JP6150167B2 - 微粒子分散性評価装置及び微粒子分散性評価方法 - Google Patents

微粒子分散性評価装置及び微粒子分散性評価方法 Download PDF

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JP6150167B2
JP6150167B2 JP2013170231A JP2013170231A JP6150167B2 JP 6150167 B2 JP6150167 B2 JP 6150167B2 JP 2013170231 A JP2013170231 A JP 2013170231A JP 2013170231 A JP2013170231 A JP 2013170231A JP 6150167 B2 JP6150167 B2 JP 6150167B2
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fine particle
light
sample
evaluation apparatus
dispersibility evaluation
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JP2015040705A5 (enExample
JP2015040705A (ja
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光弘 友田
光弘 友田
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Ricoh Co Ltd
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Ricoh Co Ltd
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JP2013170231A 2013-08-20 2013-08-20 微粒子分散性評価装置及び微粒子分散性評価方法 Expired - Fee Related JP6150167B2 (ja)

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Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6915230B2 (ja) * 2015-06-16 2021-08-04 株式会社リコー 活性エネルギー線硬化型組成物、活性エネルギー線硬化型インク、組成物収容容器、２次元又は３次元の像の形成方法及び形成装置、成形加工品、並びに分散性評価装置。
WO2018070324A1 (ja) * 2016-10-13 2018-04-19 国立研究開発法人産業技術総合研究所 ナノ粒子評価方法およびナノ粒子観察装置
KR101934926B1 (ko) * 2017-01-10 2019-01-03 충남대학교산학협력단 유동 유체 내의 나노입자 거동 예측 방법 및 장치
TWI773721B (zh) * 2017-01-20 2022-08-11 日商東京威力科創股份有限公司 異物檢測裝置、異物檢測方法及記憶媒體
JP6900702B2 (ja) * 2017-02-24 2021-07-07 株式会社リコー 計測装置および計測方法
JP7303066B2 (ja) * 2019-08-26 2023-07-04 株式会社東芝 物性測定装置
JP2021143983A (ja) * 2020-03-13 2021-09-24 横河電機株式会社 状態量測定装置、状態量測定方法及びコンピュータプログラム
CN112730167A (zh) * 2021-01-04 2021-04-30 北京化工大学 一种纳米粒子在复合材料中分布状态的可视化表征方法
CN115308164B (zh) * 2022-10-11 2022-12-13 成都赛林斯科技实业有限公司 在线实时连续测量熔融态玻璃折射率及色散的装置及方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0772066A (ja) * 1993-03-17 1995-03-17 Shinichi Ito 高純度物質中微粒子散乱光検出装置及び分散式ファブリ・ペロー型分光装置並びに平行平面鏡の製造方法及び波長安定化装置
US8101424B2 (en) * 2005-06-15 2012-01-24 University Of Maryland, Baltimore County Bioassays using plasmonic scattering from noble metal nanostructures
CN101100520A (zh) * 2006-07-04 2008-01-09 谢基生 可透红外光的黑色塑料制品的制作方法和应用
JP4852439B2 (ja) * 2006-07-06 2012-01-11 株式会社リコー ラマン分光測定装置、及びこれを用いたラマン分光測定法
JP2010117226A (ja) * 2008-11-12 2010-05-27 Ricoh Co Ltd ラマン分光測定装置および測定法
JP2012173112A (ja) * 2011-02-21 2012-09-10 Ricoh Co Ltd ラマン分光測定装置及びラマン分光測定方法

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