TW201614217A - Dynamic light scattering measurement device and dynamic light scattering measurement method - Google Patents

Dynamic light scattering measurement device and dynamic light scattering measurement method

Info

Publication number
TW201614217A
TW201614217A TW104119408A TW104119408A TW201614217A TW 201614217 A TW201614217 A TW 201614217A TW 104119408 A TW104119408 A TW 104119408A TW 104119408 A TW104119408 A TW 104119408A TW 201614217 A TW201614217 A TW 201614217A
Authority
TW
Taiwan
Prior art keywords
light
light scattering
dynamic light
scattering measurement
sample
Prior art date
Application number
TW104119408A
Other languages
English (en)
Inventor
Yusuke Izutani
Toshiaki Iwai
Original Assignee
Otsuka Denshi Kk
Univ Tokyo Nat Univ Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Otsuka Denshi Kk, Univ Tokyo Nat Univ Corp filed Critical Otsuka Denshi Kk
Publication of TW201614217A publication Critical patent/TW201614217A/zh

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/49Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/021Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0218Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J3/18Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/44Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G01J3/4412Scattering spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02Investigating particle size or size distribution
    • G01N15/0205Investigating particle size or size distribution by optical means
    • G01N15/0211Investigating a scatter or diffraction pattern
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03Cuvette constructions
    • G01N21/0303Optical path conditioning in cuvettes, e.g. windows; adapted optical elements or systems; path modifying or adjustment
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J2009/0223Common path interferometry; Point diffraction interferometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02Investigating particle size or size distribution
    • G01N15/0205Investigating particle size or size distribution by optical means
    • G01N15/0211Investigating a scatter or diffraction pattern
    • G01N2015/0222Investigating a scatter or diffraction pattern from dynamic light scattering, e.g. photon correlation spectroscopy
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03Cuvette constructions
    • G01N2021/0389Windows
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4704Angular selective
    • G01N2021/4709Backscatter
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/062LED's

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
TW104119408A 2014-06-20 2015-06-16 Dynamic light scattering measurement device and dynamic light scattering measurement method TW201614217A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014127259A JP6348349B2 (ja) 2014-06-20 2014-06-20 動的光散乱測定装置及び動的光散乱測定方法

Publications (1)

Publication Number Publication Date
TW201614217A true TW201614217A (en) 2016-04-16

Family

ID=53442637

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104119408A TW201614217A (en) 2014-06-20 2015-06-16 Dynamic light scattering measurement device and dynamic light scattering measurement method

Country Status (6)

Country Link
US (1) US20150369733A1 (zh)
EP (1) EP2960635A1 (zh)
JP (1) JP6348349B2 (zh)
KR (1) KR20150146415A (zh)
CN (1) CN105277490A (zh)
TW (1) TW201614217A (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11137519B2 (en) * 2016-07-21 2021-10-05 Rosemount Aerospace Inc. Multi-fiber optical sensor for icing
CN106680159B (zh) * 2017-01-13 2023-05-23 浙江大学 基于动态光散射样本系综分析的颗粒快速检测方法及系统
NL2020138B1 (en) 2017-12-20 2019-06-26 Inprocess Ip B V Method and apparatus for in-process particle size determination of colloidal suspensions under flow.
CN108611267B (zh) * 2018-04-02 2022-02-18 中山大学 一种实时动态光散射定量pcr仪
US12016656B2 (en) * 2020-10-09 2024-06-25 QuantuMed Pty Ltd Cellular ionic activity visualisation
CN112504922B (zh) * 2020-10-20 2022-09-02 华南师范大学 一种大气颗粒物粒径分布的在线测量系统及方法
JP7473200B2 (ja) 2020-11-12 2024-04-23 国立研究開発法人物質・材料研究機構 動的光散乱測定装置、動的光散乱測定・解析方法、および、測定・解析プログラム
EP4290213A1 (en) * 2021-02-02 2023-12-13 FUJIFILM Corporation Photometric device

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6519032B1 (en) * 1998-04-03 2003-02-11 Symyx Technologies, Inc. Fiber optic apparatus and use thereof in combinatorial material science
US20070206203A1 (en) * 2004-04-10 2007-09-06 Michael Trainer Methods and Apparatus for Determining Particle Characteristics by Measuring Scattered Light
US20140226158A1 (en) * 2004-03-06 2014-08-14 Michael Trainer Methods and apparatus for determining particle characteristics
JP2005249704A (ja) * 2004-03-08 2005-09-15 Fujinon Corp 断層映像装置
JP4501000B2 (ja) * 2004-10-01 2010-07-14 国立大学法人 新潟大学 レーザ干渉変位測定方法およびレーザ干渉変位測定装置
EP1839012B1 (en) * 2005-01-20 2014-05-07 Duke University Methods, systems and computer program products for characterizing structures based on interferometric phase data
US7671986B2 (en) * 2007-07-30 2010-03-02 Bwt Property, Inc Spectroscopy apparatus based on hetero-junction phototransistors
JP5276228B2 (ja) * 2011-04-21 2013-08-28 オリンパスメディカルシステムズ株式会社 光学測定システム、光学測定装置、校正用部材および校正方法
WO2013027034A1 (en) * 2011-08-19 2013-02-28 Malvern Instruments Limited Dual-mode characterization of particulates
JP5946193B2 (ja) * 2011-11-24 2016-07-05 国立大学法人東京農工大学 測定装置及び測定方法

Also Published As

Publication number Publication date
JP2016006397A (ja) 2016-01-14
EP2960635A1 (en) 2015-12-30
CN105277490A (zh) 2016-01-27
KR20150146415A (ko) 2015-12-31
JP6348349B2 (ja) 2018-06-27
US20150369733A1 (en) 2015-12-24

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