JP6348349B2 - 動的光散乱測定装置及び動的光散乱測定方法 - Google Patents
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- 238000002296 dynamic light scattering Methods 0.000 title claims description 39
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- 238000005259 measurement Methods 0.000 claims description 29
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- 230000003595 spectral effect Effects 0.000 claims description 25
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- 239000002245 particle Substances 0.000 claims description 16
- 238000000691 measurement method Methods 0.000 claims description 9
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- 238000010586 diagram Methods 0.000 description 17
- 239000013307 optical fiber Substances 0.000 description 15
- 230000002123 temporal effect Effects 0.000 description 7
- 238000005311 autocorrelation function Methods 0.000 description 6
- 230000000644 propagated effect Effects 0.000 description 4
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- 238000003384 imaging method Methods 0.000 description 2
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- 239000004816 latex Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
- G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
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- G—PHYSICS
- G01—MEASURING; TESTING
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- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0218—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
- G01J3/4412—Scattering spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/0303—Optical path conditioning in cuvettes, e.g. windows; adapted optical elements or systems; path modifying or adjustment
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J2009/0223—Common path interferometry; Point diffraction interferometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
- G01N2015/0222—Investigating a scatter or diffraction pattern from dynamic light scattering, e.g. photon correlation spectroscopy
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N2021/0389—Windows
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4709—Backscatter
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/062—LED's
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- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
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- Health & Medical Sciences (AREA)
- Dispersion Chemistry (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
。
図1は、第1の実施の形態に係る動的光散乱測定装置の構成を示す模式図である。
光として検出される。光検出器70は、この干渉光のスペクトル強度を検出する。光検出器70で検出された検出信号(干渉光のスペクトル強度)は、演算処理部80に出力される。
:nm)を示し、縦軸は強度(任意単位)を示す。図4、図5を、参照光Lreと基準光Lbaによって発現する干渉縞を確認することができる。また、この干渉縞には、試料40から発生する散乱光Lscの揺らぎ成分も含まれている。
図10は、第2の実施の形態に係る動的光散乱測定装置の構成を示す模式図である。図10において、図1の構成と同様の構成については同一の符号を付し、その説明を適宜省略する。
までの距離を示す。
図12は、第3の実施の形態に係る動的光散乱測定装置の構成を示す模式図である。図12において、図1の構成と同様の構成については同一の符号を付し、その説明を適宜省略する。
Claims (2)
- 低コヒーレンス光源からの光を、粒子を含む試料に照射する照射部と、
前記試料に照射される光の光路上に配置された参照面からの反射光と前記参照面を透過した前記試料からの散乱光を分光して、前記反射光と前記散乱光との干渉光のスペクトル強度を取得するスペクトル強度取得部と、
取得した前記スペクトル強度に基づいて前記試料の動的光散乱を測定する測定部とを含み、
前記照射部は、前記低コヒーレンス光源からの光を、前記試料の気液界面を介して前記試料に照射し、
前記参照面は、前記試料の気液界面である、動的光散乱測定装置。 - 低コヒーレンス光源からの光を、粒子を含む試料に照射する照射手順と、
前記試料に照射される光の光路上に配置された参照面からの反射光と前記参照面を透過した前記試料からの散乱光を分光して、前記反射光と前記散乱光との干渉光のスペクトル強度を取得するスペクトル強度取得手順と、
取得した前記スペクトル強度に基づいて前記試料の動的光散乱を測定する測定手順とを含み、
前記照射手順では、前記低コヒーレンス光源からの光を、前記試料の気液界面を介して前記試料に照射し、
前記参照面は、前記試料の気液界面である、動的光散乱測定方法。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
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JP2014127259A JP6348349B2 (ja) | 2014-06-20 | 2014-06-20 | 動的光散乱測定装置及び動的光散乱測定方法 |
TW104119408A TW201614217A (en) | 2014-06-20 | 2015-06-16 | Dynamic light scattering measurement device and dynamic light scattering measurement method |
KR1020150085841A KR20150146415A (ko) | 2014-06-20 | 2015-06-17 | 동적 광산란 측정 장치 및 동적 광산란 측정 방법 |
CN201510340652.4A CN105277490A (zh) | 2014-06-20 | 2015-06-18 | 动态光散射测定装置和动态光散射测定方法 |
US14/743,167 US20150369733A1 (en) | 2014-06-20 | 2015-06-18 | Dynamic light scattering measurement device and dynamic light scattering measurement method |
EP15172822.7A EP2960635A1 (en) | 2014-06-20 | 2015-06-19 | Dynamic light scattering measurement device and dynamic light scattering measurement method |
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JP2014127259A JP6348349B2 (ja) | 2014-06-20 | 2014-06-20 | 動的光散乱測定装置及び動的光散乱測定方法 |
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JP2016006397A JP2016006397A (ja) | 2016-01-14 |
JP6348349B2 true JP6348349B2 (ja) | 2018-06-27 |
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US (1) | US20150369733A1 (ja) |
EP (1) | EP2960635A1 (ja) |
JP (1) | JP6348349B2 (ja) |
KR (1) | KR20150146415A (ja) |
CN (1) | CN105277490A (ja) |
TW (1) | TW201614217A (ja) |
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US11137519B2 (en) * | 2016-07-21 | 2021-10-05 | Rosemount Aerospace Inc. | Multi-fiber optical sensor for icing |
CN106680159B (zh) * | 2017-01-13 | 2023-05-23 | 浙江大学 | 基于动态光散射样本系综分析的颗粒快速检测方法及系统 |
NL2020138B1 (en) * | 2017-12-20 | 2019-06-26 | Inprocess Ip B V | Method and apparatus for in-process particle size determination of colloidal suspensions under flow. |
CN108611267B (zh) * | 2018-04-02 | 2022-02-18 | 中山大学 | 一种实时动态光散射定量pcr仪 |
WO2020149139A1 (ja) * | 2019-01-16 | 2020-07-23 | 株式会社小糸製作所 | イメージング装置、その演算処理装置、車両用灯具、車両、センシング方法 |
US12016656B2 (en) * | 2020-10-09 | 2024-06-25 | QuantuMed Pty Ltd | Cellular ionic activity visualisation |
CN112504922B (zh) * | 2020-10-20 | 2022-09-02 | 华南师范大学 | 一种大气颗粒物粒径分布的在线测量系统及方法 |
JP7473200B2 (ja) | 2020-11-12 | 2024-04-23 | 国立研究開発法人物質・材料研究機構 | 動的光散乱測定装置、動的光散乱測定・解析方法、および、測定・解析プログラム |
KR20230125051A (ko) * | 2021-02-02 | 2023-08-28 | 후지필름 가부시키가이샤 | 광 계측 장치 |
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US6519032B1 (en) * | 1998-04-03 | 2003-02-11 | Symyx Technologies, Inc. | Fiber optic apparatus and use thereof in combinatorial material science |
WO2005099408A2 (en) * | 2004-04-10 | 2005-10-27 | Michael Trainer | Methods and apparatus for determining particle characterics by measuring scattered light |
US20140226158A1 (en) * | 2004-03-06 | 2014-08-14 | Michael Trainer | Methods and apparatus for determining particle characteristics |
JP2005249704A (ja) * | 2004-03-08 | 2005-09-15 | Fujinon Corp | 断層映像装置 |
JP4501000B2 (ja) * | 2004-10-01 | 2010-07-14 | 国立大学法人 新潟大学 | レーザ干渉変位測定方法およびレーザ干渉変位測定装置 |
US7633627B2 (en) * | 2005-01-20 | 2009-12-15 | Duke University | Methods, systems and computer program products for characterizing structures based on interferometric phase data |
US7671986B2 (en) * | 2007-07-30 | 2010-03-02 | Bwt Property, Inc | Spectroscopy apparatus based on hetero-junction phototransistors |
JP5276228B2 (ja) * | 2011-04-21 | 2013-08-28 | オリンパスメディカルシステムズ株式会社 | 光学測定システム、光学測定装置、校正用部材および校正方法 |
EP2742337B1 (en) * | 2011-08-19 | 2016-05-04 | Malvern Instruments Ltd | Dual-mode characterization of particulates |
US20140336990A1 (en) * | 2011-11-24 | 2014-11-13 | National University Corporation Tokyo University Of Agriculture And Technology | Measurement device and measurement method |
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- 2015-06-16 TW TW104119408A patent/TW201614217A/zh unknown
- 2015-06-17 KR KR1020150085841A patent/KR20150146415A/ko unknown
- 2015-06-18 US US14/743,167 patent/US20150369733A1/en not_active Abandoned
- 2015-06-18 CN CN201510340652.4A patent/CN105277490A/zh active Pending
- 2015-06-19 EP EP15172822.7A patent/EP2960635A1/en not_active Withdrawn
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JP2016006397A (ja) | 2016-01-14 |
US20150369733A1 (en) | 2015-12-24 |
CN105277490A (zh) | 2016-01-27 |
KR20150146415A (ko) | 2015-12-31 |
EP2960635A1 (en) | 2015-12-30 |
TW201614217A (en) | 2016-04-16 |
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