KR20160058140A - 파이프라인식 연속 아날로그-투-디지털 변환기 - Google Patents

파이프라인식 연속 아날로그-투-디지털 변환기 Download PDF

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Publication number
KR20160058140A
KR20160058140A KR1020167009667A KR20167009667A KR20160058140A KR 20160058140 A KR20160058140 A KR 20160058140A KR 1020167009667 A KR1020167009667 A KR 1020167009667A KR 20167009667 A KR20167009667 A KR 20167009667A KR 20160058140 A KR20160058140 A KR 20160058140A
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KR
South Korea
Prior art keywords
stage
significant bits
signal
analog
digital
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KR1020167009667A
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English (en)
Korean (ko)
Inventor
현식 박
소티리오스 리모티라키스
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퀄컴 인코포레이티드
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Publication of KR20160058140A publication Critical patent/KR20160058140A/ko
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
    • H03M1/145—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit the steps being performed sequentially in series-connected stages
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
    • H03M1/069—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy by range overlap between successive stages or steps
    • H03M1/0695—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy by range overlap between successive stages or steps using less than the maximum number of output states per stage or step, e.g. 1.5 per stage or less than 1.5 bit per stage type
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/80—Simultaneous conversion using weighted impedances
    • H03M1/802—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
    • H03M1/804—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Power Engineering (AREA)
KR1020167009667A 2013-09-19 2014-09-12 파이프라인식 연속 아날로그-투-디지털 변환기 Withdrawn KR20160058140A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/031,512 2013-09-19
US14/031,512 US9059730B2 (en) 2013-09-19 2013-09-19 Pipelined successive approximation analog-to-digital converter
PCT/US2014/055312 WO2015041937A1 (en) 2013-09-19 2014-09-12 Pipelined successive approximation analog-to-digital converter

Publications (1)

Publication Number Publication Date
KR20160058140A true KR20160058140A (ko) 2016-05-24

Family

ID=51589557

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020167009667A Withdrawn KR20160058140A (ko) 2013-09-19 2014-09-12 파이프라인식 연속 아날로그-투-디지털 변환기

Country Status (7)

Country Link
US (1) US9059730B2 (enExample)
EP (1) EP3047574A1 (enExample)
JP (1) JP2016531532A (enExample)
KR (1) KR20160058140A (enExample)
CN (1) CN105556847A (enExample)
BR (1) BR112016006103A2 (enExample)
WO (1) WO2015041937A1 (enExample)

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US9455737B1 (en) 2015-09-25 2016-09-27 Qualcomm Incorporated Delta-sigma analog-to-digital converter (ADC) with time-interleaved (TI) or two-step successive approximation register (SAR) quantizer
JP2017135616A (ja) * 2016-01-28 2017-08-03 日本放送協会 アナログ・デジタル変換回路
US9705520B1 (en) 2016-09-08 2017-07-11 Stmicroelectronics International N.V. Circuit and method for generating reference signals for hybrid analog-to-digital convertors
US9973202B2 (en) * 2016-09-20 2018-05-15 Kabushiki Kaisha Toshiba Successive approximation register analog-to-digital converter
US9647740B1 (en) 2016-10-25 2017-05-09 Motorola Mobility Llc Proximal user detection with a complex measurement receiver
EP3334047B1 (en) * 2016-12-08 2021-04-21 Stichting IMEC Nederland A method of gain calibration in a two-stage pipelined successive approximation register analog-to-digital converter and a two-stage pipelined successive approximation register analog-to-digital converter
EP3334049B1 (en) * 2016-12-08 2021-04-21 Stichting IMEC Nederland A method of digital-to-analog converter mismatch calibration in a successive approximation register analog-to-digital converter and a successive approximation register analog-to-digital converter
EP3334050A1 (en) * 2016-12-08 2018-06-13 Stichting IMEC Nederland A method of offset calibration in a successive approximation register analog-to-digital converter and a successive approximation register analog-to-digital converter
US11018668B2 (en) * 2017-11-14 2021-05-25 Shuze Zhao Characterization of power delivery network in field programmable gate arrays or digital integrated circuits
CN108880546B (zh) * 2018-07-09 2021-04-30 电子科技大学 一种应用于逐次逼近模数转换器的电容校正方法
US10763886B1 (en) * 2019-08-20 2020-09-01 Texas Instruments Incorporated Dithering and calibration technique in multi-stage ADC
KR102744050B1 (ko) 2020-02-06 2024-12-17 삼성전자주식회사 아날로그 디지털 변환 장치 및 아날로그 디지털 변환 방법
US12261619B2 (en) 2022-12-20 2025-03-25 International Business Machines Corporation Stochastic rounding switched capacitor computation cores useful for efficient deep learning inference
US20250183905A1 (en) * 2023-12-05 2025-06-05 Arctic Semiconductor Corporation Multi-stage pipeline sar analog-to-digital converter (adc)

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5151700A (en) * 1989-08-04 1992-09-29 Matsushita Electric Industrial Co., Ltd. Serial-parallel type a/d converter
JP3182444B2 (ja) * 1992-03-04 2001-07-03 株式会社日立製作所 Ａｄ変換器
JPH0774635A (ja) * 1993-07-02 1995-03-17 Mitsubishi Electric Corp アナログ・デジタル変換装置
JP3510306B2 (ja) * 1994-01-31 2004-03-29 ソニー株式会社 アナログデイジタル変換回路
US5771012A (en) 1996-09-11 1998-06-23 Harris Corporation Integrated circuit analog-to-digital converter and associated calibration method and apparatus
US6124818A (en) 1998-10-21 2000-09-26 Linear Technology Corporation Pipelined successive approximation analog-to-digital converters
US6489914B1 (en) 2001-12-04 2002-12-03 Motorola, Inc. RSD analog to digital converter
JP5072607B2 (ja) * 2008-01-07 2012-11-14 株式会社東芝 Ａ／ｄ変換装置
DE102009004564B4 (de) 2009-01-14 2013-08-22 Texas Instruments Deutschland Gmbh ADC mit energiesparender Abtastung
KR101381250B1 (ko) 2010-09-15 2014-04-04 한국전자통신연구원 아날로그 디지털 변환 장치 및 그것의 기준 전압 제어 방법
KR101678842B1 (ko) 2010-10-22 2016-11-23 삼성전자주식회사 아날로그 디지털 컨버터 및 이를 포함하는 이미지 센서
US8659462B2 (en) * 2010-12-10 2014-02-25 Lg Display Co., Ltd. Successive approximation register analog-to-digital converter and analog-to-digital conversion method using the same
US8471751B2 (en) * 2011-06-30 2013-06-25 Intel Corporation Two-stage analog-to-digital converter using SAR and TDC
US8643529B2 (en) * 2012-06-05 2014-02-04 Himax Technologies Limited SAR assisted pipelined ADC and method for operating the same
US8614638B1 (en) * 2012-06-19 2013-12-24 Qualcomm Incorporated Hybrid successive approximation analog-to-digital converter
JP6111662B2 (ja) * 2012-12-28 2017-04-12 富士通株式会社 アナログ／デジタル変換器
CN103281080B (zh) * 2013-04-25 2017-03-15 清华大学 一种流水线结构模数转换器的前端电路及其时序控制方法

Also Published As

Publication number Publication date
CN105556847A (zh) 2016-05-04
US20150077280A1 (en) 2015-03-19
US9059730B2 (en) 2015-06-16
BR112016006103A2 (pt) 2017-08-01
EP3047574A1 (en) 2016-07-27
WO2015041937A1 (en) 2015-03-26
JP2016531532A (ja) 2016-10-06

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PA0105 International application

Patent event date: 20160412

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid