JP2016531532A5 - - Google Patents

Download PDF

Info

Publication number
JP2016531532A5
JP2016531532A5 JP2016543936A JP2016543936A JP2016531532A5 JP 2016531532 A5 JP2016531532 A5 JP 2016531532A5 JP 2016543936 A JP2016543936 A JP 2016543936A JP 2016543936 A JP2016543936 A JP 2016543936A JP 2016531532 A5 JP2016531532 A5 JP 2016531532A5
Authority
JP
Japan
Prior art keywords
stage
signal
significant bits
res1
reference signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2016543936A
Other languages
English (en)
Japanese (ja)
Other versions
JP2016531532A (ja
Filing date
Publication date
Priority claimed from US14/031,512 external-priority patent/US9059730B2/en
Application filed filed Critical
Publication of JP2016531532A publication Critical patent/JP2016531532A/ja
Publication of JP2016531532A5 publication Critical patent/JP2016531532A5/ja
Ceased legal-status Critical Current

Links

JP2016543936A 2013-09-19 2014-09-12 パイプライン型逐次近似アナログ／デジタル変換器 Ceased JP2016531532A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/031,512 2013-09-19
US14/031,512 US9059730B2 (en) 2013-09-19 2013-09-19 Pipelined successive approximation analog-to-digital converter
PCT/US2014/055312 WO2015041937A1 (en) 2013-09-19 2014-09-12 Pipelined successive approximation analog-to-digital converter

Publications (2)

Publication Number Publication Date
JP2016531532A JP2016531532A (ja) 2016-10-06
JP2016531532A5 true JP2016531532A5 (enExample) 2017-09-28

Family

ID=51589557

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016543936A Ceased JP2016531532A (ja) 2013-09-19 2014-09-12 パイプライン型逐次近似アナログ／デジタル変換器

Country Status (7)

Country Link
US (1) US9059730B2 (enExample)
EP (1) EP3047574A1 (enExample)
JP (1) JP2016531532A (enExample)
KR (1) KR20160058140A (enExample)
CN (1) CN105556847A (enExample)
BR (1) BR112016006103A2 (enExample)
WO (1) WO2015041937A1 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9455737B1 (en) 2015-09-25 2016-09-27 Qualcomm Incorporated Delta-sigma analog-to-digital converter (ADC) with time-interleaved (TI) or two-step successive approximation register (SAR) quantizer
JP2017135616A (ja) * 2016-01-28 2017-08-03 日本放送協会 アナログ・デジタル変換回路
US9705520B1 (en) 2016-09-08 2017-07-11 Stmicroelectronics International N.V. Circuit and method for generating reference signals for hybrid analog-to-digital convertors
US9973202B2 (en) * 2016-09-20 2018-05-15 Kabushiki Kaisha Toshiba Successive approximation register analog-to-digital converter
US9647740B1 (en) 2016-10-25 2017-05-09 Motorola Mobility Llc Proximal user detection with a complex measurement receiver
EP3334047B1 (en) * 2016-12-08 2021-04-21 Stichting IMEC Nederland A method of gain calibration in a two-stage pipelined successive approximation register analog-to-digital converter and a two-stage pipelined successive approximation register analog-to-digital converter
EP3334049B1 (en) * 2016-12-08 2021-04-21 Stichting IMEC Nederland A method of digital-to-analog converter mismatch calibration in a successive approximation register analog-to-digital converter and a successive approximation register analog-to-digital converter
EP3334050A1 (en) * 2016-12-08 2018-06-13 Stichting IMEC Nederland A method of offset calibration in a successive approximation register analog-to-digital converter and a successive approximation register analog-to-digital converter
US11018668B2 (en) * 2017-11-14 2021-05-25 Shuze Zhao Characterization of power delivery network in field programmable gate arrays or digital integrated circuits
CN108880546B (zh) * 2018-07-09 2021-04-30 电子科技大学 一种应用于逐次逼近模数转换器的电容校正方法
US10763886B1 (en) * 2019-08-20 2020-09-01 Texas Instruments Incorporated Dithering and calibration technique in multi-stage ADC
KR102744050B1 (ko) 2020-02-06 2024-12-17 삼성전자주식회사 아날로그 디지털 변환 장치 및 아날로그 디지털 변환 방법
US12261619B2 (en) 2022-12-20 2025-03-25 International Business Machines Corporation Stochastic rounding switched capacitor computation cores useful for efficient deep learning inference
US20250183905A1 (en) * 2023-12-05 2025-06-05 Arctic Semiconductor Corporation Multi-stage pipeline sar analog-to-digital converter (adc)

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5151700A (en) * 1989-08-04 1992-09-29 Matsushita Electric Industrial Co., Ltd. Serial-parallel type a/d converter
JP3182444B2 (ja) * 1992-03-04 2001-07-03 株式会社日立製作所 Ａｄ変換器
JPH0774635A (ja) * 1993-07-02 1995-03-17 Mitsubishi Electric Corp アナログ・デジタル変換装置
JP3510306B2 (ja) * 1994-01-31 2004-03-29 ソニー株式会社 アナログデイジタル変換回路
US5771012A (en) 1996-09-11 1998-06-23 Harris Corporation Integrated circuit analog-to-digital converter and associated calibration method and apparatus
US6124818A (en) 1998-10-21 2000-09-26 Linear Technology Corporation Pipelined successive approximation analog-to-digital converters
US6489914B1 (en) 2001-12-04 2002-12-03 Motorola, Inc. RSD analog to digital converter
JP5072607B2 (ja) * 2008-01-07 2012-11-14 株式会社東芝 Ａ／ｄ変換装置
DE102009004564B4 (de) 2009-01-14 2013-08-22 Texas Instruments Deutschland Gmbh ADC mit energiesparender Abtastung
KR101381250B1 (ko) 2010-09-15 2014-04-04 한국전자통신연구원 아날로그 디지털 변환 장치 및 그것의 기준 전압 제어 방법
KR101678842B1 (ko) 2010-10-22 2016-11-23 삼성전자주식회사 아날로그 디지털 컨버터 및 이를 포함하는 이미지 센서
US8659462B2 (en) * 2010-12-10 2014-02-25 Lg Display Co., Ltd. Successive approximation register analog-to-digital converter and analog-to-digital conversion method using the same
US8471751B2 (en) * 2011-06-30 2013-06-25 Intel Corporation Two-stage analog-to-digital converter using SAR and TDC
US8643529B2 (en) * 2012-06-05 2014-02-04 Himax Technologies Limited SAR assisted pipelined ADC and method for operating the same
US8614638B1 (en) * 2012-06-19 2013-12-24 Qualcomm Incorporated Hybrid successive approximation analog-to-digital converter
JP6111662B2 (ja) * 2012-12-28 2017-04-12 富士通株式会社 アナログ／デジタル変換器
CN103281080B (zh) * 2013-04-25 2017-03-15 清华大学 一种流水线结构模数转换器的前端电路及其时序控制方法

Similar Documents

Publication Publication Date Title
JP2016531532A5 (enExample)
MX376695B (es) Sistema de convertidor analogico a digital.
EP2627006B1 (en) Serial-ripple analog-to-digital conversion
US9059730B2 (en) Pipelined successive approximation analog-to-digital converter
EP2629429A1 (en) A/D converter and method for calibrating the same
US8174423B2 (en) Pipelined analog-to-digital converter and sub-converter stage
JP2016005171A5 (enExample)
EP3001568A3 (en) Calibration of a time-interleaved analog-to-digital converter (adc) circuit
US8106805B2 (en) Self-calibrating pipeline ADC and method thereof
US8164497B2 (en) Pipeline analog-to-digital converter
US7830287B1 (en) Analog to digital converter having digital correction logic that utilizes a dither signal to correct a digital code
EP3703260A3 (en) Digital calibration systems and methods for multi-stage analog-to-digital converters
CN108270442B (zh) 具有增大分辨率的第一级的模-数转换器
KR20110083482A (ko) Ａｄ 변환 장치 및 제어 방법
JP2012227774A (ja) アナログデジタル変換器および信号処理システム
US9191021B1 (en) Analog-to-digital converter with controlled error calibration
JP2018098788A (ja) 逐次比較レジスタ型ａｄ変換器における利得較正方法、及び逐次比較レジスタ型アナログデジタル変換器
WO2008117134A4 (en) Analogue to digital converters
TWI835424B (zh) 管線式類比數位轉換器及其校正方法
JP2007195159A5 (enExample)
KR101840698B1 (ko) 혼합형 아날로그 디지털 변환 장치 및 그것의 동작 방법
US20150326239A1 (en) Calibration of high speed asynchronous convertor
TWI446724B (zh) 管線式再循環類比數位轉換器
US10566985B2 (en) Method for analog-to-digital conversion of analog input signals
TW201613277A (en) Pipeline analog-to-digital converting method and apparatus thereof