TW201614217A - Dynamic light scattering measurement device and dynamic light scattering measurement method - Google Patents
Dynamic light scattering measurement device and dynamic light scattering measurement methodInfo
- Publication number
- TW201614217A TW201614217A TW104119408A TW104119408A TW201614217A TW 201614217 A TW201614217 A TW 201614217A TW 104119408 A TW104119408 A TW 104119408A TW 104119408 A TW104119408 A TW 104119408A TW 201614217 A TW201614217 A TW 201614217A
- Authority
- TW
- Taiwan
- Prior art keywords
- light
- light scattering
- dynamic light
- scattering measurement
- sample
- Prior art date
Links
- 238000002296 dynamic light scattering Methods 0.000 title abstract 4
- 238000005259 measurement Methods 0.000 title abstract 3
- 238000000691 measurement method Methods 0.000 title 1
- 230000003595 spectral effect Effects 0.000 abstract 3
- 230000003287 optical effect Effects 0.000 abstract 1
- 239000002245 particle Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
- G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0218—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
- G01J3/4412—Scattering spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/0303—Optical path conditioning in cuvettes, e.g. windows; adapted optical elements or systems; path modifying or adjustment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J2009/0223—Common path interferometry; Point diffraction interferometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
- G01N2015/0222—Investigating a scatter or diffraction pattern from dynamic light scattering, e.g. photon correlation spectroscopy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N2021/0389—Windows
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4709—Backscatter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/062—LED's
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Dispersion Chemistry (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014127259A JP6348349B2 (ja) | 2014-06-20 | 2014-06-20 | 動的光散乱測定装置及び動的光散乱測定方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW201614217A true TW201614217A (en) | 2016-04-16 |
Family
ID=53442637
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW104119408A TW201614217A (en) | 2014-06-20 | 2015-06-16 | Dynamic light scattering measurement device and dynamic light scattering measurement method |
Country Status (6)
Country | Link |
---|---|
US (1) | US20150369733A1 (zh) |
EP (1) | EP2960635A1 (zh) |
JP (1) | JP6348349B2 (zh) |
KR (1) | KR20150146415A (zh) |
CN (1) | CN105277490A (zh) |
TW (1) | TW201614217A (zh) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11137519B2 (en) * | 2016-07-21 | 2021-10-05 | Rosemount Aerospace Inc. | Multi-fiber optical sensor for icing |
CN106680159B (zh) * | 2017-01-13 | 2023-05-23 | 浙江大学 | 基于动态光散射样本系综分析的颗粒快速检测方法及系统 |
NL2020138B1 (en) | 2017-12-20 | 2019-06-26 | Inprocess Ip B V | Method and apparatus for in-process particle size determination of colloidal suspensions under flow. |
CN108611267B (zh) * | 2018-04-02 | 2022-02-18 | 中山大学 | 一种实时动态光散射定量pcr仪 |
US12016656B2 (en) * | 2020-10-09 | 2024-06-25 | QuantuMed Pty Ltd | Cellular ionic activity visualisation |
CN112504922B (zh) * | 2020-10-20 | 2022-09-02 | 华南师范大学 | 一种大气颗粒物粒径分布的在线测量系统及方法 |
JP7473200B2 (ja) | 2020-11-12 | 2024-04-23 | 国立研究開発法人物質・材料研究機構 | 動的光散乱測定装置、動的光散乱測定・解析方法、および、測定・解析プログラム |
EP4290213A1 (en) * | 2021-02-02 | 2023-12-13 | FUJIFILM Corporation | Photometric device |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6519032B1 (en) * | 1998-04-03 | 2003-02-11 | Symyx Technologies, Inc. | Fiber optic apparatus and use thereof in combinatorial material science |
US20070206203A1 (en) * | 2004-04-10 | 2007-09-06 | Michael Trainer | Methods and Apparatus for Determining Particle Characteristics by Measuring Scattered Light |
US20140226158A1 (en) * | 2004-03-06 | 2014-08-14 | Michael Trainer | Methods and apparatus for determining particle characteristics |
JP2005249704A (ja) * | 2004-03-08 | 2005-09-15 | Fujinon Corp | 断層映像装置 |
JP4501000B2 (ja) * | 2004-10-01 | 2010-07-14 | 国立大学法人 新潟大学 | レーザ干渉変位測定方法およびレーザ干渉変位測定装置 |
EP1839012B1 (en) * | 2005-01-20 | 2014-05-07 | Duke University | Methods, systems and computer program products for characterizing structures based on interferometric phase data |
US7671986B2 (en) * | 2007-07-30 | 2010-03-02 | Bwt Property, Inc | Spectroscopy apparatus based on hetero-junction phototransistors |
JP5276228B2 (ja) * | 2011-04-21 | 2013-08-28 | オリンパスメディカルシステムズ株式会社 | 光学測定システム、光学測定装置、校正用部材および校正方法 |
WO2013027034A1 (en) * | 2011-08-19 | 2013-02-28 | Malvern Instruments Limited | Dual-mode characterization of particulates |
JP5946193B2 (ja) * | 2011-11-24 | 2016-07-05 | 国立大学法人東京農工大学 | 測定装置及び測定方法 |
-
2014
- 2014-06-20 JP JP2014127259A patent/JP6348349B2/ja active Active
-
2015
- 2015-06-16 TW TW104119408A patent/TW201614217A/zh unknown
- 2015-06-17 KR KR1020150085841A patent/KR20150146415A/ko unknown
- 2015-06-18 CN CN201510340652.4A patent/CN105277490A/zh active Pending
- 2015-06-18 US US14/743,167 patent/US20150369733A1/en not_active Abandoned
- 2015-06-19 EP EP15172822.7A patent/EP2960635A1/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
JP2016006397A (ja) | 2016-01-14 |
EP2960635A1 (en) | 2015-12-30 |
CN105277490A (zh) | 2016-01-27 |
KR20150146415A (ko) | 2015-12-31 |
JP6348349B2 (ja) | 2018-06-27 |
US20150369733A1 (en) | 2015-12-24 |
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