JP3850580B2 - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP3850580B2
JP3850580B2 JP08774799A JP8774799A JP3850580B2 JP 3850580 B2 JP3850580 B2 JP 3850580B2 JP 08774799 A JP08774799 A JP 08774799A JP 8774799 A JP8774799 A JP 8774799A JP 3850580 B2 JP3850580 B2 JP 3850580B2
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JP
Japan
Prior art keywords
circuit
threshold
threshold value
well
power supply
Prior art date
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Expired - Fee Related
Application number
JP08774799A
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English (en)
Japanese (ja)
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JP2000286387A5 (enExample
JP2000286387A (ja
Inventor
充宏 野口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
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Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP08774799A priority Critical patent/JP3850580B2/ja
Priority to US09/537,111 priority patent/US6313511B1/en
Publication of JP2000286387A publication Critical patent/JP2000286387A/ja
Publication of JP2000286387A5 publication Critical patent/JP2000286387A5/ja
Application granted granted Critical
Publication of JP3850580B2 publication Critical patent/JP3850580B2/ja
Anticipated expiration legal-status Critical
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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/10—Integrated device layouts
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/90—Masterslice integrated circuits
    • H10D84/903—Masterslice integrated circuits comprising field effect technology
    • H10D84/907—CMOS gate arrays

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Dram (AREA)
JP08774799A 1999-03-30 1999-03-30 半導体装置 Expired - Fee Related JP3850580B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP08774799A JP3850580B2 (ja) 1999-03-30 1999-03-30 半導体装置
US09/537,111 US6313511B1 (en) 1999-03-30 2000-03-29 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP08774799A JP3850580B2 (ja) 1999-03-30 1999-03-30 半導体装置

Publications (3)

Publication Number Publication Date
JP2000286387A JP2000286387A (ja) 2000-10-13
JP2000286387A5 JP2000286387A5 (enExample) 2005-06-02
JP3850580B2 true JP3850580B2 (ja) 2006-11-29

Family

ID=13923536

Family Applications (1)

Application Number Title Priority Date Filing Date
JP08774799A Expired - Fee Related JP3850580B2 (ja) 1999-03-30 1999-03-30 半導体装置

Country Status (2)

Country Link
US (1) US6313511B1 (enExample)
JP (1) JP3850580B2 (enExample)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6684520B1 (en) 2000-02-25 2004-02-03 Xilinx, Inc. Mask-alignment detection circuit in x and y directions
US6563320B1 (en) * 2000-02-25 2003-05-13 Xilinx, Inc. Mask alignment structure for IC layers
US6445015B1 (en) 2000-05-04 2002-09-03 Osemi, Incorporated Metal sulfide semiconductor transistor devices
US6670651B1 (en) * 2000-05-04 2003-12-30 Osemi, Inc. Metal sulfide-oxide semiconductor transistor devices
US6451711B1 (en) 2000-05-04 2002-09-17 Osemi, Incorporated Epitaxial wafer apparatus
US6936900B1 (en) 2000-05-04 2005-08-30 Osemi, Inc. Integrated transistor devices
US20040069289A1 (en) * 2001-01-24 2004-04-15 Takashi Ito Ignition device of internal combustion engine
JP3776857B2 (ja) * 2001-10-16 2006-05-17 株式会社東芝 半導体集積回路装置
JP4090231B2 (ja) * 2001-11-01 2008-05-28 株式会社ルネサステクノロジ 半導体集積回路装置
US6989556B2 (en) * 2002-06-06 2006-01-24 Osemi, Inc. Metal oxide compound semiconductor integrated transistor devices with a gate insulator structure
US7187045B2 (en) * 2002-07-16 2007-03-06 Osemi, Inc. Junction field effect metal oxide compound semiconductor integrated transistor devices
JP4221274B2 (ja) 2003-10-31 2009-02-12 株式会社東芝 半導体集積回路および電源電圧・基板バイアス制御回路
WO2005048318A2 (en) * 2003-11-17 2005-05-26 Osemi, Inc. Nitride metal oxide semiconductor integrated transistor devices
WO2005061756A1 (en) * 2003-12-09 2005-07-07 Osemi, Inc. High temperature vacuum evaporation apparatus
JP2007096036A (ja) * 2005-09-29 2007-04-12 Matsushita Electric Ind Co Ltd 昇圧回路
US7797664B2 (en) 2006-06-23 2010-09-14 National Institute Of Advanced Industrial Science And Technology System for configuring an integrated circuit and method thereof
US7352252B2 (en) * 2006-07-11 2008-04-01 International Business Machines Corporation Circuit and method to measure threshold voltage distributions in SRAM devices
US7516426B2 (en) * 2006-11-20 2009-04-07 International Business Machines Corporation Methods of improving operational parameters of pair of matched transistors and set of transistors
US8330483B2 (en) 2006-11-29 2012-12-11 Nec Corporation Semiconductor device to detect abnormal leakage current caused by a defect
JP2008153415A (ja) * 2006-12-18 2008-07-03 Renesas Technology Corp 半導体集積回路およびその製造方法
US20080157073A1 (en) * 2006-12-29 2008-07-03 Walter David Braddock Integrated Transistor Devices
US7480184B2 (en) * 2007-01-07 2009-01-20 International Business Machines Corporation Maximum likelihood statistical method of operations for multi-bit semiconductor memory
US20080217755A1 (en) * 2007-03-09 2008-09-11 Satoru Takase Systems and Methods for Providing Voltage Compensation in an Integrated Circuit Chip Using a Divided Power Plane
JP5096778B2 (ja) * 2007-04-12 2012-12-12 パナソニック株式会社 半導体集積回路
US20090144677A1 (en) * 2007-11-29 2009-06-04 International Business Machines Corporation Design Structure for a Circuit and Method to Measure Threshold Voltage Distributions in SRAM Devices
FR2999802A1 (fr) * 2012-12-14 2014-06-20 St Microelectronics Sa Cellule cmos realisee dans une technologie fd soi
US9082514B1 (en) 2013-04-22 2015-07-14 Xilinx, Inc. Method and apparatus for physically unclonable function burn-in
US8981810B1 (en) 2013-04-22 2015-03-17 Xilinx, Inc. Method and apparatus for preventing accelerated aging of a physically unclonable function
US9444618B1 (en) * 2013-04-22 2016-09-13 Xilinx, Inc. Defense against attacks on ring oscillator-based physically unclonable functions
US9966467B2 (en) * 2013-09-27 2018-05-08 Phison Electronics Corp. Integrated circuit and code generating method
WO2017179102A1 (ja) * 2016-04-11 2017-10-19 三菱電機株式会社 半導体装置
US10504899B2 (en) * 2017-11-30 2019-12-10 Taiwan Semiconductor Manufacturing Co., Ltd. Transistors with various threshold voltages and method for manufacturing the same

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5264712A (en) * 1989-03-20 1993-11-23 Hitachi, Ltd. Semiconductor integrated circuit, method of fabricating the same and apparatus for fabricating the same
JP3557275B2 (ja) 1995-03-29 2004-08-25 株式会社ルネサステクノロジ 半導体集積回路装置及びマイクロコンピュータ

Also Published As

Publication number Publication date
US6313511B1 (en) 2001-11-06
JP2000286387A (ja) 2000-10-13

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