JP2015532313A5 - - Google Patents

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Publication number
JP2015532313A5
JP2015532313A5 JP2015532525A JP2015532525A JP2015532313A5 JP 2015532313 A5 JP2015532313 A5 JP 2015532313A5 JP 2015532525 A JP2015532525 A JP 2015532525A JP 2015532525 A JP2015532525 A JP 2015532525A JP 2015532313 A5 JP2015532313 A5 JP 2015532313A5
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JP
Japan
Prior art keywords
group
antireflection film
independently selected
forming
nitrogen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2015532525A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015532313A (ja
JP6005866B2 (ja
Filing date
Publication date
Priority claimed from US13/627,599 external-priority patent/US8900797B2/en
Application filed filed Critical
Publication of JP2015532313A publication Critical patent/JP2015532313A/ja
Publication of JP2015532313A5 publication Critical patent/JP2015532313A5/ja
Application granted granted Critical
Publication of JP6005866B2 publication Critical patent/JP6005866B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2015532525A 2012-09-26 2013-09-26 現像可能な下層反射防止膜 Active JP6005866B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/627,599 2012-09-26
US13/627,599 US8900797B2 (en) 2012-09-26 2012-09-26 Developable bottom anti-reflective coating
PCT/IB2013/002121 WO2014049420A2 (en) 2012-09-26 2013-09-26 Developable bottom anti-reflective coating

Publications (3)

Publication Number Publication Date
JP2015532313A JP2015532313A (ja) 2015-11-09
JP2015532313A5 true JP2015532313A5 (enExample) 2016-03-17
JP6005866B2 JP6005866B2 (ja) 2016-10-12

Family

ID=49943392

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015532525A Active JP6005866B2 (ja) 2012-09-26 2013-09-26 現像可能な下層反射防止膜

Country Status (6)

Country Link
US (1) US8900797B2 (enExample)
EP (1) EP2895468B1 (enExample)
JP (1) JP6005866B2 (enExample)
KR (1) KR101673890B1 (enExample)
CN (1) CN104736523B (enExample)
WO (1) WO2014049420A2 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102214895B1 (ko) 2017-12-26 2021-02-09 삼성에스디아이 주식회사 레지스트 하층막용 조성물 및 이를 이용한 패턴 형성 방법
KR102117555B1 (ko) * 2018-02-09 2020-06-01 에스엠에스주식회사 고굴절 아크릴 모노머 및 이를 이용한 광경화 조성물
KR102285555B1 (ko) 2018-06-12 2021-08-03 주식회사 엘지화학 코팅 조성물 및 이를 이용한 마이크로 전자 소자 제조용 포지티브형 패턴의 제조방법
CN111670177B (zh) 2018-10-11 2022-08-23 株式会社Lg化学 化合物、包含其的光致抗蚀剂组合物、光致抗蚀剂图案及其制备方法
WO2020076123A1 (ko) * 2018-10-11 2020-04-16 주식회사 엘지화학 화합물, 이를 포함하는 포토레지스트 조성물, 이를 포함하는 포토레지스트 패턴 및 포토레지스트 패턴의 제조 방법
JP2020132749A (ja) * 2019-02-19 2020-08-31 メルク、パテント、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツングMerck Patent GmbH ポリマー、ポリマーを含んでなる半導体組成物、および半導体組成物を用いた膜の製造方法
US11269252B2 (en) * 2019-07-22 2022-03-08 Rohm And Haas Electronic Materials Llc Method for forming pattern using antireflective coating composition including photoacid generator
JP7377848B2 (ja) 2020-12-31 2023-11-10 ローム アンド ハース エレクトロニック マテリアルズ エルエルシー フォトレジスト組成物及びパターン形成方法
CN115873176B (zh) * 2021-09-28 2023-09-26 上海新阳半导体材料股份有限公司 一种duv光刻用底部抗反射涂层及其制备方法和应用
CN116102680B (zh) * 2021-11-09 2024-02-13 上海新阳半导体材料股份有限公司 一种底部抗反射涂层及其制备方法和应用
US12411412B2 (en) 2022-11-22 2025-09-09 Toyko Electron Limited Patterning semiconductor features
CN120605812B (zh) * 2025-08-12 2025-10-17 湖南明珠选矿药剂有限责任公司 一种金属矿浮选捕收剂及其制备方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3165514A (en) * 1962-08-07 1965-01-12 Dal Mon Research Co Unsaturated triazine compounds
US6156479A (en) * 1997-09-30 2000-12-05 Brewer Science, Inc. Thermosetting anti-refective coatings
JP3907165B2 (ja) * 2001-11-05 2007-04-18 富士フイルム株式会社 ポジ型レジスト組成物
US20050214674A1 (en) * 2004-03-25 2005-09-29 Yu Sui Positive-working photoimageable bottom antireflective coating
US20060250463A1 (en) * 2004-05-07 2006-11-09 Canon Kagushiki Kaisha Recording method, set of ink compositions applicable to recording method and image-forming apparatus
US8088548B2 (en) 2007-10-23 2012-01-03 Az Electronic Materials Usa Corp. Bottom antireflective coating compositions
US8329387B2 (en) 2008-07-08 2012-12-11 Az Electronic Materials Usa Corp. Antireflective coating compositions
US8455176B2 (en) * 2008-11-12 2013-06-04 Az Electronic Materials Usa Corp. Coating composition

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