JP2018019074A5 - - Google Patents

Download PDF

Info

Publication number
JP2018019074A5
JP2018019074A5 JP2017124719A JP2017124719A JP2018019074A5 JP 2018019074 A5 JP2018019074 A5 JP 2018019074A5 JP 2017124719 A JP2017124719 A JP 2017124719A JP 2017124719 A JP2017124719 A JP 2017124719A JP 2018019074 A5 JP2018019074 A5 JP 2018019074A5
Authority
JP
Japan
Prior art keywords
metal oxide
oxide layer
region
oxide
band gap
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2017124719A
Other languages
English (en)
Japanese (ja)
Other versions
JP2018019074A (ja
JP6798942B2 (ja
Filing date
Publication date
Application filed filed Critical
Publication of JP2018019074A publication Critical patent/JP2018019074A/ja
Publication of JP2018019074A5 publication Critical patent/JP2018019074A5/ja
Application granted granted Critical
Publication of JP6798942B2 publication Critical patent/JP6798942B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2017124719A 2016-06-27 2017-06-27 トランジスタおよび半導体装置 Expired - Fee Related JP6798942B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2016127106 2016-06-27
JP2016127106 2016-06-27
JP2016140981 2016-07-18
JP2016140981 2016-07-18

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2020192553A Division JP2021036615A (ja) 2016-06-27 2020-11-19 トランジスタ

Publications (3)

Publication Number Publication Date
JP2018019074A JP2018019074A (ja) 2018-02-01
JP2018019074A5 true JP2018019074A5 (https=) 2019-06-20
JP6798942B2 JP6798942B2 (ja) 2020-12-09

Family

ID=60677919

Family Applications (3)

Application Number Title Priority Date Filing Date
JP2017124719A Expired - Fee Related JP6798942B2 (ja) 2016-06-27 2017-06-27 トランジスタおよび半導体装置
JP2020192553A Withdrawn JP2021036615A (ja) 2016-06-27 2020-11-19 トランジスタ
JP2022137406A Withdrawn JP2022169759A (ja) 2016-06-27 2022-08-31 トランジスタ及び半導体装置

Family Applications After (2)

Application Number Title Priority Date Filing Date
JP2020192553A Withdrawn JP2021036615A (ja) 2016-06-27 2020-11-19 トランジスタ
JP2022137406A Withdrawn JP2022169759A (ja) 2016-06-27 2022-08-31 トランジスタ及び半導体装置

Country Status (2)

Country Link
US (1) US20170373195A1 (https=)
JP (3) JP6798942B2 (https=)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102583770B1 (ko) * 2016-09-12 2023-10-06 삼성디스플레이 주식회사 메모리 트랜지스터 및 이를 갖는 표시장치
CN111615743A (zh) * 2018-01-25 2020-09-01 株式会社半导体能源研究所 半导体装置及半导体装置的制造方法
CN112005383A (zh) 2018-03-12 2020-11-27 株式会社半导体能源研究所 金属氧化物以及包含金属氧化物的晶体管
CN108878512B (zh) * 2018-06-29 2020-08-25 云南大学 一种金属氧化物叠层场效应材料及其应用
JP2020009960A (ja) * 2018-07-11 2020-01-16 株式会社半導体エネルギー研究所 半導体装置、および半導体装置の作製方法
US11031506B2 (en) * 2018-08-31 2021-06-08 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device including transistor using oxide semiconductor
WO2020059026A1 (ja) * 2018-09-18 2020-03-26 シャープ株式会社 表示装置、および表示装置の製造方法
US11211461B2 (en) * 2018-12-28 2021-12-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and memory device
KR20240154578A (ko) * 2022-02-25 2024-10-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 기억 장치

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5489445B2 (ja) * 2007-11-15 2014-05-14 富士フイルム株式会社 薄膜電界効果型トランジスタおよびそれを用いた表示装置
JP5382763B2 (ja) * 2008-04-09 2014-01-08 独立行政法人産業技術総合研究所 半導体素子及びその製造方法と、該半導体素子を備えた電子デバイス
JP2010165922A (ja) * 2009-01-16 2010-07-29 Idemitsu Kosan Co Ltd 電界効果型トランジスタ、電界効果型トランジスタの製造方法及び半導体素子の製造方法
KR102929405B1 (ko) * 2009-12-04 2026-02-24 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
JP5497417B2 (ja) * 2009-12-10 2014-05-21 富士フイルム株式会社 薄膜トランジスタおよびその製造方法、並びにその薄膜トランジスタを備えた装置
KR101894821B1 (ko) * 2009-12-11 2018-09-05 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR101778224B1 (ko) * 2010-10-12 2017-09-15 삼성전자주식회사 트랜지스터와 그 제조방법 및 트랜지스터를 포함하는 전자소자
KR20200052993A (ko) * 2010-12-03 2020-05-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 산화물 반도체막 및 반도체 장치
US8878174B2 (en) * 2011-04-15 2014-11-04 Semiconductor Energy Laboratory Co., Ltd. Semiconductor element, memory circuit, integrated circuit, and driving method of the integrated circuit
US8952377B2 (en) * 2011-07-08 2015-02-10 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
US9059219B2 (en) * 2012-06-27 2015-06-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing semiconductor device
KR102171650B1 (ko) * 2012-08-10 2020-10-29 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
US9614258B2 (en) * 2012-12-28 2017-04-04 Semiconductor Energy Laboratory Co., Ltd. Power storage device and power storage system
JP6199581B2 (ja) * 2013-03-08 2017-09-20 株式会社半導体エネルギー研究所 金属酸化物膜、及び半導体装置
JP2016058708A (ja) * 2014-09-11 2016-04-21 株式会社半導体エネルギー研究所 半導体装置、及び半導体装置の評価方法
KR20170068511A (ko) * 2014-10-06 2017-06-19 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 전자 기기

Similar Documents

Publication Publication Date Title
JP2018019074A5 (https=)
JP5982234B2 (ja) グラフェンを含む電界効果トランジスタ
CN103715259B (zh) 包括石墨烯沟道的隧穿场效应晶体管
JP6666224B2 (ja) 半導体装置
JP2018032839A5 (ja) 半導体装置
KR20250168114A (ko) 강유전층을 포함하는 전자 소자
JP2018019072A5 (https=)
JP6487061B2 (ja) フィン型電界効果トランジスタ
CN110137356B (zh) 薄膜晶体管及其制作方法、电子装置
EP2608267B1 (en) P-type graphene base transistor
KR102257243B1 (ko) 튜너블 배리어를 구비한 그래핀 트랜지스터
CN106356405A (zh) 一种异质结碳纳米管场效应晶体管及其制备方法
KR20100111999A (ko) 그라핀 채널층을 가지는 전계 효과 트랜지스터
KR20130022854A (ko) 튜너블 배리어를 구비한 그래핀 스위칭 소자
JP2013058770A5 (https=)
JP2011187949A5 (https=)
JP2009176997A5 (https=)
JP2017139289A (ja) ダイオード
JPWO2016157718A1 (ja) 窒化物半導体装置
JP2017139293A (ja) ダイオード
JP2018019073A5 (ja) トランジスタ
CN105870182A (zh) 一种三明治结构双栅垂直隧穿场效应晶体管
WO2021189379A1 (zh) 环绕栅晶体管及其制作方法、电子设备
KR102192083B1 (ko) 높은 온/오프 전류비를 가진 박막 트랜지스터
CN109980015B (zh) 一种有效增大开态电流的隧穿场效应晶体管