JP2013500395A5 - - Google Patents

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Publication number
JP2013500395A5
JP2013500395A5 JP2012522097A JP2012522097A JP2013500395A5 JP 2013500395 A5 JP2013500395 A5 JP 2013500395A5 JP 2012522097 A JP2012522097 A JP 2012522097A JP 2012522097 A JP2012522097 A JP 2012522097A JP 2013500395 A5 JP2013500395 A5 JP 2013500395A5
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JP
Japan
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composition according
support
choh
composition
additive
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JP2012522097A
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English (en)
Japanese (ja)
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JP2013500395A (ja
JP5775077B2 (ja
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Priority claimed from PCT/EP2010/060375 external-priority patent/WO2011012475A1/en
Publication of JP2013500395A publication Critical patent/JP2013500395A/ja
Publication of JP2013500395A5 publication Critical patent/JP2013500395A5/ja
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JP2012522097A 2009-07-30 2010-07-19 無ボイドでのサブミクロン構造物充填用の、抑制剤を含有する金属メッキ組成物 Active JP5775077B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US22980909P 2009-07-30 2009-07-30
US61/229,809 2009-07-30
PCT/EP2010/060375 WO2011012475A1 (en) 2009-07-30 2010-07-19 Composition for metal plating comprising suppressing agent for void free submicron feature filling

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2015132392A Division JP6117284B2 (ja) 2009-07-30 2015-07-01 無ボイドでのサブミクロン構造物充填用の、抑制剤を含有する金属メッキ組成物

Publications (3)

Publication Number Publication Date
JP2013500395A JP2013500395A (ja) 2013-01-07
JP2013500395A5 true JP2013500395A5 (https=) 2013-09-05
JP5775077B2 JP5775077B2 (ja) 2015-09-09

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ID=42733749

Family Applications (2)

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JP2012522097A Active JP5775077B2 (ja) 2009-07-30 2010-07-19 無ボイドでのサブミクロン構造物充填用の、抑制剤を含有する金属メッキ組成物
JP2015132392A Active JP6117284B2 (ja) 2009-07-30 2015-07-01 無ボイドでのサブミクロン構造物充填用の、抑制剤を含有する金属メッキ組成物

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2015132392A Active JP6117284B2 (ja) 2009-07-30 2015-07-01 無ボイドでのサブミクロン構造物充填用の、抑制剤を含有する金属メッキ組成物

Country Status (11)

Country Link
US (1) US9617647B2 (https=)
EP (1) EP2459779B1 (https=)
JP (2) JP5775077B2 (https=)
KR (1) KR101738708B1 (https=)
CN (1) CN102471910B (https=)
IL (1) IL217234A (https=)
MY (1) MY160150A (https=)
RU (1) RU2539895C2 (https=)
SG (2) SG10201404301WA (https=)
TW (1) TWI515341B (https=)
WO (1) WO2011012475A1 (https=)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MY170653A (en) 2010-12-21 2019-08-23 Basf Se Composition for metal electroplating comprising leveling agent
US9631292B2 (en) 2011-06-01 2017-04-25 Basf Se Composition for metal electroplating comprising an additive for bottom-up filling of though silicon vias and interconnect features
EP2530102A1 (en) 2011-06-01 2012-12-05 Basf Se Additive and composition for metal electroplating comprising an additive for bottom-up filling of though silicon vias
US20130133243A1 (en) 2011-06-28 2013-05-30 Basf Se Quaternized nitrogen compounds and use thereof as additives in fuels and lubricants
MY172822A (en) 2012-11-09 2019-12-12 Basf Se Composition for metal electroplating comprising leveling agent
ES2681836T3 (es) * 2015-09-10 2018-09-17 Atotech Deutschland Gmbh Composición de baño para chapado de cobre
CN110100048B (zh) * 2016-12-20 2022-06-21 巴斯夫欧洲公司 包含用于无空隙填充的抑制试剂的用于金属电镀的组合物
CN107604414B (zh) * 2017-08-22 2020-03-24 珠海市奥美伦精细化工有限公司 一种铝及铝合金阳极氧化高温无镍封闭剂
KR102641595B1 (ko) 2017-09-04 2024-02-27 바스프 에스이 평탄화 제제를 포함하는 금속 전기 도금용 조성물
CN111344438B (zh) * 2017-11-20 2025-06-06 巴斯夫欧洲公司 用于电镀钴的包含流平剂的组合物
ES2881029T3 (es) * 2018-01-09 2021-11-26 Atotech Deutschland Gmbh Aditivo de ureileno, su uso y un método para su preparación
EP4034696A1 (en) 2019-09-27 2022-08-03 Basf Se Composition for copper bump electrodeposition comprising a leveling agent
WO2021058336A1 (en) 2019-09-27 2021-04-01 Basf Se Composition for copper bump electrodeposition comprising a leveling agent
KR20220164496A (ko) 2020-04-03 2022-12-13 바스프 에스이 폴리아미노아미드 유형 레벨링제를 포함하는 구리 범프 전착용 조성물
EP3922662A1 (en) 2020-06-10 2021-12-15 Basf Se Polyalkanolamine
CN115720598A (zh) 2020-07-13 2023-02-28 巴斯夫欧洲公司 用于在钴晶种上电镀铜的组合物
KR20240070557A (ko) 2021-10-01 2024-05-21 바스프 에스이 폴리아미노아미드 타입 레벨링제를 포함하는 구리 전착용 조성물
US20250388725A1 (en) 2022-07-07 2025-12-25 Basf Se Use of a composition comprising a polyaminoamide type compound for copper nanotwin electrodeposition
CN120457244A (zh) 2022-12-19 2025-08-08 巴斯夫欧洲公司 用于铜纳米孪晶电沉积的组合物
WO2025026863A1 (en) 2023-08-03 2025-02-06 Basf Se Composition for copper electroplating on a metal seed
JP7787368B1 (ja) * 2024-06-25 2025-12-16 Ykk株式会社 硫酸銅めっき液
WO2026003954A1 (ja) * 2024-06-25 2026-01-02 Ykk株式会社 硫酸銅めっき液
WO2026037751A1 (en) 2024-08-16 2026-02-19 Basf Se Composition for metal electroplating comprising an additive for defect-free filling of features on electronic substrates

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB602591A (en) 1945-02-12 1948-05-31 Du Pont Improvements in or relating to the electro-deposition of metals
GB1221688A (en) * 1968-03-09 1971-02-03 Geigy Uk Ltd Tin electroplating bath and process
GB2064585B (en) * 1979-11-19 1983-11-09 Enthone Acid zinc electro plating solutions and methods utilizing ethoxylated/propoxylated polyhydric alcohols
US4505839A (en) 1981-05-18 1985-03-19 Petrolite Corporation Polyalkanolamines
SU1035097A1 (ru) * 1981-07-20 1983-08-15 Днепропетровский Ордена Трудового Красного Знамени Государственный Университет Им.300-Летия Воссоединения Украины С Россией Электролит меднени
US4430490A (en) * 1982-08-10 1984-02-07 Ppg Industries, Inc. Polyether polyols and their method of preparation
JPS59182986A (ja) * 1983-04-01 1984-10-17 Keigo Obata スズ、鉛及びすず−鉛合金メツキ浴
JPS62182295A (ja) * 1985-08-07 1987-08-10 Daiwa Tokushu Kk 銅メツキ浴組成物
DE4003243A1 (de) 1990-02-03 1991-08-08 Basf Ag Verwendung von trialkanolaminpolyethern als demulgatoren von oel-in-wasser-emulsionen
JPH0641581A (ja) * 1992-07-23 1994-02-15 Seiko Epson Corp コンタクトレンズ用親水性洗浄剤
JP3244866B2 (ja) * 1993-05-25 2002-01-07 株式会社大和化成研究所 すず−鉛合金めっき浴
EP1197587B1 (en) 2000-10-13 2006-09-20 Shipley Co. L.L.C. Seed layer repair and electroplating bath
US6776893B1 (en) * 2000-11-20 2004-08-17 Enthone Inc. Electroplating chemistry for the CU filling of submicron features of VLSI/ULSI interconnect
EP1422320A1 (en) * 2002-11-21 2004-05-26 Shipley Company, L.L.C. Copper electroplating bath
WO2004050559A1 (ja) 2002-12-03 2004-06-17 Asahi Kasei Kabushiki Kaisha 酸化銅超微粒子
US20050133376A1 (en) * 2003-12-19 2005-06-23 Opaskar Vincent C. Alkaline zinc-nickel alloy plating compositions, processes and articles therefrom
US20050199507A1 (en) * 2004-03-09 2005-09-15 Taiwan Semiconductor Manufacturing Co., Ltd. Chemical structures and compositions of ECP additives to reduce pit defects
EP1819848A1 (en) 2004-11-29 2007-08-22 Technic, Incorporated Near neutral ph tin electroplating solution
US20060213780A1 (en) 2005-03-24 2006-09-28 Taiwan Semiconductor Manufacturing Co., Ltd. Electroplating composition and method
RU2282682C1 (ru) * 2005-04-28 2006-08-27 Российский химико-технологический университет им. Д.И. Менделеева Электролит и способ меднения
US20070178697A1 (en) * 2006-02-02 2007-08-02 Enthone Inc. Copper electrodeposition in microelectronics
JP2008266722A (ja) * 2007-04-20 2008-11-06 Ebara Udylite Kk パルス銅めっき浴用添加剤およびこれを用いたパルス銅めっき浴
MY157126A (en) * 2009-07-30 2016-05-13 Basf Se Composition for metal plating comprising suppressing agent for void free submicron feature filling

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