JP2015040705A5 - - Google Patents

Download PDF

Info

Publication number
JP2015040705A5
JP2015040705A5 JP2013170231A JP2013170231A JP2015040705A5 JP 2015040705 A5 JP2015040705 A5 JP 2015040705A5 JP 2013170231 A JP2013170231 A JP 2013170231A JP 2013170231 A JP2013170231 A JP 2013170231A JP 2015040705 A5 JP2015040705 A5 JP 2015040705A5
Authority
JP
Japan
Prior art keywords
fine particle
evaluation apparatus
light
dispersibility evaluation
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2013170231A
Other languages
English (en)
Japanese (ja)
Other versions
JP6150167B2 (ja
JP2015040705A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2013170231A priority Critical patent/JP6150167B2/ja
Priority claimed from JP2013170231A external-priority patent/JP6150167B2/ja
Publication of JP2015040705A publication Critical patent/JP2015040705A/ja
Publication of JP2015040705A5 publication Critical patent/JP2015040705A5/ja
Application granted granted Critical
Publication of JP6150167B2 publication Critical patent/JP6150167B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2013170231A 2013-08-20 2013-08-20 微粒子分散性評価装置及び微粒子分散性評価方法 Expired - Fee Related JP6150167B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2013170231A JP6150167B2 (ja) 2013-08-20 2013-08-20 微粒子分散性評価装置及び微粒子分散性評価方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013170231A JP6150167B2 (ja) 2013-08-20 2013-08-20 微粒子分散性評価装置及び微粒子分散性評価方法

Publications (3)

Publication Number Publication Date
JP2015040705A JP2015040705A (ja) 2015-03-02
JP2015040705A5 true JP2015040705A5 (enExample) 2017-01-12
JP6150167B2 JP6150167B2 (ja) 2017-06-21

Family

ID=52694966

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013170231A Expired - Fee Related JP6150167B2 (ja) 2013-08-20 2013-08-20 微粒子分散性評価装置及び微粒子分散性評価方法

Country Status (1)

Country Link
JP (1) JP6150167B2 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6915230B2 (ja) * 2015-06-16 2021-08-04 株式会社リコー 活性エネルギー線硬化型組成物、活性エネルギー線硬化型インク、組成物収容容器、2次元又は3次元の像の形成方法及び形成装置、成形加工品、並びに分散性評価装置。
WO2018070324A1 (ja) * 2016-10-13 2018-04-19 国立研究開発法人産業技術総合研究所 ナノ粒子評価方法およびナノ粒子観察装置
KR101934926B1 (ko) * 2017-01-10 2019-01-03 충남대학교산학협력단 유동 유체 내의 나노입자 거동 예측 방법 및 장치
TWI773721B (zh) * 2017-01-20 2022-08-11 日商東京威力科創股份有限公司 異物檢測裝置、異物檢測方法及記憶媒體
JP6900702B2 (ja) * 2017-02-24 2021-07-07 株式会社リコー 計測装置および計測方法
JP7303066B2 (ja) * 2019-08-26 2023-07-04 株式会社東芝 物性測定装置
JP2021143983A (ja) * 2020-03-13 2021-09-24 横河電機株式会社 状態量測定装置、状態量測定方法及びコンピュータプログラム
CN112730167A (zh) * 2021-01-04 2021-04-30 北京化工大学 一种纳米粒子在复合材料中分布状态的可视化表征方法
CN115308164B (zh) * 2022-10-11 2022-12-13 成都赛林斯科技实业有限公司 在线实时连续测量熔融态玻璃折射率及色散的装置及方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0772066A (ja) * 1993-03-17 1995-03-17 Shinichi Ito 高純度物質中微粒子散乱光検出装置及び分散式ファブリ・ペロー型分光装置並びに平行平面鏡の製造方法及び波長安定化装置
US8101424B2 (en) * 2005-06-15 2012-01-24 University Of Maryland, Baltimore County Bioassays using plasmonic scattering from noble metal nanostructures
CN101100520A (zh) * 2006-07-04 2008-01-09 谢基生 可透红外光的黑色塑料制品的制作方法和应用
JP4852439B2 (ja) * 2006-07-06 2012-01-11 株式会社リコー ラマン分光測定装置、及びこれを用いたラマン分光測定法
JP2010117226A (ja) * 2008-11-12 2010-05-27 Ricoh Co Ltd ラマン分光測定装置および測定法
JP2012173112A (ja) * 2011-02-21 2012-09-10 Ricoh Co Ltd ラマン分光測定装置及びラマン分光測定方法

Similar Documents

Publication Publication Date Title
JP2015040705A5 (enExample)
CN104718444B (zh) 微粒测量装置
CN102095672B (zh) 一种多方法融合的颗粒粒度仪
CN102207443B (zh) 一种颗粒粒度测量仪
CN109923396B (zh) 在散射光模式及荧光模式中测量液体纳米颗粒的浓度、尺寸及z电位装置及方法
JP6348349B2 (ja) 動的光散乱測定装置及び動的光散乱測定方法
CN109642824B (zh) 用于校准针对基于光片的纳米颗粒跟踪和计数装置的调查体积的方法
EP3148411A1 (en) Imaging apparatus, imaging method and medical imaging system
WO2008125605A3 (de) Verfahren und anordnung zur optischen abbildung mit tiefendiskriminierung
US12189108B2 (en) Sample observation device and sample observation method
US11879822B2 (en) Particle size distribution measuring device and program for particle size distribution measuring device
KR101568980B1 (ko) 자동초점 조절장치 및 자동초점 조절방법
WO2018070098A1 (ja) 試料観察装置及び試料観察方法
US11874224B2 (en) Sample observation device and sample observation method
JP2012215458A5 (enExample)
US11448579B2 (en) Particle size distribution measuring device and program for particle size distribution measuring device
US20170131197A1 (en) Fluid analysis using digital imagery
JP6593668B2 (ja) 微粒子分散性評価装置
WO2019012776A1 (ja) 試料観察装置及び試料観察方法
JP2018533014A5 (enExample)
JP2012228544A5 (enExample)
JP2018536174A (ja) コロイド粒子の成長キネティクスまたは分解キネティクスの測定のための装置および方法
CN201984011U (zh) 一种颗粒粒度测量仪
CN204405545U (zh) 一种自动调焦微流控芯片检测装置
US20240077412A1 (en) Optical imaging apparatus, processing apparatus, optical imaging method, and non-transitory storage medium