JP2019505776A5 - - Google Patents

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Publication number
JP2019505776A5
JP2019505776A5 JP2018531514A JP2018531514A JP2019505776A5 JP 2019505776 A5 JP2019505776 A5 JP 2019505776A5 JP 2018531514 A JP2018531514 A JP 2018531514A JP 2018531514 A JP2018531514 A JP 2018531514A JP 2019505776 A5 JP2019505776 A5 JP 2019505776A5
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JP
Japan
Prior art keywords
radiation
device under
under test
test
test system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2018531514A
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English (en)
Japanese (ja)
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JP2019505776A (ja
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Publication date
Priority claimed from GB1522432.2A external-priority patent/GB2545496B/en
Application filed filed Critical
Publication of JP2019505776A publication Critical patent/JP2019505776A/ja
Publication of JP2019505776A5 publication Critical patent/JP2019505776A5/ja
Priority to JP2021128013A priority Critical patent/JP2021170040A/ja
Priority to JP2024029454A priority patent/JP2024051131A/ja
Pending legal-status Critical Current

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JP2018531514A 2015-12-18 2016-12-16 試験システム Pending JP2019505776A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2021128013A JP2021170040A (ja) 2015-12-18 2021-08-04 試験システム
JP2024029454A JP2024051131A (ja) 2015-12-18 2024-02-29 試験システム

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1522432.2 2015-12-18
GB1522432.2A GB2545496B (en) 2015-12-18 2015-12-18 A Test System
PCT/GB2016/053976 WO2017103619A1 (en) 2015-12-18 2016-12-16 A test system

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2021128013A Division JP2021170040A (ja) 2015-12-18 2021-08-04 試験システム

Publications (2)

Publication Number Publication Date
JP2019505776A JP2019505776A (ja) 2019-02-28
JP2019505776A5 true JP2019505776A5 (enExample) 2020-01-30

Family

ID=55311263

Family Applications (3)

Application Number Title Priority Date Filing Date
JP2018531514A Pending JP2019505776A (ja) 2015-12-18 2016-12-16 試験システム
JP2021128013A Pending JP2021170040A (ja) 2015-12-18 2021-08-04 試験システム
JP2024029454A Pending JP2024051131A (ja) 2015-12-18 2024-02-29 試験システム

Family Applications After (2)

Application Number Title Priority Date Filing Date
JP2021128013A Pending JP2021170040A (ja) 2015-12-18 2021-08-04 試験システム
JP2024029454A Pending JP2024051131A (ja) 2015-12-18 2024-02-29 試験システム

Country Status (8)

Country Link
US (3) US11366158B2 (enExample)
EP (1) EP3391065B1 (enExample)
JP (3) JP2019505776A (enExample)
KR (1) KR20180096717A (enExample)
CN (1) CN108474821B (enExample)
GB (1) GB2545496B (enExample)
TW (3) TWI871934B (enExample)
WO (1) WO2017103619A1 (enExample)

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TWI785801B (zh) * 2021-09-15 2022-12-01 英業達股份有限公司 測試輻射敏感度之方法及系統
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CN114460446B (zh) * 2022-03-02 2024-06-14 本源量子计算科技（合肥）股份有限公司 一种量子芯片检测系统及检测方法
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