JP2018142682A5 - - Google Patents
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- JP2018142682A5 JP2018142682A5 JP2017037763A JP2017037763A JP2018142682A5 JP 2018142682 A5 JP2018142682 A5 JP 2018142682A5 JP 2017037763 A JP2017037763 A JP 2017037763A JP 2017037763 A JP2017037763 A JP 2017037763A JP 2018142682 A5 JP2018142682 A5 JP 2018142682A5
- Authority
- JP
- Japan
- Prior art keywords
- conductivity type
- dopant
- trench
- semiconductor
- silicon carbide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000004065 semiconductor Substances 0.000 claims 33
- 239000002019 doping agent Substances 0.000 claims 16
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims 10
- 229910010271 silicon carbide Inorganic materials 0.000 claims 10
- 238000004519 manufacturing process Methods 0.000 claims 3
- 239000000758 substrate Substances 0.000 claims 3
- 238000000034 method Methods 0.000 claims 2
- 230000015572 biosynthetic process Effects 0.000 claims 1
- 239000012535 impurity Substances 0.000 claims 1
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2017037763A JP6857351B2 (ja) | 2017-02-28 | 2017-02-28 | 炭化珪素半導体装置および炭化珪素半導体装置の製造方法 |
| US15/903,181 US10186575B2 (en) | 2017-02-28 | 2018-02-23 | Silicon carbide semiconductor device and a method of manufacturing a silicon carbide semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2017037763A JP6857351B2 (ja) | 2017-02-28 | 2017-02-28 | 炭化珪素半導体装置および炭化珪素半導体装置の製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018142682A JP2018142682A (ja) | 2018-09-13 |
| JP2018142682A5 true JP2018142682A5 (enExample) | 2020-03-05 |
| JP6857351B2 JP6857351B2 (ja) | 2021-04-14 |
Family
ID=63245427
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017037763A Active JP6857351B2 (ja) | 2017-02-28 | 2017-02-28 | 炭化珪素半導体装置および炭化珪素半導体装置の製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US10186575B2 (enExample) |
| JP (1) | JP6857351B2 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102016205331A1 (de) * | 2016-03-31 | 2017-10-05 | Robert Bosch Gmbh | Vertikaler SiC-MOSFET |
| US11056586B2 (en) * | 2018-09-28 | 2021-07-06 | General Electric Company | Techniques for fabricating charge balanced (CB) trench-metal-oxide-semiconductor field-effect transistor (MOSFET) devices |
| CN109888004A (zh) * | 2019-01-08 | 2019-06-14 | 上海华虹宏力半导体制造有限公司 | Igbt器件 |
| JP7472477B2 (ja) | 2019-12-02 | 2024-04-23 | 富士電機株式会社 | 炭化珪素半導体装置の製造方法および炭化珪素基板の製造方法 |
| JP7318553B2 (ja) * | 2020-02-10 | 2023-08-01 | 株式会社デンソー | スイッチング素子の製造方法 |
| CN111370480B (zh) * | 2020-03-09 | 2024-11-12 | 瑞能半导体科技股份有限公司 | 功率器件、功率器件的制作方法 |
| JP7778665B2 (ja) * | 2022-09-16 | 2025-12-02 | 株式会社東芝 | 半導体装置、半導体装置の製造方法、インバータ回路、駆動装置、車両、及び、昇降機 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3485081B2 (ja) * | 1999-10-28 | 2004-01-13 | 株式会社デンソー | 半導体基板の製造方法 |
| US6576516B1 (en) * | 2001-12-31 | 2003-06-10 | General Semiconductor, Inc. | High voltage power MOSFET having a voltage sustaining region that includes doped columns formed by trench etching and diffusion from regions of oppositely doped polysilicon |
| JP3634830B2 (ja) | 2002-09-25 | 2005-03-30 | 株式会社東芝 | 電力用半導体素子 |
| DE102006055131A1 (de) * | 2005-11-28 | 2007-06-06 | Fuji Electric Holdings Co., Ltd., Kawasaki | Halbleiterbauteil und Verfahren zu seiner Herstellung |
| JP4696986B2 (ja) * | 2006-03-17 | 2011-06-08 | トヨタ自動車株式会社 | スーパージャンクション構造を有する半導体装置の製造方法 |
| JP2010040973A (ja) * | 2008-08-08 | 2010-02-18 | Sony Corp | 半導体装置およびその製造方法 |
| WO2010109892A1 (ja) * | 2009-03-26 | 2010-09-30 | 株式会社Sumco | 半導体基板、半導体装置及び半導体基板の製造方法 |
| JP5943509B2 (ja) * | 2012-03-30 | 2016-07-05 | 国立研究開発法人産業技術総合研究所 | 炭化珪素基板への成膜方法 |
| US9041096B2 (en) * | 2013-04-16 | 2015-05-26 | Rohm Co., Ltd. | Superjunction semiconductor device and manufacturing method therefor |
-
2017
- 2017-02-28 JP JP2017037763A patent/JP6857351B2/ja active Active
-
2018
- 2018-02-23 US US15/903,181 patent/US10186575B2/en active Active
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