JP2014130884A5 - - Google Patents

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Publication number
JP2014130884A5
JP2014130884A5 JP2012287122A JP2012287122A JP2014130884A5 JP 2014130884 A5 JP2014130884 A5 JP 2014130884A5 JP 2012287122 A JP2012287122 A JP 2012287122A JP 2012287122 A JP2012287122 A JP 2012287122A JP 2014130884 A5 JP2014130884 A5 JP 2014130884A5
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JP
Japan
Prior art keywords
substrate
cleaning
fluid nozzle
fluid
fluid jet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2012287122A
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English (en)
Japanese (ja)
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JP2014130884A (ja
JP6093569B2 (ja
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Publication date
Application filed filed Critical
Priority to JP2012287122A priority Critical patent/JP6093569B2/ja
Priority claimed from JP2012287122A external-priority patent/JP6093569B2/ja
Priority to KR1020130157711A priority patent/KR102103356B1/ko
Priority to US14/139,685 priority patent/US10737301B2/en
Priority to TW102147711A priority patent/TWI586488B/zh
Publication of JP2014130884A publication Critical patent/JP2014130884A/ja
Publication of JP2014130884A5 publication Critical patent/JP2014130884A5/ja
Application granted granted Critical
Publication of JP6093569B2 publication Critical patent/JP6093569B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2012287122A 2012-12-28 2012-12-28 基板洗浄装置 Active JP6093569B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2012287122A JP6093569B2 (ja) 2012-12-28 2012-12-28 基板洗浄装置
KR1020130157711A KR102103356B1 (ko) 2012-12-28 2013-12-18 기판 세정 장치
US14/139,685 US10737301B2 (en) 2012-12-28 2013-12-23 Substrate cleaning apparatus
TW102147711A TWI586488B (zh) 2012-12-28 2013-12-23 基板洗淨裝置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012287122A JP6093569B2 (ja) 2012-12-28 2012-12-28 基板洗浄装置

Publications (3)

Publication Number Publication Date
JP2014130884A JP2014130884A (ja) 2014-07-10
JP2014130884A5 true JP2014130884A5 (enExample) 2015-08-27
JP6093569B2 JP6093569B2 (ja) 2017-03-08

Family

ID=51015751

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012287122A Active JP6093569B2 (ja) 2012-12-28 2012-12-28 基板洗浄装置

Country Status (4)

Country Link
US (1) US10737301B2 (enExample)
JP (1) JP6093569B2 (enExample)
KR (1) KR102103356B1 (enExample)
TW (1) TWI586488B (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6600470B2 (ja) 2014-04-01 2019-10-30 株式会社荏原製作所 洗浄装置及び洗浄方法
CN111589752B (zh) * 2014-04-01 2023-02-03 株式会社荏原制作所 清洗装置
KR20160065226A (ko) * 2014-11-07 2016-06-09 세메스 주식회사 기판 처리 장치 및 기판 처리 방법
JP6797526B2 (ja) * 2014-11-11 2020-12-09 株式会社荏原製作所 基板洗浄装置
JP6545511B2 (ja) * 2015-04-10 2019-07-17 株式会社東芝 処理装置
KR101704494B1 (ko) * 2015-05-26 2017-02-09 주식회사 케이씨텍 고속 유체 분사 노즐 및 이를 이용한 기판 처리 장치
WO2017098823A1 (ja) 2015-12-07 2017-06-15 東京エレクトロン株式会社 基板洗浄装置
US20170178918A1 (en) * 2015-12-18 2017-06-22 Globalfoundries Inc. Post-polish wafer cleaning
US11355366B2 (en) 2018-08-30 2022-06-07 Taiwan Semiconductor Manufacturing Co., Ltd. Systems and methods for shuttered wafer cleaning
US11791173B2 (en) * 2019-03-21 2023-10-17 Samsung Electronics Co., Ltd. Substrate cleaning equipment, substrate treatment system including the same, and method of fabricating semiconductor device using the substrate cleaning equipment
TWI765192B (zh) * 2019-11-19 2022-05-21 大量科技股份有限公司 化學機械研磨裝置之研磨墊檢測方法與研磨墊檢測裝置
JP7407574B2 (ja) * 2019-11-29 2024-01-04 東京エレクトロン株式会社 基板処理装置、及び基板処理方法
CN112122197A (zh) * 2020-09-11 2020-12-25 鹤壁市人民医院 一种医疗用重症监护护理消毒装置
JP7584965B2 (ja) * 2020-09-24 2024-11-18 芝浦メカトロニクス株式会社 洗浄装置
US12198944B2 (en) 2020-11-11 2025-01-14 Applied Materials, Inc. Substrate handling in a modular polishing system with single substrate cleaning chambers

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS549178B2 (enExample) 1973-05-19 1979-04-21
US5372652A (en) * 1993-06-14 1994-12-13 International Business Machines Corporation Aerosol cleaning method
JP3504023B2 (ja) * 1995-05-26 2004-03-08 株式会社ルネサステクノロジ 洗浄装置および洗浄方法
JP3286539B2 (ja) 1996-10-30 2002-05-27 信越半導体株式会社 洗浄装置および洗浄方法
JPH10308374A (ja) 1997-03-06 1998-11-17 Ebara Corp 洗浄方法及び洗浄装置
US6491764B2 (en) * 1997-09-24 2002-12-10 Interuniversitair Microelektronics Centrum (Imec) Method and apparatus for removing a liquid from a surface of a rotating substrate
US7527698B2 (en) * 1998-09-23 2009-05-05 Interuniversitair Microelektronica Centrum (Imec, Vzw) Method and apparatus for removing a liquid from a surface of a substrate
WO2001003165A1 (en) * 1999-07-01 2001-01-11 Lam Research Corporation Spin, rinse, and dry station with adjustable nozzle assembly for semiconductor wafer backside rinsing
KR100726015B1 (ko) * 1999-10-06 2007-06-08 가부시키가이샤 에바라 세이사꾸쇼 기판세정방법 및 그 장치
US6951221B2 (en) * 2000-09-22 2005-10-04 Dainippon Screen Mfg. Co., Ltd. Substrate processing apparatus
JP3865602B2 (ja) * 2001-06-18 2007-01-10 大日本スクリーン製造株式会社 基板洗浄装置
TW561516B (en) * 2001-11-01 2003-11-11 Tokyo Electron Ltd Substrate processing apparatus and substrate processing method
KR100871343B1 (ko) * 2002-03-29 2008-12-01 주식회사 케이씨텍 2유체 혼합물에 의한 기판 세정용 노즐
WO2003105201A1 (ja) * 2002-06-07 2003-12-18 東京エレクトロン株式会社 基板処理装置、基板処理方法及び現像装置
JP2004079767A (ja) * 2002-08-19 2004-03-11 Dainippon Screen Mfg Co Ltd 基板洗浄装置および基板洗浄方法
US6770424B2 (en) * 2002-12-16 2004-08-03 Asml Holding N.V. Wafer track apparatus and methods for dispensing fluids with rotatable dispense arms
JP4318913B2 (ja) * 2002-12-26 2009-08-26 東京エレクトロン株式会社 塗布処理装置
JP2004335671A (ja) * 2003-05-07 2004-11-25 Renesas Technology Corp 枚葉式2流体洗浄装置及び半導体装置の洗浄方法
JP2005353739A (ja) * 2004-06-09 2005-12-22 Dainippon Screen Mfg Co Ltd 基板洗浄装置
JP2007038209A (ja) * 2005-06-27 2007-02-15 Shimada Phys & Chem Ind Co Ltd 基板洗浄装置および基板洗浄方法
JP4734063B2 (ja) * 2005-08-30 2011-07-27 東京エレクトロン株式会社 基板洗浄装置及び基板洗浄方法。
KR100758220B1 (ko) * 2005-10-20 2007-09-17 주식회사 케이씨텍 다중 슬릿형 노즐을 가지는 기판 세정 장치 및 이를 이용한세정 방법
JP4547016B2 (ja) 2008-04-04 2010-09-22 東京エレクトロン株式会社 半導体製造装置、半導体製造方法
KR101041872B1 (ko) * 2008-11-26 2011-06-16 세메스 주식회사 노즐 및 이를 이용한 기판 처리 장치 및 방법
JP5294944B2 (ja) 2009-03-31 2013-09-18 株式会社荏原製作所 基板の洗浄方法
US20110289795A1 (en) * 2010-02-16 2011-12-01 Tomoatsu Ishibashi Substrate drying apparatus, substrate drying method and control program
JP2012174933A (ja) * 2011-02-22 2012-09-10 Toppan Printing Co Ltd 基板処理装置及び基板処理方法
JP5789400B2 (ja) * 2011-04-12 2015-10-07 東京エレクトロン株式会社 液処理方法及び液処理装置
TWI613037B (zh) * 2011-07-19 2018-02-01 荏原製作所股份有限公司 硏磨方法
JP2013089797A (ja) 2011-10-19 2013-05-13 Ebara Corp 基板洗浄方法及び基板洗浄装置
JP5528486B2 (ja) * 2012-02-07 2014-06-25 東京エレクトロン株式会社 基板処理装置、これを備える塗布現像装置、及び基板処理方法
JP5779168B2 (ja) * 2012-12-04 2015-09-16 東京エレクトロン株式会社 周縁部塗布装置、周縁部塗布方法及び周縁部塗布用記録媒体

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