JP2019526049A5 - - Google Patents

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JP2019526049A5
JP2019526049A5 JP2019502636A JP2019502636A JP2019526049A5 JP 2019526049 A5 JP2019526049 A5 JP 2019526049A5 JP 2019502636 A JP2019502636 A JP 2019502636A JP 2019502636 A JP2019502636 A JP 2019502636A JP 2019526049 A5 JP2019526049 A5 JP 2019526049A5
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analyte
sensing chemistry
electrode pair
substrate
conversion chamber
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JP7086927B2 (ja
JP2019526049A (ja
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Priority claimed from PCT/US2017/042830 external-priority patent/WO2018017699A1/en
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Priority to JP2022092914A priority Critical patent/JP7358563B2/ja
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Priority to JP2023164189A priority patent/JP7561941B2/ja
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JP2019502636A 2016-07-19 2017-07-19 バッチ校正可能なテストストリップを用いる検体測定方法と検体測定システム Active JP7086927B2 (ja)

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Application Number Priority Date Filing Date Title
JP2022092914A JP7358563B2 (ja) 2016-07-19 2022-06-08 バッチ校正可能なテストストリップを用いる検体測定方法と検体測定システム
JP2023164189A JP7561941B2 (ja) 2016-07-19 2023-09-27 バッチ校正可能なテストストリップを用いる検体測定方法と検体測定システム

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US201662363971P 2016-07-19 2016-07-19
US62/363,971 2016-07-19
PCT/US2017/042830 WO2018017699A1 (en) 2016-07-19 2017-07-19 Methods of and systems for measuring analytes using batch calibratable test strips

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JP2022092914A Division JP7358563B2 (ja) 2016-07-19 2022-06-08 バッチ校正可能なテストストリップを用いる検体測定方法と検体測定システム

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JP2019526049A JP2019526049A (ja) 2019-09-12
JP2019526049A5 true JP2019526049A5 (enExample) 2020-08-27
JP7086927B2 JP7086927B2 (ja) 2022-06-20

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JP2019502636A Active JP7086927B2 (ja) 2016-07-19 2017-07-19 バッチ校正可能なテストストリップを用いる検体測定方法と検体測定システム
JP2022092914A Active JP7358563B2 (ja) 2016-07-19 2022-06-08 バッチ校正可能なテストストリップを用いる検体測定方法と検体測定システム
JP2023164189A Active JP7561941B2 (ja) 2016-07-19 2023-09-27 バッチ校正可能なテストストリップを用いる検体測定方法と検体測定システム

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JP2023164189A Active JP7561941B2 (ja) 2016-07-19 2023-09-27 バッチ校正可能なテストストリップを用いる検体測定方法と検体測定システム

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US (3) US11255840B2 (enExample)
EP (2) EP4464772A3 (enExample)
JP (3) JP7086927B2 (enExample)
CN (2) CN114859028A (enExample)
AU (1) AU2017300528C1 (enExample)
CA (1) CA3031247A1 (enExample)
ES (1) ES2988367T3 (enExample)
WO (1) WO2018017699A1 (enExample)

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