JP2013526001A5 - - Google Patents

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Publication number
JP2013526001A5
JP2013526001A5 JP2012544923A JP2012544923A JP2013526001A5 JP 2013526001 A5 JP2013526001 A5 JP 2013526001A5 JP 2012544923 A JP2012544923 A JP 2012544923A JP 2012544923 A JP2012544923 A JP 2012544923A JP 2013526001 A5 JP2013526001 A5 JP 2013526001A5
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JP
Japan
Prior art keywords
semiconductor die
die
arc
vias
substrate
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Application number
JP2012544923A
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English (en)
Japanese (ja)
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JP5536901B2 (ja
JP2013526001A (ja
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Publication date
Priority claimed from US12/640,111 external-priority patent/US8710629B2/en
Application filed filed Critical
Publication of JP2013526001A publication Critical patent/JP2013526001A/ja
Publication of JP2013526001A5 publication Critical patent/JP2013526001A5/ja
Application granted granted Critical
Publication of JP5536901B2 publication Critical patent/JP5536901B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2012544923A 2009-12-17 2010-12-17 半導体ダイの反りを制御する装置及び方法 Expired - Fee Related JP5536901B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/640,111 2009-12-17
US12/640,111 US8710629B2 (en) 2009-12-17 2009-12-17 Apparatus and method for controlling semiconductor die warpage
PCT/US2010/061143 WO2011084706A2 (en) 2009-12-17 2010-12-17 Apparatus and method for controlling semiconductor die warpage

Publications (3)

Publication Number Publication Date
JP2013526001A JP2013526001A (ja) 2013-06-20
JP2013526001A5 true JP2013526001A5 (enExample) 2014-04-10
JP5536901B2 JP5536901B2 (ja) 2014-07-02

Family

ID=43629207

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012544923A Expired - Fee Related JP5536901B2 (ja) 2009-12-17 2010-12-17 半導体ダイの反りを制御する装置及び方法

Country Status (7)

Country Link
US (1) US8710629B2 (enExample)
EP (1) EP2513967A2 (enExample)
JP (1) JP5536901B2 (enExample)
KR (1) KR20120101136A (enExample)
CN (1) CN103038877A (enExample)
TW (1) TW201131717A (enExample)
WO (1) WO2011084706A2 (enExample)

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US8883634B2 (en) * 2011-06-29 2014-11-11 Globalfoundries Singapore Pte. Ltd. Package interconnects
US9184144B2 (en) * 2011-07-21 2015-11-10 Qualcomm Incorporated Interconnect pillars with directed compliance geometry
US9059191B2 (en) * 2011-10-19 2015-06-16 International Business Machines Corporation Chamfered corner crackstop for an integrated circuit chip
US8566773B2 (en) 2012-02-15 2013-10-22 International Business Machines Corporation Thermal relief automation
US8464200B1 (en) 2012-02-15 2013-06-11 International Business Machines Corporation Thermal relief optimization
CN103378030B (zh) * 2012-04-18 2016-04-20 中芯国际集成电路制造(上海)有限公司 硅通孔结构
CN103377990B (zh) * 2012-04-18 2016-08-31 中芯国际集成电路制造(上海)有限公司 硅通孔结构
US9291578B2 (en) * 2012-08-03 2016-03-22 David L. Adler X-ray photoemission microscope for integrated devices
US9245826B2 (en) * 2013-03-11 2016-01-26 Newport Fab, Llc Anchor vias for improved backside metal adhesion to semiconductor substrate
US9247636B2 (en) 2013-03-12 2016-01-26 International Business Machines Corporation Area array device connection structures with complimentary warp characteristics
US9355967B2 (en) * 2013-06-24 2016-05-31 Qualcomm Incorporated Stress compensation patterning
US9236301B2 (en) 2013-07-11 2016-01-12 Globalfoundries Inc. Customized alleviation of stresses generated by through-substrate via(S)
KR102122456B1 (ko) 2013-12-20 2020-06-12 삼성전자주식회사 실리콘 관통 비아 플러그들을 갖는 반도체 소자 및 이를 포함하는 반도체 패키지
US10006899B2 (en) 2014-03-25 2018-06-26 Genia Technologies, Inc. Nanopore-based sequencing chips using stacked wafer technology
US9728518B2 (en) 2014-04-01 2017-08-08 Ati Technologies Ulc Interconnect etch with polymer layer edge protection
US9560745B2 (en) * 2014-09-26 2017-01-31 Qualcomm Incorporated Devices and methods to reduce stress in an electronic device
US9772268B2 (en) * 2015-03-30 2017-09-26 International Business Machines Corporation Predicting semiconductor package warpage
US9721906B2 (en) * 2015-08-31 2017-08-01 Intel Corporation Electronic package with corner supports
US20170287873A1 (en) * 2016-03-29 2017-10-05 Santosh Sankarasubramanian Electronic assembly components with corner adhesive for warpage reduction during thermal processing
CN106531714A (zh) * 2017-01-24 2017-03-22 日月光封装测试(上海)有限公司 用于半导体封装的引线框架条及其制造方法
US12424531B2 (en) 2017-03-14 2025-09-23 Mediatek Inc. Semiconductor package structure
US11362044B2 (en) 2017-03-14 2022-06-14 Mediatek Inc. Semiconductor package structure
US10784211B2 (en) 2017-03-14 2020-09-22 Mediatek Inc. Semiconductor package structure
US11387176B2 (en) 2017-03-14 2022-07-12 Mediatek Inc. Semiconductor package structure
US11171113B2 (en) 2017-03-14 2021-11-09 Mediatek Inc. Semiconductor package structure having an annular frame with truncated corners
US11264337B2 (en) 2017-03-14 2022-03-01 Mediatek Inc. Semiconductor package structure
US10396003B2 (en) * 2017-10-18 2019-08-27 Micron Technology, Inc. Stress tuned stiffeners for micro electronics package warpage control
US10861797B2 (en) 2018-07-16 2020-12-08 Micron Technology, Inc. Electrically or temperature activated shape-memory materials for warpage control
US11879170B2 (en) 2019-08-14 2024-01-23 Massachusetts Institute Of Technology Stress patterning systems and methods for manufacturing free-form deformations in thin substrates
US11308257B1 (en) 2020-12-15 2022-04-19 International Business Machines Corporation Stacked via rivets in chip hotspots

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JP2704001B2 (ja) * 1989-07-18 1998-01-26 キヤノン株式会社 位置検出装置
JP3920399B2 (ja) * 1997-04-25 2007-05-30 株式会社東芝 マルチチップ半導体装置用チップの位置合わせ方法、およびマルチチップ半導体装置の製造方法・製造装置
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JP4768994B2 (ja) * 2005-02-07 2011-09-07 ルネサスエレクトロニクス株式会社 配線基板および半導体装置
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