-03-19 | 1994-09-30 | Miyagi Oki Denki Kk | 導電層の形成方法 |
| JPH0794425A (ja) * | 1993-09-24 | 1995-04-07 | Toshiba Corp | 金属薄膜の形成方法および金属薄膜の形成装置 |
| US6271129B1 (en) * | 1997-12-03 | 2001-08-07 | Applied Materials, Inc. | Method for forming a gap filling refractory metal layer having reduced stress |
| JP3070577B2 (ja) * | 1998-05-15 | 2000-07-31 | 日本電気株式会社 | 半導体装置の製造方法 |
| JP2000265272A (ja) * | 1999-01-13 | 2000-09-26 | Tokyo Electron Ltd | タングステン層の形成方法及びタングステン層の積層構造 |
| JP3628570B2 (ja) * | 1999-12-08 | 2005-03-16 | 旭化成マイクロシステム株式会社 | タングステン薄膜の形成方法、半導体装置の製造方法 |
| US6936538B2 (en) * | 2001-07-16 | 2005-08-30 | Applied Materials, Inc. | Method and apparatus for depositing tungsten after surface treatment to improve film characteristics |
| US7101795B1 (en) * | 2000-06-28 | 2006-09-05 | Applied Materials, Inc. | Method and apparatus for depositing refractory metal layers employing sequential deposition techniques to form a nucleation layer |
| JP2002151435A (ja) * | 2000-10-31 | 2002-05-24 | Applied Materials Inc | 導電部の形成方法 |
| JP4032872B2 (ja) * | 2001-08-14 | 2008-01-16 | 東京エレクトロン株式会社 | タングステン膜の形成方法 |
| KR100688652B1 (ko) * | 2001-08-14 | 2007-03-02 | 동경 엘렉트론 주식회사 | 텅스텐막의 형성 방법 |
| JP4103461B2 (ja) * | 2001-08-24 | 2008-06-18 | 東京エレクトロン株式会社 | 成膜方法 |
-
2003
- 2003-03-07 JP JP2003062443A patent/JP3956049B2/ja not_active Expired - Lifetime
-
2004
- 2004-03-06 KR KR1020040015267A patent/KR100785534B1/ko not_active Expired - Fee Related
- 2004-03-08 TW TW093106061A patent/TW200421465A/zh not_active IP Right Cessation
-
2007
- 2007-06-18 KR KR1020070059454A patent/KR100783845B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR100783845B1 (ko) | 2007-12-10 |
| KR20040079331A (ko) | 2004-09-14 |
| TWI312172B (enExample) | 2009-07-11 |
| KR100785534B1 (ko) | 2007-12-12 |
| TW200421465A (en) | 2004-10-16 |
| KR20070075383A (ko) | 2007-07-18 |
| JP2004273764A (ja) | 2004-09-30 |
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