JP3800616B2 - 目標物移動装置、位置決め装置及び可動ステージ装置 - Google Patents

目標物移動装置、位置決め装置及び可動ステージ装置 Download PDF

Info

Publication number
JP3800616B2
JP3800616B2 JP14319095A JP14319095A JP3800616B2 JP 3800616 B2 JP3800616 B2 JP 3800616B2 JP 14319095 A JP14319095 A JP 14319095A JP 14319095 A JP14319095 A JP 14319095A JP 3800616 B2 JP3800616 B2 JP 3800616B2
Authority
JP
Japan
Prior art keywords
stage
movable
drive
carrier
moving
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP14319095A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0863231A (ja
Inventor
明光 蛯原
ノヴァク トーマス
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Publication of JPH0863231A publication Critical patent/JPH0863231A/ja
Application granted granted Critical
Publication of JP3800616B2 publication Critical patent/JP3800616B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70766Reaction force control means, e.g. countermass
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70358Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70716Stages
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70716Stages
    • G03F7/70725Stages control
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70775Position control, e.g. interferometers or encoders for determining the stage position
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/709Vibration, e.g. vibration detection, compensation, suppression or isolation
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70991Connection with other apparatus, e.g. multiple exposure stations, particular arrangement of exposure apparatus and pre-exposure and/or post-exposure apparatus; Shared apparatus, e.g. having shared radiation source, shared mask or workpiece stage, shared base-plate; Utilities, e.g. cable, pipe or wireless arrangements for data, power, fluids or vacuum
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Public Health (AREA)
  • Epidemiology (AREA)
  • Toxicology (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Atmospheric Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Power Engineering (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Control Of Position Or Direction (AREA)
  • Details Of Measuring And Other Instruments (AREA)
  • Machine Tool Units (AREA)
JP14319095A 1994-06-27 1995-06-09 目標物移動装置、位置決め装置及び可動ステージ装置 Expired - Lifetime JP3800616B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US26699994A 1994-06-27 1994-06-27
US08/266999 1994-06-27

Related Child Applications (4)

Application Number Title Priority Date Filing Date
JP2002305403A Division JP3804787B2 (ja) 1994-06-27 2002-10-21 露光装置および露光方法
JP2002305402A Division JP3804786B2 (ja) 1994-06-27 2002-10-21 露光装置および露光方法
JP2002305401A Division JP3804785B2 (ja) 1994-06-27 2002-10-21 露光装置および露光方法
JP2006075215A Division JP4135188B2 (ja) 1994-06-27 2006-03-17 位置決め装置

Publications (2)

Publication Number Publication Date
JPH0863231A JPH0863231A (ja) 1996-03-08
JP3800616B2 true JP3800616B2 (ja) 2006-07-26

Family

ID=23016891

Family Applications (6)

Application Number Title Priority Date Filing Date
JP14319095A Expired - Lifetime JP3800616B2 (ja) 1994-06-27 1995-06-09 目標物移動装置、位置決め装置及び可動ステージ装置
JP2002305402A Expired - Lifetime JP3804786B2 (ja) 1994-06-27 2002-10-21 露光装置および露光方法
JP2002305403A Expired - Lifetime JP3804787B2 (ja) 1994-06-27 2002-10-21 露光装置および露光方法
JP2002305401A Expired - Lifetime JP3804785B2 (ja) 1994-06-27 2002-10-21 露光装置および露光方法
JP2006075215A Expired - Lifetime JP4135188B2 (ja) 1994-06-27 2006-03-17 位置決め装置
JP2007094076A Expired - Lifetime JP4687911B2 (ja) 1994-06-27 2007-03-30 位置決め装置及び位置決め方法

Family Applications After (5)

Application Number Title Priority Date Filing Date
JP2002305402A Expired - Lifetime JP3804786B2 (ja) 1994-06-27 2002-10-21 露光装置および露光方法
JP2002305403A Expired - Lifetime JP3804787B2 (ja) 1994-06-27 2002-10-21 露光装置および露光方法
JP2002305401A Expired - Lifetime JP3804785B2 (ja) 1994-06-27 2002-10-21 露光装置および露光方法
JP2006075215A Expired - Lifetime JP4135188B2 (ja) 1994-06-27 2006-03-17 位置決め装置
JP2007094076A Expired - Lifetime JP4687911B2 (ja) 1994-06-27 2007-03-30 位置決め装置及び位置決め方法

Country Status (4)

Country Link
JP (6) JP3800616B2 (ko)
KR (7) KR100281853B1 (ko)
GB (13) GB2329518B (ko)
HK (12) HK1025842A1 (ko)

Families Citing this family (64)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1341044A3 (en) * 1995-05-30 2003-10-29 ASML Netherlands B.V. Positioning device with a reference frame for a measuring system
JP3659529B2 (ja) * 1996-06-06 2005-06-15 キヤノン株式会社 露光装置およびデバイス製造方法
JPH10521A (ja) * 1996-06-07 1998-01-06 Nikon Corp 支持装置
US5821981A (en) * 1996-07-02 1998-10-13 Gerber Systems Corporation Magnetically preloaded air bearing motion system for an imaging device
US6222614B1 (en) * 1996-12-06 2001-04-24 Nikon Corporation Exposure elements with a cable-relaying support
EP0890136B9 (en) * 1996-12-24 2003-12-10 ASML Netherlands B.V. Two-dimensionally balanced positioning device with two object holders, and lithographic device provided with such a positioning device
EP1450208A1 (en) * 1997-03-10 2004-08-25 ASML Netherlands B.V. Lithographic apparatus having two object holders
EP0900412B1 (en) 1997-03-10 2005-04-06 ASML Netherlands B.V. Lithographic apparatus comprising a positioning device having two object holders
US20010003028A1 (en) 1997-09-19 2001-06-07 Nikon Corporation Scanning Exposure Method
KR100521704B1 (ko) 1997-09-19 2005-10-14 가부시키가이샤 니콘 스테이지장치, 주사형 노광장치 및 방법, 그리고 이것으로제조된 디바이스
JP4164905B2 (ja) * 1997-09-25 2008-10-15 株式会社ニコン 電磁力モータ、ステージ装置および露光装置
US6408045B1 (en) 1997-11-11 2002-06-18 Canon Kabushiki Kaisha Stage system and exposure apparatus with the same
EP1041607A4 (en) * 1997-11-12 2003-11-05 Nikon Corp PROJECTION EXPOSURE APPARATUS
WO1999066542A1 (fr) * 1998-06-17 1999-12-23 Nikon Corporation Procede et dispositif d'exposition
US6252234B1 (en) * 1998-08-14 2001-06-26 Nikon Corporation Reaction force isolation system for a planar motor
US6307284B1 (en) * 1998-09-16 2001-10-23 Canon Kabushiki Kaisha Positioning apparatus, information recording/reproducing apparatus, and inspection apparatus
KR20020054368A (ko) * 1999-12-16 2002-07-06 시마무라 테루오 노광방법 및 장치
TW546551B (en) * 1999-12-21 2003-08-11 Asml Netherlands Bv Balanced positioning system for use in lithographic apparatus
EP1111469B1 (en) * 1999-12-21 2007-10-17 ASML Netherlands B.V. Lithographic apparatus with a balanced positioning system
TWI264617B (en) 1999-12-21 2006-10-21 Asml Netherlands Bv Balanced positioning system for use in lithographic apparatus
US6836093B1 (en) 1999-12-21 2004-12-28 Nikon Corporation Exposure method and apparatus
DE60136667D1 (de) 2000-02-21 2009-01-08 Sharp Kk Präzisionsträgerplatte
US7301605B2 (en) 2000-03-03 2007-11-27 Nikon Corporation Projection exposure apparatus and method, catadioptric optical system and manufacturing method of devices
KR100387243B1 (ko) * 2000-06-26 2003-06-12 삼성전자주식회사 초소형 정보저장기기용 x-y 스테이지 전자 구동 장치 및그 코일 제작 방법
JP2002170765A (ja) * 2000-12-04 2002-06-14 Nikon Corp ステージ装置及び露光装置
JP4021158B2 (ja) * 2001-04-27 2007-12-12 株式会社新川 半導体製造装置におけるxyテーブル
JP2002343706A (ja) * 2001-05-18 2002-11-29 Nikon Corp ステージ装置及びステージの駆動方法、露光装置及び露光方法、並びにデバイス及びその製造方法
US6788385B2 (en) 2001-06-21 2004-09-07 Nikon Corporation Stage device, exposure apparatus and method
KR100391000B1 (ko) * 2001-06-30 2003-07-12 주식회사 하이닉스반도체 반도체 노광 장치
ES2377521T3 (es) * 2002-03-12 2012-03-28 Hamamatsu Photonics K.K. Método para dividir un sustrato
KR100937318B1 (ko) * 2002-12-02 2010-01-18 두산인프라코어 주식회사 머시닝센터 이송축의 직각도 조정장치
AU2003297814A1 (en) * 2002-12-09 2004-06-30 Acm Research, Inc. Measuring alignment between a wafer chuck and polishing/plating receptacle
KR101484435B1 (ko) 2003-04-09 2015-01-19 가부시키가이샤 니콘 노광 방법 및 장치, 그리고 디바이스 제조 방법
TWI457712B (zh) 2003-10-28 2014-10-21 尼康股份有限公司 照明光學裝置、投影曝光裝置、曝光方法以及元件製造方法
TWI612338B (zh) 2003-11-20 2018-01-21 尼康股份有限公司 光學照明裝置、曝光裝置、曝光方法、以及元件製造方法
JP4720506B2 (ja) 2003-12-15 2011-07-13 株式会社ニコン ステージ装置、露光装置、及び露光方法
JP4586367B2 (ja) * 2004-01-14 2010-11-24 株式会社ニコン ステージ装置及び露光装置
TWI412067B (zh) 2004-02-06 2013-10-11 尼康股份有限公司 偏光變換元件、光學照明裝置、曝光裝置以及曝光方法
WO2005098911A1 (ja) 2004-04-09 2005-10-20 Nikon Corporation 移動体の駆動方法、ステージ装置及び露光装置
WO2005122242A1 (ja) 2004-06-07 2005-12-22 Nikon Corporation ステージ装置、露光装置及び露光方法
WO2006025341A1 (ja) 2004-09-01 2006-03-09 Nikon Corporation 基板ホルダ及びステージ装置並びに露光装置
JP4541849B2 (ja) * 2004-11-22 2010-09-08 キヤノン株式会社 位置決め装置
US7557529B2 (en) 2005-01-11 2009-07-07 Nikon Corporation Stage unit and exposure apparatus
US7456935B2 (en) * 2005-04-05 2008-11-25 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method utilizing a positioning device for positioning an object table
JP5449672B2 (ja) 2005-05-12 2014-03-19 株式会社ニコン 投影光学系、露光装置、および露光方法
US7292317B2 (en) * 2005-06-08 2007-11-06 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method utilizing substrate stage compensating
US7675201B2 (en) * 2006-07-25 2010-03-09 Asml Netherlands B.V. Lithographic apparatus with planar motor driven support
EP2068349A4 (en) * 2006-09-29 2011-03-30 Nikon Corp STAGE EQUIPMENT AND EXPOSURE DEVICE
JP5267029B2 (ja) 2007-10-12 2013-08-21 株式会社ニコン 照明光学装置、露光装置及びデバイスの製造方法
US8379187B2 (en) 2007-10-24 2013-02-19 Nikon Corporation Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method
US9116346B2 (en) 2007-11-06 2015-08-25 Nikon Corporation Illumination apparatus, illumination method, exposure apparatus, and device manufacturing method
JP4554715B2 (ja) * 2009-02-24 2010-09-29 ファナック株式会社 ケーブルクランプまたは中継する構造を備えた直線駆動装置
TWI623819B (zh) * 2009-05-15 2018-05-11 Nikon Corp 移動體裝置、動力傳達裝置、及曝光裝置、以及元件製造方法
JP5651035B2 (ja) * 2011-02-09 2015-01-07 株式会社ソディック 移動装置
CN102887341A (zh) * 2011-07-22 2013-01-23 大银微系统股份有限公司 悬臂式平台的横梁预拉模组
CN103522079B (zh) * 2013-09-29 2016-01-06 天津大学 双弹簧预紧柔性解耦直线电机定位平台
US9878386B2 (en) 2013-10-31 2018-01-30 Foundation Of Soongsil University-Industry Cooperation Eccentric electrode for electric discharge machining, method of manufacturing the same, and micro electric discharge machining apparatus including the same
CN103824792A (zh) * 2014-02-28 2014-05-28 上海和辉光电有限公司 一种储藏柜及控制方法
JP5912143B2 (ja) 2014-03-04 2016-04-27 株式会社新川 ボンディング装置
JP6379612B2 (ja) * 2014-04-11 2018-08-29 株式会社ニコン 移動体装置及び露光装置、並びにデバイス製造方法
CN107664920B (zh) * 2016-07-29 2019-04-12 上海微电子装备(集团)股份有限公司 电磁导轨装置
CN109690406A (zh) * 2016-09-09 2019-04-26 Asml控股股份有限公司 光刻设备和支撑结构背景
CN110328405B (zh) * 2019-08-09 2020-09-22 佛山市镭科智能设备有限公司 一种型材的夹持控制方法
CN114043260B (zh) * 2022-01-13 2022-04-26 上海隐冠半导体技术有限公司 位移装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69009841T2 (de) * 1989-04-17 1994-12-22 Sharp K.K., Osaka Linearantriebsgerät.
NL9100407A (nl) * 1991-03-07 1992-10-01 Philips Nv Optisch lithografische inrichting met een krachtgecompenseerd machinegestel.
JPH0529442A (ja) * 1991-07-18 1993-02-05 Toshiba Corp テ−ブル装置
US5285142A (en) * 1993-02-09 1994-02-08 Svg Lithography Systems, Inc. Wafer stage with reference surface
JPH07260472A (ja) * 1994-03-22 1995-10-13 Nikon Corp ステージ装置の直交度測定方法
US5528118A (en) * 1994-04-01 1996-06-18 Nikon Precision, Inc. Guideless stage with isolated reaction stage
JPH08229759A (ja) * 1995-02-24 1996-09-10 Canon Inc 位置決め装置並びにデバイス製造装置及び方法

Also Published As

Publication number Publication date
HK1035430A1 (en) 2001-11-23
HK1025841A1 (en) 2000-11-24
GB2325563A (en) 1998-11-25
GB2329516A (en) 1999-03-24
GB2329521B (en) 1999-06-02
GB2329517A (en) 1999-03-24
GB2329520B (en) 1999-06-02
JP3804785B2 (ja) 2006-08-02
GB2329520A (en) 1999-03-24
GB9817490D0 (en) 1998-10-07
KR100281853B1 (ko) 2001-04-02
JP4687911B2 (ja) 2011-05-25
KR960002519A (ko) 1996-01-26
GB9817494D0 (en) 1998-10-07
HK1017824A1 (en) 1999-11-26
GB2329522A (en) 1999-03-24
GB2325566A (en) 1998-11-25
GB2329522B (en) 1999-06-02
KR100281855B1 (ko) 2001-02-15
GB2329519B (en) 1999-06-02
HK1035432A1 (en) 2001-11-23
HK1026766A1 (en) 2000-12-22
GB2329518B (en) 1999-06-02
HK1035435A1 (en) 2001-11-23
HK1025842A1 (en) 2000-11-24
GB2325565B (en) 1999-03-31
KR100281857B1 (ko) 2001-02-15
KR100281858B1 (ko) 2001-02-15
KR100281860B1 (ko) 2001-02-15
HK1035431A1 (en) 2001-11-23
JP3804786B2 (ja) 2006-08-02
GB2329516B (en) 1999-06-02
GB9512659D0 (en) 1995-08-23
GB2329517B (en) 1999-06-02
GB9817491D0 (en) 1998-10-07
GB2290658A (en) 1996-01-03
JP2006258817A (ja) 2006-09-28
GB2290658B (en) 1999-03-24
GB9825844D0 (en) 1999-01-20
KR100281859B1 (ko) 2001-02-15
GB9817492D0 (en) 1998-10-07
JP2003197518A (ja) 2003-07-11
JP2003197519A (ja) 2003-07-11
GB2329521A (en) 1999-03-24
GB2325563B (en) 1999-03-24
JP4135188B2 (ja) 2008-08-20
GB2325564B (en) 1999-03-24
JPH0863231A (ja) 1996-03-08
KR100281856B1 (ko) 2001-02-15
GB2325565A (en) 1998-11-25
GB2329518A (en) 1999-03-24
JP2003158073A (ja) 2003-05-30
HK1025840A1 (en) 2000-11-24
GB9817493D0 (en) 1998-10-07
HK1032291A1 (en) 2001-07-13
GB2329519A (en) 1999-03-24
GB2325564A (en) 1998-11-25
HK1026767A1 (en) 2000-12-22
HK1035433A1 (en) 2001-11-23
GB2325566B (en) 1999-03-31
GB2329067A (en) 1999-03-10
JP2007242034A (ja) 2007-09-20
JP3804787B2 (ja) 2006-08-02
GB2329067B (en) 1999-06-02

Similar Documents

Publication Publication Date Title
JP3800616B2 (ja) 目標物移動装置、位置決め装置及び可動ステージ装置
US6693402B2 (en) Electromagnetic alignment and scanning apparatus
EP0244012B1 (en) Positioning device
US20030173833A1 (en) Wafer stage with magnetic bearings
US20040004703A1 (en) Method and apparatus for reducing rotary stiffness in a support mechanism
WO2001081171A1 (en) Wafer stage with magnetic bearings

Legal Events

Date Code Title Description
A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20060116

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20060317

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20060410

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20060423

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20160512

Year of fee payment: 10

EXPY Cancellation because of completion of term