JP2013515249A - 物体の2次元または3次元の位置調整のための高解像度顕微鏡および方法 - Google Patents
物体の2次元または3次元の位置調整のための高解像度顕微鏡および方法 Download PDFInfo
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- JP2013515249A JP2013515249A JP2012545135A JP2012545135A JP2013515249A JP 2013515249 A JP2013515249 A JP 2013515249A JP 2012545135 A JP2012545135 A JP 2012545135A JP 2012545135 A JP2012545135 A JP 2012545135A JP 2013515249 A JP2013515249 A JP 2013515249A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N21/6458—Fluorescence microscopy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
- G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
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- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Optics & Photonics (AREA)
- Immunology (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Life Sciences & Earth Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Microscoopes, Condenser (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102009060793.5 | 2009-12-22 | ||
| DE102009060793A DE102009060793A1 (de) | 2009-12-22 | 2009-12-22 | Hochauflösendes Mikroskop und Verfahren zur zwei- oder dreidimensionalen Positionsbestimmung von Objekten |
| PCT/EP2010/007595 WO2011085766A1 (de) | 2009-12-22 | 2010-12-14 | Hochauflösendes mikroskop und verfahren zur zwei- oder dreidimensionalen positionsbestimmung von objekten |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015121233A Division JP6018263B2 (ja) | 2009-12-22 | 2015-06-16 | 物体の2次元または3次元の位置調整のための高解像度顕微鏡および方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013515249A true JP2013515249A (ja) | 2013-05-02 |
| JP2013515249A5 JP2013515249A5 (enExample) | 2013-08-08 |
Family
ID=43567611
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012545135A Pending JP2013515249A (ja) | 2009-12-22 | 2010-12-14 | 物体の2次元または3次元の位置調整のための高解像度顕微鏡および方法 |
| JP2015121233A Active JP6018263B2 (ja) | 2009-12-22 | 2015-06-16 | 物体の2次元または3次元の位置調整のための高解像度顕微鏡および方法 |
| JP2016191256A Active JP6282706B2 (ja) | 2009-12-22 | 2016-09-29 | 物体の2次元または3次元の位置調整のための高解像度顕微鏡および方法 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015121233A Active JP6018263B2 (ja) | 2009-12-22 | 2015-06-16 | 物体の2次元または3次元の位置調整のための高解像度顕微鏡および方法 |
| JP2016191256A Active JP6282706B2 (ja) | 2009-12-22 | 2016-09-29 | 物体の2次元または3次元の位置調整のための高解像度顕微鏡および方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9234846B2 (enExample) |
| EP (1) | EP2516993B1 (enExample) |
| JP (3) | JP2013515249A (enExample) |
| DE (1) | DE102009060793A1 (enExample) |
| WO (1) | WO2011085766A1 (enExample) |
Cited By (13)
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|---|---|---|---|---|
| JP2013057938A (ja) * | 2011-09-02 | 2013-03-28 | Leica Microsystems Cms Gmbh | 点状対象物の3次元位置決め用の顕微鏡装置および顕微鏡法 |
| JP2014224813A (ja) * | 2013-05-14 | 2014-12-04 | カール ツァイス マイクロスコピー ゲーエムベーハーCarl Zeiss Microscopy Gmbh | 3d高解像度局在顕微鏡法のための方法 |
| JP2014224814A (ja) * | 2013-05-14 | 2014-12-04 | カール ツァイス マイクロスコピー ゲーエムベーハーCarl Zeiss Microscopy Gmbh | 3d高解像度局在顕微鏡法のための方法 |
| JP2015505620A (ja) * | 2012-01-24 | 2015-02-23 | カール ツァイス マイクロスコピー ゲーエムベーハーCarl Zeiss Microscopy Gmbh | 高分解能3d蛍光顕微鏡法のための顕微鏡および方法 |
| JP2015531072A (ja) * | 2012-08-23 | 2015-10-29 | アイシス イノヴェイション リミテッド | 誘導放出抑制顕微鏡検査 |
| JP2016515718A (ja) * | 2013-03-22 | 2016-05-30 | ライカ ミクロジュステムス ツェーエムエス ゲーエムベーハー | 点状物体の局在化のための光学顕微鏡法 |
| JP2016534395A (ja) * | 2013-08-14 | 2016-11-04 | カール ツァイス マイクロスコピー ゲーエムベーハーCarl Zeiss Microscopy Gmbh | 高解像度の3d蛍光顕微鏡検査 |
| KR20170010590A (ko) * | 2015-07-20 | 2017-02-01 | 주식회사 토모큐브 | 파면 제어기를 활용한 초고속 고정밀 3차원 굴절률 측정 방법 및 장치 |
| JP2017506370A (ja) * | 2014-02-12 | 2017-03-02 | カール ツァイス マイクロスコピー ゲーエムベーハーCarl Zeiss Microscopy Gmbh | 複数焦点走査蛍光顕微鏡 |
| WO2017104662A1 (ja) * | 2015-12-18 | 2017-06-22 | 株式会社堀場製作所 | 粒子分析装置及び粒子分析方法 |
| WO2018128146A1 (ja) * | 2017-01-05 | 2018-07-12 | 東レエンジニアリング株式会社 | 分光測定方法および分光測定装置 |
| JPWO2017090211A1 (ja) * | 2015-11-27 | 2018-09-06 | 株式会社ニコン | 顕微鏡装置 |
| JP2019086529A (ja) * | 2017-11-01 | 2019-06-06 | 株式会社ニコン | 顕微鏡、照明装置、及び観察方法 |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0742971B2 (ja) | 1990-06-06 | 1995-05-15 | 株式会社青山製作所 | ブランクおよびこのブランクを用いたボルトの製造法 |
| DE102010041794A1 (de) | 2010-09-30 | 2012-04-05 | Carl Zeiss Microlmaging Gmbh | Mikroskopsystem, Mikroskopieverfahren und Computerprogrammprodukt |
| DE102011055294B4 (de) | 2011-11-11 | 2013-11-07 | Leica Microsystems Cms Gmbh | Mikroskopische Einrichtung und Verfahren zur dreidimensionalen Lokalisierung von punktförmigen Objekten in einer Probe |
| EP2898312B1 (en) * | 2012-09-24 | 2021-03-24 | Global Life Sciences Solutions USA LLC | Methods for resolving positions in fluorescence stochastic microscopy using three-dimensional structured illumination. |
| WO2014179269A2 (en) * | 2013-04-30 | 2014-11-06 | Molecular Devices, Llc | Apparatus and method for generating in-focus images using parallel imaging in a microscopy system |
| DE102013208415B4 (de) * | 2013-05-07 | 2023-12-28 | Carl Zeiss Microscopy Gmbh | Mikroskop und Verfahren für die 3D-hochauflösende Lokalisierungsmikroskopie |
| DE102013009042A1 (de) * | 2013-05-28 | 2014-12-04 | Carl Zeiss Microscopy Gmbh | Lumineszenzmikroskopie |
| WO2015089506A2 (en) | 2013-12-15 | 2015-06-18 | President And Fellows Of Harvard College | Methods and compositions relating to optical super-resolution patterning |
| WO2015164844A1 (en) * | 2014-04-24 | 2015-10-29 | Vutara, Inc. | Super resolution microscopy |
| JP6300658B2 (ja) * | 2014-06-19 | 2018-03-28 | オリンパス株式会社 | 標本観察装置 |
| US20160033411A1 (en) * | 2014-07-29 | 2016-02-04 | President And Fellows Of Harvard College | Methods and compositions relating to storm-based patterning |
| US10006917B2 (en) | 2014-12-15 | 2018-06-26 | President And Fellows Of Harvard College | Methods and compositions relating to super-resolution imaging and modification |
| LU92620B1 (de) * | 2014-12-19 | 2016-06-20 | Leica Microsystems | Rastermikroskop |
| DE102015016353A1 (de) | 2015-12-16 | 2017-06-22 | Horst Wochnowski | PALM-Verfahren mit mehreren sich nur marginal voneinander unterscheidenden Fluorophoren |
| CN106546513B (zh) * | 2016-11-02 | 2019-04-23 | 中国人民解放军理工大学 | 一种基于正交双视场的三维降水粒子测量与重构装置及方法 |
| CN107167929B (zh) * | 2017-06-12 | 2019-06-25 | 华南师范大学 | 基于dmd的双模式光学超分辨显微成像装置及方法 |
| JP2019066706A (ja) | 2017-10-02 | 2019-04-25 | ソニー株式会社 | 蛍光顕微鏡装置及び蛍光顕微鏡システム |
| WO2019135069A1 (en) * | 2018-01-02 | 2019-07-11 | King's College London | Method and system for localisation microscopy |
| JP7380569B2 (ja) * | 2018-08-09 | 2023-11-15 | ソニーグループ株式会社 | 光学顕微鏡装置及び光学顕微鏡システム |
| CN109407295B (zh) * | 2018-12-18 | 2020-07-24 | 中国科学院深圳先进技术研究院 | 一种基于dmd可多色激发的结构光显微系统及多色激发方法 |
| EP3987481B1 (en) * | 2019-06-18 | 2025-09-17 | SurgVision GmbH | Luminescence imaging with refining loop based on combination of partial illuminations |
| DE102019129932B4 (de) * | 2019-11-06 | 2023-12-21 | Technische Universität Braunschweig | Optische Detektionseinrichtung und Verfahren zum Betreiben einer optischen Detektionseinrichtung |
| CN110989186B (zh) * | 2019-12-18 | 2022-03-08 | 苏州显纳精密仪器有限公司 | 一种能在不同环境介质中实现大视场下超分辨成像的上浸没微球透镜组 |
| CN111650739B (zh) * | 2020-05-21 | 2022-06-03 | 中国科学院苏州生物医学工程技术研究所 | 基于dmd的单帧曝光快速三维荧光成像系统及方法 |
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Citations (10)
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| JP2002533686A (ja) * | 1998-12-21 | 2002-10-08 | エボテック バイオシステムズ アーゲー | 軸方向高解像度を有する走査型顕微鏡方法 |
| JP2003057554A (ja) * | 2001-08-09 | 2003-02-26 | Olympus Optical Co Ltd | レーザ顕微鏡 |
| JP2005031589A (ja) * | 2003-07-11 | 2005-02-03 | Olympus Corp | 顕微鏡の撮像光学系 |
| JP2005233802A (ja) * | 2004-02-20 | 2005-09-02 | Yokogawa Electric Corp | 物理量計測装置およびその装置を用いて行う物理量校正方法 |
| JP2008542826A (ja) * | 2005-05-23 | 2008-11-27 | エフ. ヘスス ハラルド | 光変換可能な光学標識を用いる光学顕微鏡法 |
| JP2008544235A (ja) * | 2005-06-16 | 2008-12-04 | マックス−プランク−ゲゼルシャフト・ツーア・フェルデルング・デア・ヴィセンシャフテン・エー.ファウ. | 試料を光学測定する方法及び装置 |
| WO2009085218A1 (en) * | 2007-12-21 | 2009-07-09 | President And Fellows Of Harvard College | Sub-diffraction limit image resolution in three dimensions |
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-
2009
- 2009-12-22 DE DE102009060793A patent/DE102009060793A1/de active Pending
-
2010
- 2010-12-14 US US13/518,064 patent/US9234846B2/en active Active
- 2010-12-14 WO PCT/EP2010/007595 patent/WO2011085766A1/de not_active Ceased
- 2010-12-14 EP EP10795617.9A patent/EP2516993B1/de active Active
- 2010-12-14 JP JP2012545135A patent/JP2013515249A/ja active Pending
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2015
- 2015-06-16 JP JP2015121233A patent/JP6018263B2/ja active Active
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2016
- 2016-09-29 JP JP2016191256A patent/JP6282706B2/ja active Active
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002533686A (ja) * | 1998-12-21 | 2002-10-08 | エボテック バイオシステムズ アーゲー | 軸方向高解像度を有する走査型顕微鏡方法 |
| JP2003057554A (ja) * | 2001-08-09 | 2003-02-26 | Olympus Optical Co Ltd | レーザ顕微鏡 |
| JP2005031589A (ja) * | 2003-07-11 | 2005-02-03 | Olympus Corp | 顕微鏡の撮像光学系 |
| JP2005233802A (ja) * | 2004-02-20 | 2005-09-02 | Yokogawa Electric Corp | 物理量計測装置およびその装置を用いて行う物理量校正方法 |
| JP2008542826A (ja) * | 2005-05-23 | 2008-11-27 | エフ. ヘスス ハラルド | 光変換可能な光学標識を用いる光学顕微鏡法 |
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Also Published As
| Publication number | Publication date |
|---|---|
| EP2516993B1 (de) | 2025-02-19 |
| WO2011085766A1 (de) | 2011-07-21 |
| JP6282706B2 (ja) | 2018-02-21 |
| US20130010098A1 (en) | 2013-01-10 |
| JP6018263B2 (ja) | 2016-11-02 |
| DE102009060793A1 (de) | 2011-07-28 |
| EP2516993A1 (de) | 2012-10-31 |
| JP2017004024A (ja) | 2017-01-05 |
| JP2015187745A (ja) | 2015-10-29 |
| US9234846B2 (en) | 2016-01-12 |
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